Microwave Plasma Chemical Vapor Deposition of Diamond Films on Silicon From Ethanol and Hydrogen

Diamond films with very smooth surface and good optical quality have been deposited onto silicon substrate using microwave plasma chemical vapor deposition(MPCVD)from a gas mixture of ethanol and hydrogen at a low substrate temperature of 450℃.The effects of the substrate temperature on the diamond nucleation and the morphology of the diamond film have been investigated and observed with scanning electron microscopy(SEM).The microstructure and the phase of the film have been characterized using Raman spectroscopy and X-ray diffraction(XRD).The diamond nucleation density significantly decreases with the increasing of the substrate temperature.There are only sparse nuclei when the substrate temperature is higher than 800℃ although the ethanol concentration in hydrogen is very high.That the characteristic diamond peak in the Raman spectrum of a diamond film prepared at a low substrate temperature of 450℃ extends into broadban indicates that the film is of nanophase.No graphite peak appeared in the XRD pattern confirms that the film is mainly composed of SP^3 carbon.The diamond peak in the XRD pattern also broadens due to the nanocrystalline of the film.     

Monte Carlo Simulation of Electron Velocity Distribution and Gas Phase Process in Electron-Assisted Chemical Vapor Deposition

The gas phase process of diamond film deposition from CH4/H2 gas mixture by electron-assisted chemical vapor deposition is simulated by the Monte-Carlo method. The electron velocity distribution under different E/P (the ratio of the electric field to gas pressure) is obtained, and the velocity profile is asymmetric. The variation of the number density of CH3 and H with different CH4 concentrations and gas pressure is investigated, and the optimal experimental parameters are obtained: the gas pressure is in the range of 2.5 kPa ~ 15 kPa and the CH4 concentration is in the range of 0.5% ~ 1%. The energy carried by the fragment CH3 as the function of the experiment parameters is investigated to explain the diamond growth at low temperature. These results will be helpful to the selection of optimum experimental conditions for high quality diamond films deposition in EACVD and the modeling of plasma chemical vapor deposition.     

Fabrication of Titanium Dioxide Thin Films by DBD-CVD Under Atmosphere

Titanium dioxide films were firstly deposited on glass substrate by DBD-CVD （dielectric barrier discharge enhanced chemical vapor deposition） technique. The structure of the films was investigated by X-ray diffraction （XRD）, scanning electron microscopy （SEM）. TiO2 films deposited under atmosphere pressure show preferred orientation, and exhibit columnar-like structure, while TiO2 films deposited under low gas pressure show no preferred orientation. The columnar-like structure with preferred orientation exhibits higher photocatalytic efficiency, since the columnar structure has larger surface area. However, it contributes little to the improvement of hydrophilicity. DBD-CVD is an alternative method to prepare photocatalytic TiO2 for its well-controllable property.     

Growth of Free-Standing Diamond Films on Stainless Steel

Free-standing diamond films have been successfully deposited on stainless steel substrates using microwave plasma-assisted chemical vapor deposition. Although iron, which is the main element of stainless steel, is known to inhibit the nucleation of diamond and enhance the formation of graphite, we were able to grow relatively thick films （-1.2 mm）. The films were easily detachable from the substrates. The poor adhesion made it possible to obtain free-standing diamond films without chemical etching. Raman spectroscopy showed the 1332 cm^-1 characteristic Raman peak of diamond and the 1580 cm^-1, 1350 cm^-1 bands of graphite on the growth surface and backside of the films, respectively. By energy dispersive X-ray spectroscopy it was only possible to detect iron on the back of the films, but not on the surface. The role of iron in the film growth is discussed.     

乙醇为碳源的低氢常压CVD法制备石墨烯薄膜及其生长机理研究

以乙醇为碳源,采用低氢常压化学气相沉积(CVD)法在铜基底上制备石墨烯薄膜,并将其成功转移至目标基底。通过SEM、Raman、TEM、选区电子衍射等分析发现,所制备的石墨烯薄膜结构完整、质量良好。通过设计实验,观察和分析了石墨烯薄膜生长过程中主要阶段的形貌特征及生长机理。结果表明,乙醇高温分解出的碳原子在铜基底表面聚集形核,形成的原始晶粒逐渐长大为岛状晶畴直至形成树枝状薄片,并在生长过程中跨越铜基底表面晶界,最后形成完整的石墨烯薄膜。     

