共查询到19条相似文献,搜索用时 209 毫秒
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风能和太阳能发电系统中的储能电池 总被引:4,自引:0,他引:4
根据风能和太阳能发电系统的特殊性及其对储能装置的要求,比较了密封铅蓄电池、镍镉电池、镍金属氢化物电池、锂离子电池的长处和短处;介绍了正在开发研制的钠硫电池,氧化还原电池和超级电容器;同时还列出了胶体密封铅蓄电池的应用实例。显而易见,胶体密封铅蓄电池是风能和太阳能发电系统的最合适的储能装置。钠硫电池、氧化还原电池和超级电容器有待进一步开发研究。 相似文献
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为了提高钠硫电池的安全性,从单体电池结构、成组技术、安全防护、监测控制四个方面对钠硫电池安全性的影响因素进行了分析.分析结果表明,通过增加安全管来优化单体纳硫电池的结构,能够使单体钠硫电池在发生β氧化铝陶瓷管破损的极端情况下外观完好,无活性物质泄漏.应用云母防火、干沙吸收、分区隔离等成组技术,可以进一步提高钠硫电池的安... 相似文献
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介绍储能技术分类及其在电力系统中的应用,对抽水蓄能、压缩空气、飞轮、超导、超级电容器、二次电池、液流电池和钠硫电池储能技术的特性进行了分析和比较,阐述了各种储能技术的适用领域。 相似文献
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Yamamoto T. Okubo M. Nagaoka T. Hayakawa K. 《Industry Applications, IEEE Transactions on》2002,38(5):1168-1173
In previous studies, the authors confirmed that the plasma-chemical combined hybrid process for controlling NO flue gas emission was extremely effective and economical in comparison with the conventional selective catalytic reduction (SCR) system and other technologies. In the present study, we carried out experiments on the simultaneous removal of NO/sub x/ and SO/sub x/ at elevated temperature using the plasma-chemical hybrid process. A series of experiments was performed to quantify all the reaction byproducts such as N/sub 2/O, CO, HNO/sub 2/, HNO/sub 3/, NO/sub 3//sup -/, and SO/sub 4//sup -/ to evaluate the simultaneous NO/sub x/ and SO/sub x/ removal efficiency. The oxidation from NO to NO/sub 2/ without decreasing NO/sub x/ concentration (i.e., minimum reaction byproducts) and with least power consumption is the key for the optimum operation of the plasma reactor. The produced NO/sub 2/ was totally converted to N/sub 2/ and Na/sub 2/SO/sub 4/ with Na/sub 2/SO/sub 3/ or Na/sub 2/S with and without NaOH using the barrier-type packed-bed plasma reactor followed by the packed-column chemical reactor. The NO/sub 2/ reduction was more effective for Na/sub 2/S than Na/sub 2/SO/sub 3/ but produces H/sub 2/S with Na/sub 2/S. For both cases at least five times the stoichiometric amount of chemicals were required for complete NO/sub 2/ reduction. Nearly 100% of NO/sub x/ and SO /sub 2/ and 40% Of CO/sub 2/ simultaneous removal were achieved with less than 5 ppm of N/sub 2/O and CO. The operating cost was less than 1/4 the SCR process. The additional SO/sub 2/ treatment system can be eliminated. 相似文献
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针对生物质中Cl和碱金属含量高的特点,研究生物质与煤混燃过程中Hg的氧化机制。使用化学热力学软件Chemical Equilibrium with Applications(CEA)建立C/H/O/N/S/Cl/K/Na模型,分析碱金属元素K、Na与非金属元素Cl和S的反应,发现1100K以下Cl仍然主要以HCl形式存在,SO2的含量逐渐减少,碱金属主要以碱金属硫酸盐(A2SO4)的形式存在,这对Hg的氧化反应变得更为有利,同时随着生物质的添加,这种趋势更为明显。同时使用动力学软件Chemkin4.1构建了Hg/C/H/O/N/S/Cl/K/Na的化学和气相平衡模型,进一步研究了生物质与煤混燃过程中对Hg氧化的影响。计算结果表明,生物质与煤之比越高,对Hg的氧化越有利,生物质中高含量的Cl是促进Hg氧化最主要的因素,而K、Na的存在对Hg的氧化有进一步的促进作用,这进一步证实了热力学计算结果。 相似文献
