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991.
Atsushi Taguchi Takashi Miyoshi Yasuhiro Takaya Satoru Takahashi 《Precision Engineering》2004,28(2):7253
We have proposed an optical method that can be applied to in-process or in situ measurement of the microsurface profile. The present method is based on optically performed spectral analysis and the phase retrieval technique. Spectral information of a surface profile is obtained by measuring the Fraunhofer diffraction intensity. The phase retrieval technique is used to reconstruct the surface profile from the measured spectrum. We have developed an instrument on the basis of the general principles of the present method, and measured the surface of a reference standard having rectangular pockets 44 nm deep at intervals of 10 μm. The measured surface profile was in good agreement with the nominal dimensions of the specimen as well as the surface profile obtained by atomic force microscopy (AFM). 相似文献
992.
Takashi Kitamura 《仪器仪表学报》2004,25(Z2)
The mechanism of toner display based on an electrical movement of black and white charged particles has been investigated. Two kinds of particles of black and white charged in the different electric polarity are enclosed in two ITO transparent electrodes using an insulating spacer. The particle movement is controlled by the external electric field applied between two transparent electrodes. The black toner is adhered on the electrode by an electrostatic force across the CTL to display a black image. The toners can be put back to the counter electrode by applying a reverse electric field, and a white image is formed. The black and white solid images are displayed by the switch of polarity of applied voltage in toner display cell. The polarity of charge and the value of charge to mass ratio of two particles were measured by observation of the particle separation on the surface-type electrodes and using q/m meter, respectively. 相似文献
993.
Kazuo Kadowaki Takashi Mochiku Hiroyuki Takeya Kazuto Hirata 《Journal of Superconductivity》1995,8(4):461-464
The dc current-voltage (I-V) relation along the c-axis of single crystalline Bi2Sr2CaCu2O8+
has been measured in magnetic fields parallel and perpendicular to the c-axis. In zero field a clear and sharp jump with large hysteresis in theI-V curve was observed, indicative of the dc-Josephson effect. In magnetic field below a characteristic fieldB
*0.4 T (at T=0 K) parallel to the c-axis the magnetic field suppresses the hysteresis and reduces the critical currentI
c drastically, whereas aboveB
* theI-V curve becomes broad and featureless behavior. The characteristic field scaleB
* can be interpreted as an energy scale of the Josephson coupling between superconducting layers in Bi2Sr2CaCu2O8+
and is argued with emphasis on the correlation length of pancake vortices in this system. 相似文献
994.
Takashi Ariyama 《Journal of Materials Science》1996,31(15):4127-4131
The stress-strain curves and stress-relaxation curves of polypropylene are obtained by using a closed-loop, electrohydraulic, servo-controlled testing machine. Effects of mean strain changes on deformation behaviour are examined in a tension-compression mode under strain control at room temperature (18–23 °C). The hysteresis loops of three mean strains show a steady-state response from the stress-strain curves at a strain rate of 1 × 10–3 s–1 at a strain width of 5%, at a number of cycles of N=50 and at three mean strains (m=0, + 1.0 and + 2.0%). The drop of stress at the mean strain of m= -1.0% is larger in magnitude than that at m=+1.0%; this is caused by the higher stress level at m=- 1.0% as compared with the stress level at m=+1.0%. From the results of stress amplitude and the stress drop behaviour, the magnitude of stress drop is hardly affected by the mean strain. 相似文献
995.
Sunil Aryal Kai Ming Ting Takashi Washio Gholamreza Haffari 《Knowledge and Information Systems》2017,53(2):479-506
Nearest neighbor search is a core process in many data mining algorithms. Finding reliable closest matches of a test instance is still a challenging task as the effectiveness of many general-purpose distance measures such as \(\ell _p\)-norm decreases as the number of dimensions increases. Their performances vary significantly in different data distributions. This is mainly because they compute the distance between two instances solely based on their geometric positions in the feature space, and data distribution has no influence on the distance measure. This paper presents a simple data-dependent general-purpose dissimilarity measure called ‘\(m_p\)-dissimilarity’. Rather than relying on geometric distance, it measures the dissimilarity between two instances as a probability mass in a region that encloses the two instances in every dimension. It deems two instances in a sparse region to be more similar than two instances of equal inter-point geometric distance in a dense region. Our empirical results in k-NN classification and content-based multimedia information retrieval tasks show that the proposed \(m_p\)-dissimilarity measure produces better task-specific performance than existing widely used general-purpose distance measures such as \(\ell _p\)-norm and cosine distance across a wide range of moderate- to high-dimensional data sets with continuous only, discrete only, and mixed attributes. 相似文献
996.
