FREE ELECTRON LASER PROJECT AT SINR

The Shanghai FEL (SFEL) project at SINR is based on a RF linac in collaboration with the SIOFM. The prime goal of the project is to provide laser beams from the ultraviolet,visible to mid-IR with a few tens of MW in peak power and of Watts in average power. In the future, the wavelength region will be extend to the far-IR and vacuum ultraviolet. The SFEL will be a user facility for interdisciplinary studies.     

用背散射进行物质表面分析

背散射是物质表面分析的一种有用工具。本文简要介绍了背散射的原理和常用的分析方法,给出了用背散射技术测量金属和非金属厚度、分析硅中掺砷含量、测量Si_3N_4样品的化学配比、分析离子注入样品、测量氯元素在二氧化硅中的深度分布等实验结果。     

PIXE AND IXX ANALYSIS OF MUSEUM PAPERLIKE OBJECT

ＰＩＸＥＡＮＤＩＸＸＡＮＡＬＹＳＩＳＯＦＭＵＳＥＵＭＰＡＰＥＲＬＩＫＥＯＢＪＥＣＴＳＷｕＸｉａｎｋａｎｇ（邬显慷）（ＩｎｓｔｉｔｕｔｅｏｆＮｕｃｌｅａｒＲｅｓｅａｒｃｈ，ｔｈｅＣｈｉｎｅｓｅＡｃａｄｅｍｙｏｆＳｃｉｅｎｃｅｓ，Ｓｈａｎｇａｉ２０１８０...     

用X射线荧光分析法对珍贵邮票进行快速鉴定的技术

在有关邮票鉴定实验结果的基础上,编写了Ｘ射线荧光分析技术对珍贵邮票快速鉴定的在线分析程序,该程序将测量,数据获取,判别分析,邮票数据库调整等工作集中在一起,在测量的同时可完成数据获取和判别分析等工作,使得分析判别工作在测量过程中完成,并将判别结果及时反馈,以便测量者决定测量工作的进行与否,使鉴定结果在尽可能短的时间内给出,从而使得鉴定技术趋于实用化。     

大气中氡气及其子体的测量

本文概括了我们对氡及其子体测量方法的研究进展,主要有:(1) 滤膜法测氡子体。发展了一个滤膜法测氡子体的一般公式,现有文献中的各种有关公式均是其特例。它使用方便,只要一张TI-59型计算器磁卡,即可导得任意条件下的具体公式。(2) 双滤膜法测氡。作为上述公式的推论,导出了双滤膜法测氡的一般公式。依此可导得Thomas公式,并解决了Thomas采用扩散系数不合理的困难。(3) 气球法测氡。导得气球法测氡的一般公式,使我国独特发展的气球法(比双滤膜法灵敏度高、速度快)有了理论基础,省去了实验校刻工作,使其成为一个独立的测量方法。 文末把理论计算与实验结果作了比较。     

核分析技术及医学显像核技术的新进展

本文阐述了近十多年来基于小加速器的核分析技术(PIXE、RBS、NRA、AMS等)以及医学显像核技术(γ照相、SPECT、PET、NMRI等)的研究进展。     

INFLUENCE OF NUCLEAR RESONANCE ~(56)Fe(p,p)~(56)Fe ON K-SHELL IONIZATION PROBABILITY

The K-shell ionization probability Pk was measured as a function of Ep across the strong resonance 56Fe(p,p)56Fe at 2.522 MeV and about 50 % variation was observed. For a large ratio of the K-shell binding energy to the total width of the nuclear resonance, Uk/Г≥5, the present experimental result is still in good agreement with theoretical calculation based on Blair and Anholt's formula.     

A NEW EXX SYSTEM AND ITS APPLICATIONS

IXX (or PIXE-induced XRF) technique gains two main advantages over conventional PIXE method. First, it can be used to avoid or significantly reduce background and spectral interferences from major elements in the sample by proper selecting the primary target. Second, target damage is greatly reduced, so that it is more suitable for the analysis of heatsensitive and delicate specimens. A new IXX system with a very tight geometry is described. Some of its performances and preliminary applications are presented.     

用质子激发X荧光分析技术鉴别玉器种类承焕生

质子激发X荧光分析技术可以测定玉器的主量、次量及微量元素的成分和含量,因而可以将那些外形及颜色相近的玉器因其化学组分的不同而清楚地分开,并得知其真实的材料种类．对于主要化学组分一致的同类玉器,如果产于不同的地方,则由于其成矿地区地球化学环境的不同,它们的微量元素种类及含量也将有所不同,因而这一方法也可用来判定玉器的产地．