Dielectric properties of CaCu3Ti4−xCoxO12 (x = 0.10, 0.20, and 0.30) synthesized by semi-wet route

Undoped CaCu₃Ti₄O₁₂ and cobalt doped CaCu₃Ti_4−xCo_xO₁₂ (CCTCO) with x = 0.10, 0.20 and 0.30 were prepared by semi-wet route for the first time using solid TiO₂ powder and metal nitrate solutions. XRD analysis confirmed the formation of single-phase material in the samples sintered at 900 °C for 6 h. Structure does not change on doping with cobalt and it remains cubic in all the three compositions studied. Lattice parameter increases slightly with cobalt doping. SEM micrographs of the CaCu₃Ti_4−xCo_xO₁₂ samples show that the grain size is in the range of 2–8 μm for these samples. EDX studies show the percentage of elements along with the grain and grain boundary, which confirm the rich phase of copper oxide at grain boundaries. Dielectric properties have been measured as a function of temperature and frequency.     

Effect of yttrium doping on the dielectric properties of CaCu3Ti4O12 thin film produced by chemical solution deposition

Pure and yttrium substituted CaCu₃Ti_4 − xY_xO_{12 − x / 2} (x = 0, 0.02, 0.1) thin films were prepared on boron doped silica substrate employing chemical solution deposition, spin coating and rapid thermal annealing. The phase and microstructure of the sintered films were examined using X-ray diffraction and scanning electron microscopy. Dielectric properties of the films were measured at room temperature using electrochemical impedance spectroscopy. Highly ordered polycrystalline CCTO thin film with bimodal grain size distribution was achieved at a sintering temperature of 800 °C. Yttrium doping was found to have beneficial effects on the dielectric properties of CCTO thin film. Dielectric parameters obtained for a CaCu₃Ti_4 − xY_xO_{12 − x / 2} (x = 0.02) film at 1 KHz were k ∼ 2700 and tan δ ∼ 0.07.     

New substitutions and novel derivatives of the Aurivillius phases, Bi5TiNbWO15 and Bi4Ti3O12

We investigated isomorphous substitution of several metal atoms in the Aurivillius structures, Bi₅TiNbWO₁₅ and Bi₄Ti₃O₁₂, in an effort to understand structure-property correlations. Our investigations have led to the synthesis of new derivatives, Bi₄LnTiMWO₁₅ (Ln = La, Pr; M = Nb, Ta), as well as Bi₄PbNb₂WO₁₅ and Bi₃LaPbNb₂WO₁₅, that largely retain the Aurivillius (n = 1) + (n = 2) intergrowth structure of the parent oxide Bi₅TiNbWO₁₅, but characteristically tend toward a centrosymmetric/tetragonal structure for the Ln-substituted derivatives. On the other hand, coupled substitution, 2Ti^IV → M^V + Fe^III in Bi₄Ti₃O₁₂, yields new Aurivillius phases, Bi₄Ti_3−2xNb_xFe_xO₁₂ (x = 0.25, 0.50) and Bi₄Ti_3−2xTa_xFe_xO₁₂ (x = 0.25) that retain the orthorhombic noncentrosymmetric structure of the parent Bi₄Ti₃O₁₂. Two new members of this family, Bi₂Sr₂Nb₂RuO₁₂ and Bi₂SrNaNb₂RuO₁₂ that are analogous to Bi₂Sr₂Nb₂TiO₁₂, possessing tetragonal (I4/mmm) Aurivillius structure have also been synthesized.     

Crystal structure and ferroelectric properties of Ca(Cu3−xMx)Ti4O12 (M = Fe and Ni) ceramics

M-substituted Ca(Cu_3−xM_x)Ti₄O₁₂ (CCMTO) ceramics, where M = Fe and Ni, were synthesized and the influence of M substitutions for Cu on the crystal structure and ferroelectric properties of CCMTO ceramics were investigated in this study. From the variations in the lattice parameters of CCMTO ceramics, the solubility limit of Ni substitution for Cu in CaCu_3−xNi_xTi₄O₁₂ (CCNTO) ceramics was x = 0.2, whereas that of CaCu_3−xFe_xTi₄O₁₂ (CCFTO) ceramics was x = 0.05. The crystal structural analysis of CCMTO ceramics revealed that the single phase of CCMTO ceramics belongs to the I23 non-centrosymmetric space group of I23; as a result, the P_r and E_c values of CCFTO ceramics at x = 0.05 were 1.8 μC/cm² and 40 kV/cm, respectively. The ferroelectric behavior of CCMTO ceramics by the M substitutions for Cu may be related to the displacement of a Ti⁴⁺ cation in the TiO₆ octahedra and tilting of the Ti–O–Ti angle because of the non-centrosymmetric space group.     

