Effect of temperature on structural and optical properties of ZnS thin films by chemical bath deposition without stirring the reaction bath

ZnS thin films were deposited at different temperatures on glass substrates by chemical bath deposition method without stirring the deposition bath. With deposition temperature increasing from 50 °C to 90 °C, pH decreases rapidly, homogeneous precipitation of ZnS, instead of Zn(OH)₂ easily forms in the bath. It means that higher temperature is favorable for the formation of relatively high stoichiometric film, due to the lower concentration of OH⁻. The thickness of the films deposited at 90 °C is much higher than that of the films deposited at 50 °C and 70 °C. Combining the film thickness with the change of pH, the growth of film, especially deposited at 90 °C mainly comes from the fluctuation region of pH. At the same time, with the increase of deposition temperature, the obtained films are transparent, homogeneous, reflecting, compact, and tightly adherent. The ZnS films deposited for 1.5 h, 2 h and 2.5 h at 70 °C and 90 °C have the cubic structure only after single deposition. The average transmission of all films, especially the thicker films deposited at 90 °C, is greater than 90% for wavelength values in the visible region. Comparing with the condition of stirring, the structural and optical properties of films are improved significantly. The direct band gaps range from 3.93 to 4.06 eV.     

Impact of capping during the formation of Cu2ZnSn(S,Se)4 thin films

Major challenge for the fabrication of kesterite absorber thin films such as CZTSSe (Cu₂ZnSn(S,Se)₄) is the volatility of chalcogens. Material loss and poor morphology are two key issues during high temperature annealing, carried out for the formation of CZTSSe thin film absorber layers. The purpose of the present study is to investigate the influence of capping during the crystallization of precursor to CZTSSe films via annealing. In this work, initial precursor was synthesized from elemental constituents by ball milling. CZTSSe films were deposited by doctor's blade process. Annealing was carried out in two different atmosphere viz. vacuum and inert gas. Both sets of samples were annealed with and without capping. We found significant changes for different annealing atmospheres. Capping has a positive influence on the film properties, revealed by structural, morphological and compositional analysis. Capping reduced material loss of volatile constituents and resulted compact crystalline films.     

Influence of heat treatment on the structural,optical and electrical properties of Cd20Sn10Se70 thin films

The effect of annealing temperature (T_a) on the structural, optical, and electrical properties of thermally evaporated Cd₂₀Sn₁₀Se₇₀ thin films has been investigated. Differential Thermal Analysis (DTA) was used to determine the glass transition temperature (T_g) of the prepared alloy. X-ray diffraction studies showed that the as-deposited film and the films that were annealed at T_a<T_g are of low crystallinity. On annealing above T_g, these films showed a polycrystalline nature. The surface morphology and microstructure of as-deposited and annealed films have been examined by scanning electron microscopy (SEM) and atomic force microscopy (AFM). Their optical constants were calculated from the transmittance measurements in the range 200–2500 nm. The dispersion of refractive index was analyzed in terms of the single-oscillator Wemple-Di Domenico model. Analysis of the optical absorption data indicates that the optical band gap E_g of these films obeys Tauc׳s relation for the allowed direct transition. The optical band gap E_g as well as the activation energy for the electrical conduction ∆E were found to increase with increase of annealing temperature up to T_g, whereas above T_g there is a remarkable decrease in both E_g and ∆E. The obtained results were interpreted in terms of the Mott-Davis model and amorphous–crystalline transformation.     

Structural,electronic and optical properties of Ilmenite ATiO3(A=Fe,Co, Ni)

Ilmenite-type ATiO₃ (A=Fe, Co, Ni) crystals have been investigated via Generalized Gradient Approximation (GGA) in the scheme of Revised Perdew-Burke-Ernzerhof (RPBE) using the first-principles method. The band structures, densities of states, bond orders and charge populations, optical properties including the dielectric function ε(ω), absorption coefficient I(ω), refractive index n(ω), extinction coefficient k(ω), electron energy loss function L(ω) and reflectivity function R(ω), are calculated. The results show that the GGA-optimized geometries agree well with the experimental data. FeTiO₃ has a direct band gap, but both CoTiO₃ and NiTiO₃ exhibit indirect band gap. The analysis for densities of states and atomic charge populations exhibits that TiO bonds possess the stronger covalent bonding strength than AO bonds. The calculated optical properties along [100], [010] and [001] as well as polycrystalline directions demonstrate the significant optical anisotropy parallel and perpendicular to c-axis for ATiO₃. Finally, the origins of main peaks for optical spectra are presented based on electron transitions. Theoretical insights into the microscopic intrinsic properties of ATiO₃ should provide fundamental investigations for further understanding the Ilmenite ATiO₃ materials and improving their practical applications.     

