关于菲尼酮在医用X线胶片高温快速冲洗显影药液中作用的探讨

本文总结了菲尼酮在医用X线胶片在90秒干至干,高温快速冲洗工艺中的作用和特征,如:超加和性、易接近潜影核、显影诱导期极短,对溴离子变化敏感程度低,显影结果重复性好等等。作者据此成功地配制了适用于90秒冲洗医用X线胶片的套药。     

压力对X线胶片灰雾形成的影响

1前言灰雾是指感光材料未经曝光通过显影而产生的密度。产生灰雾的原因很多,一般认为在卤化银晶体内部聚集了能形成显影核的较大的中性银原子,它通过显影也能产生密度形成灰雾。灰雾既能在感光材料制造过程中产生,也能在胶片储存过程中和加工过程中产生。例如,在储存过程中,温湿度高、与硬物摩擦、受到压力均会引起灰雾;在加工过程中,安全灯不符合要求、显影配方选择不当、显影时间长、温度偏高、显影液中防灰雾剂量偏少也能引起灰雾。对X线胶片而言,投照条件不正确,如千伏过高或过低、毫安大小、焦距不当等都会产生灰雾。灰雾对X线照片质…     

Kefan上海科帆化工科技有限公司新产品介绍新型显影剂—4-甲基菲尼酮(菲尼酮-B)

X线胶片显影用药一般都是以菲尼酮为显影剂，并用无水亚硫酸钠作为显影剂的保护剂，但菲尼酮通常是在碱性溶液中使用，贮存时间长时有不稳定、易变色的弱点。因此，外国近年来都大量开始使用菲尼酮－B（４－甲基菲尼酮）作为X线胶片的显影剂，它的优点在于具有较强的抗氧性，特别是在碱性溶液中具有良好的稳定性，在配成冲洗套药时贮存时间长，并且显影效果好。目前黑白胶片正大量应用于医学摄影、印刷工业、科学研究和国防军工事业。因此，用此新型显影剂配成的X线胶片的冲洗套药将具有良好的潜在市场。本公司最近推出的４－甲基菲尼酮作…     

基于显影条件动态分析上的胶片输出质量控制研究

根据印刷胶片冲洗机显影动态过程,建立了显影液浓度、显影剂氧化物浓度跟随已冲洗胶片面积变化的动态模型;分析了在一定条件下显影液浓度、显影剂氧化物浓度对印刷胶片显影质量的影响;综合两方面的结果,得出通过观察已冲洗胶片面积、调节补充液补充速度来控制印刷胶片显影质量方法.此方法既解决了DTP系统的流程中,胶片冲洗依靠人为经验控制的缺陷,同时达到减少原材料消耗,降低生产成本的目的,具有较强的实用性.     

天津MGL型感绿医用X线胶片

1前言 医用 X线胶片作为医疗诊断用的重要信息记录材料,自 20世纪初至今,始终是医学影像诊断的重要手段,被医疗卫生界所广泛应用。 医用 X线胶片主要有与常规钨酸钙增感屏组合使用的感蓝医用 X线胶片和与发射绿光的稀土增感屏组合使用的感绿医用 X线胶片两大系列。 天津牌感蓝医用 X线胶片已有四十多年的生产历史。产品主要性能基本达到国外同类产品水平,成为国内深受用户欢迎的知名产品。面对国外感绿医用 X线胶片于 90年代初开始在我国推广并取得成功的形势,为了满足我国医疗卫生界对感绿医用 X线胶片的需求,天津远大感光材料…     

增感显影的效果(1)——各种胶片与D-76的适应性

前言摄影时应将照相机、曝光表调定胶片的感光度。胶片的感光度数是经过感光测定求得的。但这个数值,由于显影加工的不同而有变化。因此,一般黑白胶片的感光测定是在一定反差条件下,求出胶片特性曲线上某点的曝光量,然后算出感光度。利用显影使胶片感光度变化的是增感显影或减感显     

乐凯牌KX-122型医用X光胶片

乐凯牌KX-122型医用X光胶片是为了适应高温快速X光胶片自动冲洗加工而设计的。其特点是胶片在90秒钟内即可完成显影、定影、水洗、干燥等加工程序,从而大大提高冲片效率,减少候诊时间。冲洗加工的胶片统一性好,可使医务工作者从繁重的体力劳动中解放出来。     