Elastic modulus and hardness of CaTiO3, CaCu3Ti4O12 and CaTiO3/CaCu3Ti4O12 mixture

Three ceramic systems, CaTiO₃ (CTO), CaCu₃Ti₄O₁₂ (CCTO) and intermediate nonstoichiometric CaTiO₃/CaCu₃Ti₄O₁₂ mixtures (CTO.CCTO), were investigated and characterized. The ceramics were sintered at 1100 °C for 180 min. The surface morphology and structures were investigated by XRD and SEM. Elastic modulus and hardness of the surfaces were studied by instrumented indentation. It was observed that CCTO presented the higher mechanical properties (E = 256 GPa, hardness = 10.6 GPa), while CTO/CCTO mixture showed intermediate properties between CTO and CCTO.     

Structural, magnetic and dielectric properties of Bi5−xLaxTi3Co0.5Fe0.5O15 ceramics

The Bi_5−xLa_xTi₃Co_0.5Fe_0.5O₁₅ (0 ≤ x ≤ 0.4) ceramics were successfully synthesized by a modified Pechini process. The samples were characterized by X-ray diffraction and no impurity phase has been detected. The cell volume of the composites increases monotonously with the increase of La content, which indicates that La ions have been incorporated into the lattice of Bi₅Ti₃Co_0.5Fe_0.5O₁₅. The magnetic measurements show that La doping on Bi sites has enhanced the magnetization of Bi_5−xLa_xTi₃Co_0.5Fe_0.5O₁₅ (0 ≤ x ≤ 0.4). Both the dielectric constants and loss tangent of all the samples decrease on increasing frequency and then become almost constant at room temperature. The La doped Bi₅Ti₃Co_0.5Fe_0.5O₁₅ samples exhibit improved dielectric and ferroelectric properties, with higher dielectric constant enhanced remnant polarization and lower losses at room temperature.     

Study on properties of BaxSmyTi7O20 ceramics with CaO-SiO2-B2O3 glass

The effect of CaO-SiO₂-B₂O₃ (CSB) glass addition on the sintering temperature and dielectric properties of Ba_xSm_yTi₇O₂₀ ceramics has been investigated using X-ray diffraction, scanning electron microscopy and differential thermal analysis. The CSB glass starts to melt at about 970 °C, and a small amount of CSB glass addition to Ba_xSm_yTi₇O₂₀ ceramics can greatly decrease the sintering temperature from about 1350 to about 1260 °C, which is attributed to the formation of liquid phase. It is found that the dielectric properties of Ba_xSm_yTi₇O₂₀ ceramics are dependent on the amount of CSB glass and the microstructures of sintered samples. The product with 5 wt% CSB glass sintered at 1260 °C is optimal in these samples based on the microstructure and the properties of sintering product, when the major phases of this material are BaSm₂Ti₄O₁₂ and BaTi₄O₉. The material possesses excellent dielectric properties: ?_r = 61, tan δ = 1.5 × 10⁻⁴ at 10 GHz, temperature coefficient of dielectric constant is −75 × 10⁻⁶ °C⁻¹.     

Abnormal dielectric behaviors in Mn-doped CaCu3Ti4O12 ceramics and their response mechanism

Mn-doped CaCu₃Ti₄O₁₂ (CCTO) polycrystalline ceramics have been prepared by the conventional solid state sintering. Our results indicate that 10% Mn doping can decrease the dielectric permittivity in CaCu₃Ti₄O₁₂ by about 2 orders of magnitude (from 10⁴ to 10²). The grain and grain boundary activation energies show an obvious increase from 0.054 eV to 0.256 eV, and decrease from 0.724 eV to 0.258 eV with increasing the Mn doping concentration, respectively, which may be caused by the variation of Cu and Ti valence states in the CCTO samples evidenced by the X-ray absorption spectra. The similar grain and grain boundary activation energies result in invalidation of the internal boundary layer capacitance effect for the 10% Mn-doped CCTO sample, and thus result in the dramatic decrease of dielectric permittivity.     

