Hygrothermal Delaminations in Lead-Free Solder Reflow of Electronic Packages

The use of environmentally friendly lead-free solder in electronic assembly requires a higher process temperatures that double the saturated steam pressure inside the electronic package. We studied the interfacial delamination fractures created by the trapped steam inside the defect voids in packages by computationally modeling the steam diffusion and evaporation processes and the hygrothermal fracture behaviors. These results were compared with results from the conventional saturated steam pressure approach. The comparisons revealed that the saturated steam approach is appropriate for small defects, while the evaporative-diffusion approach is suited for delamination analyses of small and large defects. Our results showed that the strain energy release rate increased with initial defect growth, but reached a defect-size independent plateau when the defect had grown larger than the temperature-dependent critical defect size. To control delamination in packages undergoing lead-free solder reflow, the interfacial fracture energy release rate should be engineered to be above this plateau by controlling the interfacial adhesion, and the applied strain energy release rate should be reduced by reducing the diffusion and evaporation rate of water in the materials.     

电子封装用无铅焊料的最新进展

随着WEEE/RoHS法令的颁布,电子封装行业对于无铅焊接提出了更高的要求.根据国际上对无铅焊料的最新研究进展提出了无铅焊料"三大候选"的概念.总结了目前无铅焊料尚存的三大主要弱点,并对国际上推荐使用的几种无铅焊料的优缺点进行了概述.     

电子封装中的焊点及其可靠性

在电子封装中 ,焊点失效将导致器件乃至整个系统失效 ,焊点失效的起因是焊点中热循环引起的裂纹及其扩展。从焊点的微观组织及其变化、焊点失效分析、焊点可靠性预测等方面介绍了对电子封装焊点及其可靠性研究的状况。     

无铅电子封装Sn-Cu焊料润湿性试验研究

为了改善无铅焊料的润湿性,配置活性剂松香焊剂和无机物焊剂,研究了Sn-0.75 Cu焊料的润湿性.分析讨论了影响Sn-0.75 Cu焊料润湿性的主要因素,获得了焊剂和Sn-0.75 Cu焊料的最优匹配.在镀锡铜片上,5#焊剂匹配Sn-0.75 Cu焊料能够获得最佳的润湿性(润湿角为18°),已接近Sn-37 Pb焊料的润湿性.     

Solder Joint Characteristics and Reliability of Lead-Free Area Array Packages Assembled at Various Tin–Lead Soldering Process Conditions

This paper presents a comprehensive study on the effects of critical process conditions on solder joint metallurgy and reliability of mixed-alloy solder joints. The solder joint metallurgy of mixed alloys was characterized and the lead distribution through the solder joint was analyzed, for different package types and under various process conditions. The results showed that the solder paste amount (ultimately the tin percentage (Sn%) in the alloy) and the reflow temperature play critical roles in the mixed-alloy assembly, both in terms of compositional homogeneity and voiding. The reliability of mixed-alloy solder joints was then studied at various process conditions, under different thermal and mechanical stress environments. The study revealed that the sensitivity of the reliability of the mixed-alloy solder joints to the process condition depends on the type of environmental loading.      

Study of Solidification Cracks in Sn-Ag-Cu Lead-Free Solder Joints

In the present work, solidification cracks in Sn-Ag-Cu solder joints were investigated. Experimental results indicate that solidification cracks existed in significant numbers in the miniature Sn-Ag-Cu solder joints. In order to create solidification cracks in the miniature solder joints during solidification and evaluate the susceptibility of Sn-Ag-Cu alloys to solidification cracking, a copper self-restraint specimen was designed, which can simulate the process of solidification crack formation. The solidification crack susceptibility of the Sn-Ag-Cu solder alloy was evaluated using the total crack length of the solder joint. In addition, the effect of trace amounts of elemental additions on solidification cracking of Sn-Ag-Cu solder joints was studied. It was found that adding trace amounts of Ni or Ce could depress the solidification cracks in Sn-3.0Ag-0.5Cu solder joints. However, P additions aggravated the formation of solidification cracks.     

Large-Scale Correlations in the Orientation of Grains in Lead-Free Solder Joints

A large number of lead-free Sn-Ag-Cu controlled collapse chip connection (C4) solder joints (∼100 μm in diameter) in flip-chip microelectronic packages were studied by electron backscatter diffraction (EBSD) in order to describe the statistical distribution of grain size and coincident site lattice boundaries associated with 60 deg twins in the Sn phase, as a function of silver content. It is shown that lower silver content results in smaller grains, and a lower propensity for grains to exhibit twinning symmetries. Indirect measurements of the creep properties of these joints were also obtained as a function of silver content, showing that, in the strain rate and temperature conditions that are the most relevant to the microelectronic industry, solder joints with low silver content are more susceptible to creep deformation.     

Retarding Electromigration in Lead-Free Solder Joints by Alloying and Composite Approaches

The voids induced by electromigration (EM) can trigger serious failure across the entire cathode interface of solder joints. In this study, alloying and composite approaches showed great potential for inhibiting EM in lead-free solder joints. Microsized Ni, Co, and Sb particles were added to the solder matrix. Cu and Sn particles were added to the melting solder to form in situ Cu₆Sn₅, which formed a barrier layer in the underbump metallization of flip-chip solder joints. The polarity effect induced by EM was observed to be significantly inhibited in the alloyed and composite solder joints. This indicates that the Sn-Ni, Sn-Co, Sn-Sb, and Cu₆Sn₅ intermetallic compounds may act as barriers to obstruct the movement of the dominant diffusion species along phase boundaries, which in turn improves the resistance to EM. However, Sb particles could induce crack formation and propagation that might lead to joint fracture.     

