Near-field microscopy: throwing light on the nanoworld

Optical microscopy with nanoscale resolution, beyond that which is possible with conventional diffraction-limited microscopy, may be achieved by scanning a nanoantenna in close proximity to a sample surface. This review will first aim to provide an overview of the basic principles of this technique of scanning near-field optical microscopy (SNOM), before moving on to consider the most widely implemented form of this microscopy, in which the sample is illuminated through a small aperture held less than 10 nm from the sample surface for optical imaging with a resolution of ca. 50 nm. As an example of the application of this microscopy, the results of SNOM measurements of light-emitting polymer nanostructures are presented. In particular, SNOM enables the unambiguous identification of the different phases present in the nanostructures, through the local analysis of the fluorescence from the polymers. The exciting new possibilities for high-resolution optical microscopy and spectroscopy promised by apertureless SNOM techniques are also considered. Apertureless SNOM may involve local scattering of light from a sample surface by a tip, local enhancement of an optical signal by a metal tip, or the use of a fluorescent molecule or nanoparticle attached to a tip as a local optical probe of a surface. These new optical nanoprobes offer the promise of optical microscopy with true nanometre spatial resolution.     

Novel magnetic tips developed for the switching magnetization magnetic force microscopy

Using micromagnetic calculations we search for optimal magnetic properties of novel magnetic tips to be used for a Switching Magnetization Magnetic Force Microscopy (SM-MFM), a novel technique based on two-pass scanning with reversed tip magnetization. Within the technique the sum of two scans images local atomic forces and their difference maps the local magnetic forces. The tip magnetization is switched during the scanning by a small magnetic field. The technology of novel low-coercitive magnetic tips is proposed. For best performance the tips must exhibit low magnetic moment, low switching field, and single-domain state at remanence. Such tips are equipped with Permalloy objects of a precise shape that are defined on their tilted sides. We calculate switching fields of such tips by solving the micromagnetic problem to find the optimum shape and dimensions of the Permalloy objects located on the tips. Among them, hexagon was found as the best shape for the tips.     

Implementation of atomically defined field ion microscopy tips in scanning probe microscopy

The field ion microscope (FIM) can be used to characterize the atomic configuration of the apices of sharp tips. These tips are well suited for scanning probe microscope (SPM) use since they predetermine the SPM resolution and the electronic structure for spectroscopy. A protocol is proposed for preserving the atomic structure of the tip apex from etching due to gas impurities during the period of transfer from the FIM to the SPM, and estimations are made regarding the time limitations of such an experiment due to contamination with ultra-high vacuum rest gases. While avoiding any current setpoint overshoot to preserve the tip integrity, we present results from approaches of atomically defined tungsten tips to the tunneling regime with Au(111), HOPG (highly oriented pyrolytic graphite) and Si(111) surfaces at room temperature. We conclude from these experiments that adatom mobility and physisorbed gas on the sample surface limit the choice of surfaces for which the tip integrity is preserved in tunneling experiments at room temperature. The atomic structure of FIM tip apices is unchanged only after tunneling to the highly reactive Si(111) surface.     

Force gradient sensitive detection in lift-mode Kelvin probe force microscopy

We demonstrate frequency modulation Kelvin probe force microscopy operated in lift-mode under ambient conditions. Frequency modulation detection is sensitive to force gradients rather than forces as in the commonly used amplitude modulation technique. As a result there is less influence from electric fields originating from the tip's cone and cantilever, and the recorded surface potential does not suffer from the large lateral averaging observed in amplitude modulated Kelvin probe force microscopy. The frequency modulation technique further shows a reduced dependence on the lift-height and the frequency shift can be used to map the second order derivative of the tip-sample capacitance which gives high resolution material contrast of dielectric sample properties. The sequential nature of the lift-mode technique overcomes various problems of single-scan techniques, where crosstalk between the Kelvin probe and topography feedbacks often impair the correct interpretation of the recorded data in terms of quantitative electric surface potentials.     

