工业控制系统信息安全动向及发展对策研究

关注我国工业控制系统的信息安全问题,总结国内外工业控制系统信息安全动向,展望其发展趋势,归纳了国际先进国家对工业控制系统信息安全保护和发展的经验措施,并从技术和管理角度对我国工业控制系统信息安全领域存在的不足和问题提出对策与建议。     

顺势而行 切实加强工业控制系统信息安全管理

工业控制系统信息安全事关工业生产运行安全、国家经济安全和人民生命财产安全。随着计算机和网络技术的发展,工业控制系统以各种方式与公共网络连接,木马、黑客等威胁正在向工业控制系统扩散,工业控制系统信息安全问题日益突出。工信部近期出台《关于加强工业控制系统信息安全管理的通知》,加强工业控制系统信息安全管理。本刊特约工信部信息安全协调司欧阳武副司长解读该通知的出台背景和核心内容,并介绍现阶段将如何开展工业控制系统信息安全管理工作。     

能源行业工控系统信息安全分析与防护

工控系统已广泛的应用于电力、煤炭、石油、天然气等能源行业的各个领域。在推动该领域技术进步的同时也面临着日益严重的信息安全问题。能源行业工控系统信息安全事关我国国家经济安全和人民生命财产安全,工控系统的信息安全已引起业界高度的关注。2011年9月,工业和信息化部专门发文《关于加强工业控制系统信息安全管理的通知》,要求加强国家重点领域主要工业基础设施控制系统的安全保护工作,强调加强     

浅谈军工企业工业控制系统信息安全

随着两化融合的不断推进,使工业控制系统信息安全问题逐步显现。文章从军工企业工业控制系统信息安全现状入手,分析了军工企业工业控制系统信息安全存在的风险,并对军工企业工业控制系统信息安全的应对策略提出了建议。     

工业控制系统信息安全标准化

从工业控制系统面临的信息安全威胁出发,阐述相应解决方法和信息安全目标,介绍了国际、国内相关安全标准研究进展,并对国内的工业控制系统信息安全标准化建设提出建议。     

工业控制系统信息安全风险评估研究

筒要地介绍了工业控制系统的信息安全现状,分析了工业控制系统的信息安全需求,指出了其可能面临的信息安全隐患.并在此基础上,提出了工业控制系统信息安全风险评估的内容、风险评估的方法和风险评估的流程,总结出了一套针对工业控制系统的信息安全风险评估思路.     

IEC 62443工控网络与系统信息安全标准综述

通过分析工业控制系统信息安全的概念,阐释了工业控制系统信息安全与传统IT信息安全的区别,详细讲解了IEC 62443工业通信网络信息安全系列标准,以及工业控制系统信息安全评估方法。     

建立安全基准对抗风险

为了保证信息安全，大部分企事业单位通过建立信息安全管理制度，使用信息安全设备、技术，构建信息系统安全体系架构，来保证信息系统安全。但是，安全事件还是频繁发生，造成直接或间接的经济损失以及不良的社会影响。究其具体原因，有很多方面，比如安全管理不善、内部人员有意或无意造成的安全事件、外来非法攻击、病毒感染、软硬件的故障等。其中，信息安全基准作为信息安全技术和管理的重要组成部分，常常被忽略。     

不容回避的工控领域操作系统风险

所谓工业控制系统就是由计算机设备与工业过程控制部件组成的自动控制系统。工业过程控制部件对实时数据进行采集、监测,在计算机调配下,实现设施自动化运行和业务流程管理与监控。工业控制系统网络的信息安全问题一直存在,只是以往的工业控制系统相对封闭,网络信息安全方面暴露出的问题少,因而没有得到足够的重视。但是随着工业控制系统越来越多地采用通用的操作系统、通讯协议和标准,与企业信息管理系统的结合越来越紧密,信息安全问题也就凸显了出来。     