Structural and optical properties of CdTe-nanocrystals thin films grown by chemical synthesis

By mans of a chemical synthesis technique stoichiometric CdTe-nanocrystals thin films were prepared on glass substrates at 70 °C. First, Cd(OH)₂ films were deposited on glass substrates, then these films were immersed in a growing solution prepared by dissolution of Te in hydroxymethane sulfinic acid to obtain CdTe. The structural analysis indicates that CdTe thin films have a zinc-blende structure. The average nanocrystal size was 19.4 nm and the thickness of the films 170 nm. The Raman characterization shows the presence of the longitudinal optical mode and their second order mode, which indicates a good crystalline quality. The optical transmittance was less than 5% in the visible region (400–700 nm). The compositional characterization indicates that CdTe films grew with Te excess.     

Facile deposition of ZnO:Cu films: Structural and optical characterization

Sol–gel technology has been applied for preparation of ZnO:Cu films. The proposed facile approach allows obtaining a wide variety of copper doped zinc oxide systems, revealing different structural and optical behaviors. The work presents structural and optical studies depending on Cu concentration and thermal treatments in the range of 500–800 °C. The structural analysis is performed by X-Ray diffraction (XRD). It reveals that small Cu addition enhances the film crystallization. Increasing copper concentration results in deterioration of ZnO:Cu crystallization. XRD study manifests no Cu oxide phases in ZnO:Cu film structure for lower Cu additions. For a specific higher copper concentration, an appearance of a small fraction of copper oxide is detected. Vibrational properties have been characterized by FTIR spectroscopy. The effect of the copper introduction into ZnO reveals a slight change of optical properties compared to ZnO films for certain Cu ratios. ZnO:Cu films with higher copper contents manifest different optical behaviors with very high transparency in spectral visible range.     

Characterization and optical properties of bismuth chalcogenide films prepared by pulsed laser deposition technique

Thin films of Bi-based chalcogenides were prepared by pulsed laser deposition (PLD) technique according to the stoichiometric formula: Bi₂(Se_1−xTe_x)₃. Their optical properties were studied aiming to find the suitable area of application and the optimum composition amongst the samples under study. X-ray diffraction analysis proved the crystallinity of the deposited samples; in addition, surface roughness and films homogeneity were studied by atomic force microscopy (AFM) confirming the suitability of PLD technique to prepare homogenous and smooth films of the concerned alloys. Absorption coefficient calculations showed higher absorption values of 5×10⁵ and 6×10⁵ cm⁻¹ for Te contents of 90% and 100% in the Bi₂(Se_1−xTe_x)₃ system respectively. Optical band gap of the concerned films were calculated and found to be in the range of 0.76–1.11 eV, exhibiting comparable values with the previously reported by other authors. Optical studies conformed direct and allowed transitions in all films. Refractive index (n) and dielectric constants (Ɛ_r) and (Ɛ_i) were calculated and studied as a function of the wavelength. Values and behavior of (n), (Ɛ_r) and (Ɛ_i) indicated strong dependence on the composition and the wavelength range.     

Effect of Ag photo-doping on structural,optical and phase change properties of GeTe chalcogenide films

This paper reports the effect of Ag photo-doping on optical, electrical and structural properties of GeTe:Ag thin films. The absence of sharp diffraction peak confirms the amorphous nature of as-deposited and photo-doped films. The decrease in reflectance of GeTe:Ag bilayer films with photo-doping reaction time has been observed. The RAMAN spectrum showed the characteristic Raman bands for GeTe₄ (127 cm⁻¹), long chain interactions of Te–Te chains (145 cm⁻¹) and a broad peak for Ge–Ge vibrations (275 cm⁻¹) without appreciable change in their position/shape with photodoped Ag concentration. The electrical resistivity measurement shows that photo-doping of Ag led to sharp amorphous-crystalline phase transition along with an increase in transition temperature and resistivity value in both amorphous as well as crystalline state. The annealing of photo-doped GeTe:Ag samples showed an enhancement in the crystallinity of GeTe phase without any segregation of Ag phases in annealed samples. The preferential formation of GeTe (200) phase upon crystallization has been observed for GeTe:Ag films. Different optical parameters have been calculated for photo-doped and annealed samples and are discussed in conjunction with the modification of network structure of GeTe with inclusion of photo-doped Ag content.     