The effect of Ca-rich on the electric properties of Ca1+xCu3−xTi4O12 polycrystalline system

Ca_1+xCu_3−xTi₄O₁₂ (x = 0, 0.25, 0.5, 1) ceramics were prepared using the conventional solid-state reaction method. The XRD patterns show that Ca_1+xCu_3−xTi₄O₁₂ compounds are comprised of CaCu₃Ti₄O₁₂ (CCTO) and CaTiO₃ (CTO) phases compared with the traditional CCTO and the content of CTO phase increases with the increase of x. The micrographs demonstrate that the sample for x = 0 has larger grain size 8-10 μm. However, for the samples (x = 0.25, 0.5, 1), the mean grain size decreases markedly with the increase of CTO phase. The measurement for electric properties indicates that the permittivity values decrease with the increase of Ca atoms, but the breakdown electric field E_b and the nonlinear coefficient α values have a behavior reverse to it. The nonlinear coefficient α reaches 28 for x = 1, yet it is only 11.4 for x = 0 in the current range of 1-10 mA. This can be ascribed to the reduction of grain size and the changes in the electric conductivity of main grains and grain boundary with increasing Ca/Cu ratio. Imbalances between Ca and Cu atoms with Ca in excess can favor the non-ohmic properties in detriment to the dielectric property and a suitable Ca/Cu ratio can be selected to adjust the permittivity and I-V nonlinearity, according to different desired device applications.     

Effect of Gd substitution on ferroelectric and magnetic properties of Bi4Ti3O12

Polycrystalline samples Bi_4 − xGd_xTi₃O₁₂ (x = 1, 1.5, 2) were investigated by X-ray diffraction, piezoresponse force microscopy and SQUID-magnetometry techniques. Increasing the gadolinium content was shown to suppress the spontaneous polarization in Bi_4 − xGd_xTi₃O₁₂, resulting in a polar-to-nonpolar phase transition near x = 1.5. In contrast to previous expectations, all these samples were found to be paramagnets. It was thus proven that introducing magnetically-active Gd ions into the lattice of the ferroelectric Aurivillius-type compound should not be considered as an effective way to achieve multiferroic behavior.     

Microstructure and microwave dielectric characteristics of (1 − x)Ba(Zn1/3Ta2/3)O3-xBaTi4O9 ceramics

(1 − x)Ba(Zn_1/3Ta_2/3)O₃-xBaTi₄O₉ (0.1 ≤ x ≤ 0.85) composites are prepared by mixing 1150 °C-calcined BaTi₄O₉ with 1150 °C-calcined Ba(Zn_1/3Ta_2/3)O₃ powders. The crystal structure, microwave dielectric properties and sinterabilites of the (1 − x)Ba(Zn_1/3Ta_2/3)O₃-xBaTi₄O₉ ceramics have been investigated. X-ray diffraction patterns reveal that BaTi₄O₉, ordered and disordered Ba(Zn_1/3Ta_2/3)O₃ phases exist independently over the whole compositional range. The sintering temperatures of (1 − x)Ba(Zn_1/3Ta_2/3)O₃-xBaTi₄O₉ ceramics are about 1240 - 1320 °C and obviously lower than those of Ba(Zn_1/3Ta_2/3)O₃ ceramics. The dielectric constants (?_r) and the temperature coefficient of resonant frequency (τ_f) of (1 − x)Ba(Zn_1/3Ta_2/3)O₃-xBaTi₄O₉ ceramics increase with the increase of BaTi₄O₉ content. Nevertheless, the bulk densities and the quality values (Q × f) of (1 − x)Ba(Zn_1/3Ta_2/3)O₃-xBaTi₄O₉ ceramics increase with the increase of Ba(Zn_1/3Ta_2/3)O₃ content. The results are attributed to the higher density and quality value of Ba(Zn_1/3Ta_2/3)O₃ ceramics, the better grain growth, and the densification of sintered specimens added a small BaTi₄O₉ content. The (1 − x)Ba(Zn_1/3Ta_2/3)O₃-xBaTi₄O₉ ceramic with x = 0.1 sintered at 1320 °C exhibits a ?_r value of 31.5, a maximum Q × f value of 68500 GHz and a minimum τ_f value of 4.1 ppm/°C.     

Studying trivalent/bivalent metal ion doped TiO2 as p-TiO2 in bipolar heterojunction devices

Trivalent/bivalent metal ions doped TiO₂ thin films (M_xTi_1−xO₂, M = Cr³⁺, Fe³⁺, Ni²⁺, Co²⁺, Mn²⁺ and x = 0.01, 0.05, 0.1, 0.15, 0.2) were deposited on Indium–tin oxide (ITO) coated glass substrates by spin coating technique. X-ray photoelectron spectroscopy (XPS) showed Ti⁴⁺ oxidation state of the Ti2p band in the doped p-TiO₂. The homogenous M_xTi_1−xO₂ was used to support n-ZnO thin films with thickness ∼40–80 nm and vertically aligned n-ZnO nanorods (NR) with length ∼300 nm and 1.5 μm. Current (I)–voltage (V) characteristics for the Ag/n-ZnO/M_xTi_1−xO₂/ITO/glass assembly showed rectifying behavior with small turn-on voltages (V₀) < 1 V. The ideality factor (η) and the resistances in both forward and reverse bias were calculated. The temperature dependence performance of these bipolar devices was performed and variation of the parameters with temperature was studied.     

