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Claims for the partial oxidation of methane to CO and H2 have been clouded by the possibility of the indirect reaction sequence occurring at hot spots in the catalyst bed. In this report, we claim that the direct reaction occurs on NiO/silica at 500°C with methane conversions as high as 80% and selectivities for H2 of 80% and CO of 70%. Arguments are presented to show that the amount of diluent gas employed prevents formation of local hot spots with temperatures high enough for the indirect reaction to occur. Consequently, this study constitutes one of the most convincing reports for the conversion of CH4 to syngas by the partial oxidation of methane. The catalyst deactivates in 10 h. Surface studies show coke formation and aggregation of NiO contribute to the loss of activity. This revised version was published online in August 2006 with corrections to the Cover Date.  相似文献   
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Microsystem Technologies - One of the vital non-linearity issues that exists in a charge pump (CP) circuit is the current mismatch, which does not only reduce efficiency and increases latency, but...  相似文献   
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The signal integrity metrics such as jitter, noise, peak-to-peak signal swing and power dissipation play a pivotal role in determining the quality of high data rate on-chip wireline communication and a decision circuit is the most vital section of it. This article explores an area efficient 40 Gb/s configuration of passive element free current mode decision module implemented in 90 nm CMOS technology. The simulation using Cadence Virtuoso platform is carried out at a power supply of 1.2 V along with a clock frequency of 40 GHz and pseudo random bit sequence data input of (27 − 1) having 1 ns bit period. The device foot print of entire arrangement is (76 × 23) µm2, which reads a power dissipation, delay, PDP, peak-to-peak jitter and RMS jitter of 7.02 mW, 198.1 ps, 1.391 pJ, 58.00 ps and 13.12 ps respectively. Monte Carlo runs with ‘no skew’ and 5% process skew are performed at different corners to prove the robustness of the design. The whole circuit is finally validated at lower technology node like 28 nm UMC.

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With the advent of semiconductor process technology, both the dynamic and static power consumption have become major concerns for the circuit designers. Though clock gating (CG) is a potentially accomplished technique to minimise the dynamic power, it generally fails to cut down the static power dissipation. To address the same, we have unveiled a new CG scheme incorporating leakage control transistor, which simultaneously curbs the static and dynamic power along with the alleviation of power supply noise (PSN) in silicon chips by smartly controlling the current ramp (di/dt) and average current i(t): the main contributors to PSN. The proposed CG does not only save average, dynamic and static power by 84.34%, 90.33% and 66.73%, respectively, but also reduces PSN by 84.44% with respect to its non-gated counterpart when simulated using Cadence Virtuoso® for 90 nm Generic Process Design Kit at a switching frequency of 5 GHz and power supply voltage of 1.1 V.  相似文献   
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This article proposes a design approach of common source (CS) amplifier based Voltage Controlled Oscillator (VCO) to derive higher oscillation frequency. The working feature is such that, the active load of CS amplifier is varied to modulate the flow of current based on a bias circuit steered by an external controlled voltage (Vctrl), which controls the delay of each stage and thereby regulates the oscillation frequency. The circuit is designed and analyzed on Cadence Virtuoso platform at a supply voltage of 1.2 V for 90 nm CMOS to read a device footprint of 0.105 mm2, which offers a power burn and frequency of 2.092 mW and 9.21 GHz respectively with a phase noise and output noise of − 137.9 dBc/Hz and − 168.40 dB at 1 MHz offset frequency. To justify the reliability of the circuit we have conducted worst case analysis by considering effect of power delivery network (PDN) and corner variation along with 500 runs of Monte Carlo. The design is also introduced under 28 nm UMC to validate its scalability with technology trends.

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