工业SCADA系统信息安全技术

《网络与信息安全前沿技术丛书之工业SCADA系统信息安全技术》一书目前正式与读者见面。该书立足解决政府、军队、企业、研究团体、学术机构等需要迫切解决的工业控制系统信息安全问题,既系统性地分析了工业SCADA系统存在的脆弱点和面l陆的信息安全成胁,提出工业SCADA系统信息安全体系,又对相关应用案例以及国内外工业控制系统信息安全发展趋势进行了分析。     

Resolution Enhancement Technology:Integrated Process Solutions using OPC

DUV lithography, using the 248 nm wavelength, is a viable manufacturing option for devices with features at 130 nm and less. Given the low kl value of the lithography, integrated process development is a necessary method for achieving acceptable process latitude. The application of assist features for rule based OPC requires the simultaneous optimization of the mask, illumination optics and the resist.Described in this paper are the details involved in optimizing each of these aspects for line and space imaging.A reference pitch is first chosen to determine how the optics will be set. The ideal sigma setting is determined by a simple geometrically derived expression. The inner and outer machine settings are determined, in turn,with the simulation of a figure of merit. The maximum value of the response surface of this FOM occurs at the optimal sigma settings. Experimental confirmation of this is shown in the paper.Assist features are used to modify the aerial image of the more isolated images on the mask. The effect that the diffraction of the scattering bars (SBs) has on the image intensity distribution is explained. Rules for determining the size and placement of SBs are also given.Resist is optimized for use with off-axis illumination and assist features. A general explanation of the material' s effect is discussed along with the affect on the through-pitch bias. The paper culminates with the showing of the lithographic results from the fully optimized system.     

Cost-effective test solutions for smart card and other integrated flash applications

From its emergence in the late 1980s as a lower cost alternative to early EEPROM technologies, flash memory has evolved to higher densities and speedsand rapidly growing acceptance in mobile applications.In the process, flash memory devices have placed increased test requirements on manufacturers. Today, as flash device test grows in importance in China, manufacturers face growing pressure for reduced cost-oftest, increased throughput and greater return on investment for test equipment. At the same time, the move to integrated flash packages for contactless smart card applications adds a significant further challenge to manufacturers seeking rapid, low-cost test.     

Theoretical analysis of the relationship between the Brillouin gain coefficient and the strain in the optical-fiber sensors

The relation between the power of the Brillouin signal and the strain is one of the bases of the distributed fiber sensors of temperature and strain. The coefficient of the Bfillouin gain can be changed by the temperature and the strain that will affect the power of the Brillouin scattering. The relation between the change of the Brillouin gain coefficient and the strain is thought to be linear by many researchers. However, it is not always linear based on the theoretical analysis and numerical simulation. Therefore, errors will be caused if the relation between the change of the Brillouin gain coefficient and the strain is regarded as to be linear approximately for measuring the temperature and the strain. For this reason, the influence of the parameters on the Brillouin gain coefficient is proposed through theoretical analysis and numerical simulation.     

An improved parallel thinning algorithm with two subiterations

The parallel thinning algorithm with two subiterations is improved in this paper. By analyzing the notions of connected components and passes, a conclusion is drawn that the number of passes and the number of eight-connected components are equal. Then the expression of the number of eight-connected components is obtained which replaces the old one in the algorithm. And a reserving condition is proposed by experiments, which alleviates the excess deletion where a diagonal line and a beeline intersect. The experimental results demonstrate that the thinned curve is almost located in the middle of the original curve connectivelv with single pixel width and the processing speed is high.     

Novel fiber-optical interferometer with miniaturized probe for in-hole measurements

Today, micro-system technology and the development of new MEMS （Micro-Electro-Mechanical Systems） are emerging rapidly. In order for this development to become a success in the long run, measurement systems have to ensure product quality. Most often, MEMS have to be tested by means of functionality or destructive tests. One reason for this is that there are no suitable systems or sensing probes available which can be used for the measurement of quasi inaccessible features like small holes or cavities. We present a measurement system that could be used for these kinds of measurements. The system combines a fiber optical, miniaturized sensing probe with low-coherence interferometry, so that absolute distance measurements with nanometer accuracy are possible.     

