考虑测试环境和实际运行环境的软件可靠性增长模型

软件可靠性增长模型中测试阶段和操作运行阶段环境的不同导致了两个阶段故障检测率的不同.非齐次泊松过程类软件可靠性增长模型是评价软件产品可靠性指标的有效工具.在一些非齐次泊松过程类模型中,有些学者提出了常量的环境因子,用来描述测试环境和运行环境的差别.实际上,环境因子应该是随时间变化的变量.考虑了运行阶段和测试阶段环境的不同,根据实测数据得到了变化的环境因子,并且根据测试阶段的故障检测率和变化的环境因子,转化得到了操作运行阶段的故障检测率.考虑到故障的排除效率和故障引入率,从而建立了一个既考虑运行环境和测试环境差别,又考虑故障排除效率和故障引入率的非齐次泊松过程类软件可靠性增长模型（PTEO-SRGM）.在两组失效数据上的实验分析表明,对这组失效数据,PTEO-SRGM模型比G-O模型等模型的拟合效果和预测能力更好.     

一个考虑多种排错延迟的NHPP类软件可靠性增长模型

软件可靠性增长模型通常假设软件的测试环境与软件实际运行的现场环境相同,期望利用测试阶段获得的失效数据评估软件在现场运行时的失效行为。多数非齐次泊松过程类软件可靠性增长模型假设软件故障被发现后立即被排除,这点假设无论是在测试环境还是在现场环境下都很难实现。根据故障对测试过程的影响,故障的排错时间可被分为多种。提出了一个考虑多种排错延迟的软件可靠性增长模型,讨论了基于这个模型的故障排除效率函数,指出从用户角度出发讨论软件可靠性时必须考虑重复性故障。     

一个基于响铃形故障检测率函数的软件可靠性增长模型

非齐次泊松过程类软件可靠性增长模型是评价软件产品可靠性指标的有效工具．影响软件可靠性增长模型评估和预测准确性的最重要的两个因素是软件中隐藏的初始故障数和故障检测率．一些非齐次泊松过程类模型假设故障检测率是不随测试时间变化的常量,有些模型假设故障检测率是增函数或减函数．这些假设或忽略了测试者的学习过程,或忽略了越迟被检测到的故障的概率就可能越低的特点．该文将测试者的学习过程和软件固有故障检测率的变化特征相结合,提出了一个铃形的故障检测率函数,建立了一个非齐次泊松过程类软件可靠性增长模型——Bbell—SRGM．在一组失效数据上的实验分析表明：对这组失效数据,Bbell—SRGM模型比G-O模型等的拟合效果更好．     

一种考虑缺陷关联的软件可靠性增长模型

非齐次泊松过程类软件可靠性增长模型(NHPP-SRGMs)是评价软件产品可靠性指标的有效工具,但大多数该类模型都未考虑软件缺陷关联这一测试过程中普遍存在的现象。该文在考虑软件缺陷关联关系的基础上对缺陷进行分类,提出一个改进的NHPP类软件可靠性增长模型。在一组失效数据上的实验分析表明,改进的模型具有较好的拟合效果和预测能力。     

潜伏故障点不完美覆盖的软件可靠性增长模型

现有的基于测试覆盖率的非齐次泊松过程（NHPP）类软件可靠性增长模型绝大多数都没有考虑到潜伏故障点不完美覆盖的情况。提出了一种考虑潜伏故障点不完美覆盖的软件可靠性NHPP增长模型,称之为UPNHPP模型。在一组失效数据上的实验分析表明,对这组数据,UPNHPP模型与其他模型相比有更好的拟合效果。     

考虑测试与运行差别的软件可靠性增长模型

软件可靠性增长模型中测试阶段和操作运行阶段环境的不同导致了两个阶段故障检测率的不同．在随机过程类非齐次泊松过程（NHPP）中的经典模型G—O模型基础上,考虑运行剖面和测试剖面的不同,对测试阶段和操作运行阶段的故障检测率进行了转化,得到了较好的刻画测试阶段和操作阶段失效率差别的模型（TO—SRGM）．最后,通过实例用最小二乘法对此模型的参数进行了估计．实验结果表明,在某些失效数据集上TO—SRGM的拟和效果比G—O模型和PZ—SRGM好．     

