QFN用环保塑封料研究

环氧塑封料是微电子工业和技术发展的基础材料,作为IC产品后道封装的三大主材料之一,随着IC封装技术的发展,对其特性的要求也越来越严格。IC产品未来发展趋势倾向于小体积高性能化的方向,QFN即为顺应此发展趋势所开发出来的封装形式。针对此封装形式长兴电子材料(昆山)有限公司开发出EK5600GH环保塑封料产品,此产品具有低吸湿率、低收缩率、高流动性及高可靠性的特点,可以满足QFN封装要求。同时还分别介绍了QFN用环保塑封料的测试数据、可靠性测试结果和客户端可靠性评估结果。     

SD卡用环保塑封料研究

环氧塑封料是微电子工业和技术发展的基础材料,作为IC产品后道封装的三大主材料之一,随着IC封装技术的发展,IC产品未来发展趋势倾向于小体积和高性能化的方向,对其特性的要求也越来越严格。SD卡为目前流行的存储设备,长兴电子材料(昆山)有限公司开发出针对SD卡的EK5600GHL环保塑封料产品,此产品具有低吸湿率、低收缩率、高流动性及高可靠性的特点,可以满足SD卡封装要求。同时文章还介绍了SD卡用环保塑封料的测试数据、可靠性测试结果和客户端可靠性评估结果。     

LQFP封装用环保型环氧塑封料KHG700产品研制

北京科化新材料科技有限公司承担国家科技部"十一五"02重大专项子课题,成功研制出LQFP封装用环保型环氧塑封料KHG700产品,并实现产业化。经过客户验证,批量产品应用达到进口同类产品水平。KHG700产品采用环保阻燃、快速固化和高填料量技术,具有低膨胀率、低粘度、低吸湿性、高可靠性等特点,并具有优良的封装工艺性能,可用于QFP、LQFP、TQFP等类别产品封装。文中对关键封装要求做了重点分析,并详细介绍了塑封料产品配方设计、性能测试、客户可靠性试验结果。     

高导热MSL-1环氧树脂模塑料的开发与应用

基于终端客户在产品应用面对信赖性及可靠性要求越来越高的情况,开发出一种绿色环保环氧塑封料EMC-GTR,满足高导热及高可靠封装要求,用其封装的器件通过了AEC-Q101-REV-C 《基于离散半导体元件应力测试认证的失效机理》考核。     

EMC所用环保阻燃剂介绍及优缺点比较

随着人们健康环保意识的增强,寻求环保化、低毒化、高效化、多功能化的阻燃剂已成为阻燃剂行业的必然趋势。对于环保模塑料来讲,必须有相对应的符合法令要求的产品。用环保阻燃剂替代原先使用的溴锑阻燃剂加入到基础配方中制备了环保塑封料,文章简单介绍了目前市场上主要的有机及无机阻燃剂的种类,并重点讲述了在环氧塑封料中引用各环保阻燃剂...     

绿色环保塑封料（EMC）的研究

为了适应人们对绿色环境的渴求和市场的发展，本文主要从阻燃剂的改进这一角度来研究绿色环保塑封料(EMC)。重点是从传统阻燃剂的阻燃机理到新型环保阻燃剂的阻燃机理，对绿色环保塑封料(EMC)进行探讨。同时也介绍了适用于无铅焊料工艺中对EMC的性能要求。     

浅析全球环氧塑封料的发展状况

环氧塑封料(Epoxy Molding Compound)是一种半导体封装用电子材料,主要应用于半导体器件和集成电路芯片的封装。文章主要是通过对环氧塑封料的发展历程、典型技术和制造工艺,以及国内外发展状况和市场应用等方面的研究,对全球的环氧塑封料的发展状况进行浅析。文章特别提到有关绿色环保塑封料的应用情况。     

环氧塑封料绿色环保化过程中的问题研究

本文以国内电子封装产业中绿色环保型环氧塑封料的使用情况为背景,通过对其可靠性和工艺成型性的深入分析,结合具体实例的比较,总结出环氧塑封料向高性能和绿色环保方向发展过程中的若干问题,并提出针对这些问题的相关建议。     