铀上激光辅助化学气相沉积镍薄膜研究

为防止金属铀的腐蚀,本文采用激光辅助化学气相沉积(LACVD)方法在铀上制备了镍薄膜。采用SEM、XRD分析了薄膜的形貌、物相以及界面特性,采用黏胶拉伸测试表征了膜-基结合性能,采用电化学极化法分析了薄膜的抗腐蚀性能。结果表明:压力和温度对化学气相沉积(CVD)方法制备镍薄膜的质量有较大的影响。随着基底温度和沉积气压的降低,薄膜变得致密、平整,质量提高。在优化的工艺条件165℃、3Pa下,CVD方法所得镍薄膜非常致密。采用LACVD方法时,激光能量为200mJ时所制得的薄膜致密,300mJ时膜变得粗糙。无激光辅助时,CVD方法所制得的薄膜较易剥落,激光辅助下所得薄膜的膜-基结合力较好。LACVD方法大幅提高了薄膜的抗腐蚀性能,抗腐蚀性能的提高主要源于激光辅助使薄膜致密化,提高了薄膜与基底的结合力。     

Growth of 4 diameter polycrystalline diamond wafers with high thermal conductivity by 915 MHz microwave plasma chemical vapor deposition

Polycrystalline diamond (PCD) films 100 mm in diameter are grown by 915 MHz microwave plasma chemical vapor deposition (MPCVD) at different process parameters,and their thermal conductivity (TC) is evaluated by a laser flash technique (LFT) in the temperature range of 230-380 K.The phase purity and quality of the films are assessed by micro-Raman spectroscopy based on the diamond Raman peak width and the amorphous carbon (a-C) presence in the spectra.Decreasing and increasing dependencies for TC with temperature are found for high and low quality samples,respectively.TC,as high as 1950 ± 230 W m-1 K-1 at room temperature,is measured for the most perfect material.A linear correlation between the TC at room temperature and the fraction of the diamond component in the Raman spectrum for the films is established.     

低压促进的金刚石薄膜的低温生长

本文研究了气压对热丝化学气相沉积金刚石薄膜沉积温度的影响.扫描电子显微镜(SEM)结果表明,同常规热丝化学气相沉积的气压(5.32 kPa)相比,采用较低的气压(0.67 kPa)、在500℃的低温下可获得常规气压下不大容易获得的、小颗粒的金刚石薄膜.Raman结果进一步证实了这种薄膜具有同5.32 kPa、700℃条件下沉积的薄膜的可比拟的质量.低温低压下高质量的金刚石薄膜的获得同气压在决定衬底表面的碳氢分子活性基团浓度的两种相反的作用密切相关.同相同温度其它气压条件相比,在500℃的衬底温度、0.67 kPa气压下到达衬底表面的碳氢分子活性基团具有较高的浓度,从而导致了常规气压下不大可能获得的高质量,小颗粒金刚石薄膜的低温沉积.     

CHN薄膜的制备

文章简要描述了空心阴极等离子体化学气相沉积(HPCVD)的原理，以及用HPCVD方法制备CHN薄膜的工艺和实验结果。用XPS和AFM分别分析了CHN薄膜中C和N的成分及表面形貌，并得到了一定条件下的薄膜沉积速率。     

离子束辅助沉积(IVD)方法制备Ag/Si薄膜

离子束辅助沉积(以下简称IVD)方法是将离子束技术与真空沉积薄膜技术相结合的一种新的制膜方法。它具有沉积速率高、薄膜吸附强度大、薄膜外延温度低并能消除膜应力等优点。因此,近年来在国际上受到重视和发展。     

Growth of Aligned Carbon Nanotubes through Microwave Plasma Chemical Vapor Deposition

Aligned carbon nanotubes (CNTs) were synthesized on glass by microwave plasma chemical vapor deposition (MWPCVD) with a mixture of methane and hydrogen gases at the low temperature of 550~C. The experimental results show that both the self-bias potential and the density of the catalyst particles are responsible for the alignment of CNTs. When the catalyst particle density is high enough, strong interactions among the CNTs can inhibit CNTs from growing randomly and result in parallel alignment.     

ZrCl4蒸汽沉积法制备高温气冷堆包覆燃料颗粒ZrC涂层

采用ZrCl₄蒸汽、H₂和C₃H₆作为化学反应体系,以Ar为载气,在流化床沉积炉中制备高温气冷堆包覆燃料颗粒ZrC涂层。对所制备涂层进行了分析表征,结果显示：ZrC涂层剖面均匀光滑,无明显孔洞;与内致密热解炭层的界面清晰,厚度约为35μm;涂层主要成分为Zr和C,Zr/C摩尔比接近化学计量比1∶1,其主要相组成为面心立方的ZrC;晶粒生长无明显的择优取向。     

Deposition of Thin Titania Films by Dielectric Barrier Discharge at Atmospheric Pressure

A homogeneous atmospheric pressure dielectric barrier discharge is studied. It is in argon with small admixtures of titanium tetrachloride vapour and oxygen for the deposition of thin titania films on glass substrates. A special electrode configuration was applied in order to deposit the titania film uniformly. The sustaining voltage （6 kV to 12 kV）, current density （about 3 mA/cm^2） and total optical emission spectroscopy were monitored to characterize the discharge in the gap of 2 mm. Typical deposition rates ranged from approximately 30 nm/min to 120 nm/min. The film morphology was investigated by using scanning electron microscopy （SEM） and the composition was determined with an energy dispersive x-ray spectroscopy （EDS） analysis tool attached to the SEM. The crystal structure and phase composition of the films were studied by x-ray diffraction （XRD）. Several parameters such as the discharge power, the ratio of carrier gas to the precursor gas, the deposition time on the crystallization behavior, the deposition rate and the surface morphology of the titania film were extensively studied.     

