无铅焊点力学性能的研究现状与趋势

综述了“无铅化”背景下无铅焊点力学性能研究的热点问题,着重讨论了无铅焊点的拉伸、剪切、蠕变、疲劳性能以及微观力学响应的特性,以达到获得高强度、高可靠性无铅焊点的研究目的.国内外大量的研究表明,无铅焊点的强度特性、塑性变形行为、微观组织演化、失效机理等相互紧密联系,是所含材料的宏观个认识已经深入到微米及纳米的层次.对无铅焊点力学性能在多学科交叉,新技术不断应用的背景下的研究与发展趋势进行了展望.     

无铅焊点金属间化合物的纳米压痕力学性能

研究Sn3.0Ag0.5Cu/Cu界面处的IMC在150℃下等温时效的生长情况,时效时间分别为100,300,500,1000 h.拟合出IMC的厚度与时效时间的关系,采用纳米压痕仪进行纳米压痕试验,发现Cu6 Sn5与Cu3 Sn的变形机制不同.Cu6Sn5为非连续性塑性变形,表现为压痕过程中的锯齿流变;Cu3 Sn的压痕曲线比较平滑.随Cu6Sn5厚度的增加,Cu6 Sn5的弹性模量和硬度没有太大变化.对时效100,500 h后的Sn3.0Ag0.5Cu/Cu界面处的过渡区进行纳米压痕试验,发现Cu,Cu3Sn,Cu6 Sn5和Sn3.0Ag0.5Cu的硬度大小顺序为Cu6 Sn5＞ Cu3 Sn＞ Cu＞ Sn3.0Ag0.5Cu.     

电子互连无铅钎料及焊点蠕变行为研究进展

针对近年来无铅钎料及焊点的蠕变失效问题,综合评述了蠕变变形行为及其在焊点可靠性评估中的应用。首先系统地介绍无铅钎料的蠕变行为,探讨含合金元素/颗粒无铅钎料蠕变性能改性机制。其次评述焊点蠕变行为,探讨焊点成分以及不同基板材料对焊点蠕变特性影响的研究进展。再次结合具体电子器件,采用有限元模拟,分析基于有限元的焊点蠕变响应及疲劳寿命预测,评估焊点可靠性。最后针对无铅钎料及焊点蠕变行为的未来发展进行展望,分析其研究中存在的问题及解决办法,为焊点可靠性进一步研究提供理论支撑。     

不同体积无铅微尺度焊点的蠕变力学性能

采用基于动态力学分析仪的精密蠕变试验方法,对比研究了5.34×107 μm3与7.07×106 μm3两种体积相差近一个数量级的无铅Sn-3.0Ag-0.5Cu微尺度焊点的高温蠕变力学行为与蠕变性能.结果表明,所有微尺度焊点的蠕变曲线均呈现初始蠕变、稳态蠕变和加速蠕变阶段.虽然微尺度焊点的体积存在较大差异,但是它们的蠕变激活能与蠕变应力指数均非常接近.此外,在相同的试验温度与拉伸应力作用下,大体积微尺度焊点的稳态蠕变速率相对小体积焊点更大,而蠕变寿命则呈现完全相反的趋势.     

The orientation imaging microscopy of lead-free Sn-Ag solder joints

Orientation imaging microscopy was used to identify solidification microstructures and early stages of damage evolution in tin-silver eutectic solder joints on copper and nickel substrates after aging, creep, and thermomechanical fatigue. A visco-plastic self-consistent plasticity model was able to simulate texture changes when work hardening occurred at higher strain rates, but not with lower rates, where grain boundary sliding dominated the deformation and slip occurred predominantly on one or two slip systems that could be predicted using a Schmid (Sachs) analysis. A.U. Telang (currently employed at Intel Corporation, Hillsboro, Oregon) completed his Ph.D. in 2004, with Associate Professor     

Aspects of the structural evolution of lead-free solder joints

Studies of the formation of intermetallic compounds at some lead-free solder/metallization interfaces are briefly reviewed in this article. SnAgCu/Ni and SnAgCu/Cu interfaces are examined in particular. It has been found that (Cu,Ni)₆Sn₅ forms at SnAgCu/Ni interfaces until copper is depleted from the solder matrix. This article also contrasts the formation of (Au,Ni)Sn₄ and related compounds in PbSn/Ni solder joints and lead-free solder joints.     

稀土元素Ce对Sn-Cu-Ni无铅钎料铺展性能及焊点力学性能的影响

研究了不同含量稀土元素Ce对Sn-Cu-Ni钎料铺展性能及其焊点力学性能及钎料显微组织的影响规律.结果表明,随着稀土元素Ce含量的增加,钎料在铜基板上的铺展面积逐渐增大,当Ce元素含量达到0.05%时,钎料的铺展面积达到最大.Sn-Cu-Ni钎料中添加适量的稀土元素Ce,能够细化钎料组织,从而提高焊点的力学性能.当Ce元素的含量为0.05%左右时,焊点的力学性能达到最佳值.Ce元素含量超过0.05%后,继续增大稀土元素Ce的添加量,Sn-Cu-Ni钎料的显微组织又变得粗大,铺展性能有所降低,焊点力学性能也随之有所下降.     

