共查询到20条相似文献,搜索用时 62 毫秒
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采用Cu箔作中间层,在温度为853K的条件下进行了SiCp/Al复合材料的瞬间液相(Transient Liquid-Phase bonding,TLP)连接,用扫描电镜观察了连接界面微观形貌,测定了接头的剪切强度,着重研究了连接时间和压力对界面结构和强度的影响。研究表明,不加压连接时,由于在界面处形成纯金属带,且氧化膜也难以去除,接头强度较低,约为母材强度的48%,接头剪切强度随连接时间延长而增高,连接时施加0.2MPa的压力即可显著提高接头强度,达到母材强度的70%,且强度随连接时间变化不大,试验还发现,用Cu箔中间层无压瞬间液相连接小增强相颗粒、高体积百分含量的SiCp/AlMMCs时,接头界面区域没有发现颗粒偏聚,本文对此进行了理论分析。 相似文献
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文中采用Al/Cu/Al复合箔扩散钎焊SiCP/Al复合材料,采用SEM,EDS,XRD分析接头界面组织,研究了钎焊温度对接头界面组织及力学性能的影响,并结合Al-Cu二元相图分析接头形成机制.结果表明,固定连接压力为1 MPa,保温时间为10 min,当钎焊温度从590℃升至640℃,接头界面产物由Al2Cu+αAl共晶组织转变为断续的Al2Cu金属间化合物,Al-Cu液相向两侧母材扩散的距离增加,接头的抗剪强度呈现先增大后减小的变化趋势.当钎焊温度为620℃,保温时间为10 min,连接压力为1 MPa时,接头的抗剪强度达到最大值69 MPa. 相似文献
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采用Ni箔和Cu/Ni/Cu多层箔作中间层在923K进行了SiC颗粒增强铝基复合材料的瞬间液相连接。研究表明,无压连接时,接头强度随保温时间延长有所增高,但界面处会存在纯金属(无增强颗粒)区域和氧化物夹杂,是导致接头强度不高的主要原因。加压TLP连接则能有效改善界面组织和接头性能。采用Cu/Ni/Cu多层箔作中间层加压连接时接头强度可达189.6MPa,约为母材强度的85%。本文对压力的作用和复合材料TLP连接界面特性进行了讨论。 相似文献
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Ti/Cu/Ti部分瞬间液相连接Si_3N_4的界面反应和连接强度 总被引:2,自引:0,他引:2
用Ti/Cu/Ti多层中间层在 12 73K进行氮化硅陶瓷部分瞬间液相连接 ,实验考察了保温时间对连接强度的影响。用SEM ,EPMA和XRD对连接界面进行微观分析 ,并用扩散路径理论 ,研究了界面反应产物的形成过程。结果表明 :在连接过程中 ,Cu与Ti相互扩散 ,形成Ti活度较高的液相 ,并与氮化硅发生反应 ,在界面形成Si3N4 /TiN/Ti5Si3 Ti5Si4 TiSi2 /TiSi2 Cu3Ti2 (Si) /Cu的梯度层。保温时间主要是通过影响接头反应层厚度和残余热应力大小而影响接头的连接强度 相似文献
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Ti/Cu/Ti部分瞬间液相连接Si3N4的界面反应和连接强度 总被引:13,自引:1,他引:13
用Ti/Cu/Ti多层中间导在1273K进行氮化硅陶瓷部分瞬间液相连接,实验考察了保温时间对连接强度的影响,用SEM,EPMA和XRD对连接界面进行微观分析,并用扩散路径理论,研究了界面反应产物的形成过程,结果表明:在连接过程中,Cu与Ti相互扩散,形成Ti活度较高的液相,并与氮化硅发生反应,在界面形成Si3N4/TiN/Ti5Si3 Ti5Si4 TiSi2/TiSi2 Cu3Ti2(Si)/Cu的梯度层,保温时间主要是通过影响接头反应层厚度和残余热应力大小而影响接头的连接强度。 相似文献
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采用Al—Cu合金作为中间层研究了铝基复合材料(Al2O3p/6061Al)瞬间液相扩散连接接头的组织与力学性能。研究结果表明,在Al—Cu/A12O3p/6061Al接头中无明显的增强相偏聚区和增强相贫化区,且接头成分分布较为均匀;在Al—C。合金中间层厚度30μm、连接温度600℃、连接时间30min条件下,接头抗剪强度为130~140MPa,较Cu/A12O3p/6061Al接头抗剪强度提高45%。因此,采用Al—Cu中间层是改善铝基复合材料接头力学性能的有效途径。 相似文献
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采用Ti/Cu/Ni中间层对Si3N4陶瓷进行二次部分瞬间液相(PTLP)连接,研究连接工艺参数对Si3N4/Ti/Cu/Ni连接强度的影响,同时研究了连接强度随试验温度的变化规律。结果表明,在该试验条件下,室温连接强度随着二次连接温度的提高和二次保温时间的延长而提高,改变连接工艺参数对Si3N4/Ti/Cu/Ni二次PTLP连接界面反应层厚度无明显影响;连接强度在试验温度400℃时达到最大,随后随试验温度升高,连接强度降低,但在800℃前,其高温强度具有很好的稳定性。 相似文献
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Joydeep Maity Tapan Kumar Pal 《Journal of Materials Engineering and Performance》2012,21(7):1232-1242
In the present study, the transient liquid-phase diffusion bonding of an aluminum metal matrix composite (6061-15?wt.% SiCp) has been investigated for the first time using a mixed Cu-Ni powder interlayer at 560?°C, 0.2?MPa, for different holding times up to 6?h. The microstructure of the isothermally solidified zone contains equilibrium precipitate CuAl2, metastable precipitate Al9Ni2 in the matrix of ??-solid solution along with the reinforcement particles (SiC). On the other hand, the microstructure of the central bond zone consists of equilibrium phases such as NiAl3, Al7Cu4Ni and ??