法拉第简阵列探测器在电子束束流均匀度测量中的应用

描述一种法拉第筒阵列探测器，其由拦截式法拉第筒、抑制电极、绝缘层和底座等组成。应用该探测器测量了电子加速器的束流均匀度，计算了被辐照样品的吸收剂量，将为电子加速器的改造、生物辐照、材料辐照提供重要参数。     

DZ-12/4多能量档电子直线加速器辐照关键参数测试

中国原子能科学研究院建立了一台DZ-12/4多能量档电子直线加速器,该装置主要用作辐射加工级电子束辐照实验平台。为了检测该电子束辐照实验平台辐照工艺控制参数,本文利用中国原子能科学研究院FJL-02型辐射变色薄膜剂量计对DZ-12/4多能量档电子直线加速器关键参数能量进行了测量,并对研制的束流监测系统法拉第筒的可靠性进行了验证。结果表明,DZ-12/4多能量档电子直线加速器能量在4~12 MeV范围可调,运行参数准确可靠;日常运行中,加速器运行人员通过监测设备和调节加速器参数可有效控制并估计辐照剂量,具有非常好的实用性和简便性。     

用于AMS的束流测量与调试系统

HI-13串列加速器质谱计的束流测量系统由可变狭缝仪、法拉第筒、荧光靶和探测器等构成,其中,可变狭缝仪、法拉第筒和荧光靶实验中需由试验人员手动操作,影响实验工作效率。为改变这一状况,已将可变狭缝仪、法拉第筒、半导体探测器、摄像头和荧光靶置于一靶室内。采用电控平移台     

HI-13串列加速器核孔膜辐照专用束流线的研制

所研制的HI 13串列加速器核孔膜辐照束流线没有采用扫描装置 ,但采取了一些有效措施 ,使束流展宽面积大于 30mm× 30 0mm ,束流均匀度好于 80 %。辐照真空盒中安装有观察窗和荧光屏 ,可观测束流展宽尺寸 ;在 y方向移动的法拉第筒 ,用于测量束流稳定度 ;在x方向移动的三法拉第筒装置 ,用于测量束流的均匀性。束流线已提供使用 ,运行情况良好。     

AMS专用注入器同时测量方法进展

中国原子能科学研究院HI-13串列加速器质谱装置新的注入器系统具有同时测量的功能。在注入磁铁后有两个偏置法拉第筒，在探测器测量待测核素的同时，可以用它来测量其稳定同位素的束流，实现放射性核素和稳定核素的同时测量。这样，避免了束流不稳定造成的误差，实现了高精度测量。偏置法拉第筒的移动范围为25-75 m。     

MLFC在质子单粒子效应实验束流诊断中的应用

对宇航微电子器件进行抗质子辐射性能评估时,常利用加速器产生的质子束流来测量其质子单粒子效应截面曲线（σ-E曲线）。基于北京HI-13串列加速器重离子辐照装置,研制了适用于质子能量测量的多叶法拉第筒（MLFC）,为今后开展质子单粒子效应辐照实验奠定基础。测试结果表明,研制的MLFC既可测量质子能量和束流强度,也能测量质子束流的能量纯度,这对判定束流是否符合实验要求及调束非常实用。     

限口法拉第筒的研制

自行研制了一种限口法拉第筒,用于确定20 MeV以下能量质子入射到不同材料中的吸收剂量。与传统法拉第筒相比,限口法拉第筒的改进在于：抑制电极由外筒和回弯环两部分构成,回弯环改变了法拉第筒的电场分布,增强了电场对次级电子的束缚能力.减小了对入射离子束的影响,提高了测量的准确度。     

辐照电子直线加速器辐射剂量测定的技术研究

研究了辐照电子直线加速器辐射剂量测定的技术方法,在测量方法上采取实测与蒙特卡洛模拟计算相结合的方法提高辐射剂量测定的准确度和可操作性;用化学剂量计建立电子束吸收能量测量的方法;用平板电离室建立电子束表面剂量、电子束吸收剂量率测量的方法;用半导体探测器阵列建立电子束辐照均匀性测量的方法。     

