助焊剂活性物质的制备与研究

通过润湿角和铺展性表征对16种有机活性剂进行了性能测试,用热失重法测试其热解过程,对所选活性剂进行复配处理完成表面包覆并制得活性物质。结果表明:柠檬酸和苹果酸复配符合要求,三乙醇胺可以很好地调节助焊剂的酸度,丙烯酸树脂可作为活性物质微胶囊的囊壁材料。微胶囊化后的复配活性物质易溶于有机溶剂,pH值接近6。以其制备的助焊剂的助焊效果良好,IMC层薄而明晰。     

SMT无铅电子焊膏活性剂的研究

选择腐蚀性较低的有机酸作为制备无铅电子焊膏活性剂的原料。对五种有机酸进行筛选和复合选取,并进行回流焊接模拟。按国家标准(GB/T9491—2002)对其铺展率、腐蚀性进行了测试。结果表明,选用w(己二酸)为60%和w(丁二酸)为40%的混合酸作为活性剂,具有良好的润湿性和助焊活性,铺展率在87%左右。焊后残留少,腐蚀性弱,焊点饱满光亮,焊层薄而明晰。     

vf-BGA封装焊球热疲劳可靠性的研究

采用有限元分析方法对vf-BGA焊球的热疲劳特性进行了模拟 .通过扫描电镜(SEM)对温度循环试验后焊球金属间化合物(IMC)层和剪切强度试验后的断裂面进行了形貌、结构和组分的观察及分析.实验和模拟结果表明:热疲劳负载下焊球的剪切疲劳强度,受到焊球塑性应变能量的积累和分布以及金属间化合物层的厚度和微结构变化导致的界面脆性等因素的影响.使用Darveaux能量疲劳模型的裂纹初始化寿命预测结果与实验数据一致.     

vf-BGA封装焊球热疲劳可靠性的研究

采用有限元分析方法对 vf- BGA焊球的热疲劳特性进行了模拟 .通过扫描电镜 (SEM)对温度循环试验后焊球金属间化合物 (IMC)层和剪切强度试验后的断裂面进行了形貌、结构和组分的观察及分析 .实验和模拟结果表明 :热疲劳负载下焊球的剪切疲劳强度 ,受到焊球塑性应变能量的积累和分布以及金属间化合物层的厚度和微结构变化导致的界面脆性等因素的影响 .使用 Darveaux能量疲劳模型的裂纹初始化寿命预测结果与实验数据一致     

无铅焊膏工艺适应性的研究

无铅焊膏是适应环保要求的一种绿色焊接材料,其质量的优劣直接决定着现代表面组装组件品质的好坏,为了检测与评价无铅焊膏的性能,研究影响其焊接可靠性的因素,实验研制了一种Sn-Ag-Cu无铅焊膏,并根据其本身的材料特性和实际工艺性能结合IPC的有关标准设计了整套试验,包括:焊膏黏度测试、塌陷实验、焊球实验以及铜板腐蚀测试等。研究结果表明:焊粉的质量分数与焊膏黏度呈正比关系;高温高湿环境下焊膏的可靠性降低,焊后残留物的腐蚀性增强;焊膏过多暴露在氧化环境中易引起焊料成球等焊接缺陷。     

松香树脂对SnAgCu焊膏性能的影响

通过焊膏回流焊接铺展性能及其抗塌落能力测试分析.研究了助焊剂中氢化松香和聚合松香的总含量以及它们的复配比例对SnAgCu焊膏性能的影响.结果表明:当助焊剂中松香质量分数在20%～60%的范围时,增加松香含量可提高焊膏的铺展性能,改善焊点形貌,并显著增强抗塌落能力.当助焊剂中松香总质量分数为40%时,不同松香复配比例的焊膏铺展试验均表现出焊点饱满、表面光亮、周边规则的特征,铺展率基本相当,约为82%,而焊膏的抗塌落性能随聚合松香比例提高而提高.元件试焊表明焊膏具有良好的焊接性能,可用于一般电子产品的焊接.     

SnAgCu无铅焊膏用溶剂的优化研究

以SnAgCu无铅焊膏铺展性能和焊点形貌作为评价的主要指标,通过回流焊接实验,对常用于焊膏的10种溶剂进行了单一溶剂优选,并对两种性能较好的溶剂进行复配优化研究.结果表明:A醇、二缩三乙二醇和B醚作为单一溶剂时焊膏的润湿性较好、焊点外形较饱满,铺展率都大于83%;A醇和B醚按质量比3:2复配时得到的焊膏铺展率达到93%...     

预成型焊片润湿性动态测试方法

预成型焊片的润湿性直接关系到光电子封装的可靠性。常用的焊料润湿性评价方法对于评价预成型焊片润湿性具有很大局限性。提出了一种动态测试焊料润湿性的方法,并设计了一套测试系统。通过铺展面积与时间的关系曲线得出最大铺展面积、润湿时间、平均润湿速度和瞬时润湿速度等特征参数,对预成型焊片的润湿性进行评价。实验表明,该润湿性动态测试...     

