带2阶温度补偿的多输出带隙基准电压源

基于传统带隙基准的原理,通过优化电路结构,消除双极晶体管基极．发射极电压中的非线性项,设计了一种带2阶补偿的多输出带隙基准电压源。整个电路采用CSMC0．5μmCMOS工艺模型进行仿真。Spectre仿真结果表明,在-55～125℃的温度范围内,带隙基准电压源的温度系数为3．1ppm／℃,在5V电源电压下,输出基准电压为1．2994V;带隙基准电压源的电源抑制比在低频时为84．5dB;在5v电源电压下,可以同时输出0—5V多个基准电压。     

一种可减小工艺影响的带隙基准电压源

提出了一种新颖的基准电压源结构,有效地减小了运算放大器由于工艺偏差给基准电压源带来的影响。该电路在面积上与现有传统结构基本相同,并且具有与传统结构相同的温度补偿系数和良好的电源抑制比(PSRR)。     

一种高电源抑制比全工艺角低温漂CMOS基准电压源

基于SMIC0.35μm的CMOS工艺,设计了一种高电源抑制比,同时可在全工艺角下的得到低温漂的带隙基准电路。首先采用一个具有高电源抑制比的基准电压,通过电压放大器放大得到稳定的电压,以提供给带隙核心电路作为供电电源,从而提高了电源抑制比。另外,将电路中的关键电阻设置为可调电阻,从而可以改变正温度电压的系数,以适应不同工艺下负温度系数的变化,最终得到在全工艺角下低温漂的基准电压。Cadence virtuoso仿真表明:在27℃下,10 Hz时电源抑制比(PSRR)-109 dB,10 kHz时(PSRR)达到-64 dB;在4 V电源电压下,在-40～80℃范围内的不同工艺角下,温度系数均可达到5.6×10-6V/℃以下。     

用于高分辨率ADC的高精度可编程带隙电压参考设计

A programmable high precision bandgap reference is presented, which can meet the accuracy requirements for all technology corners while a traditional bandgap reference cannot.This design uses SMIC 0.18 μm 1P4M CMOS technology.The theoretically achievable temperature coefficient is close to 0.69 ppm/°C over the whole temperature range.     

Low voltage bandgap reference with closed loop curvature compensation

A new low-voltage CMOS bandgap reference (BGR) that achieves high temperature stability is proposed. It feeds back the output voltage to the curvature compensation circuit that constitutes a closed loop circuit to cancel the logarithmic term of voltage VBE. Meanwhile a low voltage amplifier with the 0.5μm low threshold technology is designed for the BGR. A high temperature stability BGR circuit is fabricated in the CSMC 0.5μm CMOS tech-nology. The measured result shows that the BGR can operate down to 1 V, while the temperature coefficient and line regulation are only 9 ppm/℃ and 1.2 mV/V, respectively.     

闭环曲率补偿的低电源电压带隙基准源

A new low-voltage CMOS bandgap reference （BGR） that achieves high temperature stability is proposed. It feeds back the output voltage to the curvature compensation circuit that constitutes a closed loop circuit to cancel the logarithmic term of voltage VBE. Meanwhile a low voltage amplifier with the 0.5 μm low threshold technology is designed for the BGR. A high temperature stability BGR circuit is fabricated in the CSMC 0.5μm CMOS technology. The measured result shows that the BGR can operate down to 1 V, while the temperature coefficient and line regulation are only 9 ppm/℃ and 1.2 mV/V, respectively.     

