Determining the optical constants of read-write sliders during flying-height testing

Flying-height testers for rigid disk drives employ a transparent glass substrate in place of the magnetic disk and use optical interferometry to measure the flight properties of the read-write slider. Because of the material phase change on reflection, the effective optical constants n and k of the slider play an important role in the measurement. We describe an instrument that determines the optical constants simultaneously with flying height, using polarization interferometry. This in situ analysis of n and k obviates the need for independent ellipsometry, while avoiding the problematic retract calibration characteristic of traditional flying-height test equipment. The rms uncertainty for n and k are 0.04, resulting in height uncertainties that range from 3 nm for 250-nm flying heights down to 0.5 nm at contact. We verify these results by use of a variety of experimental techniques on both laboratory samples and actual read-write sliders.     

3Y-TZP/LZAS微晶玻璃功能梯度涂层的微观结构与性能

为了提高钢基体微晶玻璃涂层的韧性, 在Q235钢基体上采用涂搪法制备了钇稳定四方相氧化锆/Li₂O- ZnO-Al₂O₃-SiO₂ (3Y-TZP/LZAS) 微晶玻璃功能梯度涂层。采用XRD、SEM分析了梯度涂层的物相组成和微观结构, 采用压痕法测试并计算了涂层的显微硬度和断裂韧性, 通过粘接-拉伸法测试了涂层的结合强度。结果表明, 3Y-TZP/LZAS微晶玻璃功能梯度涂层各层之间的界面结合紧密; 涂层与钢基体依靠玻璃中的SiO₂与铁的氧化物发生界面反应形成牢固的结合, 反应产物为Fe₂SiO₄和FeSiO₃; 涂层的显微硬度和断裂韧性沿涂层厚度方向逐渐增大, 涂层韧性提高是表面残余压应力增韧、3Y-TZP相变及3Y-TZP的颗粒增韧共同作用的结果; 梯度涂层与Q235的结合强度达16.3 MPa。热震实验表明, 梯度涂层在300℃下经历30余次热循环, 表现出较好的抗热震性能。     

Simple birefringence measurement method for coated optical disks with a fixed incident angle ellipsometer

In a coated and laminated optical disk, only a reflectance method is available for oblique incidence retardation measurements to evaluate the birefringence in a polycarbonate substrate. I propose a simple measurement method that simultaneously measures both the lateral and vertical birefringence in a coated substrate. In this reflectance method, only two oblique incidence retardation values with a fixed incident angle are measured from the radial and the circumferential directions of the disk. Using the sum and the difference of these two retardation values, we can calculate both birefringences without any cumbersome curve-fitting procedure. This method can easily be introduced into the routine inspection for optical disk manufacturing.     

Influence of substrate thickness on optical disk readout

I consider the influence of different substrate thicknesses on the signal obtained from an optical disk. Two solutions are presented for the reading of different disk types. In one situation a substrate thickness change for disks with equal density is made inoffensive by introduction of a combined amplitude-phase mask in the pupil of the readout objective. In a second situation, where the different thickness is accompanied by a change in optical density, a specific selection in the far field of the detected radiation has proven to be adequate.     

Substrate noise in optical data-storage systems

Noise in optical disk readout has been examined for different polarizations of the incident beam. The disks studied are bare grooved glass substrates, having different groove shapes or differing jaggedness in the sidewalls. We perform measurements for the electric field of the incident laser beam parallel to the track and perpendicular to the track using both differential magneto-optical and conventional phase-change readout schemes. The incident beam of light is focused on the grooved surface of the (bare) substrate either through the substrate or directly from the air. Experiments reveal that the noise level is dependent on the state of polarization, the nature of the track (i.e., land or groove), and the medium of incidence. Surface roughness and sidewall jaggedness are two dominant contributors to the media noise in these substrates.     

磁光盘记录光场畸变分析

运用光波衍射理论，针对磁光盘建立了记录光场的数学模型。该数学模型可全面描述基片杂质大小、位置、透射率对记录光场的影响。利用该数学模型可进一步研究基片杂质与磁畴特性，以及盘片误码的关系。     

Nanoindentation and the tribology of head-disk interface components

Nanoindentation data are presented for three different but interrelated components of the thin film disk magnetic recording system-the air bearing slider/recording head, the disk substrate, and the sputter deposited thin film disk recording medium. Hardness traces across the slider trailing edge demonstrate the hardness of the NiFe, sputtered Al₂O₃, and the ceramic Al₂O ₃/TiC are 8, 10 and 24-40 GPa, respectively. Lapping under non-optimum, aggressive conditions can lead to significant recession in these components which is directly related to their hardness. The hardness and modulus have been measured for a number of alternate substrate materials ranging from AlMg/NiP to glass and glass ceramic. The ability of these substrates to resist damage from slider shock forces is presented and generally increases with substrate hardness, although other criteria (fracture toughness and plasticity initiation) rue required to rationalize all the data. Finally, hardness and modulus of carbon overcoat films are presented which have been sputtered under various conditions. The process variations lead to variations in hardness, the hardness/modulus (H/E) parameter, and tribological performance in slider/disk testing. The applicability of these mechanical property parameters to the wear degradation is discussed     

Tilt correction in an optical disk system

A servo system for the correction of disk tilt in optical disk data storage is proposed, and its basic concepts are demonstrated by the use of a static system in which the disk does not spin. Because disk tilt produces primarily coma in the beam focused onto the disk, the system uses a variable coma generator to produce an equal and opposite amount of coma as that caused by the tilted disk. The magnitude and direction of disk tilt are detected by the use of the light reflected from the front facet of the disk substrate.     

Subtle effects of the substrate in optical disk data storage systems

Much attention has been focused on the effects of the disk substrate in optical data storage. In particular, substrate birefringence has been studied extensively because it causes significant problems in magneto-optic systems. We investigate certain subtle effects of the substrate, such as feedback into the laser diode, in compact disk and phase-change systems. Our analysis of the compact disk system led us to discover a new technique for the rapid measurement of the substrate birefringence. We also address the question of how focusing the laser beam through the substrate will affect the depth of focus.     

Dual-wavelength optical head with a wavelength-selective filter for 0.6- and 1.2-mm-thick-substrate optical disks

A dual-wavelength optical head, believed to be new in design, for 0.6- and 1.2-mm-thick-substrate optical disks was developed by use of 650- and 780-nm-wavelength light and a wavelength-selective filter, which reduces the spherical aberration that is due to the difference in substrate thicknesses and restricts the numerical aperture for 780-nm-wavelength light. According to this configuration, both high light power efficiency and wide image field characteristics are obtained, which are suitable not only for read-only but also for recordable or rewritable optical disk systems. A reading operation for a digital video disc and for a compact disc and a recording operation for a phase change optical disk were successfully demonstrated.