Structural,transport and spectroscopic properties of Ti substituted magnetite: Fe3−xTixO4

The effect of Ti⁴⁺ ion on the formation of magnetite, which were prepared by solid-state route reaction method, were studied by resistivity, Raman and ⁵⁷Fe Mössbauer spectrometry. Resistivity measured in the range of 10 < T < 300 K for Ti⁴⁺ magnetite Fe_3−xTi_xO₄ exhibit first order phase transformations at the Verwey transition T_v for Fe₃O₄, Fe_2.98Ti_0.02O₄ and Fe_2.97Ti_0.03O₄ at 123 K, 121 K and 118 K, respectively. No first order phase transition was observed for Fe_2.9Ti_0.1O₄ and small polaron model retraces the semiconducting resistivity behavior with activation energy of about 72 meV. The changes in Raman spectra as a function of doping show that the changes are gradual for samples with higher Ti doping. The Raman active mode for Fe_2.9Ti_0.1O₄ at ≅634.4 cm⁻¹ is shifted as compared to parent Fe₃O₄ at ≅670 cm⁻¹, inferring that Mn²⁺ ions are located mostly on the octahedral sites. ⁵⁷Fe Mössbauer spectroscopy probes the site preference of the substitutions and their effect on the hyperfine magnetic fields confirms that Ti⁴⁺ ions are located mostly on the octahedral sites of the Fe_3−xTi_xO₄ spinel structure.     

Leakage current characteristics of Bi3.15Nd0.85Ti3 − xZrxO12 thin films

Thin films of Bi_3.15Nd_0.85Ti₃O₁₂ (BNT) and Bi_3.15Nd_0.85Ti_3 − xZr_xO₁₂ (BNTZ_x, x = 0.1 and 0.2) were fabricated on Pt/TiO₂/SiO₂/Si(100) substrates by a chemical solution deposition (CSD) technique at 700 °C. Structures, surface morphologies, leakage current characteristics and Curie temperature of the films were studied as a function of Zr ion content by X-ray diffraction, atomic force microscopy, ferroelectric test system and thermal analysis, respectively. Experimental results indicate that Zr ion substitution in the BNT film markedly decreases the leakage current of the film, while almost not changing the Curie temperature of the film, which is at about 420-460 °C. The decrease of the leakage current in BNTZ_x films is that the conduction by the electron hopping between Ti⁴⁺ and Ti³⁺ ions is depressed because Zr⁴⁺ ions can block the path between two adjacent Ti ions and enlarge hopping distance.     

Photocatalytic activity of Ca3Ti2O7 layered-perovskite doped with Rh under visible light irradiation

The photocatalytic activities of layered-perovskite Ca₃Ti₂O₇ doped with Rh were investigated with visible light irradiation. Although the Rh-doped Ca₃Ti₂O₇ as prepared showed low activity after an induction period, the photocatalytic activity was highly enhanced by treating the samples in reducing atmosphere without the need for an induction period. The rate of H₂ evolution from an aqueous methanol solution by 3 mol% Rh-doped Ca₃Ti₂O₇ after the reduction treatment was about 5 times higher than that before the reduction. The layered photocatalytic compounds, Ca₃Ti_2 − xRh_xO₇, showed higher stability in air than CaTi_1 − xRh_xO₃, which consists of a simple perovskite structure.     

Microstructural and dielectric properties of donor doped (La3+) CaCu3Ti4O12 ceramics

