Bi3NbTiO9的结构与电学性能

用传统固相法成功制备出了致密的、相对密度超过95％的Bi₃NbTiO₉(BNT)压电陶瓷;采用XRD和SEM对陶瓷的结构和晶粒形貌进行了表征;测出了BNT陶瓷在居里温度点附近的介电特性,同时确定了该陶瓷的居里温度T_c为914℃电滞回线的测试显示了该材料典型的硬铁电性,经过高温极化,测出材料的压电常数d₃₃=7pC/N.     

高Tc钙钛矿结构压电陶瓷物理机理研究进展

高性能高居里温度的压电陶瓷是当前国内外压电铁电材料研究的热点之一.在归纳钙钛矿结构压电陶瓷居里温度的物理机理的基础之上,结合近年来的文献报道,对影响钙钛矿结构陶瓷居里温度的物理机理研究进展进行分析讨论,以期为高性能高居里温度压电陶瓷的设计和研究提供依据.     

（Bi0．5Na0．5）1-χ（BaaSrb）χTiO3无铅压电陶瓷体系的设计、制备与性能

综合考虑(Bi0．5Na0．5)TiO3(BNT)基无铅压电陶瓷的A-位、B-位原子的原子量差、离子半径差和电负性差，提出了一种BNT基无铅压电陶瓷的设计方法。依据BNT基无铅压电陶瓷所报道的相关数据，定义了ABO3型压电陶瓷的综合因子F(ω)为F(ω)=|M| |R| 100|χ|，式中，M为A-位和B-位离子的质量差，R为A-位和B-位离子的离子半径差，χ为A-位和B-位离子的电负性差。研究发现，F(ω)与BNT基无铅压电陶瓷的压电耦合系数κ33和kp，以及压电常数d33有非常紧密的关系。根据该方法设计了(Bi0．5Na0．5)1-χ(BaaSrb)χTiO3无铅压电陶瓷新体系，并申报了国家发明专利。研究结果表明，该体系压电陶瓷具有很好的工艺特性和压电响应，高的压电常数，其机电耦合系数kp为0．311，压电常数d33高达146pC／N，居里温度Tc为310℃，是一种很有实际应用前景的新型压电陶瓷材料体系。     

钛酸铋钠掺杂对BaTiO3-Nb2O5-ZnO系统介电性能的影响

研究了Bi0.5Na0.5TiO3(BNT)掺杂对BaTiO3(BT)-Nb2O5-ZnO三元系统介电性能与微结构的影响.BaTiO3陶瓷在低温端(-55℃)的电容量变化率随BNT含量的增大而单调降低,而高温端(150℃)的变化率持续增大,且居里温度单调递增.掺杂1.0wt%与2.5wt%BNT的BT陶瓷满足EIA XSR特性.SEM观察表明,BaTiO3陶瓷内部由细小的基质晶粒和第二相晶粒组成,且第二相比例随BNT含量的增加而增大.XRD分析表明,基质晶粒为BaTiO3,第二相晶粒为CaB2Si2O8和NaBiTi6O14.条状第二相CaB2Si2O8和NaBiTi6O14的产生改变了BT系统的内应力结构是钛酸钡陶瓷居里温度升高以及电容量温度特性改善的原因.     

(Bi0.5Na0.5)1-x(BaaSrb)x TiO3无铅压电陶瓷体系的设计、制备与性能

综合考虑(Bi0.5Na0.5) TiO3(BNT)基无铅压电陶瓷的A-位、B-位原子的原子量差、离子半径差和电负性差,提出了一种BNT基无铅压电陶瓷的设计方法.依据BNT基无铅压电陶瓷所报道的相关数据,定义了ABO3型压电陶瓷的综合因子F(w)为 F(w)= M+R+100X,式中,M为A-位和B-位离子的质量差,R为A-位和B-位离子的离子半径差,X为A-位和B-位离子的电负性差.研究发现,F(w)与BNT基无铅压电陶瓷的压电耦合系数k33和kp, 以及压电常数d33有非常紧密的关系.根据该方法设计了(Bi0.5Na0.5)1-x(BaaSrb)xTiO3无铅压电陶瓷新体系,并申报了国家发明专利.研究结果表明,该体系压电陶瓷具有很好的工艺特性和压电响应,高的压电常数,其机电耦合系数kp为0.311,压电常数d33高达146pC/N,居里温度Tc为310℃,是一种很有实际应用前景的新型压电陶瓷材料体系.     