Microsystem Technologies - We present wafer-level vacuum package of two-dimensional (2-D) micro-scanner based on glass-silicon anodic bonding. To form the sacrificial gap for evacuating air in the... 相似文献
997.
Shohei Ezaki Wenlei Shan Takafumi Kojima Alvaro Gonzalez Shin’ichiro Asayama Takashi Noguchi 《Journal of Low Temperature Physics》2018,193(5-6):720-725
We fabricated silicon (100) membranes of 3 mm in diameter on the surface of silicon-on-insulator (SOI) substrates and investigated the characteristics of the membranes. The handle layer of one SOI substrate was etched using deep reactive ion etching process with the buried oxide (BOX) layer that remained together with the device layer. The BOX layer of the other SOI substrate was removed using C4F8-based plasma etching after the handle layer etching. The surfaces of both silicon (100) membranes were observed using the scanning white light interferometer system at room temperature. Both silicon (100) membranes have dome-like deformations. The silicon (100) membranes are effectively flattened by etching the BOX layer under the device layer. Both silicon (100) membranes were cooled from room temperature to 4 K by a Gifford–McMahon refrigerator. Wrinkles appeared on the surfaces of both silicon (100) membranes when the temperature dropped to about 200 K. However, the wrinkles disappeared below about 180 K. This phenomenon indicates the wrinkles at low temperature would depend on the properties of the silicon (100) of the device layers and independent of the properties of the BOX layers under the silicon (100) membranes. 相似文献
998.
In periodic review inventory systems, inventory is classified into cycle stock and safety stock. Cycle stock is defined as inventory that absorbs differences between supply and demand frequencies. It can be calculated without deficiency or excess because a method has been established for ensuring that the minimum on-hand inventory during a periodic review is zero. Safety stock is defined as inventory that absorbs various differences between supply and demand. Unlike for cycle stock, a method for calculating safety stock without deficiency or excess remains to be established. An approach is proposed to establishing a method for calculating inventory in which inventory is classified on the basis of the holding purpose and the calculation factors indicate solutions. This approach was applied to inventory held to absorb, on the basis of fluctuations in demand, the difference in terms of time and quantity between supply and demand. Stock held for this purpose is referred to as ‘fluctuation stock’. The objective is to establish a method for calculating fluctuation stock so that the minimum on-hand inventory during a periodic review is zero and to clarify the relationship between fluctuation stock and safety stock. 相似文献
999.
Ellipsoidal load‐domain shakedown analysis with von Mises yield criterion: A robust optimization approach
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Takashi Yamaguchi Yoshihiro Kanno 《International journal for numerical methods in engineering》2016,107(13):1136-1144
The static formulation of elastic shakedown analysis, based upon Melan's lower‐bound theorem, can essentially be viewed as a robust optimization problem. This paper discusses an advantage that is enjoyed by taking this perspective. Specifically, we assume the von Mises yield criterion and an ellipsoidal load domain. In this setting, the shakedown analysis problem, which is viewed as robust second‐order cone programming, can be recast as semidefinite programming. Copyright © 2016 John Wiley & Sons, Ltd. 相似文献
1000.
Ko‐Chun Lee Shih‐Hsien Yang Yung‐Shang Sung Yuan‐Ming Chang Che‐Yi Lin Feng‐Shou Yang Mengjiao Li Kenji Watanabe Takashi Taniguchi Ching‐Hwa Ho Chen‐Hsin Lien Yen‐Fu Lin 《Advanced functional materials》2019,29(22)
Complementary circuits based on 2D materials show great promise for next‐generation electronics. An ambipolar all‐2D ReSe2 field‐effect transistor (FET) with a hexagonal boron nitride gate dielectric is fabricated and its electronic characteristics are comprehensively studied by temperature dependence and noise measurements. Ambipolar transfer characteristics are achieved owing to the tunable Fermi level of the graphene contact and negligible and 30 meV Schottky barrier heights for the n‐ and p‐channel regimes, respectively. An inverter is also fabricated to demonstrate ambipolar ReSe2 FET operation in a logic circuit. Furthermore, a p/n switchable unipolar FET is designed and shows potential for building complimentary circuits from a signal device. This work demonstrates the potential of all‐2D ReSe2 FETs and makes available new approaches for designing next‐generation devices. 相似文献