The effect of La³⁺ doping on Ca²⁺ sites in CaCu₃Ti₄O₁₂ (CCTO) was examined. Polycrystalline samples in the chemical formula Ca_(1-x)La_(2/3)x Cu₃Ti₄O₁₂ with x = 0, 0.5, 1 were synthesized via the conventional solid state reaction route. X-ray powder diffraction analysis confirmed the formation of the monophasic compounds and indicated the structure to be remaining cubic with a small increase in lattice parameter with increase in La³⁺ doping. The dielectric and impedance characteristics of Ca_(1-x)La_(2/3)x Cu₃Ti₄O₁₂ were studied in the 100 Hz–10 MHz frequency range at various temperatures (100–475 K). A remarkable decrease in grain size from 50 μm to 3–5 μm was observed on La³⁺ substitution. The dielectric constant of CaCu₃Ti₄O₁₂ decreased drastically on La³⁺ doping. The frequency and temperature responses of dielectric constant of La³⁺ doped samples were found to be similar to that of CaCu₃Ti₄O₁₂. The effects of La³⁺ doping on the electrical properties of CaCu₃Ti₄O₁₂ were probed using impedance spectroscopy. The conducting properties of grain decreased while that of the grain boundary increased on La³⁺ doping, resulting in a decrease of the internal barrier layer effect. A decrease in grain boundary capacitance and stable grain response in La³⁺ doped CCTO ceramics were unambiguously established by modulus spectra studies.     

Microstructural evolution and dielectric properties of Cu-deficient and Cu-excess CaCu3Ti4O12 ceramics

The microstructural evolution and dielectric properties of CaCu_3−xTi₄O_12−x (3 − x = 2.8-3.05) ceramics were investigated. Normal grain growth behavior was observed at Cu/Ca ≤ 2.9, while abnormal grain growth was observed at Cu/Ca ≥ 2.95. A CuO-rich intergranular liquid phase at Cu/Ca ≥ 2.95 and angular grain morphology were the main reasons for abnormal grain growth. However, the abundant intergranular liquid at Cu/Ca = 3.05 significantly affected the relative dielectric permittivity and dielectric loss. The CuO composition is the key parameter that determines the microstructure and dielectric properties of CCTO ceramics.     

V-doping effects on ferroelectric properties of K0.5Bi4.5Ti4O15 thin films

V-doped K_0.5Bi_4.5Ti₄O₁₅ (K_0.5Bi_{4.5 − x/3}Ti_4 − xV_xO₁₅, KBTiV-x, x = 0.00, 0.01, 0.03, and 0.05) thin films were prepared on a Pt(111)/Ti/SiO₂/Si(100) substrate by a chemical solution deposition method. The thin films were annealed by using a rapid thermal annealing process at 750 °C for 3 min in an oxygen atmosphere. Among them, KBTiV-0.03 thin film exhibited the most outstanding electrical properties. The value of remnant polarization (2P_r) was 75 μC/cm² at an applied electric field of 366 kV/cm. The leakage current density of the thin film capacitor was 5.01 × 10⁻⁸ at 100 kV/cm, which is approximately one order of magnitude lower than that of pure K_0.5Bi_4.5Ti₄O₁₅ thin film capacitor. We found that V doping is an effective method for improving the ferroelectric properties of K_0.5Bi_4.5Ti₄O₁₅ thin film.     

Structural and optical properties of Er-doped Y2Ti2O7 thin films by sol-gel method

Er³⁺-doped Y₂Ti₂O₇ and Er₂Ti₂O₇ thin films were fabricated by sol-gel spin-coating method. A well-defined pyrochlore phase Er_xY_2-xTi₂O₇ was observed while the annealing temperature exceeded 800 °C. The average transmittance of the Er_xY_2-xTi₂O₇ thin films annealed at 400 to 900 °C reduces from ∼ 87 to ∼ 77%. The refractive indices and optical band gaps of Er_xY_2-xTi₂O₇ (x = 0-2) annealed at 800 °C/1 h vary from 2.20 to 2.09 and 4.11 to 4.07 eV, respectively. The ∼ 1.53 μm photoluminescence spectrum of Er³⁺ (5 mol%)-doped Y₂Ti₂O₇ thin films annealed at 700 °C/1 h exhibits the maximum intensity and full-width at half maximum (∼ 60 nm).     

Novel transparent conducting oxide: Anatase Ti1−xNbxO2

Single-crystalline Ti_1−xNb_xO₂ (x = 0.2) films of 40 nm thickness were deposited on SrTiO₃ (100) substrates by the pulsed laser deposition (PLD) technique. X-ray diffraction measurement confirmed epitaxial growth of anatase (001) film. The resistivity of Ti_1−xNb_xO₂ films with x ≥ 0.03 is 2-3 × 10^− 4 Ω cm at room temperature. The carrier density of Ti_1−xNb_xO₂, which is almost proportional to the Nb concentration, can be controlled in a range of 1 × 10¹⁹ to 2 × 10²¹ cm^− 3. Optical measurements revealed that internal transmittance in the visible and near-infrared region for films with x = 0.03 was more than 97%. These results demonstrate that the presently developed anatase Ti_1−xNb_xO₂ is one of the promising candidates for the practical TCOs.