Structural and optical properties of CaO

CaO is a wide band gap material yet unexplored for optoelectronics, but which was recently proposed as a candidate for spintronics applications. In the present work we report the results of an ab initio electronic band structure calculation of cubic CaO using both the local-density and the generalized gradient approximations. We performed the structural CaO crystal optimization, and calculated its optical properties, which are compared with the available experimental data and with other theoretical results for the cubic CaO structure.     

Synthesis and photoluminescence characterizations of the Er3+-doped ZnO nanosheets with irregular porous microstructure

Er-doped ZnO nanosheets with high quality were synthesized by the hydrothermal and post-annealing techniques, and the effect of erbium dopant on the structures, morphologies and photoluminescence properties of the as-synthesized samples were determined using XRD, SEM, TEM, EDS, PL and Raman spectroscopy. The results showed that Er³⁺ ions were successfully incorporated into the crystal lattice of ZnO host, and some irregular porous microstructure with diameter of 3–10 nm could be seen on ZnO nanosheets as various doping concentrations. It was found that the crystallization and photoluminescence properties of ZnO nanosheets were strongly influenced by erbium doping concentration. The ultraviolet emission and deep level emission were both appeared in PL spectra, and the intensity of the whole deep level emission was enhanced with erbium doping, indicating the deep-level-defect luminescent centers were increased in the doped samples. Moreover, the crystallization of the samples became worse due to more defects by erbium doping.     

Characterization of Bi2S3 nanorods prepared at room temperature

Bi₂S₃ is a direct band gap semiconductor with a band gap of 1.3 eV. It belongs to the family of metal chalcogenides of type A₂^VB₃^VI (A=As, Sb, and Bi; B=S, Se, and Te), whose importance in photovoltaic and thermoelectric applications is well recognized. Although nanostructures of Bi₂S₃ have been obtained using a number of techniques, reports on assemblies of Bi₂S₃ are sparse. In the present work, we prepared single crystalline bismuth sulfide (Bi₂S₃) nanorods at room temperature by reacting Bi(NO₃)₃, thioacetamide (TAA), hydrochloric acid and distilled water.Energy dispersive analysis of X-rays (EDAX) obtained from Bi₂S₃ nanorods indicated no incorporation of other foreign impurities in it. X-ray diffraction confirmed the single phase of Bi₂S₃ and different diffracting planes were indexed based on the orthorhombic structure and lattice parameters were determined. X-ray photoelectron spectroscopy (XPS) was used to evaluate its composition and purity. The synthesized nanorods with different images observed under transmission electron microscopy (TEM) are shown in the paper and the selected area electron diffraction (SAED) pattern obtained from these nanorods shows their single crystalline behavior. Raman measurement performed at room temperature using Ar⁺ laser (488 nm) confirms the presence of 238 cm⁻¹ and 972 cm⁻¹ phonon modes. The optical absorption spectra obtained by UV–vis spectrometer show blue shift in comparison to bulk Bi₂S₃ while its thermal stability was studied by thermogravimetric analysis.     

Electrodeposition of single and duplex layers of ZnO with different morphologies and electrical properties

ZnO films have been prepared by electrodeposition from aqueous solutions. Dense, nanostructured and doped samples can be prepared by changing the composition of the electrolytic bath and fine-tuning the electrochemical parameters. Duplex layers can also be produced, with a nanostructured ZnO layer electrodeposited using as the substrate a previously prepared dense or In-doped ZnO layer. The films are deposited potentiostatically using conductive glass as the primary substrate. Deposition over various periods of time has been explored in order to achieve the desired thickness. Different combinations of materials have been prepared entirely by electrodeposition, all showing absorption and XRD spectra, as well as morphologies, in good agreement with those reported for similar materials prepared otherwise. After thermal annealing in air, the optical quality of the ZnO further improves. Thus, the feasibility of electrodepositing one semiconductor using another as a substrate has been demonstrated.     