一种有效的带封装进行缺陷定位的技术研究

提出了一种基于塑料封装器件进行缺陷定位的分析方案,并且以T0-247封装的功率器件为例详细阐述了带封装进行缺陷定位的过程与方法。通过精密研磨、抛光、激光等先进制样手段减薄塑封料,并用显微红外热成像技术实现器件缺陷定位,从而确定器件的失效模式与失效机理。实验证明该方法切实有效,这种失效分析方法对优化封装流程以及提升良率和可靠性都有重要的参考意义。     

IC环氧塑封料性能及其发展趋势

材料是微电子工业和技术发展的粮食，随着IC封装技术的发展，对材料特性的要求也愈来愈严格，也顺势带动封装材料发展。环氧塑封料(Epoxy Molding Compound，简称EMC)是IC后道封装三大主材料(塑封料、金丝、引线框架)之一，用环氧塑封料封装超大规模集成电路(VLSI)在国内外已成为主流，目前95％以上的微电子器件都是塑封器件。本文将简要介绍EMC配方组成、反应机理、性能之间关系及其发展趋势。     

Preparation and Characterization of a Novel Epoxy Molding Compound with Low Storage Modulus at High Temperature and Low Glass-Transition Temperature

Epoxy molding compound (EMC) has been widely used as a main material for encapsulation and protection of semiconductor packages because of its low cost, high moisture resistance, high heat resistance, and good mechanical performance. Due to the extensive application of lead-free solder in place of Sn-Pb, soldering temperature is higher than before; this demands that EMC, which is usually used for lead-free solder, should have extremely low thermal stress and excellent stability at elevated temperatures. In this work, 1,3-propanediol bis(4-aminobenzoate) (PBA) was added to an EMC product to form a novel epoxy molding compound (FEMC). PBA had very limited effect on the process feasibility of EMC, and caused reduction of the storage modulus by 40% to 50% at high temperatures and reduction of the glass-transition temperature by more than 10°C, which are very helpful to reduce thermal stress buildup during high-temperature soldering processes. The increases of the tab pull force of copper- and silver-plated lead frames within EMC due to PBA were up to 58% and 117%, respectively. With increasing PBA content in the EMC, water absorption increased in a linear fashion, so the amount of PBA added to the EMC should be limited, preferably to not more than 1%.     

绿色环保无卤阻燃环氧塑封料的研究与发展

随着先进集成电路封装技术的快速发展以及全球环境保护呼声的日益高涨,绿色环保无卤阻燃环氧塑封料得到了越来越广泛的重视。文章综述了近年来国内外在绿色无卤阻燃环保塑封料研究与开发领域内的最新进展。分别介绍了均聚型、共聚型以及含氟苯酚-芳烷基型酚醛树脂固化剂、环氧树脂以及塑封料的阻燃机制、研究现状以及发展趋势。同时介绍了中国科学院化学研究所在相关领域内的研究进展情况,最后对我国绿色环保塑封料产业的发展前景进行了展望。     

Adhesion strength of leadframe/EMC interfaces

Cu-based leadframe sheets were oxidized in alkaline solutions to produce brown and/or black oxide on the surfaces, and molded with epoxy molding compound (EMC). The adhesion strength of leadframe/EMC interface was measured using sandwiched double-cantilever beam (SDCB) specimens and pull-out specimens. Results showed that the adhesion strength of leadframe/EMC interface was inherently very poor but could be increased drastically with the nucleation of acicular CuO precipitates. The presence of smooth-faceted Cu₂O on the surface of the leadframe gave close to zero fracture toughness (G_C) and suitable pull strength (PS). A direct correlation between G_C and PS showed that PS can be a measure of G_C only in a limited range.     

