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A. K. Sinevich 《Glass and Ceramics》1991,48(6):269-271
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L. I. Sankova 《Glass and Ceramics》1966,23(7):379-380
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V. V. Lityushkin A. P. Sivko M. A. Filimonova N. N. Ermolenko 《Glass and Ceramics》1996,53(9):256-259
Methods of IR spectroscopy, differential thermal and x-ray analysis are used for investigating a charge of uviol electrovacuum glass prepared from raw materials from different deposits. It is shown that the most expedient crystalline base for introducing SiO2 into the composition of uviol glass is milk-white quartz from the Taldy-Kurganskoe Deposit and amorphous synthetic silicon dioxide.Translated from Steklo i Keramika, No. 9, pp. 6 - 9, September, 1996. 相似文献