The Effects of Annealing and Discharging on the Characteristics of MgO Thin Films Prepared by Ion Beam-Assisted Deposition as a Protective Layer of AC-PDP

This study investigated the effects of annealing and discharging on the characteristics of MgO thin films prepared by ion beam-assisted deposition as a protective layer of AC-PDP. By an annealing process at a temperature of 450 ℃ for more than three hours, the crystallinity of the deposited MgO films was improved, but the surface of the （200）-oriented MgO thin films in the vicinity of the discharge electrodes, especially on the inner sides of the electrodes, was subjected to crack formation to the compressive stress of The failure mechanism of the MgO films plus the additional （200）-oriented MgO films was due compressive stress induced by the differences in the coefficient of thermal expansion between the electrode and the dielectric layer. In the discharging process, all MgO films were eroded unevenly, and the serious erosion occurred near the edges of the discharge electrodes. ATM（atomic force microscopy） images show that the eroded surface of the （200）-oriented MgO thin film is smoother than that of the （111）-oriented fihn. Also, the （200）-oriented MgO thin film shows an improved ability to resist ion erosion compared to the （111）-oriented film.     

制备工艺对自支撑薄膜粗糙度的影响

利用磁过滤等离子沉积技术,以甜菜碱、油酸钾、抛光NaCl单晶基片、自支撑火棉胶膜和自支撑SiN薄膜为衬底制备了自支撑Ni膜。采用原子力显微镜和场发射扫描电子显微镜对薄膜表面形态和粗糙度进行了分析。结果表明：自支撑Ni膜的粗糙度与衬底材料密切相关,等离子体的沉积角度直接影响纳米薄膜的微观结构,采用60°倾斜沉积在自支撑火棉胶膜衬底上,可获得表面粗糙度为1.5nm的自支撑Ni膜。     

The Gas Nucleation Process Study of Anatase TiO2 in Atmospheric Non-Thermal Plasma EnhancedChemical Vapor Deposition简

Abstract The gas phase nucleation process of anatase TiO2 in atmospheric non-thermal plasma enhanced chemical vapor deposition is studied. The particles synthesized in the plasma gas phase at different power density were collected outside of the reactor. The structure of the collected particles has been investigated by field scanning electron microscope （FESEM）, X-ray diffraction （XRD）, high resolution transmission electron microscopy （HRTEM） and selected area electron diffraction （SAED）. The analysis shows that uniform crystalline nuclei with average size of several nanometers have been formed in the scale of micro second through this reactive atmo- spheric plasma gas process. The crystallinity of the nanoparticles increases with power density. The high density of crystalline nanonuclei in the plasma gas phase and the low gas temperature are beneficial to the fast deposition of the 3D porous anatase TiO2 film.     

用于ICF的非晶SiC微球制备及微观结构研究

以四甲基硅烷、反式二丁烯和氢气为工作气源,采用化学气相沉积-高温热解法成功制备了壁厚约21μm的非晶SiC微球。利用能量色散X射线光谱仪、X射线光电子能谱仪、X射线衍射仪、Raman光谱仪、扫描电子显微镜、白光干涉仪和X射线照相机对SiC微球的化学成分、结晶状态、表面形貌与粗糙度以及密度与球形度等进行了测量和分析。结果表明:在无氧环境下,通过450~900℃的高温热解及致密化可将在聚α甲基苯乙烯芯轴上沉积的掺硅碳氢聚合物涂层转变成致密的SiC微球。SiC微球呈非晶态,其C/Si原子比约为1.3,主要含有C—Si键和C=C键,微观结构呈无规则状且颗粒分布均匀,密度、球形度和壁厚均匀性分别为2.62 g/cm~3、99.8%和96.8%。     

Thin relaxed SiGe layer grown on Ar^＋ ion implanted Si substrate by ultra-high vacuum chemical vapor deposition

1 Introduction Relaxed SiGe layers have gained considerable attention due to their applications in strained Si/SiGe high electron mobility transistor, metal-oxide-semi- conductor field-effect transistor (MOSFET) and other devices. High-quality relaxed SiGe templates, espe- cially those with low threading dislocation density and smooth surface, are crucial for the electrical perform- ance of devices.[1,2] In order to realize high-quality relaxed SiGe layer with such good characteristics, …