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Salman A.A. Gauthier R. Putnam C. Riess P. Muhammad M. Min Woo Ioannou D.E. 《Device and Materials Reliability, IEEE Transactions on》2003,3(3):79-84
Historically, the failure mode of the nMOS/lateral n-p-n (L/sub npn/) bipolar junction transistor (BJT) due to electrostatic discharge (ESD) is source-to-drain filamentation, as the temperature exceeds the melting temperature of silicon. However, as the gate-oxide thickness shrinks, the ESD failure changes over to oxide breakdown. In this paper, transmission line pulse (TLP) testing is combined with measurements of various leakage currents and numerical simulations of the electric field to examine the failure mode of an advanced 0.1-/spl mu/m CMOS technology, which is shown to be through gate-oxide breakdown. It is also shown by I/sub D/-V/sub G/ and I/sub G/-V/sub G/ measurements that the application of nondestructive ESD pulses causes gradual degradation of the oxide well before failure is reached, under the (leakage current) failure criteria used. Finally, the latent effects of stress-induced oxide degradation on the failure current I/sub f/ of the nMOS/L/sub npn/ are studied, and it is shown that as the device ages from an oxide perspective, its ESD protection capabilities decrease. 相似文献
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Na~+对PEMFC Pt/C气体扩散电极的影响 总被引:1,自引:1,他引:0
采用燃料电池半电池体系模拟了质子交换膜燃料电池(PEMFC)中Na+污染气体扩散电极时的工况,研究了Na+对PEMFC常用的Pt/C气体扩散电极性能的影响.通过循环伏安曲线和电化学阻抗谱,测试了电极在Na+污染前后催化层电化学比表面积(ECA)和电极反应界面上的电荷转移电阻发生的变化.实验结果表明,随Na+污染浓度的增大,电极性能逐渐下降;污染后电极催化层电化学活性比表面积出现明显减少,当污染物浓度为10 000X 10-6时,ECA降低了43%;外加相同电位时,随Na+污染的增加,电极反应界面上的电荷转移电阻逐渐增大.Na+的存在对Pt/C气体扩散电极具有明显毒化作用. 相似文献
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《Device and Materials Reliability, IEEE Transactions on》2009,9(1):20-30
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Selvarajoo T.A.L. Ranjan R. Kin-Leong Pey Lei-Jun Tang Chih Hang Tung Wenhe Lin 《Device and Materials Reliability, IEEE Transactions on》2005,5(2):190-197
The breakdown phenomena in SiO/sub x/N/sub y/ (EOT=20 /spl Aring/) gate dielectric under a two- stage constant voltage stress in inversion mode are physically analyzed with the aid of transmission electron microscopy. The results show that dielectric-breakdown-induced epitaxy (DBIE) remains as one of the major failure defects responsible for gate dielectric breakdown evolution even for a stress voltage as low as 2.5 V. Based on the results, the same failure mechanism i.e., presence of DBIE would be responsible for the degradation in ultrathin gate dielectrics for gate voltage below 2.5 V. It is believed that DBIE will be present in MOSFETs failed at nominal operating voltage. 相似文献
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研究了手机中失效振子连接器镀金触点后发现,接触表面污染、连接器制造及表面镀层材料缺陷是造成电接触故障的主要原因。表面污染物来自于尘土颗粒和微动磨损,主要集中在印制电路板(PCB)一侧,其成分包括C、O、S i、A l、S、C l、Na、N i等多种元素。测试结果表明,污染表面多达86%的测量点的接触电阻超过设计标准。随后通过有限元建立振子连接器模型进行模态分析,结果表明连接器固有频率与其工作振动频率相接近,容易引起触点接触正压力的降低和磨损加速,降低了振子连接器的接触可靠性。 相似文献