SnAgCu无铅微焊点剪切力学性能的体积效应

对直径200～600 μm的Sn3.OAg0.5Cu无铅微焊点进行了多次重熔及老化试验,并采用专业的微小焊点力学性能测试仪DAGE4000测试了焊点的抗剪强度,分析了焊点体积差异对焊点抗剪强度的影响,发现SnAgCu无铅焊点的抗剪强度随着焊点体积增大呈下降趋势,体现出明显的体积效应.讨论了老化时间及重熔次数对不同体积焊...     

Sn-9Zn-xAg无铅钎料润湿性能及焊点力学性能

研究了合金元素Ag的添加量对Sn-9Zn无铅钎料润湿性能及其焊点力学性能的影响.结果表明,当Ag元素的添加量(质量分数)为0.3%时,钎料具有最好的润湿性能,焊点的力学性能最佳,焊接接头的断口形貌显示钎料与铜基板接头断口处有明显的韧窝,是典型的韧性断裂;当Ag元素的添加量(质量分数)为0.5%～1.0%时,钎料的润湿性能下降,当Ag元素的添加量(质量分数)增加到1.0%时,焊点的力学性能有所下降,在断口的韧窝底部有大颗的Cu-Zn,Ag-Zn金属间化合物.因此,Sn-9Zn无铅钎料中合金元素Ag的最佳添加量(质量分数)为0.3%.     

Sn-Zn-Ga-xPr钎料组织与性能

研究了添加合金元素Ga及稀土元素Pr对Sn-Zn钎料组织与性能的影响.适量添加镨,可以提高钎料的润湿性能;但当镨含量超过0.12%(质量分数)时,镨会在钎料表面形成氧化渣,恶化钎料的润湿性能.镨的添加可以改善焊点的力学性能,抗剪强度在镨含量为0.08%时增加至最大.镨加入后细化了钎料基体中的富锌相,当镨含量不超过0.08%时,界面层平整且厚度变化不大,但若稀土添加过量,则界面层会明显增厚.镨在Sn9Zn0.5Ga钎料中的最佳添加量为0.08%左右.     

Sn-3.5Ag-2Bi无铅焊料的压入蠕变性能

测试了Sn-3．5Ag-2Bi无铅焊料的压入蠕变应力指数n、蠕变激活能Q及其结构常数A,推导了压入蠕变稳态蠕变速率的本构方程,总结了压入蠕变随温度和应力的变化规律以及蠕变塑性变形机制,并初步探讨提高Sn-3．5Ag-2Bi无铅焊料抗蠕变性能的有效途径。结果表明：Sn-3．5Ag-2Bi无铅焊料的应力指数（n）为3．304、蠕变激活能（Q）为61．181kJ／mol,材料的结构常数（A）为0．679;并得出压入蠕变稳态蠕变速率的本构方程：压入蠕变的位移量随温度的升高和应力的增加有规律地变大：通过分析其蠕变前后的微观结构和组织的变化,认为Sn-3．5Ag-2Bi无铅焊料蠕变塑性变形机制主要由位错滑移和位错攀移共同控制。     

Factors of effecting creep rupture of SMT solder joints

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应变率对无铅焊锡接点力学行为的影响

对150℃条件下经过0,72,288,500 h等温时效的Cu/Sn3.0Ag0.5Cu/Cu焊锡接点试样进行了应变率为2×10^-4,2×10^-2和2 s^-1的拉伸试验,研究了时效时间和应变率对焊锡接点抗拉强度和破坏模式的影响.结果表明,应变率对焊锡接点的抗拉强度有明显强化作用,抗拉强度随应变率的升高而增大.应变率从低到高的过程中,焊锡接点的破坏模式由焊料内部的韧性断裂逐渐转变为界面金属间化合物(intermetallic compound-IMC)层内的脆性断裂.     

SMT炉后晶体管类元件无铅焊点的自动光学检测算法

基于3CCD彩色相机和3色(红、绿、蓝)LED阵列环形结构光源获取的无铅焊点图像,其图像的颜色分布反映焊点的三维特征.通过分析晶体管类元件的无铅焊点图像,提取出无铅焊点的区域特征、数字特征和逻辑特征;在这些特征的基础上,设计了一种检测炉后晶体管类元件无铅焊点的自动光学检测(AOI)算法.该算法提取的特征较全面地反映了无铅焊点的信息,适用于表面贴装技术(SMT)炉后晶体管类元件无铅焊点的检测.结果表明,此算法可有效地检测多锡、少锡、无锡、假焊、偏移、桥接、缺件等晶体管类元件常见的无铅焊点缺陷.