浅谈电子产品无铅化

鉴于铅对人体及自然环境的危害性,文章从电子产品无铅化的提出、焊料的无铅化、电子器件的无铅化、无铅化实施过程中存在的问题这几个方面阐述电子产品的无铅化。     

Crystallographically Faceted Void Formation in the Matrix of Lead-Free Solder Joints

Crystallographically faceted void (CFV) formation in lead-free solder joints has been observed after solidification and during subsequent solid-state aging. Such voids have not previously been reported in the literature. This paper gives a preliminary report on observations of voids which tend to be associated with, and adjacent to, intermetallic compounds in the solder bulk and near-substrate interface region. It has been observed that CFVs are correlated with β-Sn crystallographic orientation and form in a tetragonal shape. Aging promotes CFV clustering and growth.     

Reliability of Lead-Free Solder Interconnections in Thermal and Power Cycling Tests

Lead-free solder interconnection reliability of thin fine-pitch ball grid array (BGA) lead-free packages has been studied experimentally as well as with finite-element (FE) simulations. The reliability tests were composed of the thermal shock test, the local thermal cycling test (resistors embedded in the board around the package), and the power cycling test (heat generation in the die). A 3-D board-level finite-element analysis (FEA) with local models was carried out to estimate the reliability of the solder interconnections under various test conditions. Due to the transient nature of the local thermal cycling test and the power cycling test, a sequential thermal-structural coupling analysis was employed to simulate the transient temperature distribution as well as the mechanical responses. Darveaux's approach was used to predict the life time of the solder interconnections. Furthermore, the numerical results validated by the experimental results indicated that the diagonal solder interconnections beneath the die edge were the most critical ones of all the tests studied here. It has been found that the fatigue life in the power cycling test was much longer than that in the other two tests. Detailed discussions about the failure mechanism of solder interconnections as well as the microstructural observations of the primary cracks are reported in this paper.      

袖里乾坤

设计出在苛刻环境下满足轻便、紧凑、明亮、用户界面友好，还能展现高质量图像要求的小型显示器并不容易，然而需求当前——这就要求具有独创性。     

Solder Joint Reliability Assessment for Flip Chip Ball Grid Array Components with Various Designs in Lead-Free Solder Materials and Solder Mask Dimensions

This study investigates the reliability of flip chip ball grid array (FCBGA) components with three types of solder materials: eutectic solder with a composition Sn63Pb37 and the lead-free solders SnAg3.0Cu0.5 and SnAg4.0Cu0.5. Two substrate-side solder mask (S/M) opening sizes, 0.4 mm and 0.525 mm, were used. Both the monotonic and cyclic mechanical four-point bend tests are conducted for the reliability assessment. It is found that the FCBGA components with SnAg3.0Cu0.5 solder have the best durability during the cyclic bend test, yet the eutectic solder is the strongest during the monotonic bend test. Besides, the FCBGA components with 0.525-mm S/M opening have around 3 times more life cycles than those with the 0.4-mm S/M opening in the cyclic bend test. It is also noteworthy that the lead-free solder materials have much variation in the failed cycles during the cyclic test. Moreover, the failure locations for those components with 0.4-mm S/M openings are found to be at the interface between the package side metal pad and the solder ball, and those with an S/M opening of 0.525 mm are observed to be failed mostly at the interface between the printed circuit board (PCB) side metal pad and the solder ball.     

Crystal Plasticity Finite-Element Analysis of Deformation Behavior in Multiple-Grained Lead-Free Solder Joints

The elastic and plastic anisotropy of the tin phase in a Pb-free tin-based solder joint has a very important effect on the reliability of solder joints. The crystal plasticity finite-element (CPFE) method takes into account the effect of anisotropy, and it can be used to solve crystal mechanical deformation problems under complicated external and internal boundary conditions imposed by inter- and intragrain micromechanical interactions. In this study, experimental lap-shear test results from the literature are used to calibrate the CPFE model. The spatial neighbor orientation relationships of the crystals were assessed by studying four different sets of orientations using a very simple model to establish a basis for further development of the model. Average shear strain and Schmid factor analyses were applied to study the activity of slip systems. Further optimization of model parameters using comparisons with experiments will be needed to identify more suitable rules for stress evolution among the 10 slip systems in Sn. By suppression of some of the slip systems the CPFE model is able to simulate heterogeneous deformation phenomena that are similar to those observed in experiments. This work establishes a basis for an incremental model development strategy based upon experiments, modeling, and comparative analysis to establish model parameters that could predict the slip processes that lead to damage evolution in lead-free solder joints.     

无铅焊接工艺中常见缺陷及防止措施

无铅化电子组装中,由于原材料的变化带来了一系列工艺的变化,随之产生许多新的焊接缺陷。针对“黑盘”现象进行了产生机理分析,并给出了相应的解决措施。     

无铅焊接工艺中常见缺陷及防止措施

无铅化电子组装中,由于原材料的变化带来一系列工艺的变化,随之产生许多新的焊接缺陷.针对表面裂纹、表面发暗及二次回流等缺陷进行了机理分析,并给出了相应的解决措施.     

回流焊工艺中常见缺陷及其防止措施

元器件的微型化和产品的多功能化,驱动了产品安装设计的高密度化和立体化.其特点是焊点越来越密集;焊点尺寸越来越微小;间距越来越细.焊接缺陷是影响电子产品质量的主要因素,针对回流焊接工艺中常见的几种缺陷进行分析,并给出相应的解决措施.     

无铅焊接工艺中常见缺陷及防止措施

无铅化电子组装中,由于原材料的变化带来了一系列工艺的变化,随之产生许多新的焊接缺陷.针对电迁移和Kirkendall空洞等缺陷进行了产生机理分析,并给出了相应的解决措施.