闪烁体薄膜在线测量质子束流强度

质子单粒子效应实验研究和质子加速器研究中,质子束流强测量关系着实验结果的可靠性和准确性。法拉第筒、金硅面垒探测器、金刚石探测器等传统探测方法均为拦截式测量,无法实现束流的在线测量。本文用闪烁体薄膜在线监测质子束流强。质子束流穿过薄膜闪烁体,沉积部分能量使其发光,用光电倍增管收集光信号,从而得到束流的强度信息。通过质子与闪烁体材料相互作用的理论计算得到闪烁体材料对质子束流的响应关系。在北大2×6 MeV串列加速器上对3–10 MeV的质子束流进行了实验测量,验证了其响应关系。     

限口法拉第简的研制

自行研制了一种限口法拉第筒,用于确定20 MeV以下能量质子入射到不同材料中的吸收剂量.与传统法拉第筒相比,限口法拉第筒的改进在于:抑制电极由外简和回弯环两部分构成,回弯环改变了法拉第筒的电场分布,增强了电场对次级电子的束缚能力,减小了对入射离子束的影响,提高了测量的准确度.     

Development of a silver ion source using nanosecond pulses of a Nd:YAG laser at different wavelengths

A silver ion source was designed by focusing the fundamental and harmonics of Q-switched Nd:YAG laser pulses onto a silver target and simultaneously applying an electric potential in an argon environment. The silver ions were detected at a distance of 2 cm from the target surface using a Faraday cup ion probe after letting them pass through a retarding mesh grid (copper electrode). We aim to produce and characterize the silver ions generated by the laser radiation of different wavelengths and pulse energy, ambient gas pressure and the electrode spacing under applied electric field. In addition to this, the effect of laser radiation on plasma under vacuum and at different argon gas pressures was investigated. The velocity distribution function of the plasma emitted from the silver target was investigated under argon discharge. These measurements demonstrated clearly that the velocity distribution function and current signals depend on laser power, laser wavelength and argon pressure. We observed a ten fold increase in the plume current with increase in the applied voltage and ion velocity in the presence of a laser field. The surface morphology of the laser irradiated samples was investigated using reflection optical microscopy.     

用于中国散裂中子源调束的法拉第筒结构优化设计

本文将法拉第筒应用于中国散裂中子源前端系统和漂移管加速器临时线两个调束阶段,以吸收和截止束流。根据给定的束流物理参数,法拉第筒选择石墨吸收束流,紧贴石墨的无氧铜作为导热材料。通过靶型和冷却效率分析比较,确定采用单斜板靶,束流与靶面夹角为10°,同时设计了新型的瀑布型并联圆孔水冷结构。采用有限元软件ANSYS对结构模型进行热分析,对水冷管孔径和孔间距进行优化。经结构分析和应力变形校核,保证了加工制造的可靠性。用本文研制的法拉第筒顺利完成了调束任务。     

H- Beam Stripping Loss at Background Partial Pressure of Ar

It has been observed that H^- current could be improved by adding Ar to H2 plasma. But due to a slower pumping speed for Ar with the existing pumping scheme, the tank pressure will increase quickly during the length of a beam pulse. Since H^- stripping loss depends on the tank pressure and gas species, part of the H^- beam can be converted to H^0 and then H^0 can be converted into H^＋ with background H2 and Ar gas thickness. Therefore, the H^- beam current, measured by a Faraday cup, situated at a distance L from GG （ground grid）, will decrease because it will be converted into a H^＋ current. This gives a ratio of the Faraday cup net current to the H^- beam current before stripping at background partial pressure of Ar.     

An accelerator voltage regulating system using a position sensitive Faraday cup

A Faraday cup has been developed for precise current measurements in accelerator mass spectrometry, which provides in addition information on the beam position. These data are used to monitor the energy of the beam and, if necessary, the terminal voltage of the accelerator is automatically adjusted.     

