Trapping of charge carriers into InAs/AlAs quantum dots at liquid-helium temperature

The problem of how the probability of trapping of charge carriers into quantum dots via the wetting layer influences the steady-state and time-dependent luminescence of the wetting layer and quantum dots excited via the matrix is analyzed in the context of some simple models. It is shown that the increase in the integrated steady-state luminescence intensity of quantum dots with increasing area fraction occupied by the quantum dots in the structure is indicative of the suppression of trapping of charge carriers from the wetting layer into the quantum dots. The same conclusion follows from the independent decays of the time-dependent luminescence signals from the wetting layer and quantum dots. The processes of trapping of charge carriers into the InAs quantum dots in the AlAs matrix at 5 K are studied experimentally by exploring the steady-state and time-dependent photoluminescence. A series of structures with different densities of quantum dots has been grown by molecular-beam epitaxy on a semi-insulating GaAs (001) substrate. It is found that the integrated photoluminescence intensity of quantum dots almost linearly increases with increasing area occupied with the quantum dots in the structure. It is also found that, after pulsed excitation, the photoluminescence intensity of the wetting layer decays more slowly than the photoluminescence intensity of the quantum dots. According to the analysis, these experimental observations suggest that trapping of excitons from the wetting layer into the InAs/AlAs quantum dots at 5 K is suppressed.     

Effect of carrier dynamics and temperature on two-state lasing in semiconductor quantum dot lasers

It is analytically shown that the both the charge carrier dynamics in quantum dots and their capture into the quantum dots from the matrix material have a significant effect on two-state lasing phenomenon in quantum dot lasers. In particular, the consideration of desynchronization in electron and hole capture into quantum dots allows one to describe the quenching of ground-state lasing observed at high injection currents both qualitatevely and quantitatively. At the same time, an analysis of the charge carrier dynamics in a single quantum dot allowed us to describe the temperature dependences of the emission power via the ground- and excited-state optical transitions of quantum dots.     

Molecular beam epitaxy of AlGaAs/Zn(Mn)Se hybrid nanostructures with InAs/AlGaAs quantum dots near the heterovalent interface

Features of the growth of InAs quantum dots in an Al_0.35Ga_0.65As matrix by molecular beam epitaxy at different substrate temperatures, deposition rates, and amounts of deposited InAs are studied. The optimum conditions for growing an array of low-density (≤2 × 10¹⁰ cm^?2) small (height of no more than 4 nm) self-organized quantum dots are determined. The possibility of the formation of optically active InAs quantum dots emitting in the energy range 1.3–1.4 eV at a distance of no more than 10 nm from the coherent heterovalent GaAs/ZnSe interface is demonstrated. It is established that inserting an optically inactive 5-nm GaAs quantum well resonantly coupled with InAs quantum dots into the upper AlGaAs barrier layer enhances the photoluminescence efficiency of the quantum-dot array in hybrid heterostructures.     

GaAs structures with InAs and As quantum dots produced in a single molecular beam epitaxy process

Epitaxial GaAs layers containing InAs semiconductor quantum dots and As metal quantum dots are grown by molecular beam epitaxy. The InAs quantum dots are formed by the Stranskii-Krastanow mechanism, whereas the As quantum dots are self-assembled in the GaAs layer grown at low temperature with a large As excess. The microstructure of the samples is studied by transmission electron microscopy. It is established that the As metal quantum dots formed in the immediate vicinity of the InAs semiconductor quantum dots are larger in size than the As quantum dots formed far from the InAs quantum dots. This is apparently due to the effect of strain fields of the InAs quantum dots upon the self-assembling of As quantum dots. Another phenomenon apparently associated with local strains around the InAs quantum dots is the formation of V-like defects (stacking faults) during the overgrowth of the InAs quantum dots with the GaAs layer by low-temperature molecular beam epitaxy. Such defects have a profound effect on the self-assembling of As quantum dots. Specifically, on high-temperature annealing needed for the formation of large-sized As quantum dots by Ostwald ripening, the V-like defects bring about the dissolution of the As quantum dots in the vicinity of the defects. In this case, excess arsenic most probably diffuses towards the open surface of the sample via the channels of accelerated diffusion in the planes of stacking faults.     

Analysis of thermal emission processes of electrons from arrays of InAs quantum dots in the space charge region of GaAs matrix

We thoroughly analyze admittance spectroscopy data on the temperature dependence of the rate of electron emission from the ground state of InAs quantum dots in the space-charge layer of a Schottky barrier on an n-GaAs matrix. The experimental results are described using a one-dimensional model of thermally activated tunneling with the involvement of virtual states. The shape of the potential barrier to be overcome by emitted electrons is selected by introducing the effective concentration of shallow donors such that the electron binding energies in the quantum dots were similar to those determined from the measured capacitance-voltage characteristics of the investigated structures. The obtained electron-capture cross sections increase with the ground-state binding energy (quantum dot size). The capture cross-section values for InAs quantum dots with average lateral sizes of 9 and 20 nm lie in the ranges 1 × 10^?14?2 × 10^?13 and 4 × 10^?12?2 × 10^?11 cm².     