一种1.8 ppm/℃曲率补偿BiCMOS带隙基准源

介绍了一种基于BiCMOS工艺的新型温度补偿技术。该技术充分利用了PN结反向饱和电流是温度敏感函数的特性,使用简单的电路结构,达到了很好的温度特性和电源抑制性能。该电路结构产生的带隙基准电压在-40~125℃范围内使用HSPICE进行仿真,得到的温度系数仅有1.8 ppm/℃。     

闭环曲率补偿的低电源电压带隙基准源的设计

这篇文章提出了一种低电源电压高温度稳定性的带隙基准源.这种基准源主要思路是将输出基准电压反馈回曲率补偿回路,从而建立了一个闭环反馈回路.在这个闭环回路中,一方面,输出电压的温度系数越低,补偿电路就可以产生更准确地补偿电流,从而更加完全的抵消掉具有温度依赖的对数项;另一方面,如果补偿电路将对数项抵消得更彻底,输出电压的温度系数就会更低,这就形成了一种静态的正反馈.因而通过不断的调节补偿电阻,可以完全抵消掉对数项,实现高温度稳定性的基准源.同时利用电平移位技术为基准源设计了一个适合低电压工作的运算放大器.基于标准的0.18μmCMOS工艺设计了一种基准源电路.仿真结果表明这种基准源可以工作在电源电压从0.8V到1.8V,输出基准电压Vref的电压偏差只有0.87mV/V,在-20到80度温度范围内,Vref的温度系数为0.63ppm/oC.     

An integratable second-order compensated bandgap reference for 1V supply

A new systematic approach is used for the design of bandgap references. A linear combination of two base-emitter voltages is taken to compensate implicitly for the temperature behavior of these base-emitter voltages. To reach optimum circuit performance with respect to accuracy and power, systematic design procedures are used. The realized bandgap reference circuit is completely integratable and operates from a supply voltage of only 1V. The output voltage is approximately 194 mV and has an average temperature dependency of 1.5ppm/°C in the range of 0°C to 100°C. The circuit has been realized in a bipolar process withf _t 5 GHz. The total amount of capacitance is approximately 150 pF and the current consumption is about 100µA.     

低温漂带隙基准源及驱动电路设计

基于标准N阱CMOS工艺设计了一种带隙基准电压产生及输出驱动转换电路。该电路采用0.6μmCSMC-HJN阱CMOS工艺验证,HSPICE模拟仿真结果表明电路输出基准电压为1.25V左右;在–55℃～125℃温度范围内的典型工艺参数条件下,电路温度系数仅为7×10-6/℃;电源电压范围为4V￣6V,在产生标称1.25V基准电压的同时,可以为负载提供1mA￣2mA的电流驱动能力。     

Ultra-low-power temperature compensated voltage reference generator

A CMOS voltage reference generator, based on the difference between the gate-source voltages of two NMOS transistors, has been implemented with AMS 0.35 μm CMOS technology (V_thn=0.45 and at 0 °C). The minimum and maximum supply voltages that ensure the correct operation of the reference voltage generator, are 1.5 and 4.3 V, respectively. The supply current at the maximum supply voltage and at 80 °C is 2.4 μA. A temperature coefficient of 25 ppm/°C and a line sensitivity of 1.6 mV/V are achieved. The power supply rejection ratios without any filtering capacitor at 100 Hz and 10 MHz are larger than −74 and −59 dB, respectively. The occupied chip area is 0.08 mm².     

基于温度补偿的无运放低压带隙基准源设计

设计了一种带温度补偿的无运放低压带隙基准电路。提出了同时产生带隙基准电压源和基准电流源的技术,通过改进带隙基准电路中的带隙负载结构以及基准核心电路,基准电压和基准电流可以分别进行温度补偿。在0.5μmCMOS N阱工艺条件下,采用spectre进行模拟验证。仿真结果表明,在3.3V条件下,在-20～100℃范围内,带隙基准电压源和基准电流源的温度系数分别为35.6ppm/℃和37.8ppm/℃,直流时的电源抑制比为-68dB,基准源电路的供电电压范围为2.2～4.5V。     

一种高PSR CMOS带隙基准电路设计

为了降低芯片电路功耗,电源电压需要不断的减小,这将导致电源噪声对基准电压产生严重影响。为此针对这一问题进行相关研究,采用SMIC 0.18μm工艺,设计出一种低功耗、低温度系数的高PSR带隙基准电压源。仿真结果表明,该设计带隙基准源的PSR在50 kHz与100 kHz分别为-65.13 dB和-53.85 dB;在2⁶ V电源电压下,工作电流为30μA,温度系数为30.38 ppm/℃,电压调整率为71.47μV/V。该带隙基准适用于在低功耗高PSR性能需求的LDOs电路中应用。     