Ion Beam Emission in a Low Energy Plasma Focus Device

The characteristics of the Ar ion beam generated in a low energy plasma focus device were investigated. A Mather-type PF device filled with argon gas driven by an 11 μF single capacitor bank was used. A Faraday cup, operating in the bias ion collector mode, is used to estimate the energy spectrum and ion flux along the PF axis. The results of the experiments show the dependence of the energy spectrum on the gas pressure and the anode shape.     

Measurement of the Energy of Nitrogen Ions Produced in Filippov Type Plasma Focus Used for the Nitriding of Titanium

In this paper the nitrogen ion properties (maximum energy, current density and the most probable energy) are investigated by using Faraday cup in a time of flight method. These ions are produced in a Filippov type plasma focus (Sahand Facility) device and the Faraday cup was placed in a distance range of 18–24?cm from the top of the anode. Maximum and minimum most probable ion energies are 76 and 8.5?keV for the distance range of 18 and 24?cm, respectively. The displacement from 18 to 24?cm at top of the anode the ion current density varies from 4.5?×?10⁶ to 3.2?×?10⁵ (A?m^?2). For the investigation of the effect of ions bombardment of materials at different positions, at the optimum working conditions of 14?kV as a working voltage, and 0.25?Torr as a gas pressure, titanium samples are placed in a distance of 21, 22, 23 and 24?cm from the top of the anode (θ?=?0) and each sample is put under irradiation for 30 plasma shots. The structure of the nitrided surfaces and their morphologies are characterized by X-ray diffractometry and by scanning electron microscopy, respectively. The average crystallite size deduced for (200) and (222) planes of TiN deposited with 30 shots in different distances are estimate to be from ~13 to ~38?nm.     

用0.5 MV端电压的串列AMS装置开展10Be测量方法研究

本文通过对¹⁰Be离子在加速器质谱计（CAMS）高能端束流传输进行模拟计算,确定了¹⁰Be离子束流传输的优化设计。设计安装了测量⁹Be束流的法拉第筒、能量吸收膜（SiN膜）装置、ΔE-E_res气体探测器等,结果表明,改进后的CAMS可进行¹⁰Be测量,¹⁰Be测量总传输效率约为2%,测量本底约为4×10^-14。     

Instrumentation for Monitoring Current from a 30 MeV Electron Linac

Non-intercepting monitors for measuring the total current or charge passing down the electron drift tubes have been constructed which are suitable for electron pulses from about 50 nanoseconds to 3.5 microseconds in width. Measurements are derived from output signals which are tuned to frequencies in the range 250 kcs to 45 kcs. Alternatively, for viewing pulse envelopes, ferrite coil outputs are integrated by a 25 ohm termination. The monitors are calibrated using an air cooled Faraday cup which is described.     

质子吸收剂量校准中蒙特卡罗方法的应用

在使用法拉第筒校准丙氨酸剂量计质子吸收剂量的实验中,质子会受到管道和器壁等物质的影响,造成实验测量结果偏差。为提高测量的准确性,使用FLUKA蒙特卡罗软件,模拟质子在管道中的输运过程。结果表明,加入Ta散射膜后,质子束能均匀地辐照并覆盖丙氨酸剂量计。穿过丙氨酸剂量计的质子数略大于法拉第筒测量值,模拟计算得到测量修正因子k＝1.014。模拟计算了丙氨酸剂量计中的质子能谱分布,随后计算了丙氨酸剂量计的平均碰撞阻止本领。通过模拟计算和修正,获得了更准确的实验数据,最终得到丙氨酸剂量计质子辐照校准曲线,线性相关系数为0.9995。     

X-Ray Produced Charge Distributions at Interfaces between Materials of Different Atomic Number

X-rays traversing a material deposit charge near an interface between two different materials. Results of measurement and calculation of these charge distributions are presented. The measurements were made using a planar dielectric-filled Faraday cup. The charge was calculated using primarily the Compton and photoelectric effects, experimental electron ranges, and experimental electron reflection coefficients. The charge distributions near the interface were determined for the Compton, photoelectric, and mixed Compton-photoelectric regimes: for each of these, the x-ray direction was from low to high atomic number and also in the opposite direction.