再成形（Re—Balled）焊球阵魏封装的焊球强度评估

近年来,许多国家禁止在电子产品中铅的使用,但是一些特定产品拥有豁免权。拥有豁免权的电子产品生产厂商面临含铅元器件供应缺乏的现状,因此生产厂商开始寻求利用焊球再成形技术把焊球阵列封装中的无铅焊球转变为锡铅焊球。焊球再成形技术曾经被用于元器件的回收再利用．但是关于焊球再成形元器件的可靠性信息十分有限。介绍了利用焊球再成形技术使无铅焊球阵列封装转变为锡铅焊球阵列封装。两种焊球去除方法和两种焊球再贴装方法分别用于实现从无铅焊球到锡铅焊球的转变,用以调查再成形工艺对于封装质量的影响。热时效试验以及焊球强度评估用于检测焊球再成形工艺过程。     

再成形(Re-Balled)焊球阵列封装的焊球强度评估

近年来,许多国家禁止在电子产品中铅的使用,但是一些特定产品拥有豁免权。拥有豁免权的电子产品生产厂商面临含铅元器件供应缺乏的现状,因此生产厂商开始寻求利用焊球再成形技术把焊球阵列封装中的无铅焊球转变为锡铅焊球。焊球再成形技术曾经被用于元器件的回收再利用,但是关于焊球再成形元器件的可靠性信息十分有限。介绍了利用焊球再成形技术使无铅焊球阵列封装转变为锡铅焊球阵列封装。两种焊球去除方法和两种焊球再贴装方法分别用于实现从无铅焊球到锡铅焊球的转变,用以调查再成形工艺对于封装质量的影响。热时效试验以及焊球强度评估用于检测焊球再成形工艺过程。     

Novel Maskless Bumping for 3D Integration

A novel, maskless, low‐volume bumping material, called solder bump maker, which is composed of a resin and low‐melting‐point solder powder, has been developed. The resin features no distinct chemical reactions preventing the rheological coalescence of the solder, a deoxidation of the oxide layer on the solder powder for wetting on the pad at the solder melting point, and no major weight loss caused by out‐gassing. With these characteristics, the solder was successfully wetted onto a metal pad and formed a uniform solder bump array with pitches of 120 µm and 150 µm.     

Novel Bumping Material for Solder‐on‐Pad Technology

A novel bumping material, which is composed of a resin and Sn3Ag0.5Cu (SAC305) solder power, has been developed for the maskless solder‐on‐pad technology of the fine‐pitch flip‐chip bonding. The functions of the resin are carrying solder powder and deoxidizing the oxide layer on the solder power for the bumping on the pad on the substrate. At the same time, it was designed to have minimal chemical reactions within the resin so that the cleaning process after the bumping on the pad can be achieved. With this material, the solder bump array was successfully formed with pitch of 150 µm in one direction.     

Interfacial reaction and solder joint reliability of Pb-free solders in lead frame chip scale packages (LF-CSP)

Chip scale packages (CSP) have essential solder joint quality problems, and a board level reliability is a key issue in design and development of the CSP type packages. There has been an effort to eliminate Pb from solder due to its toxicology. To evaluate the various solder balls in CSP package applications, Pb-free Sn-Ag-X (X=In, Cu, Bi) and Sn-9Zn-1Bi-5In solder balls were characterized by melting behavior, phases, interfacial reaction, and solder joint reliability. For studying joint strength between solders and under bump metallurgy (UBM) systems, various UBMs were prepared by electroplating and electroless plating. After T/C (temperature cycle) test, Sn3.5Ag8.5In solder was partially corroded and its shape was distorted. This phenomenon was observed in a Sn3Ag10In 1Cu solder system, too. Their fractured surface, microstructure of solder joint interface, and of bulk solder ball were examined and analyzed by optical microscopy, SEM and EDX. To simulate the real surface mounting condition and evaluate the solder joint reliability on board level, Daisy chain test samples using LF-CSP packages were prepared with various Pb-free solders, then a temperature cycle test (−65∼ 150°C) was performed. All tested Pb-free solders showed better board level solder joint reliability than Sn-36Pb-2Ag. Sn-3.5Ag-0.7Cu and Sn-9Zn-1Bi-5In solders showed 35%, 100% superior solder joint reliability than Sn-36Pb-2Ag solder ball, respectively.     

Encapsulation of lead-free Sn/Zn/Bi solder alloy particles by coating with wax powder for improving oxidation resistance

An encapsulation treatment of lead-free Sn/Zn/Bi solder powder was investigated for improving the oxidation resistance. Sn-8mass%Zn-3mass%Bi alloy particles were coated with a wax (12-hydroxystearic acid) powder by means of a dry mechanical treatment method using a ball mill. In order to determine the optimum operating conditions of the ball mill in the wax-coating treatments, the compressive energy required for deforming a single Sn/Zn/Bi alloy particle was measured with an unconfined compression tester and the mechanical energy applied to the alloy particles in the ball mill was estimated using the results of the compression test. The optimum operating conditions were determined based on both the applied energy and the flowability of solder pastes, and the wax-coated alloy particles maintaining the spherical shape were obtained under the conditions. The wettability test and the solder balling test for the solder pastes containing the wax-coated alloy particles stored at room temperature in air were carried out to evaluate the oxidation resistance performance. The wax-coated alloy particles had an excellent wettability compared with the original alloy particles, and the oxidation resistance of the Sn/Zn/Bi solder powder was improved by the encapsulation treatment.     

