A novel 0.84 ppm/°C CMOS curvature-compensated bandgap with 1.2 V supply voltage

This paper proposes a novel CMOS curvature-compensated bandgap reference (BGR) by using a new full compensation technique. The theory behind the proposed full compensation technique is analyzed. The proposed BGR is designed and implemented using 0.15 μm standard CMOS process. Simulation results show that the proposed BGR achieves a temperature coefficient (TC) of 0.84 ppm/°C over the temperature range from −40 °C to 120 °C with a 1.2 V supply voltage. The current consumption of proposed BGR is 51 μA at 27 °C. The line regulation of proposed BGR is 0.023%/V over the supply voltage range from 1.2 V to 1.8 V at 27 °C. In addition, the PSRRs of proposed BGR are −91 dB, −81 dB, −61 dB and −29 dB at DC or 10 Hz, 1 kHz, 10 kHz, and 100 kHz, respectively.     

A 3 V 110 μW 3.1 ppm/°C curvature-compensated CMOS bandgap reference

This paper presents design of a high-precision curvature-compensated bandgap reference (BGR) circuit implemented in a 0.35 μm CMOS technology. The circuit delivers an output voltage of 1.09 V and achieves the lowest reported temperature coefficient of ~3.1 ppm/°C over a wide temperature range of [?20°C/+100°C] after trimming, a power supply rejection ratio of ?80 dB at 1 kHz and an output noise level of 1.43 μV $ \sqrt {\text{Hz}} $ at 1 kHz. The BGR circuit consumes a very low current of 37 μA at 3 V and works for a power supply down to 1.5 V. The BGR circuit has a die size of 980 μm × 830 μm.     

一种无电阻高电源抑制比的CMOS带隙基准源

提出一种输出低于1V的、无电阻高电源抑制比的CMOS带隙基准源(BGR).该电路适用于片上电源转换器.用HJTC0.18μm CMOS工艺设计并流片实现了该带隙基准源,芯片面积(不包括pad和静电保护电路)为0.031mm2.测试结果表明,采用前调制器结构,带隙基准源电路的输出在100Hz与lkHz处分别获得了-70与-62dB的高电源抑制比.电路输出一个0.5582V的稳定参考电压,当温度在0～85℃范围内变化时,输出电压的变化仅为1.5mV.电源电压VDD在2.4～4V范围内变化时,带隙基准输出电压的变化不超过2mV.     

A high PSRR CMOS voltage reference with 1.2 V operation

A high power supply rejection ratio (PSRR) CMOS band-gap reference (BGR) with 1.2 V operation is proposed in this paper. The reference features include an error amplifier with a trimming circuit and a trimming resistor array on the chip. Local positive feedback is used in the error amplifier to obtain high gain. By trimming the resistor array, the PSRR of the error amplifier is trimmed around one to obtain a high PSRR. The trimming resistor array is controlled externally. The post simulation results indicate that the PSRR is up to ?130 dB@DC and ?89 dB@10 kHz. The experimental results show that, under a supply voltage of 1.2 V the measured PSRR is ?103 dB@dc and ?74 dB@10 kHz.     

A High-Order Temperature-Compensated Subthreshold Voltage Reference Using Channel Length Modulation Compensation Technique

The paper presents a novel high-order temperature-compensated subthreshold voltage reference that utilizes temperature characteristics of the gate-to-source voltage of subthreshold MOS transistor. The proposed high-order temperature-compensated voltage reference has been designed using two CMOS voltage references and a current subtraction circuit to achieve a low temperature coefficient over a wide temperature range. The proposed circuit offers an output reference voltage of 250.8 mV, line sensitivity of 0.0674%/V and temperature coefficient of 37.4 ppm/°C for the temperature range varying from???20 \(\mathrm{^\circ{\rm C} }\) to 140 °C at nominal conditions. The power supply rejection ratio is obtained as???46.02 dB at a frequency of 100 Hz and???41.91 dB at a frequency of 1 MHz. The proposed circuit shows an output noise of 1.86 \(\mathrm{\mu V}/\surd \mathrm{Hz}\) at 100 Hz and 259.72 \(\mathrm{nV}/\surd \mathrm{Hz}\) at 1 MHz. The proposed circuit has been designed in BSIM3V3 180 nm CMOS technology using Cadence tool. The corner analysis of the proposed circuit has also been performed to show its performance in extreme conditions. The proposed circuit occupies a small chip area of 51 \(\upmu\)m?×?75.3 \(\upmu\)m.

