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钛酸铅和锆钛酸铅铁电薄膜的热释电效应的研究 总被引:1,自引:0,他引:1
本文测量了钛酸铅和锆钛酸铅铁电薄膜的热释电效应,在这些以钛薄片为衬底,用Sol-Gel方法制备的铁电薄膜上可测到明显的热释电响应,同时,对这些薄膜的牡民I-V特性也进行了测试,对敏感元工之间的热传导以及材料中发现的光效应对热释电响应的影响进行了分析和讨论。 相似文献
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高温钛酸铅钡PTCR陶瓷制备中铅的挥发与抑制 总被引:5,自引:0,他引:5
通过理论分析,提出了在BaTiO3中掺入PbTiO3而不是按传统掺入PbO或Pb3O4采用敝开式烧结工艺便可有效地减少烧结过程中Pb成分的损失。实验结果表明效果极好,同时表明Pb元素对居里温度的移动效率随Pb总含量而明显变化,在铅含量较低时,可获得比通常文献报导的高得多的值。本文阐述了这些规律,并作出了理论解释。 相似文献
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我们用Sol-Gel法制备了非晶钛酸铅膜。研究了各种温度下离子注入对其结构的影响。发现注入温度较低时,铅在非晶钛酸铅膜中聚集并结晶;当注入温度较高时,离子注入阻碍晶态钛酸铅的形成而使膜中出现晶态铅和氧化铅。 相似文献
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本文采用反射式高能电子衍射(RHEED)监测脉冲激光沉积法制备钛酸铅薄膜过程.根据PbTiO3/MgO(001)薄膜、PbTiO3/Si(100)薄膜生长过程中RHEED强度的时间演变,分析基片对薄膜生长模式的影响.并且观测不同生长时刻的RHEED强度的空间分布,讨论生长过程中薄膜表面的台阶尺寸变化.另外,比较在不同氧分压下沉积的钛酸铅薄膜表面的RHEED图案,发现氧气将改变薄膜的微结构,提高薄膜的结晶性. 相似文献
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改进的sol-gel工艺制备细晶Ba0.6Sr0.4TiO3陶瓷及其介电性能的研究 总被引:2,自引:1,他引:1
用改进的sol-gel工艺制备了细晶钛酸锶钡(Ba0.6Sr0.4TiO3,BST)陶瓷块体,研究了BST陶瓷的结晶与介电性能.在这种改进sol-gel的工艺中,用传统的固相反应煅烧形成BST粉体,经高能球磨制备BST纳米陶瓷粉体,再将一定质量的纳米粉体加入到相同化学组成的BST的溶胶液中,经普球球磨12h后,制备成悬浮性好,分散均匀的浆料.浆料可用来制备BST陶瓷,并在1200℃保温2h烧结成瓷,结果显示,BST陶瓷块体结构致密,晶粒尺寸在0.15~2μm之间.分析了样品的介电性能和晶粒尺寸对材料介电性能的影响.介电温谱显示,在0℃,100kHz时,相对介电常数为2500,介电损耗为0.02;并且存在明显的弥散相变. 相似文献
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Sol-gel derived Pb40Sr60TiO3 (PST) thin film has been investigated as a diffusion barrier for integrating in PbZr30Ti70O3 (PZT) device structures on Si substrates. PST film was deposited on SiO2/Si substrate and annealed at a relatively low temperature range of 550-600 °C producing a crack-free, smooth and textured surface. Following deposition on PST/SiO2/Si template PZT thin film was crystallised exhibiting random grain orientations and an insertion of the bottom Pt/Ti electrode forming PZT/Pt/Ti/PST/SiO2/Si stacks promoted the preferred PZT (111) perovskite phase. PZT (111) peak intensity gradually decreased along with slight increase of the PZT (110) peak with increasing annealing temperature of the buffer PST film. The dielectric and ferroelectric properties of the PZT with barrier PST deposited at 550 °C were assessed. The dielectric constant and loss factor were estimated as 390 and 0.034 at 100 kHz respectively and the remnant polarisation was 28 µC/cm2 at 19 V. The performance of the PZT/PST device structures was compared to similar PZT transducer stacks having widely used barrier TiO2 layer. 相似文献
