钠硫电池硫极预制结构对电性能退化的影响

讨论了3种不同硫极预制结构对钠硫电池充放电性能及电池退化性能的影响.实验表明;钠硫电池的充放电性能与硫极结构材料、纤维走向、材料与硫和多硫化钠的润湿性有关.采用石墨毡内村氧化铝纤维的硫极冷装结构,能缓和电极极化,提高电池充电性能,延长电池寿命.     

30Ah实用型单体钠硫电池的研制

研制成功３０Ａｈ实用型单体钠硫电池，研究了电池的性能特征和寿命，该电池具有放电电流大（１０～１８Ａ）容量大、比能量大（１３０Ｗｈ／ｋｇ）、放电容量与放电率无关、安全可靠等特点，放电深度达到８０％，最高寿命超过８００次循环（约２４０００Ａｈ）。研究了电池工作电流与温度变化的关系。电池退化表征为：随寿命增大，电池内阻上升，容量下降。导致电池退化和失效的主要因素为β″－Ａｌ２Ｏ３电解质的制备工艺和性能；电池结构和密封性；材料纯度。严格控制这三个因素是保证电池性能良好的关键     

中国钠硫电池技术的发展与现状概述

钠硫电池是一种目前深受关注的储能技术。简要介绍了钠硫电池的工作原理以及该技术在国外的发展历史,重点介绍了我国近年来上海硅酸盐研究所与上海市电力公司合作在钠硫电池储能技术方面的研究与发展情况,叙述了批量化制备的650A.h大容量储能钠硫电池的关于材料制备、电池制备、电池模块制备及组成电池储能系统等关键技术的进展概况,研制成功的100 kW/800 kW.h钠硫储能系统在上海世博会期间稳定并网运行。     

风能和太阳能发电系统中的储能电池

根据风能和太阳能发电系统的特殊性及其对储能装置的要求,比较了密封铅蓄电池、镍镉电池、镍金属氢化物电池、锂离子电池的长处和短处;介绍了正在开发研制的钠硫电池,氧化还原电池和超级电容器;同时还列出了胶体密封铅蓄电池的应用实例。显而易见,胶体密封铅蓄电池是风能和太阳能发电系统的最合适的储能装置。钠硫电池、氧化还原电池和超级电容器有待进一步开发研究。     

钠硫电池安全性影响因素分析

为了提高钠硫电池的安全性,从单体电池结构、成组技术、安全防护、监测控制四个方面对钠硫电池安全性的影响因素进行了分析.分析结果表明,通过增加安全管来优化单体纳硫电池的结构,能够使单体钠硫电池在发生β氧化铝陶瓷管破损的极端情况下外观完好,无活性物质泄漏.应用云母防火、干沙吸收、分区隔离等成组技术,可以进一步提高钠硫电池的安...     

电化学储能技术的研究进展

储能技术是一项可能对未来能源系统发展及运行带来革命性变化的技术。在众多储能技术中,技术进步最快的是电化学储能技术。以锂离子电池、钠硫电池、液流电池为主导的电化学储能技术在安全性、能量转换效率和经济性等方面均取得了重大突破,极具产业化应用前景。介绍了铅酸电池、锂离子电池、钠硫电池以及液流电池的电化学反应原理、体系特点和各材料的发展现状。     

一种锂离子电池容量退化经验模型

锂离子电池随着时间的推移,其性能逐步下降退化直至寿命终结,往往会导致系统整体功能失效,应用于军事目的将直接导致各种无人作战系统无法完成战略战术预期,失去作战能力。分析了锂离子电池电学特性,给出电池内部阻抗与容量退化的关系,提出一种根据容量退化速率优先确定整数变量的条件三参数容量退化经验模型,并通过不同退化速率的锂离子电池退化实验数据对模型的可性行及实用性加以验证,为基于数据驱动的锂离子电池寿命预测和健康管理提供理论支撑。     

钠/氯化镍高能电池

钠/氯化镍(Zebra)电池是在钠硫电池研制基础上发展起来的一种新型高能电池。本文综述了钠/氯化镍(Zebra)电池的基本原理、主要特性、研究进展和应用前景。     

面向大规模电网储能的钠基电池研究进展

讨论了钠基储能电池体系,包括钠硫电池、Na-Ni Cl2电池和钠离子电池的发展历史、研发现状,以及不同电池应用到电网储能中的优势和存在的问题,展望了钠电池储能技术的未来发展方向,在后续研究中必须进一步提高现有钠电池的性能、降低储能价格。     