无电阻低压低温漂的CMOS基准电压源

结合工作在亚阈值区、饱和区和线性区的MOS管,提出一种纯MOS结构的基准电压源,其结构能有效补偿MOS管的栽流子迁移率和亚闽值斜率的温度系数。基于SMIC0．13μm的CMOS工艺的仿真结果表明,在-5-90℃的范围内。输出电压的温度系数为5ppm／℃。在室温时,整个电路能在低到0．9V的电源电压下工作并消耗0．68μW的功耗。     

一种低温漂低功耗的简易带隙基准电压设计

电压基准在模拟电路中提供一个受电源或温度等影响较小的参考电压,以保证整个电路正常工作。设计了一种低温漂低功耗带隙基准电压源,采用不受电源影响的串联电流镜做偏置．利用PTAT电压的正向温度系数和基极发射极电压的负向温度系数特性,以适当的系数加权构造零温度系数的电压量。该设计避开了运放的应用．结构简易,原理清晰,便于入门级的同学在短时间内学习掌握。0-70℃范围内,温漂系数为16．4ppm／℃。供电电压在5-6V范围内变化时,电源抑制比达57．7dB。总输出噪声为140．3μV,功耗为300．6μW。     

A high precision programmable bandgap voltage reference design for high resolution ADC

temperature coefficient is close to 0.69 ppm/℃ over the whole temperature range.     

Optimization of SiGe bandgap-based circuits for up to 300 °C operation

An investigation of the performance and reliability issues associated with operating silicon-germanium (SiGe) devices and circuits at temperatures up to 300 °C is presented, along with a new bypass compensation technique for optimizing bandgap reference performance at these extreme temperatures. In addition to the device-level characterization of a SiGe BiCMOS platform, improved circuit design and a device-level collector-substrate leakage suppression technique are shown to improve the viability of SiGe bandgap reference (BGR) circuits on low-cost, bulk Si wafers for high temperature applications. A shunting technique using various transistors to further improve BGR performance above 200 °C is presented, and optimized compensation designs predict new performance records for a bulk-silicon based technology across temperatures from −200 °C to 300 °C. Finally, a closely-related SiGe temperature sensor circuit is characterized for operating environments up to 300 °C.     

An ultra-low-power CMOS voltage reference generator based on body bias technique

A CMOS voltage reference, based on body bias technique, has been proposed and simulated using SMIC 0.18 μm CMOS technology in this paper. The proposed circuit can achieve a temperature coefficient of 19.4 ppm/°C in a temperature range from −20 °C to 80 °C, and a line sensitivity of 0.024 mV/V in a supply voltage range from 0.85 V to 2.5 V, without the use of resistors and any other special devices such as thick gate oxides MOSFETs with higher threshold voltage. The supply current at the maximum supply voltage and at 27 °C is 214 nA. The power supply rejection ratio without any filtering capacitor at 10 Hz and 10 kHz are −88.2 dB and −36 dB, respectively.     

低功耗低温漂高PSR带隙基准电压源的设计

在专用医学微弱信号放大电路中,需要非常精准的电压源,为此,提出了一种新型的带隙基准电压源,采用低温补偿和高温补偿相结合的温度补偿方式,输出带隙基准电压为1.109 V,在-40~125℃范围内的温度系数为0.445~0.604 ppm/℃。同时采用了预稳压器来提高电路的PSR(电源抑制),使得PSR在10 Hz时为-127.5 dB,在100 kHz时达到-63 dB。文中设计的电路静态电流只有10μA,消耗的功耗在36μW左右。该带隙基准电路还有不随工艺变化的特点,工艺差别使输出电压最大产生61.5μV的变化。