LiF掺杂对BiFeO3-BaTiO3陶瓷结构、铁电和压电性能的影响

采用固相反应法制备0.7BiFeO₃-0.3BaTiO₃+0.35%(摩尔分数，下同)MnO₂+x%LiF(BF-BT-MN-xLF)压电陶瓷。采用XRD,SEM,铁电测试系统和精密阻抗分析仪测试陶瓷的物相组成、显微结构和铁电、压电性能。结果表明：LiF掺杂加强晶格畸变，促进烧结和晶粒生长，改善压电性能的温度稳定性。Li⁺和F^-不等价取代A/B位产生的复合缺陷偶极子，转向速度滞后于外加电场的变化，导致电滞回线呈现夹持现象。同时，对BF-BT-MN-xLF陶瓷的退极化行为以及居里温度变化的研究表明，LiF掺杂显著提高陶瓷的居里温度T_c和退极化温度T_d,T_c和T_d分别由500℃和410℃(x=0)升高到550℃和505℃(x=0.50)。当LiF掺杂量为0.50%时，在860～1020℃温度范围内烧结的陶瓷始终保持较高的压电系数，d₃₃=176～202 pC/N。x=0.5...     

钛酸铋钠基无铅压电陶瓷的组分设计与性能调控研究进展

钛酸铋钠(Bi0.5Na0.5TiO3,BNT)基无铅压电陶瓷是目前研究最多且极具应用前景的钙钛矿(ABO3)型无铅压电材料之一。最近几年,BNT基无铅压电陶瓷仍然是国际压电铁电材料研究的热点之一。从BNT基无铅压电陶瓷A位和/或B位取代、多组元复合、掺杂离子改性以及制备技术改进等方面,综合介绍了2006年以来国内外的研究进展,特别是准同型相界的构建以及组分设计与性能调控的研究进展,并对今后的研究进行了展望。     

含铋层状结构陶瓷CaBi2Nb2O9的A位掺杂改性研究

利用固相反应法合成了Ca1-x(KLa)x/2Bi2Nb2O9(x=0～0.20)(xKLaCBNO)铋层状陶瓷,分析不同KLa掺杂量对CaBi2Nb2O9(CBNO)基陶瓷微观结构、介电、压电及电导性能的影响.XRD分析表明KLa的引入未改变CBNO陶瓷的单相结构.SEM和介电系数温度谱结果分别显示,KLa掺杂量的增加,细化尺寸趋于一致,而居里温度(Tc)从943℃降低至875℃,其峰值介电常数减小、峰值介电损耗增大.当掺杂量x=0.1时,样品的高温电阻率较纯CBNO显著升高,压电系数d33由5.2 pC/N提高到15.8 pC/N,居里温度高达870℃,说明A位(KLa)掺杂改性后的CBNO陶瓷在高温传感器等领域具有潜在的应用前景.     

Mn掺杂(K 0.5 Na 0.5 ) 0.96 Sr 0.02 NbO3无铅压电陶瓷的研究

采用常压烧结方法制备了Mn掺杂的（K0.5Na0.5）0.96Sr0.02Nb1-xMnxO3无铅压电陶瓷.研究了Mn含量对该体系材料的相组成、微观结构、介电、压电和热稳定性能的影响.XRD表明随着Mn含量的增加,体系由正交相过渡到赝四方相;而且,富Na的第二相消失,得到纯净的钙钛矿相结构.在Mn含量为x=0.03和0.04时,观察到了两个温度（200和390℃）处的介电反常,这和晶格畸变引起的复晶胞结构有关.Mn含量为x=0.02时,得到综合性能优良的压电超声换能器用材料：介电常数ε^T33/ε0=479,压电常数d33=121pC/N,机电耦合系数Kp=41%,机械品质因子Qm=298,介电损耗tanδ=1.6%,居里温度Tc=391℃,谐振频率αfr和机电耦合系数Kp随温度的变化率αfr（80℃）和αKp（80℃）分别为-1.85%和1.19%.     

BaTiO3-Nb2O5-Ni2O3三元系统的介电性能研究

对三元系统BaTiO3-Nb2O5-Ni2O3的微结构和介电性能进行了研究．XRD分析表明Nb2O5／Ni2O3协同掺杂的BaTiO3陶瓷为赝立方相结构；在掺杂1．0mol％Ni的BaTiO3中，Nb的固溶度〈4．0mol％．SEM观察表明，随Nb掺杂量的增加，BaTiO3陶瓷的晶粒尺寸先增大后减小．BaTiO3陶瓷的室温介电常数、介质损耗，以及在低温端和高温端的电容变化率都随Nb含量的增加而先增大后减小．DSC测量表明，Nb掺杂使BaTiO3陶瓷的居里温度向高温方向移动．该系统瓷料介电性质的变化与材料的晶粒尺寸以及掺杂剂导致的相变温度的移动密切相关．本实验在BaTiO3-Nb2O5-Ni2O3系统中开发出了新型的X8R材料，这种材料很有希望用于制备大容量X8R多层陶瓷电容器．     

Magnetic coupling in La0.67Ca0.33MnO3/La0.67Sr0.33CoO3/La0.67Ca0.33MnO3 sandwiches