大规模电力储能技术的特性与比较

介绍储能技术分类及其在电力系统中的应用,对抽水蓄能、压缩空气、飞轮、超导、超级电容器、二次电池、液流电池和钠硫电池储能技术的特性进行了分析和比较,阐述了各种储能技术的适用领域。     

LED开关电源中铝电解电容性能退化模型的研究

应用表明铝电解电容是开关电源中故障率最高的元件,是影响开关电源可靠性的最关键因素。针对LED开关电源中的铝电解电容性能退化进行了研究,首先研究了铝电解电容的失效机理,确定退化原因及其在电路模型参数上的表现形式,然后针对某实际的LED开关电源,设计了LED开关电源在线监测系统,以获取反映开关电容退化的数据。最后根据退化数据总结开关电容的退化规律,建立起开关电容的退化模型。     

Simultaneous removal of NO/sub x/, SO/sub x/, and CO/sub 2/ at elevated temperature using a plasma-chemical hybrid process

In previous studies, the authors confirmed that the plasma-chemical combined hybrid process for controlling NO flue gas emission was extremely effective and economical in comparison with the conventional selective catalytic reduction (SCR) system and other technologies. In the present study, we carried out experiments on the simultaneous removal of NO/sub x/ and SO/sub x/ at elevated temperature using the plasma-chemical hybrid process. A series of experiments was performed to quantify all the reaction byproducts such as N/sub 2/O, CO, HNO/sub 2/, HNO/sub 3/, NO/sub 3//sup -/, and SO/sub 4//sup -/ to evaluate the simultaneous NO/sub x/ and SO/sub x/ removal efficiency. The oxidation from NO to NO/sub 2/ without decreasing NO/sub x/ concentration (i.e., minimum reaction byproducts) and with least power consumption is the key for the optimum operation of the plasma reactor. The produced NO/sub 2/ was totally converted to N/sub 2/ and Na/sub 2/SO/sub 4/ with Na/sub 2/SO/sub 3/ or Na/sub 2/S with and without NaOH using the barrier-type packed-bed plasma reactor followed by the packed-column chemical reactor. The NO/sub 2/ reduction was more effective for Na/sub 2/S than Na/sub 2/SO/sub 3/ but produces H/sub 2/S with Na/sub 2/S. For both cases at least five times the stoichiometric amount of chemicals were required for complete NO/sub 2/ reduction. Nearly 100% of NO/sub x/ and SO /sub 2/ and 40% Of CO/sub 2/ simultaneous removal were achieved with less than 5 ppm of N/sub 2/O and CO. The operating cost was less than 1/4 the SCR process. The additional SO/sub 2/ treatment system can be eliminated.     

生物质与煤混燃过程中碱金属对汞氧化影响的热力学研究

针对生物质中Cl和碱金属含量高的特点,研究生物质与煤混燃过程中Hg的氧化机制。使用化学热力学软件Chemical Equilibrium with Applications(CEA)建立C/H/O/N/S/Cl/K/Na模型,分析碱金属元素K、Na与非金属元素Cl和S的反应,发现1100K以下Cl仍然主要以HCl形式存在,SO2的含量逐渐减少,碱金属主要以碱金属硫酸盐(A2SO4)的形式存在,这对Hg的氧化反应变得更为有利,同时随着生物质的添加,这种趋势更为明显。同时使用动力学软件Chemkin4.1构建了Hg/C/H/O/N/S/Cl/K/Na的化学和气相平衡模型,进一步研究了生物质与煤混燃过程中对Hg氧化的影响。计算结果表明,生物质与煤之比越高,对Hg的氧化越有利,生物质中高含量的Cl是促进Hg氧化最主要的因素,而K、Na的存在对Hg的氧化有进一步的促进作用,这进一步证实了热力学计算结果。     

ESD-induced oxide breakdown on self-protecting GG-nMOSFET in 0.1-/spl mu/m CMOS technology