Development of the readout system for waveguide multilayer optical card

Waveguide multilayer optical card （WMOC） is a novel storage device of three-dimensional optical information. An advanced readout system fitting for the WMOC is introduced in this paper. The hardware mainly consists of the light source for reading, WMOC, motorized stages addressing unit, microscope imaging unit, CCD detecting unit and PC controlling ＆ processing unit. The movement of the precision motorized stage is controlled by the computer through Visual Basic （VB） language in software. A control panel is also designed to get the layer address and the page address through which the position of the motorized stages can be changed. The WMOC readout system is easy to manage and the readout result is directly displayed on computer monitor.     

Study of waveguide coupling efficiency in hybrid silicon lasers

This paper presents a new method to increase the waveguide coupling efficiency in hybrid silicon lasers. We find that the propagation constant of the InGaAsP emitting layer can be equal to that of the Si resonant layer through improving the design size of the InP waveguide. The coupling power achieves 42% of the total power in the hybrid lasers when the thickness of the bonding layer is 100 nm. Our result is very close to 50% of the total power reported by Intel when the thickness of the thin bonding layer is less than 5 nm. Therefore, our invariable coupling power technique is simpler than Intel＇s.     

Collinear phase-matching study of terahertz-wave generation via difference frequency mixed in GaAs and Inp

The collinearly phase-matching condition of terahertz-wave generation via difference frequency mixed in GaAs and InP is theoretically studied. In collinear phase-matching, the optimum phase-matching wave hands of these two crystals are calculated. The optimum phase-matching wave bands in GaAs and lnP are 0.95-1.38μm and 0.7-0.96μm respectively. The influence of the wavelength choice of the pump wave on the coherent length in THz-wave tuning is also discussed. The influence of the temperature alteration on the phase-matching and the temperature tuning properties in GaAs crystal are calculated and analyzed. It can serve for the following experiments as a theoretical evidence and a reference as well.     

Effects of the alloy compositions on the phonon-polaritons in ternary mixed crystals

Composition dependence of bulk and surface phonon-polaritons in ternary mixed crystals are studied in the framework of the modified random-element-isodisplacement model and the Bom-Huang approximation. The numerical results for Several Ⅱ - Ⅵ and Ⅲ- Ⅴ compound systems are performed, and the polariton frequencies as functions of the compositions for ternary mixed crystals AlxGa1-xAs, GaPxAS1-x, ZnSxSe1-x, GaAsxSb1-x, GaxIn1-xP, and ZnxCd1-xS as examples are given and discussed. The results show that the dependence of the energies of two branches of bulk phonon-polaritons which have phonon-like characteristics, and surface phonon-polaritons on the compositions of ternary mixed crystals are nonlinear and different from those of the corresponding binary systems.     

New insert layer structure OLEDs

An insert layer structure organic electroluminescent device（OLED） based on a new luminescent material （Zn（salen）） is fabricated. The configuration of the device is ITO/CuPc/NPD/Zn（salen）/Liq/LiF/A1/CuPc/NPD/Zn（salen）/Liq/LiF/A1. Effective insert electrode layers comprising LiF（1nm）/Al（5 nm） are used as a single semitransparent mirror, and bilayer cathode LiF（1 nm）/A1（100 nm） is used as a reflecting mirror. The two mirrors form a Fabry-Perot microcavity and two emissive units. The maximum brightness and luminous efficiency reach 674 cd/m^2 and 2.652 cd/A, respectively, which are 2.1 and 3.7 times higher than the conventional device, respectively. The superior brightness and luminous efficiency over conventional single-unit devices are attributed to microcavity effect.