La_0.67Ca_0.33MnO₃ (LCMO)/La_0.67Sr_0.33CoO₃ (LSCO)/LCMO trilayer films are fabricated on single-crystal substrates NdGaO₃ (110) and the interlayer coupling are investigated. Compared with LCMO single layer, sandwiches showed the enhanced metal-insulator transition temperature of LCMO layers. The magnetoresistance is dependent on spacer thickness and the peak value dramatically decreases when LSCO layer is thick enough because of shorting by the LSCO layer. The magnetic coercivity H_C shows a nonmonotonic behavior with changing spacer layer thickness and the waist-like hysteresis indicates that there is an indirect exchange coupling between the top and bottom LCMO layers across the spacer layer.     

Varistor properties of ZnO-Pr6O11-CoO-Cr2O3-Y2O3-In2O3 ceramics

The varistor properties of the ZnO-Pr₆O₁₁-CoO-Cr₂O₃-Y₂O₃-In₂O₃ ceramics were investigated for different concentrations of In₂O₃. The increase of In₂O₃ concentration slightly increased the sintered density (5.60-5.63 g/cm³) and slightly decreased the average grain size (3.4-2.9 μm). The breakdown field increased from 6023 to 14822 V/cm with increasing concentration of In₂O₃. The nonlinear coefficient increased from 17.6 to 44.6 for up to 0.005 mol%, whereas the further doping caused it to decrease to 36.8. In₂O₃ acted as an acceptor due to the donor concentration, which decreases in the range of 1.02 × 10¹⁷ to 0.24 × 10¹⁷/cm³ with increasing concentration of In₂O₃.     

Nanocrystallization of SrBi2Nb2O9 from glasses in the system Li2B4O7---SrO---Bi2O3---Nb2O5

Transparent glasses in the system (100−x)Li₂B₄O₇–x(SrO---Bi₂O₃---Nb₂O₅) (10≤x≤60) (in molar ratio) were fabricated by a conventional melt-quenching technique. Amorphous and glassy characteristics of the as-quenched samples were established via X-ray powder diffraction (XRD) and differential thermal analyses (DTA) respectively. Glass–ceramics embedded with strontium bismuth niobate, SrBi₂Nb₂O₉ (SBN) nanocrystals were produced by heat-treating the as-quenched glasses at temperatures higher than 500 °C. Perovskite SBN phase formation through an intermediate fluorite phase in the glass matrix was confirmed by XRD and transmission electron microscopy (TEM). Infrared and Raman spectroscopic studies corroborate the observation of fluorite phase formation. The dielectric constant (_r) and the loss factor (D) for the lithium borate, Li₂B₄O₇ (LBO) glass comprising randomly oriented SBN nanocrystals were determined and compared with those predicted based on the various dielectric mixture rule formalism. The dielectric constant was found to increase with increasing SBN content in LBO glass matrix.     

Microstructures of YBa2Cu3O7/La0.7Ca0.3MnO3 and La0.7Ca0.3MnO3/YBa2Cu3O7 bi-layers grown on (001)LaAlO3

Epitaxial YBa₂Cu₃O₇/La_0.7Ca_0.3MnO₃ (YBCO/LCMO) bi-layers and La_0.7Ca_0.3MnO₃/YBa₂Cu₃O₇ (LCMO/YBCO) bi-layers were grown on (001)LaAlO₃ by pulsed laser deposition, and their microstructures were compared by transmission electron microscopy investigation. In the YBCO(100 nm)/LCMO(150 nm) bi-layers, the LCMO layer consists of columnar grains of ~ 17 nm in diameter and contains mixed orientation domains of [100]_c, [010]_c and [001]_c. The YBCO layer is totally c-axis oriented and the YBCO lattices are tilted − 2.5° to + 2.5° as they grew on the rough surfaces of LCMO columnar grains. For the LCMO(140 nm)/YBCO(140 nm) bi-layers, the LCMO/YBCO interface is sharp and flat. The initial 12-nm thickness of the YBCO layer is composed of c-axis oriented domains, and the upper part of YBCO layer is [100] oriented. The LCMO layer was predominantly [001]_c oriented while [100]_c-oriented domains were occasionally observed.     

Syntheses of hollandite type Rb2Cr8O16, K2Cr2V6O16 and K2V8O16

Hollandite-type compounds, Rb₂Cr₈O₁₆, K₂Cr₂V₆O₁₆ and K₂V₈O₁₆, were synthesized under high P-T conditions up to 1200°C and 7GPa. The structural refinement using a single crystal of Rb₂Cr₈O₁₆ confirms that the structure is similar to that of K₂Cr₈O₁₆. Magnetic measurements indicate that Rb₂Cr₈O₁₆ is ferromagnetic below 295K, K₂Cr₂V₆O₁₆ paramagnetic down to 77K and K₂V₈O₁₆ has susceptibility anomaly at 175K. These compounds are all semiconductive and show discontinuities in temperature-resistivity curves at points corresponding to magnetic anomalies.     