一种新型电磁屏蔽复合涂料的研制

以镀锡镍硅酸钙镁矿物晶须与镍粉为复合填料,以环氧树脂作为粘结剂,按照涂料制备的方法,研制了一种新型电磁波屏蔽复合材料——镀锡镍硅酸钙镁矿物晶须／镍粉／环氧树脂电磁波屏蔽复合材料,并介绍了其主要特点及市场前景。测试结果表明：在300kHz～1．5GHz范围内,其屏蔽效能为37．197～46．139dB。     

Interconnection Technology Based on InSn Solder for Flexible Display Applications

A novel interconnection technology based on a 52InSn solder was developed for flexible display applications. The display industry is currently trying to develop a flexible display, and one of the crucial technologies for the implementation of a flexible display is to reduce the bonding process temperature to less than 150°C. InSn solder interconnection technology is proposed herein to reduce the electrical contact resistance and concurrently achieve a process temperature of less than 150°C. A solder bump maker (SBM) and fluxing underfill were developed for these purposes. SBM is a novel bumping material, and it is a mixture of a resin system and InSn solder powder. A maskless screen printing process was also developed using an SBM to reduce the cost of the bumping process. Fluxing underfill plays the role of a flux and an underfill concurrently to simplify the bonding process compared to a conventional flip‐chip bonding using a capillary underfill material. Using an SBM and fluxing underfill, a 20 μm pitch InSn solder SoP array on a glass substrate was successfully formed using a maskless screen printing process, and two glass substrates were bonded at 130°C.     

High-temperature variable melting point Sn-Sb lead-free solder pastes using transient liquid-phase powder processing

During this investigation, a high-temperature, variable melting point (VMP) Sn-Sb solder paste was developed. The solder was created by mixing pure Sn and Sb powders together with a flux to form a paste. The proper choice of flux composition and Sn powder size resulted in a Sn-10wt.%Sb solder paste that had an initial melting point of 232°C and solder ball formation at peak temperatures as low as 241°C. This represents a significant reduction in the process temperature that would normally be required for a prealloyed solder with a melting point of 250°C. When this solder paste is reheated, significant remelting does not take place until a temperature above 241°C is reached. In this way, the solder exhibits a VMP. Experiments indicate that this VMP behavior is due to isothermal solidification (or freezing) at the solder temperature owing to the partial transient liquid-phase (TLP) behavior of the solder powder paste.     

Creep properties of eutectic Sn-3.5Ag solder joints reinforced with mechanically incorporated Ni particles

The creep deformation behavior of eutectic Sn-3.5Ag based Ni particle rein forced composite solder joints was investigated. The Ni particle reinforced composite solder was prepared by mechanically dispersing 15 vol.% of Ni particles into eutectic Sn-3.5Ag solder paste. Static-loading creep tests were carried out on solder joint specimens at 25 C, 65 C, and 105 C, representing homologous temperatures ranging from 0.6 to 0.78. A novel-design, miniature creep-testing frame was utilized in this study. Various creep parameters such as the global and localized creep strain, steady-state creep rate, onset of tertiary creep and the activation energy for creep were quantified by mapping the distorted laser ablation pattern imprinted on the solder joint prior to testing. The Ni-reinforced composite solder joint showed improved creep resistance compared to the results previously reported for eutectic Sn-3.5Ag solder, Sn-4.0Ag-0.5Cu solder alloys, and for eutectic Sn-3.5Ag solder reinforced with Cu or Ag particle reinforcements. The activation energy for creep was ∼0.52 eV for Sn-3.5Ag and Sn-4Ag-0.5Cu solder alloys. The activation energies ranged from 0.55–0.64 eV for Cu, Ag, and Ni reinforced composite solder joints, respectively. Most often, creep fracture occurred closer to one side of the solder joint within the solder matrix.     

Novel Bumping and Underfill Technologies for 3D IC Integration

In previous work, novel maskless bumping and no‐flow underfill technologies for three‐dimensional (3D) integrated circuit (IC) integration were developed. The bumping material, solder bump maker (SBM) composed of resin and solder powder, is designed to form low‐volume solder bumps on a through silicon via (TSV) chip for the 3D IC integration through the conventional reflow process. To obtain the optimized volume of solder bumps using the SBM, the effect of the volumetric mixing ratio of resin and solder powder is studied in this paper. A no‐flow underfill material named “fluxing underfill” is proposed for a simplified stacking process for the 3D IC integration. It can remove the oxide layer on solder bumps like flux and play a role of an underfill after the stacking process. The bumping process and the stacking process using the SBM and the fluxing underfill, respectively, for the TSV chips are carefully designed so that two‐tier stacked TSV chips are sucessfully stacked.