Historically, the failure mode of the nMOS/lateral n-p-n (L/sub npn/) bipolar junction transistor (BJT) due to electrostatic discharge (ESD) is source-to-drain filamentation, as the temperature exceeds the melting temperature of silicon. However, as the gate-oxide thickness shrinks, the ESD failure changes over to oxide breakdown. In this paper, transmission line pulse (TLP) testing is combined with measurements of various leakage currents and numerical simulations of the electric field to examine the failure mode of an advanced 0.1-/spl mu/m CMOS technology, which is shown to be through gate-oxide breakdown. It is also shown by I/sub D/-V/sub G/ and I/sub G/-V/sub G/ measurements that the application of nondestructive ESD pulses causes gradual degradation of the oxide well before failure is reached, under the (leakage current) failure criteria used. Finally, the latent effects of stress-induced oxide degradation on the failure current I/sub f/ of the nMOS/L/sub npn/ are studied, and it is shown that as the device ages from an oxide perspective, its ESD protection capabilities decrease.     

Na~+对PEMFC Pt/C气体扩散电极的影响

采用燃料电池半电池体系模拟了质子交换膜燃料电池(PEMFC)中Na+污染气体扩散电极时的工况,研究了Na+对PEMFC常用的Pt/C气体扩散电极性能的影响.通过循环伏安曲线和电化学阻抗谱,测试了电极在Na+污染前后催化层电化学比表面积(ECA)和电极反应界面上的电荷转移电阻发生的变化.实验结果表明,随Na+污染浓度的增大,电极性能逐渐下降;污染后电极催化层电化学活性比表面积出现明显减少,当污染物浓度为10 000X 10-6时,ECA降低了43%;外加相同电位时,随Na+污染的增加,电极反应界面上的电荷转移电阻逐渐增大.Na+的存在对Pt/C气体扩散电极具有明显毒化作用.     

Geometry and Microstructure Effect on EM-Induced Copper Interconnect Degradation

Statistical analysis of electromigration (EM) lifetimes of inlaid copper interconnects, in situ microscopy experiments at embedded inlaid copper interconnect structures, and numerical simulations of grain growth and EM degradation processes are necessary for future on-chip interconnect systems with high immunity to EM-induced failure. Experimental results, i.e., statistics of lifetime and void distributions, copper microstructure data from electron backscatter diffraction studies, as well as in situ scanning electron microscopy and transmission X-ray microscopy studies of EM degradation processes, are discussed for inlaid interconnect structures, varying geometry and process conditions. EM failure statistics for a large number of interconnects and in situ studies for a selected number of samples, which allow to visualize the time-dependent evolution of voids, demonstrate that interconnect degradation and, eventually, interconnect failure depend on interface bonding and the copper microstructure. With decreasing interconnect dimensions, the copper microstructure will become more critical for interconnect reliability.      

Dielectric-breakdown-induced epitaxy: a universal breakdown defect in ultrathin gate dielectrics

The breakdown phenomena in SiO/sub x/N/sub y/ (EOT=20 /spl Aring/) gate dielectric under a two- stage constant voltage stress in inversion mode are physically analyzed with the aid of transmission electron microscopy. The results show that dielectric-breakdown-induced epitaxy (DBIE) remains as one of the major failure defects responsible for gate dielectric breakdown evolution even for a stress voltage as low as 2.5 V. Based on the results, the same failure mechanism i.e., presence of DBIE would be responsible for the degradation in ultrathin gate dielectrics for gate voltage below 2.5 V. It is believed that DBIE will be present in MOSFETs failed at nominal operating voltage.     

铅酸蓄电池失效模式

铅酸蓄电池的主要失效模式是正极板质量衰降、正极板栅的腐蚀和生长以及负极板质量衰降和硫酸化.阐述了造成铅酸蓄电池失效的原因.     

手机中振子连接器的失效分析

研究了手机中失效振子连接器镀金触点后发现,接触表面污染、连接器制造及表面镀层材料缺陷是造成电接触故障的主要原因。表面污染物来自于尘土颗粒和微动磨损,主要集中在印制电路板(PCB)一侧,其成分包括C、O、S i、A l、S、C l、Na、N i等多种元素。测试结果表明,污染表面多达86%的测量点的接触电阻超过设计标准。随后通过有限元建立振子连接器模型进行模态分析,结果表明连接器固有频率与其工作振动频率相接近,容易引起触点接触正压力的降低和磨损加速,降低了振子连接器的接触可靠性。