     

一种低温漂、高精度CMOS带隙基准源设计

基于线性分段补偿的基本原理,依据输出支路内部的温度负反馈结构,提出了一种结构简单、适应不同开口方向的高阶补偿方法。并设计了一种基于电流镜结构的低温漂、高精度的电压基准电路。CSMC 0.35 μm CMOS工艺的仿真结果表明,经高阶补偿的电压模基准,在-40~125 ℃温区范围内温度系数为2.84×10^-6/℃,低频100 Hz时的PSRR达到-70.6 dB,10 kHz为-63.36 dB。当电源电压在2~3 V范围内变化时,其电压值波动为3 mV/V。整个带隙基准电压源具有较好的综合性能。     

A 0.6V 44.6 ppm/ºC subthreshold CMOS voltage reference with wide temperature range and inherent leakage compensation

In this paper, a 0.6 V subthsheshold CMOS voltage reference (CVR) achieving wide temperature range and high power supply ripple rejection (PSRR) is presented. The proposed CVR structure can compensate the high temperature leakage and current mirror induced mismatches so as to increase the operating temperature range. The generated reference voltage of the proposed CVR circuit is the threshold voltage difference of two NMOS transistors, leading to relatively small variations. Moreover, the enhanced current source helps achieve high PSRR. The proposed CVR circuit is implemented in a standard 0.18-μm CMOS technology. Measurement results show that, with one single trimming, a mean output of 344 mV with standard deviation of only 2.89 mV and average TC of 44.6 ppm/°C over a wide temperature range from −40 °C to 125 °C is achieved. The measured PSRR is −68 dB, −52 dB and −52 dB at 10 Hz, 100 kHz and 10 MHz, respectively. The measured line sensitivity (LS) is 0.06%/V with a power supply from 0.6 V to 2 V while consuming 19.8  nW at 0.6 V supply. The active area is 0.019 mm².     

A resistorless CMOS bandgap reference with low temperature coefficient and high PSRR

A novel bandgap reference (BGR) with low temperature and supply voltage sensitivity without any resistor, which is compatible with standard CMOS process, is presented in this article. The proposed BGR utilises a differential amplifier with an offset voltage proportional to absolute temperature to compensate the temperature drift of emitter–base voltage. Besides, a self-biased current source with feedback is used to provide the bias current of the BGR core for reducing current mirror errors dependent on supply voltage and temperature further. Verification results of the proposed BGR implemented with 0.35?µm CMOS process demonstrate that a temperature coefficient of 10.2?ppm/°C is realised with temperature ranging from ?40°C to 140°C, and a power supply rejection ratio of 58?dB is achieved with a maximum supply current of 27?µA. The active area of the presented BGR is 160?×?140?µm².     

A novel current reference based on subthreshold MOSFETs with high PSRR

A novel current reference based on subthreshold MOSFETs with high power supply rejection ratio (PSRR) is presented. The proposed circuit takes full advantages of the I-V transconductance characteristics of MOSFET operating in the subthreshold region and the enhancement pre-regulator with the high gain negative feedback loop for the current reference core circuit. The proposed circuit, designed with the SMIC 0.18 μm standard CMOS logic process technology, exhibits a stable current of about 1.701 μA with much low temperature coefficient of 2.5×10⁻⁴ μA/°C in the temperature range of −40 to 150 °C at 1.5 V supply voltage, and also achieves a best PSRR over a broad frequency. The PSRR is about −126 dB at dc frequency and remains −92 dB at the frequency higher 1 MHz. The proposed circuit operates stably at the supply voltage higher 1.2 V and has good process compatibility.     

一种改进型BiCMOS带隙基准源的仿真设计

依据带隙基准原理,设计了一种基于90 nm BiCMOS工艺的改进型带隙基准源电路.该电路设置运算跨导放大器以实现低压工作,用共源-共栅MOS管提高电路的电源抑制比,并加设了新颖的启动电路.HSPICE仿真结果表明,在低于1.1 V的电源电压下,所设计的电路能稳定地工作,输出稳定的基准电压约为610 mV;在电源电压V_(DD)为1.2 v、温度27℃、频率为10 kHz以下时,电源噪声抑制比约为-45 dB;当温度为-40～120℃时,电路的温度系数约为11 × 10~(-6)℃,因此该基准源具有低工作电压、高电源抑制比、低温度系数等性能优势.     