Vapour-liquid equilibria in the ternary mixtures N2---CH4---C2H6 and N2---C2H6---C3H8

A systematic study was performed with mixtures consisting of N₂, CH₄, C₂H₆ and C₃H₈, to investigate experimentally phase equilibria and caloric properties and to test the accuracy of thermodynamic correlations. The first part of this Paper reports results of T---p---x---y measurements on ternary systems in the range 20 < p < 120 bar and 140 < T < 220 K. The results are compared with data calculated by generalized equations of state.     

PbSbBiS4-Sb2S3 and PbSbBiS4-Bi2S3 joins in the PbS-Sb2S3-Bi2S3 system

Phase equilibria along the PbSbBiS₄-Sb₂S₃ and PbSbBiS₄-Bi₂S₃ joins of the PbS-Sb₂S₃-Bi₂S₃ system have been studied for the first time using differential thermal analysis, X-ray diffraction, microstructural analysis, microhardness tests, and density measurements, and the phase diagrams of the joins have been mapped out. The joins are shown to be pseudobinary with limited series of terminal solid solutions. The solid solutions are p-type semiconductors.     

Characterization of YBa2Cu3O7/PrBa2Cu3O7 superlattices

We investigated the structural and superconducting properties ofc-axis oriented (YBa₂Cu₃O₇) _nY /(PrBa₂Cu₃O₇) _npr superlattices with thicknesses of the individual layers down to one unit cell (10nY1; 18>nPr 1). By transmission electron microscopy and X-ray diffraction we find an excellent structural quality of the samples, though the quantitative analysis shows the existence of defects. In superlattices with decoupled YBa₂Cu₃O₇ layers of two unit cell thickness we find a highT _c value of 75 K. We probed the flux line structure in the superlattices by measurements of the critical current density in magnetic fields. The experiments show that the flux-line dynamics is dominated by the movement of pancake vortices.     

The effect of Bi1.5Zn0.5Nb0.5Ti1.5O7 cover layer on the dielectric and tunable properties of Ba0.6Sr0.4TiO3/Bi1.5Zn0.5Nb0.5Ti1.5O7 bilayered thin films

Bi_1.5Zn_0.5Nb_0.5Ti_1.5O₇ (BZNT) thin films with different thicknesses as cover layers were deposited on the Ba_0.6Sr_0.4TiO₃ (BST) thin films on the Pt/Ti/SiO₂/Si substrates by radio frequency magnetron sputtering method. The microstructure, surface morphology, dielectric and tunable properties of BST/BZNT heterogeneous bilayered films were investigated as a function of the thickness of BZNT films and the effect of BZNT films on the asymmetric electrical properties of BST/BZNT bilayered films was discussed. It was found that BZNT cover layer significantly improved the leakage current and the dielectric loss, and the dielectric constant and tunability of BST/BZNT bilayered thin films simultaneously decreased with the increasing thickness of BZNT films. The BST/BZNT bilayered thin film with a 50 nm BZNT cover layer gave the largest figure of merit (FOM) of 33.48 with the upper tunability of 55.38%. The asymmetric electrical behavior of BST/BZNT bilayered films is probably related to an internal electric field caused by built-in voltages at Pt/BST and BZNT/Au interfaces.     

Structural study of Sr0.3Ba0.7Nb2O6 and La0.030Sr0.255Ba0.700Nb2O6 ceramic systems

Sr_0.3Ba_0.7Nb₂O₆ (SBN) and La_0.030Sr_0.255Ba_0.700Nb₂O₆ (LSBN) ceramic compounds have been prepared using the traditional ceramic method at two different calcination temperatures (900 and 1000 °C) and later sintered both at 1400 °C. A study of the effects of the calcination temperatures and La substitution on the morphological, compositional, and structural properties of SBN and LSBN is presented using scanning electronic microscopy (SEM), energy dispersive spectroscopy (EDS), and X-ray diffraction (XRD) analysis. From Rietveld refinement processes, the XRD patterns were interpreted to evaluate such effects in the structural parameters and the site occupation factors of the heavy metals and oxygen atoms. The effect of the incorporation of La resulted in a 0.25% cell contraction and turned out to be higher than the 0.08% dilation effect produced by the increase of calcination temperature. The La ion with similar effective ionic radius and higher electronegativity is incorporated into the structure occupying the A₁ site just like the Sr ions in the SBN compound. Differences in the site occupation factors between the SBN and LSBN samples lead to substantial changes in the physical properties such as temperature of relative dielectric constant maximum, relative dielectric constant, and dielectric loss, correlated with the distortion and the relative orientation of the oxygen octahedra.