基于扇出型封装塑封材料性能的表征研究

扇出型封装在塑封过程中会出现芯片偏移及翘曲等缺陷,详细了解环氧塑封材料(EMC)的特性能够准确预测封装材料、结构、塑封工艺对塑封效果的影响。针对用于扇出型封装的EMC材料采用动态机械分析仪、差示扫描量热仪、流变仪测试其动态力学性能、固化动力学性能、流变学性能和热容,并建立可用于有限元分析的材料特性数学模型。结果表明,EMC在150℃等温固化60 min后具有最少残余固化;100℃环境下黏度随温度增加速率最快;时温等效原理可预测实验频率以外的力学行为。模型曲线与实验数据的拟合优度均大于0.982,材料表征模型满足准确性与适用性的要求。     

环氧模塑料中导热通道的构造与导热性能

以低密度聚乙烯(LDPE)为原料,添加不同含量的高导热氮化硅陶瓷颗粒和短切玻璃纤维,熔融挤出不同直径的Si3N4/LDPE杆料。采用热模压法制备了环氧模塑料(EMC)。研究了杆料直径、陶瓷填充量对EMC导热性能、介电性能的影响。结果表明:在相同填充量下,杆料直径越大,样品热导率越大;5mm含玻纤杆料φ(填充量)为40%,热导率高达2.1W/(m·K)。样品的εr随杆料填充量的增大而显著减小,φ5mm含玻纤杆料填充量为40%时降至最低,为3.25(1MHz)。     

Numerical analysis of the warpage problem in TSOP

The reliability and the solderability of thin small outline package (TSOP) are significantly affected by the warpage that is generated after epoxy molding compound (EMC) molding process. This warpage problem mainly results from the mismatch of material properties such as Young's modulus, Poisson's ratio and coefficient of thermal expansion (CTE) and the geometric structure of each component for TSOP. The optimization of both material properties and geometric structures using the numerical analysis is necessary to reduce the warpage of TSOP. However, there are still some limitations for the numerical analysis to obtain proper results consistent with the practical warpage values. In this paper, the numerical analysis is performed under the assumption of elastic behavior for EMC. Furthermore, to solve the limitations, the material properties at the molding temperature and the degree of reaction rate at the end of the molding process of EMC are considered together for the analysis. This numerical analysis gives the higher warpage values than the measured ones, and is applicable to the practical design of the reliable electronic package.     

填料硬度对环氧模塑料和封装体性能影响的研究

在环氧模塑料(EMC)各组分中,填料是最主要的成分之一,也是含量最高的组分,对生产设备和封装设备有很严重的磨损。通过研究,对设备的磨损将引入新的Fe3+,降低EMC和封装体的可靠性和操作性;而低硬度填料的EMC则具有良好的耐磨损性,有助于提高EMC的可靠性和操作性。     

环氧模塑料在半导体封装中的应用

环氧模塑料是一种重要的微电子封装材料,是决定最终封装性能的主要材料之一,具有低成本和高生产效率等优点,目前已经成为半导体封装不可或缺的重要材料。本文简单介绍了环氧模塑料在半导体封装中的重要作用和地位;分析了环氧模塑料性能对半导体封装的影响,并对不同半导体封装对环氧模塑料的不同要求进行了分析;最后展望半导体封装和环氧模塑料的未来发展趋势,以及汉高华威公司在新产品开发中的方向。     

Design and fabrication of an IC encapsulation mold adhesion force tester

In integrated circuit (IC) packaging, when epoxy molding compound (EMC) is filling the mold cavity and cured in the mold, adhesion occurs in the interface between EMC and mold surface. Too large an adhesion force can damage an IC and lower the yield rate. However, there was no report showing how to measure the mold adhesion force. This paper described the design and fabrication of an automatic EMC adhesion force test instrument that will measure adhesion force between mold surface and EMC. By measuring the adhesion force, one can judge how much does a specific type of surface treatment help in reducing the amount of mold adhesion force. One can also use this instrument to determine what parameters are important for reducing the magnitude of adhesion force between EMC and mold surface.