一种新型CMOS电流模带隙基准源的设计

设计了一种新型电流模带隙基准源电路和一个3bit的微调电路。该带隙基准源可以输出可调的基准电压和基准电流,避免了在应用中使用运算放大器进行基准电压放大和利用外接高精度电阻产生基准电流的缺点,同时该结构克服了传统电流模带隙基准源的系统失调、输出电压的下限限制以及电源抑制比低等问题。该带隙基准源采用0.5μm CMOS混合信号工艺进行实现,有效面积450μm×480μm;测试结果表明在3 V电源电压下消耗1.5mW功耗,电源抑制比在1 kHz下为72dB,当温度从-40～85°C变化时,基准电压的有效温度系数为30×10-6V/°C。该带隙基准电路成功应用在一款高速高分辨率模数转换器电路中。     

A novel sub-1V bandgap reference with offset compensated techniques

A sub-1V bandgap reference (BGR) featuring with low offset is proposed. In order to reduce the effect of the offset of the operation amplifiers, the proposed BGR introduces feedback paths to not only realize sub-1V output but also reduce the factor of operation amplifier’s offset voltage. In addition, a cross-coupled structure is dedicated to reduce the offset voltage factor further by increasing the bipolar junction transistor’s base emitter voltage difference. The new proposed offset-compensated BGR has been successfully verified in a 0.5 μm BCD process. The relative accuracy is increased by 4 times compared with the conventional circuit. Furthermore, the proposed circuit achieves a temperature coefficient of 8.5 ppm/°C over a wide temperature range of ?20 to 120 °C, power supply rejection ratio of more than 70 dB at low frequencies and a line regulation of 0.09 % easily, without requiring additional operational amplifiers or complex circuits.     

一种用于音频Σ-ΔA/D转换器的CMOS带隙电压基准源

在传统带隙基准电压源电路结构的基础上,通过在运放中引入增益提高级,实现了一种用于音频Σ-ΔA/D转换器的CMOS带隙电压基准源。在一阶温度补偿下实现了较高的电源抑制比(PSRR)和较低的温度系数。该电路采用SIMC 0.18-μm CMOS工艺实现。利用Cadence/Spectre仿真器进行仿真,结果表明,在1.8 V电源电压下,-40～125℃范围内,温度系数为9.699 ppm/℃;在27℃下,10 Hz时电源抑制比为90.2 dB,20 kHz时为74.97 dB。     

A low power CMOS voltage reference generator with temperature and process compensation

A low power CMOS voltage reference with process compensation is presented in TSMC 0.18-μm standard CMOS technology. Detailed analysis of the process compensation technique is discussed. The circuit is simulated with Spectre. Simulation results show that, without any trimming procedure, the output voltage achieves a maximum deviation of 0.35 % across different process corners. The temperature coefficient of the proposed circuit is 12.7 ppm/°C in a temperature range from ?40 to 85 °C and the line sensitivity is 0.036 mV/V with a supply voltage range from 1.2 to 2.5 V under typical condition. The maximum supply current is 390.4 nA at maximum supply voltage and ?40 °C. The power supply rejection ratio is ?68.3 dB at 100 Hz and 2.5 V without any filtering capacitor.     

A high-order curvature compensation technique for bandgap voltage reference using subthreshold MOSFETs

A bandgap voltage reference with high-order curvature compensation is presented in this study. It exploits subtraction and derivative equalisation of currents generated from two complementary NMOS and PMOS bandgap references (BGRs) using subthreshold MOSFETs. By equating the derivative with respect to temperature of the two currents, generated by the complementary bandgaps, and subtracting these currents, an accurate high-order curvature compensation is achieved. To overcome problems due to the limited input common-mode range of opamps used in BGRs, a transimpedance amplifier with new accurate current compensation that tracks the temperature variation is proposed. This bandgap is implemented using the 0.18 μm CMOS process with a supply voltage as low as 0.7 V. At 0.8 V power supply and an output reference voltage of 386 mV, the proposed circuit achieves a temperature coefficient of 19 ppm/°C from 0 to 130°C. The power consumption is 119 μW and the power supply reduction ratio is 24 dB at 1 kHz.     

