铝液夹杂物检测DMIRT－Ⅲ法的试验研究

提出了一种新的铝液夹杂物快速检测方法。导出了该法的检测原理方程。分析并试验研究了影响检测重复性和分辨率的因素。试验选择了较好的检测参数，并获得了较好的检测结果。     

高质量的一级光栅1．55μmDFB激光器

本文详细叙述了ＤＦＢ激光器的设计要点和新的工艺。采用一级全息光栅和二步液相外延法批量研制出高稳定单纵模工作的１．５５μｍ分布反馈激光器（ＤＦＢ—ＬＤ）。外延片成品率＞４０％。器件特性：２５℃时阈值电流２０ｍＡ，单面光功率＞１０ｍｗ，主边模抑制比ＳＭＳＲ达４３ｄＢ（λ／４相移光栅），谱线宽度△ν－２０ｄＢ＝０．３ｎｍ，调制速率＞１．８ＧＨｚ。可靠性测试显示：高温监测光谱稳定，２５°Ｃ时阈值退化率△Ｉｔｈ／ｔ＜０．３ｍＡ／ｋｈ，对应器件预估寿命将超过１０万ｈ。     

节能是提高企业经济效益的有效途径

叙述了鲁中公司能源消耗的状况，分析了节能管理中存在的问题，提出了今后节能管理的措施。     

平煤集团以人为本全面推动安全工作

介绍了平煤集团围绕以人为本的理念开展的提升理念、创新管理、加大投入和提高员工素质等一系列安全活动，为进一步抓好安全生产打下了坚实基础。     

Modeling and design of an AC to DC converter

A step-up/down single-phase AC-to-DC power converter without current sensor is proposed to achieve high performance and simple control logic. The power converter adopts a front-end diode rectifier so that only one active switch is required. The familiar state-space averaging technique for discontinuous mode DC-to-DC power converters is extended to model the proposed AC-to-DC converter. Unlike the existing model, which is valid only for a very low frequency range, namely below line frequency, the proposed model is applicable up to half switching frequency. The design of the controller is detailed. Selected experimental results are presented to verify the proposed theory     

MERLIN: a device diagnosis system based on analytic models

An approach to computer-aided interpretation of parametric test data for integrated circuit process-problem diagnosis is presented. In contrast to a conventional expert system, which reasons with a knowledge base consisting of rules acquired from human experts, the system presented centers its knowledge around analytic device equations. By using equations as the basis of the system knowledge, a more universal, well-organized, and concise level of knowledge is encoded. With the use of objects to present this knowledge, a great deal of useful information outside that described by only the symbolic expressions can be represented, and extension to qualitative or numeric models should be straightforward. The result is an expressive, well-organized, easily built, and easily maintained knowledge base. The authors describe the system's interactive graphical displays and the automatic data interpretation algorithms. Examples evaluating n-channel metal oxide semiconductor (NMOS) parameter variations, interconnect parameter variations, and interconnect yields are used for illustration