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In this paper, platinum/titanium (Pt/Ti) film was introduced as a residual stress balance layer into wafer scale thick lead zirconate titanate (PZT) film fabrication by sol-gel method. The stress developing in PZT film's bottom electrode as well as in PZT film itself during deposition were analyzed; the wafer curvatures, PZT crystallizations and PZT electric properties before and after using Pt/Ti stress balance layer were studied and compared. It was found that this layer is effective to balance the residual stress in PZT film's bottom electrode induced by thermal expansion coefficient mismatch and Ti diffusion, thus can notably reduce the curvature of 4-in. wafer from − 40.5 μm to − 12.9 μm after PZT film deposition. This stress balance layer was also found effective to avoid the PZT film cracking even when annealed by rapid thermal annealing with heating-rate up to 10.5 °C/s. According to X-ray diffraction analysis and electric properties characterization, crack-free uniform 1-μm-thick PZT film with preferred pervoskite (001) orientation, excellent dielectric constant, as high as 1310, and excellent remanent polarization, as high as 39.8 μC/cm2, can be obtained on 4-in. wafer. 相似文献
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以乙二醇为溶剂,硝酸钕为钕源,采用改进的溶胶-凝胶法制备了钕掺杂锆钛酸铅纳米粉体Pb1-3x/2NdxZr0.52Ti0.48O3(PNZT).通过FTIR、XRD、TG-DTA讨论了溶胶经热处理制备纳米粉体的反应机理,PNZT的热处理温度较PZT高50~100℃.采用XRD、SEM、TEM对纳米粉体进行表征.研究表明,钕掺杂增加了晶格畸变程度.与PZT相比,随着钕掺杂量增加晶格参数a和V下降,而参数c和c/a则不同,少量钕掺杂导致参数c和c/a增加,随着钕掺杂量增加逐渐下降.当钕掺杂量≤9%(摩尔分数)时可生成粒径约为20~50nm的钙钛矿型粉体, Nd3 离子取代Pb2 离子与Ti4 离子、O2 离子形成稳定的钙钛矿型结构. 相似文献
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在成功地采用柠檬酸溶胶-凝胶法在硬质合金试样表面制备出MoS2软涂层的基础上,采用扫描电镜形貌观察和摩擦系数测定等实验方法研究了MoS2加入量对涂层表面微观形貌及其摩擦性能的影响规律。结果表明,采用溶胶-凝胶法在1.6mol/L柠檬酸水溶液中分别添加13、20和27g/L MoS2粉末条件下,应用刷涂法均可以在硬质合金试样表面得到与基体结合牢固、表面质量较高的MoS2软涂层。所获得的MoS2软涂层的表面形貌呈片状。MoS2软涂层的存在明显地降低了硬质合金试样的摩擦系数,由硬质合金试样的0.58~0.86降低到软涂层的0.18~0.23。而具有不同MoS2加入量的软涂层间的摩擦系数相差不大。软涂层试样的摩擦系数明显低于硬质合金试样的原因与涂层中存在有摩擦系数低、承载力大等优良性能的MoS2以及软涂层的存在改变了原摩擦副材料间的性质等因素有关。 相似文献
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钛酸锶钡(BaxSr1-xTiO3)陶瓷制备及其介电性能的研究 总被引:5,自引:0,他引:5
采用乙酸钡、乙酸锶和钛酸丁酯为原料的溶胶凝胶方法制备了BaxSn1-xTiO3(x=0.6)超细粉体,将BST超细粉体压制成型,进行烧结,得到(Ba0.6Sr004)TiO3陶瓷。通过热分析(DSC/TG)、X射线衍射(XRD)分析(Ba0.6Sr0.4)TiO3粉体合成过程及其相结构变化。采用扫描电子显微镜(SEM)描述(Ba0.6Sr0.4)TiO3烧结体的相结构和显微组织结构变化。阻抗分析仪测量(Ba0.6Sr0.4)TiO3陶瓷的-50~100℃介电温谱。实验结果表明BaxSn1-xTiO3粉体的相结构为立方相钙钛矿结构,其合成温度及烧结温度分别为800℃及1250℃,均低于传统工艺的相应温度。(Ba0.6Sr0.4)TiO3陶瓷在-50~100℃温度范围内,其电容率随着烧结温度升高而增大.介电损耗tgδ在-50~100℃温度范围内,随温度的增加而降低。1250℃的(Ba0.6Sr0.4)TiO3陶瓷烧结体样品存在介电峰弥散化。 相似文献