功能梯度薄膜的脉冲激光沉积研究进展

介绍了功能梯度薄膜材料的特点和应用 ;比较了功能梯度薄膜常用制备方法 ;概括了功能梯度薄膜制备中的掺杂技术并给出了脉冲激光沉积功能梯度薄膜的模型 ;论述了脉冲激光沉积技术在制备功能梯度薄膜材料方面的应用与最新进展     

脉冲激光沉积高性能薄膜制备及其应用研究进展

随着脉冲激光器的飞速发展和成本下降,利用脉冲激光沉积制备高性能薄膜逐渐成为近年来的一个研究热点,被广泛应用于多个领域。本文首先概述了脉冲激光沉积的基本原理和特点;然后从材料体系的角度系统地综述了近年来脉冲激光沉积高性能薄膜的研究现状,详细地介绍了脉冲激光沉积制备的金属薄膜、合金薄膜、碳薄膜、化合物薄膜以及复合薄膜的工艺、结构、形貌和性能特点,继而对薄膜沉积技术在光电、新能源、生物、超导、电子封装等重点和新兴领域的应用现状进行介绍;最后对脉冲激光技术制备高性能薄膜进行了总结和展望。     

PZT/LaNiO3/ LaAlO3结构制备及性能研究

利用激光脉冲法在LaAlO3衬底上沉积制备LaNiO3薄膜作为底电极材料,其上利用射频磁控溅射制备了PZT铁电薄膜。试验分析了LaNiO3表面结构和形貌,采用快速退火法在不同温度下对样品进行了热处理,发现在500℃即得到（100）取向、晶化完全的PZT薄膜,而性能测试表明,600℃下晶化的样品表现出非常优异的介电和铁电性能,电滞回线完全饱和而且形状对称,剩余极化和矫顽场分别为28.3μC/cm^2和54.1 kV/cm。     

铁酸铋薄膜柔性化微纳制造及铁电性能

研究了铁酸铋薄膜的柔性化可控制造方法及其电畴调控动态。利用脉冲激光沉积法制备了周期性畴结构的铁酸铋薄膜,结合可控剥离技术,完成了铁酸铋薄膜从刚性基底到柔性基底的制备过程。利用原子力显微镜和压电力显微镜技术对柔性化铁酸铋薄膜的微观形貌和铁电特性进行表征。结果表明,柔性化后的铁酸铋薄膜保持完整的表面形貌特征(粗糙度保持不变),电畴反转特性保持可调,且保持良好的铁电特性及电畴反转响应。该研究为铁酸铋薄膜的柔性化制备提供了一种新思路。     

脉冲激光沉积法制备二氧化钒薄膜的研究进展

主要阐述了脉冲激光沉积(PLD)技术在制备金属氧化物方面的物理过程和技术特点,详细介绍了脉冲激光沉积制备二氧化钒(VO2)薄膜的工艺参数和同内外研究进展,并与几种常规制备方法进行了对比,给出了脉冲激光沉积掺杂对VO2溥膜特性的影响,以及脉冲激光沉积制备VO2纳米材料,讨论了脉冲激光沉积制备VO2薄膜存在的问题和发展方向.     

我国第一台激光分子束外延设备和关键技术研究通过专家鉴定和国家基金委验收

薄膜研究是近些年来迅速发展的科学技术领域之一，尤其是原子尺度人工超晶格材料的生长，引起了对凝聚态物理和材料科学研究与应用的极大重视与兴趣。脉冲激光沉积被公认为是应用面最广和最好的制膜方法之一。但普通脉冲激光沉积制备的薄膜，存在表面颗粒，难以精确控制层...     

脉冲激光溅射沉积光学增益薄膜实验研究

用脉冲激光沉积方法,以多靶交替溅射方式,在SiO2/Si基底上沉积镱铒共掺Al2O3光学薄膜,讨论了脉冲激光能量对薄膜沉积速率、表面形貌、光致发光强度的影响.在脉冲激光能量较高条件下制备出的薄膜的光致发光性能较好,脉冲激光能量较低条件下制备出的薄膜的表面形貌较均匀.综合放大器增益系数对光致发光强度和光刻工艺对薄膜表面形貌的要求,薄膜应该在合适的激光能量下制备.脉冲激光溅射沉积方法与中频磁控溅射方法相比,在抑制上转换发光方面具有优越性.     