Abstract：

The color distribution of lead-free solder joint image, which is acquired by a 3-color (red, green, and blue) hemispherical LED arrays light resource and a 3-CCD color camera, can express the 3 dimensional shape of the solder joint. The region features, digital features and logical features are extracted from the solder joint image. Base on these features, an automatic optical inspection (AOI) algorithm for transistor lead-free solder joints is presented. The features obtained in the algorithm reflect the shape information of the lead-free solder joint properly, which can be applied to inspect the quality of the transistor lead-free solder joints in surface mounted technology (SMT). The experiment and analysis results show that the proposed method can effectively identify the lead-free solder joint defects of the transistor, such as surplus solder, lacking solder, no solder, riseudo solder, shift, bridging and component absent.     

电迁移对低银无铅微尺度焊点力学行为的影响

研究了电迁移条件下不同电流密度(0.63~1.0×104 A/cm2)和通电时间(0~48 h)对低银无铅Sn-Ag-Cu微尺度焊点的拉伸力学行为的影响. 结果表明,电迁移导致了低银无铅微尺度焊点的抗拉强度显著降低,并且随着电流密度的增加或通电时间的延长,焊点的抗拉强度均呈下降趋势;同时电迁移还导致焊点的拉伸断裂模式发生明显变化,在经历高电流密度或长时间通电的电迁移后,焊点在服役条件下会发生由韧性断裂向脆性断裂的转变. 此外含银量高的微尺度焊点的抗电迁移性能更强.     

Plastic characterization and performance of SnAgCuBiNi/Cu lead-free BGA solder joints

Nanoindentation test is performed on study the plastic and creep properties of the Sn-Ag-Cu (SAC) lead-free ball grid array (BGA) solder joints. The dynamic hardness of two kinds of solder joints decreases with indentation depth increase. SAC0705BiNi/Cu exhibits a higher ultimate dynamic hardness and a smaller indentation depth than SAC305/Cu. Then the strain hardening phenomenon of SAC305/Cu is more obvious compared to that of SAC0705BiNi/Cu. The indentation creep of SAC0705BiNi/Cu solder joint is lower than that of SAC305/Cu solder joint before and after thermal shock. The creep rate sensitive index of SACBiNi/Cu solder joint is lower than that of solder joint. SAC0705BiNi/Cu solder joint is superior to SAC305/Cu solder joint in the anti-creep property. The plasticity of SAC0705BiNi/Cu and SAC305/Cu solder joints are similar. Compared with SAC305 solder, the SAC0705BiNi solder performs higher hardness and solder creep resistance and still maintains a good plasticity.     

High temperature reliability of lead-free solder joints in a flip chip assembly

The visco-plastic behaviour of solder joints of two models of a flip chip FC48D6.3C457DC mounted on a printed circuit board (PCB) via SnAgCu solder is investigated using Anand's model. While the bumps of one of the models are realistic with 6 μm thickness of intermetallic compound (IMC) at interconnects of solder and bond pads, the other are made up of conventional bumps without IMC at these interconnects. The solder bump profiles were created using a combination of analytical method and construction geometry. The assembled package on PCB was accelerated thermally cycled (ATC) using IEC standard 60749-25. It was found in the result of the simulation that IMC does not only impact solder joint reliability but also is a key factor of fatigue failure of solder joints. The IMC sandwiched between bond pad at chip side and solder bulk is the most critical and its interface with solder bulk is the most vulnerable site of damage. With reference to our results, it is proposed that non inclusion of IMC in solder joint models composed of Sn-based solder and metalized copper substrate is one of the major causes of the discrepancy on solder joint fatigue life predicted using finite element modelling and the one obtained through experimental investigation.     

BGA无铅焊点在跌落冲击载荷下的失效模式与机理

通过PCB组件跌落试验,探究了BGA封装的失效模式和失效机理;分析了焊球中裂纹的产生机理及扩展特点.结果表明,BGA封装失效的主要原因是焊球裂纹和PCB结构性断裂.焊球裂纹主要有两种,分别位于焊球顶部和根部,且产生机理不同.焊球顶部由于重力导致局部钎料不足而使焊球与阻焊膜之间产生间隙,进而形成裂纹;焊球根部则是由于残留助焊剂与焊球和阻焊膜之间存在间隙,在载荷作用下形成裂纹.裂纹的扩展与裂纹源的初始位置、方向及应力情况有关,焊盘与焊球的相对位置对裂纹的扩展有重要影响.     

等温时效对SnCuTi/Cu无铅焊点界面反应及力学性能的影响

研究了在125℃时效过程中,Sn-0.7Cu-0.008Ti/Cu焊点界面IMC的生长及抗剪强度的变化。结果表明,Sn-0.7Cu-0.008Ti/Cu焊点界面IMC厚度在时效过程中不断增加,并且与时效时间呈抛物线函数关系;界面IMC形貌由扇贝状转变为波浪状,相组成由单一的Cu6Sn5相转变为Cu6Sn5+Cu3Sn的分层组织。相同时效条件下,钎焊间隙对界面IMC的生长影响不大。焊点的抗剪强度随时效时间的增加而逐渐降低,但微量Ti的加入可明显改善焊点的力学性能。