激光照排片的显影

本文阐述了适用于激光照排胶片的高温冲洗套药中的显影药液的组成，其作用和配比以及使用时的注意事项，如：冲洗胶片容量、使用时的稀释程度，补充液的添加速度，更换周期，保存条件。着重介绍了显影加工条件如温度、时间等对华光牌激光照排胶片照相性能的影响。     

三种新型彩底的性能比较

1973年美国柯达公司生产了一种新型号的柯达彩底Ⅱ型胶片,该胶片由于在乳剂制备过程中采用了显影抑制成色剂(DIR),以及进行了涂层结构、工艺配方的改进,因此胶片的清晰度、颗粒度、显影加工等方面与旧型号柯达彩底X型胶片相比均有明显的提高。继柯达彩底Ⅱ型之后,日本小西六照相工业公司、富士胶片公司也于1974年生产了与柯达彩底Ⅱ型具有大致相同效果的樱花彩底Ⅱ型和富士彩底F-Ⅱ型胶片。现将上述三种胶片的显影抑制剂类型、涂层结构和照相特性作一比较。     

避免胶片冲花的方法

盘中显影,胶片容易出现气泡和划伤两大症状。气泡,主要是胶片投入显影液时翻动不匀所致,特别是显影初期,这种现象最易发生。所以,胶片在显影前最好在清水中浸泡1—2分钟,让胶片湿透,然后进行显影。显影过程中要均匀地翻动,每次显影的胶片不要超过20张。     

聚乙二醇刷型聚合物在聚砜膜上的光化接枝

对在聚砜薄膜上接枝的聚乙二醇的形貌做了大量研究,探讨了在透明平整的无孔聚砜薄膜上接枝刷型聚乙二醇的条件。首先制作出了透明且光滑平整的无孔聚砜薄膜,然后以对叠氮苯甲酸为光敏剂,在λ=365 nm紫外光的辐照下,用二步法将聚乙二醇接枝在聚砜膜表面,通过X射线-光电子能谱分析、原子力学显微镜及椭圆偏振仪等测试手段,对接枝前后聚砜膜表面形貌进行了表征,证明接枝的聚乙二醇层呈刷状。     

Comparison of back-foil SXRF and EPMA for the elemental characterization of thin coatings

Back-foil scanning X-ray microfluorescence (SXRF), developed in a scanning electron microscope and applied for the analysis of very thin coatings is compared with electron probe X-ray microanalysis (EPMA). Both experimental results and Monte-Carlo calculations are used in this respect. The signal to background ratio as a function of the primary electron beam energy and angle of incidence, and for different film thicknesses is obtained for both techniques and a comparative study of sensitivity is made. Back-foil SXRF used in optimized experimental conditions, is found to be more sensitive than EPMA, especially in the case of very thin overlayers. The resolving power of back-foil SXRF is also calculated for the anode used by Monte-Carlo simulations.     

Instrument-invariant method of film thickness determination by means of substrate-to-film X-ray peak intensity ratioing

A simple method for the determination of thin film thickness using X-ray spectrometry is described. The ratio of the substrate X-ray peak intensity to that of the film is taken as a measure of the thickness of the film. A calibration curve, constructed using specimens of known thickness, can then be used for thockness determination. The results are independent of the incident electron beam current. The calibration curve is made instrument invariant by means of a normalization procedure and by taking into account the respective X-ray take-off angles. Normalized calibration curves are reported for 13 different elements on a silicon substrate, covering thicknesses between 2.5 and 650 nm. The method, ideally suited to thin films on solid substrates, can also be applied to films not on substrates, and in the presence of a thin organic interfacial layer between film and substrate.     