脉冲激光沉积薄膜技术研究新进展

脉冲激光沉积薄膜是近年来发展起来的使用范围最广、最有希望的制膜技术。陈述了其原理、特点、研究方法,总结了超快脉冲激光、脉冲激光真空弧、双光束脉冲激光沉积等最新的PLD薄膜制备技术研究进展。     

SBT铁电薄膜及其脉冲准分子激光制备

采用脉冲准分子激光沉积法在Ｐｔ／Ｔｉ／ＳｉＯ２／Ｓｉ衬底上成功地制备了ＳＢＴ铁电薄膜，发现存在一个最佳沉积衬底温度约为４５０℃。在该温度下沉积的ＳＢＴ薄膜具有较饱和的方形电滞回线，其剩余极化Ｐｒ和矫顽电场Ｅｃ分别为８．４μＣ／ｃｍ２和５７ｋＶ／ｃｍ。     

脉冲激光沉积工艺

脉冲激光沉积是一种新型沉积工艺，跟其它沉积工艺相比它具有许多的优点，这是因为在沉积过程中其靶材料的相对原子浓度可保持不变，从而可制备出理想配比的沉积薄膜。本文介绍了采用这种脉冲激光沉积工艺制备而成的新型ＺｎＯ：Ｇａ透明导电薄膜，以及Ｚｎ－Ｇａ２Ｏ４和Ｙ３Ａｌ５Ｏ１２：Ｔｂ荧光薄膜。     

PLD制备铁电薄膜工艺参数的研究现状

铁电薄膜在微电子学、光电子学、集成光学和微电子机械系统等领域有着广泛的应用(前景)。脉冲激光沉积（PLD）在铁电薄膜制备方面显示出独特的优越性。介绍了PLD的原理、特点；综述了PLD工艺参数，包括衬底温度、氧气压力、靶材结构与成分、能量密度、靶基距离、缓冲膜以及退火工艺等的研究现状；展望了PLD制备铁电薄膜的应用前景。     

脉冲激光沉积技术及其应用

薄膜材料已在微电子元件、超导材料、生物材料等方面得到广泛应用,为了得到高质量的薄膜材料,脉冲激光沉积技术受到了广泛的关注。介绍了脉冲激光沉积技术的原理、特点,综述了其在制备半导体、高温超导、类金刚石、铁电、生物陶瓷薄膜等方面的应用和研究现状,展望了该项技术的应用前景。     

X‐Band Phased Array Antenna Using Ferroelectric (Ba,Sr)TiO3 Coplanar Waveguide Phase Shifter

A phased array antenna was fabricated using four‐element ferroelectric phase shifters with a coplanar waveguide (CPW) transmission line structure based on a Ba0.6Sr0.4TiO3(BST)/MgO structure. Epitaxial BST films were deposited on MgO (001) substrates by pulsed laser deposition. To attain the large differential phase shift and small losses for a ferroelectric CPW phase shifter, an impedance‐matching‐part adding technique between the effective transmission line and connecting cable was used. The return loss and insertion loss for this technique‐adapted BST CPW device were improved with respect to those for a normal BST CPW device. For an X‐band phased array antenna system consisting of ferroelectric BST CPW phase shifters, power divider, dc block, patch antenna, and programmed dc power, the steering beam could be tilted by 15° in either direction.     

