共查询到18条相似文献,搜索用时 31 毫秒
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高体积效率、超薄型化是实现钽电容器进一步小型化的有效技术途径,基于丝网印刷技术,提出了一种新的钽阳极制作方法,即首先将高比容钽粉制成浆料,然后印刷在钽箔上进行高温烧结作为电容器的阳极片,接着利用传统的阳极氧化方法生成五氧化二钽(Ta2O5)作为电容器的电介质,并通过多次浸渍硝酸锰、高温热分解循环被覆二氧化锰(MnO2)作为阴极材料,该方法制备的电容器其钽芯厚度最薄可以达到 0.2mm,体积效率相比传统技术提高了30%,而且经过 125℃、2000h寿命测试,试 验样品各项电性能参数稳定,基于丝网印刷工艺技术制造钽浆阳极的方法将加速钽电容器小型化和薄型化的发展。 相似文献
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广泛地收集了国产固体钽电解和Ⅰ类瓷介等电容器在多种环境下的现场失效率数据,分析得出现场失效率与电容量的回归方程式,发现国产固体钽电解电容器随着容量增大其失效率增大的“速率”过大,进一步分析表明,这种偏离常规的原因与我国大容量固体钽电解电容器制造技术上的缺陷及使用中的开关浪涌电流密切相关,因此,作者根据分析的结果提供了提高大容量固体钽电容器可靠性的技术途径和措施。 相似文献
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高频固体钽电解电容器电性能与钽粉 总被引:2,自引:2,他引:0
对高频固体钽电容器应特别关注高频阻抗、电感量、等效串联电阻、纹波电流等参数。研究这类电容器电性能参数与钽粉性能的关系表明:当前对钽粉应以提高化学纯度、增多品种和规格、改善性能,以满足制造不同用途的电容器的需要 相似文献
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利用片式钽电容器纹波电流与等效串联电阻(ESR)、额定功耗、温升及热阻之间的关系,提出了一种片式钽电容器耐受纹波电流能力的详细实验标定方法和程序,并对典型的规格产品进行了标定实验。该方法不但适用于片式钽电容器生产厂进行系列产品耐受纹波电流能力的测定,用户工程师同样可以用它来对相应规格的产品进行测算。 相似文献
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介绍了钽电解电容器的常见失效模式,结合我厂军品电源模块使用的CAK45钽电解电容器,进行了失效率估算,并对钽电解电容器使用中常见的失效模式提出了具体的预防对策,最后对钽电解电容器的加速寿命试验结果进行了分析。 相似文献
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从场致晶化和热致晶化的角度对固体电介质钽电容器介质膜晶化现象和机理进行了讨论,并结合CA45-H-35V-470μF固体电解质钽电容器的失效分析对介质膜晶化引起电容器失效进行了进一步的说明.采用筛选、物理分析和降额使用的方法,可有效避免介质膜晶化引起的钽电解电容器失效. 相似文献
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Use of ESR for deterioration diagnosis of electrolytic capacitor 总被引:2,自引:0,他引:2
A new deterioration diagnosis method for the electrolytic capacitor is proposed for a forward-type converter and a buck-boost converter. It was observed that the ESR (equivalent series resistance) of the electrolytic capacitor increases as it deteriorates, and the knowledge that ripple varies proportionally to the ESR increase was used. With this method, the electrolytic capacitor life-cycle aging rate can be projected for the active circuit over the system life. This approach to deterioration is valid for any load condition, no matter whether the circuit has feedback control or not 相似文献
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Tantalum capacitor failure modes have been discussed both for the standard manganese dioxide cathode and the new conductive polymer (CP) type. For standard tantalum in the normal operation mode, an electrical breakdown can be stimulated by an increase of the electrical conductance in channel by an electrical pulse or voltage level. This leads to capacitor destruction followed by thermal breakdown. In the reverse mode, we have reported that thermal breakdown is initiated by an increase of the electrical conductance by Joule heating at a relatively low voltage level. Consequently, a feedback cycle consisting of temperature–conductivity–current–Joule heat–temperature, ending with electrical breakdown was created. Both of these breakdown modes possess a stochastic behavior and can be hardly localized in advance. CP capacitors have shown a slightly different current conductivity mechanism compared to standard tantalum capacitors. The breakdown of CP dielectrics is similar to avalanche and field emission breaks. It is an electromechanical collapse due to the attractive forces between electrodes, electrochemical deterioration, dendrite formation, and so on. However, some self-healing of the cathode film has been reported. This can be attributed to film evaporation, carbonizing or reoxidation. Not all of the breakdowns of CP capacitors can lead to self-healing or an open circuit state. Short circuits can also occur. 相似文献
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《Electron Devices, IEEE Transactions on》1973,20(12):1147-1149
A new material has been developed as a resistive sea for the silicon diode-array camera tube target. The material is prepared by reactive sputtering of a hafnium tantalum cathode in a nitrogen atmosphere. By adjusting the relative amounts of hafnium and tantalum in the cathode or by changing the sputtering parameters, the resistivity of the hafnium tantalum nitride sea may be optimized. The nitride may be heated to 350°C during camera tube bakeout with no degradation in performance. By controlling the film deposition conditions, electrostatic focus camera tubes have been made with excellent aging, dark current, lag, and resolution characteristics. 相似文献