Routine femtogram-level chemical analyses using vibrational spectroscopy and self-cleaning scanning probe microscopy tips

Simultaneous structural and chemical characterization of materials at the nanoscale is both an immediate need and an ongoing challenge. This article reports a route to address this need, which can be rapidly adopted by practitioners, by combining the benefits of widely available scanning probe microscopy and vibrational microspectrometry. In an atomic force microscope (AFM), the probe tip can provide a nanoscale topographic image. Here, we use a temperature-controlled probe tip to selectively acquire an analyte from a specified location and determine its mass in a thermogravimetric manner. The tip is then analyzed via complementary Raman and Fourier transform infrared microspectrometers, providing a molecular characterization of samples down to the femtogram level in minutes. The probe can be self-cleaned and employed for repeated use by rapidly heating it to vaporize the analyte. By combining the established analytical modalities of AFM and vibrational spectrometry, a complete physical and molecular characterization of nanoscale domains is possible: mass determination is facile, thermal analyses can be integrated on the probe, and the obtained spectral data can be related to existing knowledge bases.     

Waveguide analysis of heat-drawn and chemically etched probe tips for scanning near-field optical microscopy

We analyze two basic aspects of a scanning near-field optical microscope (SNOM) probe's operation: (i) spot-size evolution of the electric field along the probe with and without a metal layer, and (ii) a modal analysis of the SNOM probe, particularly in close proximity to the aperture. A slab waveguide model is utilized to minimize the analytical complexity, yet provides useful quantitative results--including losses associated with the metal coating--which can then be used as design rules.     

Scanning electrochemical microscopy: approach curves for sphere-cap scanning electrochemical microscopy tips

The parameters of functions used to predict diffusion-controlled scanning electrochemical microscopy approach curves under positive and negative (hindered diffusion) feedback for sphere-cap tips are reported. These functions were obtained by fitting approach curves simulated with an error-bounded adaptive finite element algorithm. Several geometries corresponding to different sphere-cap dimensions were considered including the effect of the tip insulating sheath. The simulated approach curves were successfully compared with experimental ones obtained with mercury sphere caps electrodeposited onto platinum microdisk electrodes.     

Scanning probe microscopy

The authors describe a range of microscopy techniques which are based on scanning a sharp tip over a surface. With such techniques it is possible both to image surfaces to atomic resolution, and to perform local property measurements to a resolution determined by the nature of the tip-surface interaction. As well as producing surface images, applications include imaging the electronic structure of semiconductor surfaces, measuring local magnetic properties and determining tribological properties of surfaces such as adhesion, lubrication and the coefficient of friction. The scanned probe techniques described are available commercially and therefore account for the majority of applications in this rapidly growing field     

Chemically etched fiber tips for near-field optical microscopy: a process for smoother tips

An improved method for producing fiber tips for scanning near-field optical microscopy is presented. The improvement consists of chemically etching quartz optical fibers through their acrylate jacket. This new method is compared with the previous one in which bare fibers were etched. With the new process the meniscus formed by the acid along the fiber does not move during etching, leading to a much smoother surface of the tip cone. Subsequent metallization is thus improved, resulting in better coverage of the tip with an aluminum opaque layer. Our results show that leakage can be avoided along the cone, and light transmission through the tip is spatially limited to an optical aperture of a 100-nm dimension.     

Tapping-mode scanning force microscopy: Metallic tips and samples

The operation of a tapping-mode scanning force microscope using a metallic tip and metallic sample, with a bias voltage applied between the two, is modelled as a driven nonlinear oscillator, where metal-metal adhesion and electric forces are taken into account. The model, which applies to the case where the sample indentation by the tip is minimal, shows that one can obtain a good estimate of the tip-sample contact time from the tip-sample current.     

Fabrication and use of a nanoscale Hall probe for measurements of the magnetic field induced by MFM tips

Extraordinary Hall effect probes with 160?nm × 160?nm working area were fabricated using photo-?and electron-beam lithographic procedures with the aim of direct measurements of MFM cantilever tip magnetic properties. The magnetic field sensitivity of the probes was 35?Ω?T(-1). Magnetic induction of the MFM cantilever tips coated by Co and SmCo films was measured with the probes. It was shown that the resolution of the probes was of the order of 10?nm.