一种高精度CMOS带隙基准电路的设计

采用ASMC0.35μm CMOS工艺设计了低功耗、高电源抑制比(PSRR)、低温漂、输出1V的带隙基准源电路。该设计中,偏置电压采用级联自偏置结构,运放的输出作为驱动的同时也作为自身电流源的驱动,实现了与绝对温度成正比(PTAT)温度补偿。通过对其进行仿真验证,当温度在-40～125℃和电源电压在1.6～5V时,输出基准电压具有3.68×10-6/℃的温度系数,Vref摆动小于0.094mV;在低频时具有-114.6dB的PSRR,其中在1kHz时为-109.3dB,在10kHz时为-90.72dB。     

非制冷红外焦平面读出电路用带隙基准电压源

提出了一种高精度、低功耗、小面积的电流型CMOS基准电压源以满足非制冷红外焦平面(IRFPA)读出电路对基准电压源模块的要求。设计中采用两种分别具有正负一阶温度系数的电阻,通过对基准电压源的高阶温度系数进行补偿,获得更好的温度系数TC(Temperature Coefficient)。通过使用共源共栅结构代替传统的运放,节约了传统运放和偏置电路的功耗,并且具有出色的电源电压抑制比PSRR(Power Supply Reject Ratio)。该设计使用标准0.18 m CMOS工艺实现,工作电压3.3 V,-40~120 ℃温度范围内,输出基准电压温度系数约为3.7 ppm/℃,PSRR约为-78 dB@1 kHz,在25 ℃时消耗电流6.3 A,消耗芯片面积仅230 m100 m,所提出的电路是一种低功耗、节约面积的设计。     

一种基于斩波调制的低压高精度CMOS带隙基准源

实现了一种适用于SOC的低压高精度带隙基准电压源设计。利用斩波调制技术有效地减小了带隙基准源中运放的失调电压所引起的误差,从而提高了基准源的精度。考虑负载电流镜和差分输入对各2%的失配时,该基准源的输出电压波动峰峰值为0.31 mV。与传统带隙基准源相比,相对精度提高了86倍。在室温下,斩波频率为100 kH z时,基准源提供0.768 V的输出电压。当电源电压在0.8 V到1.6 V变化时,该基准源输出电压波动小于0.05 mV;当温度在0°C到80°C变化时,其温度系数小于12 ppm/°C。该基准源的最大功耗小于7.2μW,采用0.25μm 2P 5M CM O S工艺实现的版图面积为0.3 mm×0.4 mm。     

A Subthreshold Low Phase Noise CMOS LC VCO for Ultra Low Power Applications

A subthreshold low power, low phase-noise voltage controlled oscillator (VCO) is demonstrated in a commercial 0.18 mum CMOS process. In subthreshold regime, MOS drain current is dominated by diffusion mechanism resulting in a high ratio of transconductance to drain current and suppressed phase noise. Therefore, low power and low phase noise characteristics are achieved without using nonconventional high passive components. The VCO measures a phase noise of -106 dBc/Hz at 400 kHz offset from 2.63 GHz oscillation frequency with 0.43 mW power dissipation drawn from 0.45 V power supply. Figures of merit for this VCO (power-frequency-normalized of 12 dB and power frequency-tuning-normalized of -10 dB) are among the best reported for CMOS oscillators.     

A 2.87 ppm/°C 65 nm CMOS bandgap reference with nonlinearity compensation

Based on the review and analysis of two recently reported low temperature coefficient (TC) bandgap voltage references (BGRs), a new temperature compensation technique is presented. With the double-end piecewise nonlinearity correction method, the logarithm cancellation technique and the mixed-mode output topology, a BGR with high-temperature stability is realised based on 65?nm CMOS low-leakage process. The post-simulation results using Spectre show that this BGR produces an output voltage of about 953?mV with 2.5?V supply voltage, and the output voltage varies by only 0.16?mV from ?40°C to 125°C. This low TC BGR has been used in a 65?nm CMOS touch screen controller, and the measurement shows that the output voltage of this BGR is about 949?mV varying by 0.44?mV from ?40°C to 125°C. The TC of this BGR is about 2.87?ppm/°C, meeting the requirement of high-precision SoC application.