Optical study of InP quantum dots

Results of photoluminescence (PL) studies of self-organized nanoscale InP islands (quantum dots, QDs) in the In_0.49Ga_0.51P matrix, grown on a GaAs substrate by metalorganic vapor phase epitaxy (MOVPE), are presented. Dependences of the PL efficiency on temperature in the range 77–300 K and on excitation level at pumping power densities of 0.01–5 kW/cm² have been obtained. The PL spectra are a superposition of emission peaks from QDs and the wetting layer. Their intensity ratio depends on the pumping power and temperature, and the emission wavelength varies in the range 0.65–0.73 μm. At 77 K and low excitation level, InP QDs exhibit high temperature stability of the emission wavelength and high quantum efficiency. __________ Translated from Fizika i Tekhnika Poluprovodnikov, Vol. 35, No. 2, 2001, pp. 242–244. Original Russian Text Copyright ? 2001 by Vinokurov, Kapitonov, Nikolaev, Sokolova, Tarasov.     

Si/SiO2Structures with Quantum Size Effects: The Construction of a Low-Dimensional Nanoscale Electronic System in the Interface Layer of Si by Incorporating a Regularly Distributed Charge into SiO2

A novel approach to producing long-lived, reconfigurable, self-organized nanoscale electronic systems of a low dimension (quantum wells, wires, dots, superlattices, etc.) in a semiconductor is discussed. This approach consists of creating a regular charge distribution in an adjacent dielectric, so that a two-dimensional potential distribution is induced in the interface layer of the semiconductor. Advanced methods to generate a desired charge distribution in dielectrics are reviewed. They use (1) the local injection of electrons or ions into a thin dielectric layer by a precisely focused beam, (2) the local electronic or ionic polarization of dielectrics with a scanning tunneling microscope, or (3) nanoscale charge patterns that can be spontaneously formed by electrons or ions in dielectrics. The possible applications of the approach are considered in the context of the Si/SiO₂system.     

Spin injection in GaAs/GaSb quantum-well heterostructures

GaAs/GaSb type-II quantum-dot heterostructures were grown by molecular-beam epitaxy. The circularly polarized photoluminescence of these samples in a magnetic field up to 4.7 T in the Faraday configuration was investigated. It was found that the emission from quantum dots in a magnetic field is σ⁻-polarized, which corresponds to the electron-spin component along the magnetic-field vector of +1/2. The degree of polarization increases with increasing excitation intensity. The observed effect is explained in terms of spin injection from the GaSb matrix, where spin orientation appears owing to the Zeeman splitting of the conduction band. An increase in the degree of polarization occurs due to a reduction in the charge-carrier radiative lifetime in type-II quantum dots with increasing excitation level.     

Coupling of electron states in the InAs/GaAs quantum dot molecule

Deep level transient spectroscopy (DLTS) is used to study electron emission from the states in the system of vertically correlated InAs quantum dots in the p-n InAs/GaAs heterostructures, in relation to the thickness of the GaAs spacer between the two layers of InAs quantum dots and to the reverse-bias voltage. It is established that, with the 100 Å GaAs spacer, the InAs/GaAs heterostructure manifests itself as a system of uncoupled quantum dots. The DLTS spectra of such structures exhibit two peaks that are defined by the ground state and the excited state of an individual quantum dot, with energy levels slightly shifted (by 1–2 eV), due to the Stark effect. For the InAs/GaAs heterostructure with two layers of InAs quantum dots separated by the 40 Å GaAs spacer, it is found that the quantum dots are in the molecule-type phase. Hybridization of the electron states of two closely located quantum dots results in the splitting of the levels into bonding and antibonding levels corresponding to the electron ground states and excited states of the 1s ⁺, 1s ^?, 2p ⁺, 2p ^?, and 3d ⁺ types. These states manifest themselves as five peaks in the DLTS spectra. For these quantum states, a large Stark shift of energy levels (10–40 meV) and crossing of the dependences of the energy on the electric field are observed. The structures with vertically correlated quantum dots are grown by molecular beam epitaxy, with self-assembling effects.     

