共查询到18条相似文献,搜索用时 109 毫秒
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金属钽可作为集成电路中铜与硅基板的阻隔层材料,以防止铜与硅扩散生成铜硅合金影响电路性能。采用钽靶材通过物理气相沉积技术溅射钽到硅片上。靶材晶粒尺寸与织构取向影响溅射速率及溅射薄膜均匀性,要求钽靶材晶粒尺寸应小于100μm,在靶材整个厚度范围内应主要是(111)型织构。同时,为了避免薄膜存在杂质颗粒,要求钽靶材纯度不小于99.99%。本文对钽靶材电子束熔炼、锻造、轧制、热处理等关键工艺进行了系统研究,找到了一种有别于常规钽靶材生产工艺的新方法,所生产产品化学纯度、晶粒尺寸、织构等性能优良,产品成品率高,适于批量化生产。 相似文献
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通过研究钼金属靶材轧制变形量及热处理工艺对溅射薄膜的微观组织、表面粗糙度及晶形的影响,结果表明:变形量为80%的钼靶材溅射制备的薄膜晶化程度优于变形量小的靶材溅射薄膜;溅射相同的薄膜厚度,随着靶材变形量的增大,溅射薄膜的方阻越大;1373K退火靶材溅射薄膜的粗糙度最小,表面颗粒最细小均匀,晶粒取向明显。 相似文献
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目的 研究锻造和轧制两种不同加工成形方法对银靶微观组织的影响,解决纯银靶材内部晶粒粗大、分布不均匀的问题。方法 采用锻造和轧制方法分别对纯银靶材铸锭进行加工,通过对微观组织的观察和测试分析,研究两种不同加工方法对银靶微观组织的影响。结果 锻造加工的纯银靶材致密性更好;轧制加工的纯银靶材在冒口处存在大量缺陷。锻造加工的纯银靶材晶粒细小且分布均匀;轧制加工的纯银靶材晶粒较粗大、分布均匀性差,存在部分粗大晶粒。锻造加工的纯银靶材硬度值(73HV0.05)明显高于轧制加工的纯银靶材(55HV0.05)。结论 在晶粒细化及分布均匀性方面,锻造比轧制加工纯银靶材更具优势。 相似文献
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为揭示溅射工艺参数对氧化铌涂层耐蚀性的影响规律,采用直流反应溅射技术在AZ31镁合金表面制备了不同工艺参数的氧化铌涂层,并通过扫描电镜和电化学工作站对涂层进行微观结构及耐蚀性测试。结果表明:氧气流量对涂层微观结构的影响不显著,但涂层的耐蚀性随氧气流量的增加而降低;当溅射功率由60 W增大到100 W时,涂层表面的致密性变差,甚至出现裂纹,耐蚀性则先增强后减弱;随着沉积时间由180 min增加到420min,涂层的厚度增加、致密性下降,对基底的腐蚀保护效果先增强后减弱。 相似文献
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为探讨制备参数对直流反应溅射氧化铌涂层晶相成分与结合性能的影响规律,采用不同的氧气流量、功率和沉积时间,通过直流反应溅射技术在AZ31镁合金表面制备了氧化铌涂层。利用X射线衍射仪和X射线光电子能谱仪对涂层进行表征,采用划痕仪测定了涂层的结合力。结果表明:当氧气流量为0.5~3.0 mL/min、功率为60~100 W、沉积时间为3~7 h时,制备参数对氧化铌涂层的晶相结构和化学价态没有影响,但是对涂层的结合性能影响显著。涂层结合力随氧气流量的增大而减小,随溅射功率和沉积时间的增加而先增大后减小。当溅射功率为80 W(W3试样)和沉积时间为300 min(T3试样)时,涂层的结合力分别为最大。 相似文献
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Thermal breakdown induced either by electron loading or by local defects of enhanced RF losses limits the accelerating field of superconducting niobium cavities. Replacing niobium with a material of higher thermal conductivity would be highly desirable to increase the maximum field. Therefore, cavities made of OFHC copper were coated by D.C. bias sputtering with a thin niobium film (1.5 to 5 μm). Accelerating fields up to 8.6 MVm-1were obtained without observing any field breakdown, the limitation being due to the available rf power. The Q values achieved at 4.2 K and low field were similar to those of niobium sheet cavities (i.e.sim 2 times 10^{9} ), but a fast initial decrease of Q to about 109was reproducibly experienced. Subsequent inspection of regions of enhanced rf losses revealed defects the origin of which is under study. The apparatus used for coating the cavities and the results obtained are presented and discussed. 相似文献
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磁控溅射靶面磁感应强度的水平分布直接关系到靶材的利用率和刻蚀的均匀性.为了寻求更好的磁控靶结构参数,从而实现靶而水平磁感应强度的均匀分布,作者应用ANSYS软件对SD500型磁控溅射镀膜机的圆平面靶表面磁感应强度进行模拟,应用SHT-V型特斯拉计通过同心十字线法对实物靶表面磁感应强度进行测试,将模拟结果与测量结果进行比较,证明其模拟的准确性.进而对圆平面磁控靶的结构参数进行优化设计,得出靶与磁钢间距为3 mm、磁钢高度为15 mm、内磁柱半径为4 mm、内磁柱高度为14 mm时靶面水平磁感应强度最强、分布最均匀.在工程应用中,设计人员可以预先对靶的参数进行优化设计,使设计的磁控溅射靶更好的满足生产和科学研究的需要. 相似文献
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M. BraicV. Braic M. BalaceanuA. Vladescu C.N. ZoitaI. Titorencu V. JingaF. Miculescu 《Thin solid films》2011,519(12):4064-4068
Nb-C composite films, obtained by DC magnetron sputtering method, were investigated as possible candidates for the protective layers used in medical implants. Coatings of different carbon/niobium ratios were prepared and analyzed for elemental and phase composition, crystallographic structure, texture, corrosion behavior, and cell viability. The coating with the highest C/Nb ratio (≈ 1.9) was found to have a nanocomposite structure, in which NbC nanocrystalline phase coexists with an amorphous a-C one. The coated samples exhibited an improved corrosion resistance as compared with the Ti alloy. Cell viability measurements proved that human osteosarcoma cells are adherent to the coating surfaces, the highest viability being found for the film with the highest carbon content. 相似文献
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Bi-Shiou Chiou Jen-Huan Tsai 《Journal of Materials Science: Materials in Electronics》1999,10(7):491-495
The refractive index n of radio-frequency (r.f.) magnetron sputtered indium tin oxide (ITO) films varies with sputtering parameters, such as sputtering power and oxygen percentage in the sputtering ambient. In this study, the feasibility to fabricate multilayer antireflective (AR) coating with a single ITO target by controlling the sputtering conditions is explored. Reduction in the reflectance can be achieved by using a one-quarter-wavelength inner layer ITO with a refractive index n = 1.87 and a one-quarter-wavelength outer layer ITO with n = 2.17. Hence, a single ITO target suffices in the preparation of multilayer AR coating. This simplifies the deposition processes and equipment for the fabrication of AR coating. Surface corrugation, another approach to the reduction of reflectance, is also discussed. 相似文献