不完美排错软件可靠性增长模型效用量化研究

为了进一步提升现有非齐次泊松过程类软件可靠性增长模型的拟合和预测性能,首先从故障总数增长趋势角度对不完美排错模型进行深入研究,提出两个一般性不完美排错框架模型,分别考虑了总故障数量函数与累计检测故障函数间的线性关系与微分关系,并求得累计检测的故障数量与软件中总故障数量函数表达式;其次,在六组真实的失效数据集上对比了提出的两种一般性不完美排错模型和六种不完美排错模型拟合预测性能表现。实例验证结果表明,提出的一般性不完美排错框架模型在大多数失效数据集上都具有优秀的拟合和预测性能,证明了新建模型的有效性和实用性;通过对提出的模型与其他不完美排错模型在数据集上的性能的深入分析,为实际应用中不完美排错模型的选择提出了建议。     

运用MATLAB进行军用软件可靠性评估

军用软件的可靠性已成为影响武器装备系统质量的关键因素。介绍了非齐次泊松过程类软件可靠性增长模型的原理以及如何运用MATLAB绘制软件故障数据曲线、模型参数估计及分布拟合检验,进而建立可靠性增长模型,进行可靠性评估。     

多层缺陷关联效应对软件可靠性增长过程的影响

软件系统中的缺陷通常以非常复杂的方式互相关联,并最终导致系统失效。基于非齐次泊松过程的软件可靠性增长模型,是一种描述软件随机失效行为和测量软件可靠性增长过程的常见工具。为此,考虑到有关联作用的多层缺陷,提出一个基于非齐次泊松过程的软件可靠性增长模型来研究软件系统的可靠性增长过程,并通过现实数据集对模型的性能进行评估。研究表明,新模型抓住了多层缺陷的关联效应,很好地拟合了缺陷数据集,且优于传统模型。此外,对于同时考虑了可靠性要求和测试成本的软件发行策略,研究发现,如果测试团队忽略缺陷不同层之间的关联效应,会使软件包发行到市场的最佳时间提前,从而相应的增加整体成本。     

考虑故障排除率和引入率的软件可靠性建模

软件测试中排错过程的故障排除率并不是100％的,并且由于检测到的尚未被排除的故障影响还会引入新的故障,即存在故障排除率和故障引入率,两者是具有不同的下降趋势的减函数.针对上述问题,提出一种新的非齐次泊松过程软件可靠性增长模型,考虑了随时间变化的故障排除率函数和故障引入率函数.利用一组公开发表的包含故障检测数和故障排除数的软件失效数据集进行仿真与验证,实验结果表明,改进模型具有更好的拟合效果和预测能力.     

Selecting software reliability growth models and improving their predictive accuracy using historical projects data

During software development two important decisions organizations have to make are: how to allocate testing resources optimally and when the software is ready for release. SRGMs (software reliability growth models) provide empirical basis for evaluating and predicting reliability of software systems. When using SRGMs for the purpose of optimizing testing resource allocation, the model's ability to accurately predict the expected defect inflow profile is useful. For assessing release readiness, the asymptote accuracy is the most important attribute. Although more than hundred models for software reliability have been proposed and evaluated over time, there exists no clear guide on which models should be used for a given software development process or for a given industrial domain.Using defect inflow profiles from large software projects from Ericsson, Volvo Car Corporation and Saab, we evaluate commonly used SRGMs for their ability to provide empirical basis for making these decisions. We also demonstrate that using defect intensity growth rate from earlier projects increases the accuracy of the predictions. Our results show that Logistic and Gompertz models are the most accurate models; we further observe that classifying a given project based on its expected shape of defect inflow help to select the most appropriate model.     

考虑测试工作量与覆盖率的软件可靠性模型

为了进一步提升现有非齐次泊松过程类软件可靠性增长模型的拟合与预计精度,首先,提出一个同时考虑测试工作量与测试覆盖率的NHPP类软件可靠性建模框架.在此基础上,将变形S型测试工作量函数(IS-TEF)以及Logistic测试覆盖率函数(LO-TCF)带入该建模框架,建立了一个新的软件可靠性增长模型,即IS-LO-SRGM.同时,还对利用该框架进行建模过程中的两个重要问题进行了描述与分析,即如何确定具体的TEF和TCF以及模型参数估计.然后,在两组真实的失效数据集上,利用该建模框架建立了最为合适的增长模型,即IS-LO-SRGM,并将该模型与8种经典NHPP模型进行对比.实例验证结果表明,所提出的IS-LO-SRGM模型具有最为优秀的拟合与预计性能,从而证明新建模框架的有效性和实用性.最后,对不完美排错情况进行了初步的讨论与建模分析.     