脉冲激光沉积法制备PZT铁电薄膜及衬底温度对膜的影响

采用脉冲激光沉积法在Si(10 0 )衬底上制备了Pb(Zr0 .52 Ti0 .4 8)O3 铁电薄膜 ,并用X射线衍射 (XRD) ,扫描电镜 (SEM )对其结构、形貌以及结构随沉积时衬底温度的变化进行了研究。由脉冲激光制备薄膜的机制出发 ,从PbO ,ZrO2 和TiO2 熔融体的化学反应及应力造成能量释放引起的相变两方面分析了铅基铁电薄膜制备时衬底温度的影响。     

Functional Perovskites – From Epitaxial Films to Nanostructured Arrays

Functional perovskite materials gain increasing significance due to their wide spectrum of attractive properties, including ferroelectric, ferromagnetic, conducting and multiferroic properties. Due to the developments of recent years, materials of this type can conveniently be grown, mainly by pulsed laser deposition, in the form of epitaxial films, multilayers, superlattices, and well‐ordered arrays of nanoislands. These structures allow for investigations of preparation–microstructure–property relations. A wide variation of the properties is possible, determined by strain, composition, defect contents, dimensional effects, and crystallographic orientation. An overview of our corresponding work of recent years is given, particularly focusing on epitaxial films, superlattices and nanoisland arrays of (anti)ferroelectric and multiferroic functional perovskites.     

Strain as a Global Factor in Stabilizing the Ferroelectric Properties of ZrO2

Since the discovery of ferroelectricity in doped HfO₂ and ZrO₂ thin films over a decade ago, fluorite-structured ferroelectric thin films have attracted much research attention due to their excellent scalability and complementary metal-oxide semiconductor compatibility compared to conventional perovskite ferroelectric materials. Although various factors influencing the formation of the ferroelectric properties are identified, a clear understanding of the causes of the phase formation have been difficult to determine. In this work, ZrO₂ films deposited by atomic layer deposition and chemical solution deposition have resulted in films with completely different structural properties. Regardless of these differences, a general relationship between strain and phase formation is established, leading to a more unified understanding of ferroelectric phase formation in undoped ZrO₂ films, which can be applied to other fluorite-structured films.     

准分子激光扫描淀积PZT/YBCO结构铁电薄膜

利用脉冲准分子激光（工作气体ＸｅＣｌ，波长３０８ｎｍ，脉宽２８ｎｓ）在外延ＹＢＣＯ／ＬａＡｌＯ３（１００）单晶基片上淀积了Ｐｂ（Ｚｒ０．５５Ｔｉ０．４５）Ｏ３铁电薄膜，ＹＢＣＯ薄膜既为生长高取向ＰＺＴ薄膜提供了晶体匹配条件，同时也为ＰＺＴ铁电薄膜提供了下电极。讨论了工艺参数对晶相结构和表面形貌的影响。用Ｘ射线衍射表征了该多层膜的晶相结构，扫描电镜观察其表面形貌。ＰＺＴ铁电薄膜的剩余极化为２１μＣ／ｃｍ２，矫顽场为６５ｋＶ／ｃｍ。     

Synthesis of the PZT films deposited on pt-coated (100) Si substrates for nonvolatile memory applications

Ferroelectric lead-zirconate-titanate (PZT) thin films were deposited by the pulsed laser deposition technique on Pt-coated (100) Si substrates. This study was focused on the investigation of the PZT film growth on (100) Si substrate at varying deposition parameters and electrical characterization of the films including hysteresis loop and fatigue properties by RT66A Standardized Ferroelectric Test System. PZT deposited at higher temperature (575°C in 450 mTorr O₂ partial pressure) showed the best crystalline structure. The remnant polarization and the retained polarization of the ferroelectric capacitors were 13 μC/cm² and 20 μC/cm², respectively. The crystallographic properties of the films were determined using the x-ray diffractometer method. The cross-sectional transmission electron microscope results showed very smooth interfaces among different layers of films.     

层状结构铁电薄膜中频率对界面电位降的影响

利用准分子激光原位沉积方法制备了层状结构铁电薄膜,借助HP4192A低频率阻抗分析仪对样品的C－V特性进行了测试,对同一频率下不同结构的铁电薄膜的界面电压降及不同频率下同一结构的铁电薄膜的界面电压降进行计算。结果表明,在同一频率下不同结构的铁电薄膜其界面电压降不同,同一结构的多层铁电薄膜在不同频度下其界面电压降也不同。不同的耗尽层厚度导致了界面电压降的不同。