The effect of annealing on the physical properties of thermally evaporated CuIn2n+1S3n+2 thin films (n=0, 1, 2 and 3)

In this study, the annealing effect on structural, electrical and optical properties of CuIn_2n+1S_3n+2 thin films (n=0, 1, 2 and 3) are investigated. CuIn_2n+1S_3n+2 films were elaborated by vacuum thermal evaporation and annealed at 150 and 250 °C during 2 h in air atmosphere. XRD data analysis shows that CuInS₂ and CuIn₃S₅ (n=0 and 1) crystallize in the chalcopyrite structure according to a preferential direction (112), CuIn₅S₈ and CuIn₇S₁₁ (n=2 and 3) crystallize in the cubic spinel structure with a preferential direction (311). The optical characterization allowed us to determine the optical constants (refractive indexes 2.2–3.1, optical thicknesses 250–500 nm, coefficients of absorption 10⁵ cm^?1, coefficients of extinction <1, and the values of the optical transitions 1.80–2.22 eV) of the samples of all materials. We exploited the models of Cauchy, Wemple–DiDomenico and Spitzer–Fan for the analysis of the dispersion of the refractive index and the determination of the optical and dielectric constants.     

Structural, electrical and optical properties of ZnO thin films deposited by sol-gel method

Thin films of intrinsic and Al-doped ZnO were prepared by the sol-gel technique associated with spin coating onto glass substrates. Zinc acetate dehydrate, ethanol and monoethanolamine were used as a starting material, solvent and stabiliser, respectively. Structural, electrical and optical characterizations of the films have been carried out. All films are polycrystalline with a hexagonal wurtzite structure with a preferential orientation according to the direction 〈0 0 2〉. The four-points technique was used to characterize thin films electrically. All films exhibit a transmittance above 80-90% along the visible range up to 650 nm and a sharp absorption onset about 375 nm corresponding to the fundamental absorption edge 3.3 eV. Intense UV photoluminescence is observed for undoped and 1% Al-doped ZnO films.     

Photoelectrochemical (PEC) studies on Cd0.5Fe0.5Se nanocrystalline thin films deposited by a spray pyrolysis technique

Recently, nanostructured thin films have attracted the attention of researchers from several disciplines, due to their outstanding electronic and optical properties and potential applications in various optoelectronic devices. The ternary Cd_0.5Fe_0.5Se nanocrystalline thin films were deposited by a spray pyrolysis method onto glass, aluminium, copper and stainless steel substrates. The structural and morphological properties were studied by X-ray diffraction and scanning electron microscopy analysis. The XRD study revealed that, Cd_0.5Fe_0.5Se films are nanocrystalline in nature with hexagonal lattice. The optical absorption study showed that, the semiconductor Cd_0.5Fe_0.5Se thin film deposited on glass exhibits direct band gap energy of the order of 1.95 eV. The PEC study revealed that, Cd_0.5Fe_0.5Se thin films deposited on aluminium substrate exhibited maximum fill factor (FF) and efficiency (η) as compared to the films deposited on stainless steel and copper substrates.     

Structural and electrical properties of brush plated ZnTe films

Zinc telluride thin films were deposited by the brush plating technique at a potential of −0.90 V (SCE) on conducting glass and titanium substrates at different temperatures in the range 30–90 °C. The films were polycrystalline in nature with peaks corresponding to the cubic phase. Direct band gap of 2.30 eV was observed. XPS studiers indicated the formation of ZnTe. Depth profiling studies indicated a uniform distribution of Zn and Te throughout the entire thickness. EDAX measurements were made on the films and it was found that there was a slight excess of Te. The carrier concentration was found to vary from 10¹⁴–10¹⁵ cm⁻³ with increase of substrate temperature. The mobility was found to vary from 5 to 60 cm² V⁻¹ s⁻¹.     

Thickness dependent physical properties of chemically deposited nanocrystalline MgSe thin films deposited at room temperature by solution growth method

Chemical bath deposition method has been employed to deposit nanocrystalline magnesium selenide thin films of thickness 104–292 nm onto glass substrates at room temperature. The deposition bath consists of magnesium chloride, triethanolamine (TEA) and selenium dioxide. The as deposited films were characterized by X-ray diffraction, scanning electron microscopy (SEM), atomic force microscopy (AFM), optical absorption, electrical resistivity and thermo-emf measurements. The X-ray diffraction (XRD) studies revealed that the crystallinity of the magnesium selenide thin film increases with thickness. SEM studies reveal that MgSe films exhibit uniform distribution of round shaped grains over the entire substrate surface.The optical band-gap and electrical resistivity of MgSe film decrease as the film thickness increases. Such type of dependence is attributed to the quantum size effect that is observed in nanocrystalline semiconductors.The thermo-emf measurement confirms its p-type conductivity.