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41.
This paper investigates the effect of the waterproofing sleeve on the calibration of kilovoltage photon beams (50-300 kV). The sleeve effect correction factor, ps has been calculated using the Monte Carlo method as the ratios of the air kerma in an air cavity of a cylindrical chamber without the waterproofing sleeve to that with a sleeve. Three sleeve materials have been studied, PMMA, nylon and polystyrene. The calculations were carried out using the EGS4 (Electron Gamma Shower version 4) code system with the application of a correlated-sampling variance-reduction technique. The results show that the sleeve correction factor for 1-mm thick nylon and polystyrene sleeves, ps varies from 0.992 to 1.000 and from 0.981 to 1.000, respectively, for the same beam quality range. The ps factor varies with sleeve thickness, beam quality and phantom depth. No significant dependence of the ps factor on field size and source-surface distance has been found. Measurements for PMMA, nylon and polystyrene sleeves of various thicknesses have also been carried out and show excellent agreement with Monte Carlo calculations. 相似文献
42.
Tang Y.Y. Hong Ma Jiming Liu Bing Fa Li Dihua Xi 《IEEE transactions on pattern analysis and machine intelligence》1997,19(8):921-926
Based on wavelets, a theoretical method has been developed to process multi-gray level documents. In this method, two-dimensional multiresolution analysis, a wavelet decomposition algorithm, and compactly supported orthonormal wavelets are used to transform a document image into sub-images. According to these sub-images, the reference lines of a multi-gray level document can be extracted, and knowledge about the geometric structure of the document can be acquired. Particularly, this approach is more efficient to process form documents with gray level background. Experiments indicate that this new method can be applied to process documents with promising results 相似文献
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Ma Z.J. Chen J.C. Liu Z.H. Krick J.T. Cheng Y.C. Hu C. Ko P.K. 《Electron Device Letters, IEEE》1994,15(3):109-111
It has been reported that high-temperature (~1100°C) N2 O-annealed oxide can block boron penetration from poly-Si gates to the silicon substrate. However, this high-temperature step may be inappropriate for the low thermal budgets required of deep-submicron ULSI MOSFETs. Low-temperature (900~950°C) N2O-annealed gate oxide is also a good barrier to boron penetration. For the first time, the change in channel doping profile due to compensation of arsenic and boron ionized impurities was resolved using MOS C-V measurement techniques. It was found that the higher the nitrogen concentration incorporated at Si/SiO2 interface, the more effective is the suppression of boron penetration. The experimental results also suggest that, for 60~110 Å gate oxides, a certain amount of nitrogen (~2.2%) incorporated near the Si/SiO2 interface is essential to effectively prevent boron diffusing into the underlying silicon substrate 相似文献
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核医学成像技术中计算机的应用 总被引:2,自引:2,他引:0
由于计算机和核医学的结合,各种成像方法的计算机化医学图像层析技术正在迅速发展,并开始广泛应用。本文介绍各类成像技术中计算机的应用,特别评述其最近进展,并提出了今后的展望。 相似文献