X光胶片的有机物剖析

介绍了X光胶片中照相有机物的剖析研究过程，采用酶解法富集样品，色层法分离提纯制备纯品，波谱法推测认定未知物的化学结构。从而了解国际上X光胶片技术的发展动态，为这一片种的技术贮备提供可靠的结构信息。     

磁控溅射MoS2/WS2复合薄膜的工艺与摩擦学性能研究

采用MoS2/WS2复合靶材在不锈钢和硅基片上溅射MoS2/WS2纳米薄膜,通过多次实验,得到溅射MoS2/WS2薄膜的最佳工艺如下:溅射气压4.0Pa,靶基距为70mm,溅射功率为150W,溅射时间为3h.使用X-射线衍射仪,能谱仪,扫描电子显微镜对薄膜的成分和结构进行分析.采用HH-3000薄膜结合强度划痕试验仪,纳米压痕测试系统,UNT-3摩擦磨损试验机对薄膜进行机械性能和摩擦磨损性能分析,结果表明:在大气环境中,WS2/MoS2 复合薄膜摩擦性能要优于纯MoS2薄膜.     

光敏热显影材料概论

本文综述了目前国际感光科学界的热点研究课题之一，而国内尚未正式开始研究的光敏热显影材料(Photothermographic materials,简称为PTG)。从研究PTG材料的现实意义及发展历史来看，PTG材料取得了很大的进步并且具有明显的优势。了解PTG系统的组成与功能，对于改进材料性能有很大帮助，同时对成像过程的机理探讨，可以指导PTG材料的发展。     

Thickness dependence of structure and optical properties of silver films deposited by magnetron sputtering

A series of silver films with different thickness were prepared under identical conditions by direct current magnetron sputtering. The optical properties of the silver films were measured using spectrophotometric techniques and the optical constants were calculated from reflection and transmission measurements made at near normal incidence. The results show that the optical properties and constants are affected by films' thickness. Below the critical thickness of 17 nm at which Ag film forms a continuous film, the optical properties and constants vary significantly as the thickness of films increases and then tends to a stable value which is reached at 41 nm. X-ray diffraction measurements were carried out to examine the structure and stress evolution of the Ag films as a function of films' thickness. It was found that the interplanar distance of (111) orientation decreases when the film thickness increases and tends to be close to that of bulk material. The compressive strains also decrease with increasing thickness.     

Chemical bath deposition of MoS2 thin film using ammonium tetrathiomolybdate as a single source for molybdenum and sulphur

Molybdenum disulphide, MoS₂, thin films have been deposited by chemical bath deposition method on glass and quartz substrate using ammonium tetrathiomolybdate as a single source precursor for Mo and S and subjected to vacuum heat treatment at different temperatures. X-ray diffraction of as-deposited film indicated its amorphous character and showed the development of poorly crystalline MoS₂ thin film on increasing annealing temperature. The film has been characterized by energy dispersive X-ray analysis, X-ray photoelectron spectroscopy, scanning electron micrograph and the optical properties also have been studied.     

电镀Ni－S合金的析出过程及非晶态结构的形成

研究了在含有硫代硫酸钠（Ｎａ２Ｓ２Ｏ３）的镀液中电镀Ｎｉ－Ｓ非晶态合金的条件。结果表明，Ｎｉ－Ｓ合金镀膜的成分随着电流密度、镀液中Ｎａ２Ｓ２Ｏ３的含量、镀液ｐＨ值的变化而变化，但镀膜结构则由镀膜中硫含量所决定。根据Ｘ射线衍射分析，含硫量为１５－３０ａｔ％的镀层具有非晶态结构。此外还对Ｎｉ－Ｓ合金镀膜的形成过程及电镀条件与镀膜形成的关系进行了研究。     

Preparation and characterization of long-chain alkyl silane-functionalized graphene film

Functionalized graphene (FG) was prepared in one step by treating graphene oxide (GO) successively with hexadecyltrimethoxysilane and triethylamine. The FG sheets were subsequently assembled into a thin film by vacuum extraction filtering. Fourier transform infrared spectroscopy, X-ray photoelectron spectroscopy, thermogravimetric analysis, X-ray diffraction, and Raman spectroscopy were employed to confirm the reduction and silane functionalization of GO to be simultaneously completed during the treatment. The presence of the long hexadecyl chain made the FG hydrophobic. The graphene film showed a high surface roughness, which consisted of many randomly stacked flakes, exhibiting a contact angle of up to 128.1°.