Effect of multicomponent InAsSbP matrix surface on formation of InSb quantum dots at MOVPE growth

Indium-antimonide quantum dots (7–9 × 10⁹ cm²) are produced on an InAs(001) substrate by metal-organic vapor-phase epitaxy at a temperature of T = 440°C. Epitaxial deposition occurred simultaneously onto an InAs binary matrix and an InAsSbP quaternary alloy matrix layer lattice-matched to the InAs substrate in terms of the lattice parameter. Transformation of the quantum-dot shape and size is studied in relation to the chemical composition of the working matrix surface, onto which the quantum dots are deposited. The use of a multicomponent layer makes it possible to control the lattice parameter of the matrix and the strains produced in the system during the formation of self-assembled quantum dots.     

InP quantum dots in (1 0 0) GaP: Growth and luminescence

We describe the growth and optical emission from strained InP quantum wells and quantum dots grown on GaP substrates using gas-source molecular beam epitaxy. Self-organized quantum dot formation takes place for InP coverage greater than 1.8 monolayers on the (1 0 0) GaP surface. Atomic force and scanning-electron microscopy studies indicate that unburied dots have a lateral size of 60–100 nm and are about 20 nm high, with dot densities in the range of 2–6×10⁸ cm⁻² for InP coverage between 1.9 and 5.8 MLs. Intense photoluminescence is emitted from both the quantum wells and the quantum dots at energies of about 2.2 and 2.0 eV, respectively. Time-resolved measurements indicate rather long carrier lifetimes of about 19 ns in the quantum wells and about 3 ns in the quantum dots. The data indicate that the InP/GaP quantum wells form a type-II band system, with electrons in the X valleys of the GaP recombine with holes in the InP. Furthermore, in the InP/GaP quantum dot system, the conduction band edge in the X valley of the GaP is nearly aligned with that in the Γ valley of the InP. Rapid thermal annealing of the quantum dots results in at least a six-fold enhancement of integrated emission intensity as well as some Ga-In interdiffusion. The low interdiffusion activation energy indicates that the material near the interface between the GaP matrix and the InP dots is not free of defects.     

Effect of a low-temperature-grown GaAs layer on InAs quantum-dot photoluminescence

The photoluminescence of InAs semiconductor quantum dots overgrown by GaAs in the low-temperature mode (LT-GaAs) using various spacer layers or without them is studied. Spacer layers are thin GaAs or AlAs layers grown at temperatures normal for molecular-beam epitaxy (MBE). Direct overgrowth leads to photoluminescence disappearance. When using a thin GaAs spacer layer, the photoluminescence from InAs quantum dots is partially recovered; however, its intensity appears lower by two orders of magnitude than in the reference sample in which the quantum-dot array is overgrown at normal temperature. The use of wider-gap AlAs as a spacer-layer material leads to the enhancement of photoluminescence from InAs quantum dots, but it is still more than ten times lower than that of reference-sample emission. A model taking into account carrier generation by light, diffusion and tunneling from quantum dots to the LT-GaAs layer is constructed.     

Evolution of exciton states near the percolation threshold in two-phase systems with II–VI semiconductor quantum dots

From studies of two-phase systems (borosilicate matrices containing ZnSe or CdS quantum dots), it was found that the systems exhibit a specific feature associated with the percolation phase transition of charge carriers (excitons). The transition manifests itself as radical changes in the optical spectra of both ZnSe and CdS quantum dot systems and by fluctuations of the emission band intensities near the percolation threshold. These effects are due to microscopic fluctuations of the density of quantum dots. The average spacing between quantum dots is calculated taking into account their finite dimensions and the volume fraction occupied by the quantum dots at the percolation threshold. It is shown that clustering of quantum dots occurs via tunneling of charge carriers between the dots. A physical mechanism responsible for the percolation threshold for charge carriers is suggested. In the mechanism, the permittivity mismatch of the materials of the matrix and quantum dots plays an important role in delocalization of charge carriers (excitons): due to the mismatch, “a dielectric trap” is formed at the external surface of the interface between the matrix and a quantum dot and, thus, surface exciton states are formed there. The critical concentrations of quantum dots are determined, such that the spatial overlapping of such surface states provides the percolation transition in both systems.     

Nonvolatile Memory Effect in Indium Gallium Arsenide-Based Metal–Oxide–Semiconductor Devices Using II–VI Tunnel Insulators

This paper reports the successful use of ZnSe/ZnS/ZnMgS/ZnS/ZnSe as a gate insulator stack for an InGaAs-based metal–oxide–semiconductor (MOS) device, and demonstrates the threshold voltage shift required in nonvolatile memory devices using a floating gate quantum dot layer. An InGaAs-based nonvolatile memory MOS device was fabricated using a high-κ II–VI tunnel insulator stack and self-assembled GeO _x -cladded Ge quantum dots as the charge storage units. A Si₃N₄ layer was used as the control gate insulator. Capacitance–voltage data showed that, after applying a positive voltage to the gate of a MOS device, charges were being stored in the quantum dots. This was shown by the shift in the flat-band/threshold voltage, simulating the write process of a nonvolatile memory device.     