Better reliability assessment and prediction through data clustering

This paper presents a new approach to software reliability modeling by grouping data into clusters of homogeneous failure intensities. This series of data clusters associated with different time segments can be directly used as a piecewise linear model for reliability assessment and problem identification, which can produce meaningful results early in the testing process. The dual model fits traditional software reliability growth models (SRGMs) to these grouped data to provide long-term reliability assessments and predictions. These models were evaluated in the testing of two large software systems from IBM. Compared with existing SRGMs fitted to raw data, our models are generally more stable over time and produce more consistent and accurate reliability assessments and predictions.     

Optimal testing resource allocation during module testing considering cost, testing effort and reliability

Software reliability is one of the most important quality attributes of commercial software. During software testing, software reliability growth models (SRGMs) are commonly used to describe the phenomenon of failure occurrence and/or fault removal which consequently enhancements software reliability. Large software systems are developed by integrating a number of relatively small and independent modules, which are tested independently during module testing phase. The amount of testing resource available is limited which is desired to be consumed judiciously so as to optimize the testing process. In this paper we formulate a resource allocation problem of minimizing the cost of software testing under available amount of testing resource, given a reliability constraint. We use a flexible SRGM considering testing effort which, depending upon the values of parameters, can describe either exponential or S-shaped failure pattern of software modules. A systematic and sequential Algorithm is proposed to solve the optimization problem formulated. Numerical examples are given to illustrate the formulation and solution procedures. Sensitivity analysis is performed to examine the behavior of some parameters of SRGM with most significant influence.     

An Empirical Method for Selecting Software Reliability Growth Models

Estimating remaining defects (or failures) in software can help test managers make release decisions during testing. Several methods exist to estimate defect content, among them a variety of software reliability growth models (SRGMs). SRGMs have underlying assumptions that are often violated in practice, but empirical evidence has shown that many are quite robust despite these assumption violations. The problem is that, because of assumption violations, it is often difficult to know which models to apply in practice. We present an empirical method for selecting SRGMs to make release decisions. The method provides guidelines on how to select among the SRGMs to decide on the best model to use as failures are reported during the test phase. The method applies various SRGMs iteratively during system test. They are fitted to weekly cumulative failure data and used to estimate the expected remaining number of failures in software after release. If the SRGMs pass proposed criteria, they may then be used to make release decisions. The method is applied in a case study using defect reports from system testing of three releases of a large medical record system to determine how well it predicts the expected total number of failures.     

Considering the fault dependency concept with debugging time lag in software reliability growth modeling using a power function of testing time

Since the early 1970s tremendous growth has been seen in the research of software reliability growth modeling.In general, software reliability growth models (SRGMs) are applicable to the late stages of testing in software development and they can provide useful information about how to improve the reliability of software products.A number of SRGMs have been proposed in the literature to represent time-dependent fault identification/removal phenomenon;still new models are being proposed that could fit a greater number of reliability growth curves.Often,it is assumed that detected faults axe immediately corrected when mathematical models are developed.This assumption may not be realistic in practice because the time to remove a detected fault depends on the complexity of the fault,the skill and experience of the personnel,the size of the debugging team,the technique,and so on.Thus,the detected fault need not be immediately removed,and it may lag the fault detection process by a delay effect factor.In this paper,we first review how different software reliability growth models have been developed,where fault detection process is dependent not only on the number of residual fault content but also on the testing time,and see how these models can be reinterpreted as the delayed fault detection model by using a delay effect factor.Based on the power function of the testing time concept,we propose four new SRGMs that assume the presence of two types of faults in the software:leading and dependent faults.Leading faults are those that can be removed upon a failure being observed.However,dependent faults are masked by leading faults and can only be removed after the corresponding leading fault has been removed with a debugging time lag.These models have been tested on real software error data to show its goodness of fit,predictive validity and applicability.