-solid solution along with SiC particles (without any segregation) and the presence of microporosities. During shear test, the crack originates from microporosities and propagates along the interphase interfaces resulting in poor bond strength for lower holding times. As the bonding time increases, with continual diffusion, the structural heterogeneity is diminished, and the microporosities are eliminated at the central bond zone. Accordingly, after 6-h holding, the microstructure of the central bond zone mainly consists of NiAl3 without any visible microporosity. This provides a joint efficiency of 84% with failure primarily occurring through decohesion at the SiC particle/matrix interface. 相似文献
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The studies of soldered joints were carried out in systems: Al/solder/Al, Al/solder/Cu, Cu/solder/Cu, where the solder was (Al-Zn)EUT, (Al-Zn)EUT with 0.5, 1.0, and 1.5 at.% of Ag and (Al-Zn)EUT with 0.5, 1.0, and 1.5 at.% of Cu addition. Brazing was performed at 500 °C for 3 min. The EDS analysis indicated that the composition of the layers starting from the Cu pad was CuZn, Cu5Zn8, and CuZn4, respectively. Wetting tests were performed at 500 °C for 3, 8, 15, and 30 min, respectively. Thickness of the layers and their kinetics of growth were measured based on the SEM micrographs. The formation of interlayers was not observed from the side of Al pads. On the contrary, dissolution of the Al substrate and migration of Al-rich particles into the bulk of the solder were observed. 相似文献
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曾建谋 《稀有金属(英文版)》1998,(3)
1IntroductionTheroledAg/Cucompositecontactsarewidelyusedinindustrialequipmentandhomeappliance.However,thebondingstrengthofco... 相似文献
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The present study details the microstructure evolution of the interfacial intermetallic compounds (IMCs) layer formed between
the Sn-xAg-0.5Cu (x = 1, 3, and 4 wt.%) solder balls and electroless Ni-P layer, and their bond strength variation during aging. The interfacial
IMCs layer in the as-reflowed specimens was only (Cu,Ni)6Sn5 for Sn-xAg-0.5Cu solders. The (Ni,Cu)3Sn4 IMCs layer formed when Sn-4Ag-0.5Cu and Sn-3Ag-0.5Cu solders were used as aging time increased. However, only (Cu,Ni)6Sn5 IMCs formed in Sn-1Ag-0.5Cu solders, when the aging time was extended beyond 1500 h. Two factors are expected to influence
bond strength and fracture modes. One of the factors is that the interfacial (Ni,Cu)3Sn4 IMCs formed at the interface and the fact that fracture occurs along the interface. The other factor is Ag3Sn IMCs coarsening in the solder matrix, and fracture reveals the ductility of the solder balls. The above analysis indicates
that during aging, the formation of interfacial (Ni,Cu)3Sn4 IMCs layers strongly influences the pull strength and the fracture behavior of a solder joint. This fact demonstrates that
interfacial layers are key to understanding the changes in bonding strength. Additionally, comparison of the bond strength
with various Sn-Ag-Cu lead-free solders for various Ag contents show that the Sn-1Ag-0.5Cu solder joint is not sensitive to
extended aging time. 相似文献
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利用电阻压焊进行Cu/Al合金异种材料复合管的焊接试验,分析了接头微观组织与界面主要元素的分布特征。结果表明,接头中Cu元素大量扩散溶入Al基体中,形成有害的CuAl2金属间化合物,但是,电阻压焊过程中外加顶锻力使结合区产生剧烈塑性变形,能破碎粗大CuAl2金属间化合物并细化接头熔合区晶粒,有利于改善接头的结合性能,获得优质焊接接头。 相似文献