Study of the Structural and Luminescence Properties of InAs/GaAs Heterostructures with Bi-Doped Potential Barriers

The influence of Bi in GaAs barrier layers on the structural and optical properties of InAs/GaAs quantum-dot heterostructures is studied. By atomic-force microscopy and Raman spectroscopy, it is established that the introduction of Bi into GaAs to a content of up to 5 at % results in a decrease in the density of InAs quantum dots from 1.58 × 10¹⁰ to 0.93 × 10¹⁰ cm^–2. The effect is defined by a decrease in the mismatch between the crystal-lattice parameters at the InAs/GaAsBi heterointerface. In this case, an increase in the height of InAs quantum dots is detected. This increase is apparently due to intensification of the surface diffusion of In during growth at the GaAsBi surface. Analysis of the luminescence properties shows that the doping of GaAs potential barriers with Bi is accompanied by a red shift of the emission peak related to InAs quantum dots and by a decrease in the width of this peak.     

Analysis of mechanisms of carrier emission in the p-i-n structures with In(Ga)As quantum dots

With the help of the photocurrent spectroscopy, the mechanism of emission of charge carriers from energy levels of the (In,Ga)As/(Al,Ga)As quantum dots of different design are studied. Thermal activation is shown to be the main mechanism of carrier emission from the quantum dots for the isolated layer of quantum dots separated by wide (Al,Ga)As spacer layers. At a small width of the (Al,Ga)As spacer layer, when electron binding of separate layers of the quantum dots in the vertical direction takes place, the role of the tunneling mechanism of carrier emission between the vertically coupled quantum dots increases.     

The sandwich InGaAs/GaAs quantum dot structure for IR photoelectric detectors

A new possibility for growing InAs/GaAs quantum dot heterostructures for infrared photoelectric detectors by metal-organic vapor-phase epitaxy is discussed. The specific features of the technological process are the prolonged time of growth of quantum dots and the alternation of the low-and high-temperature modes of overgrowing the quantum dots with GaAs barrier layers. During overgrowth, large-sized quantum dots are partially dissolved, and the secondary InGaAs quantum well is formed of the material of the dissolved large islands. In this case, a sandwich structure is formed. In this structure, quantum dots are arranged between two thin layers with an increased content of indium, namely, between the wetting InAs layer and the secondary InGaAs layer. The height of the quantum dots depends on the thickness of the GaAs layer grown at a comparatively low temperature. The structures exhibit intraband photoconductivity at a wavelength around 4.5 μm at temperatures up to 200 K. At 90 K, the photosensitivity is 0.5 A/W, and the detectivity is 3 × 10⁹ cm Hz^1/2W^?1.     

Photoconductivity of composite structures based on porous SnO2 sensitized with CdSe nanocrystals

The introduction of CdSe nanocrystals (colloidal quantum dots) into a porous SnO₂ matrix brings about the appearance of photoconductivity in the structures. Sensitization is a consequence of charge exchange between the quantum dots and the matrix. Photoconductivity spectral measurements show that the nanocrystals embedded into the matrix are responsible for the optical activity of the structure. The photoconductivity of the structures sensitized with different-sized quantum dots is studied in the temperature range from 77 to 300 K. It is shown that the maximum photoconductivity is attained by introducing nanocrystals of the minimum size (2.7 nm). The mechanisms of charge-carrier transport in the matrix and the charge-exchange kinetics are discussed.     

Specific features of electroluminescence in heterostructures with InSb quantum dots in an InAs matrix

The electrical and electroluminescence properties of a single narrow-gap heterostructure based on a p-n junction in indium arsenide, containing a single layer of InSb quantum dots in the InAs matrix, are studied. The presence of quantum dots has a significant effect on the shape of the reverse branch of the current-voltage characteristic of the heterostructure. Under reverse bias, the room-temperature electroluminescence spectra of the heterostructure with quantum dots, in addition to a negative-luminescence band with a maximum at the wavelength λ = 3.5 μm, contained a positive-luminescence emission band at 3.8 μm, caused by radiative transitions involving localized states of quantum dots at the type-II InSb/InAs heterointerface.     

Electron emission from multilayer ensembles of vertically coupled InAs quantum dots in an <Emphasis Type="Italic">n</Emphasis>-GaAs matrix

Electron emission from multilayer arrays of vertically coupled InAs quantum dots into the n-GaAs matrix in Schottky-barrier structures (electron concentration n ≈ 2 × 10¹⁶ cm^?3) is studied by admittance spectroscopy. It is established that, in the temperature region below ～70 K, electron emission in a rate range of 3 × 10⁴–3 × 10⁶ s^?1 proceeds via thermally activated tunneling through intermediate virtual states. As the number of layers in the quantum dot array increases from three to ten, a decrease in the electron emission rate is observed.