新型碱性精抛液对300mm铜膜全局平坦化的影响

The copper removal rate and uniformity of two types copper slurries were investigated, which was performed on the 300 mm chemical mechanical planarization （CMP） platform. The experiment results illustrate that the removal rate of the two slurries is nearly the same. Slurry A is mainly composed ofa FA/OI1 type chelating agent and the uniformity reaches to 88.32%. While the uniformity of slurry B is 96.68%, which is mainly composed of a FA/OV type chelating agent. This phenomenon demonstrates that under the same process conditions, the uniformity of different slurries is vastly different. The CMP performance was evaluated in terms of the dishing and erosion values. In this paper, the relationship between the uniformity and the planarization was deeply analyzed, which is mainly based on the endpoint detection mechanism. The experiment results reveal that the slurry with good uniformity has low dishing and erosion. The slurry with bad uniformity, by contract, increases Cu dishing significantly and causes copper loss in the recessed region. Therefore, the following conclusions are drawn： slurry B can improve the wafer leveling efficiently and minimize the resistance and current density along the line, which is helpful to improve the device yield and product reliability. This investigation provides a guide to improve the uniformity and achieve the global and local planarization. It is very significant to meet the requirements for 22 nm technology nodes and control the dishing and erosion efficiently.     

螯合剂与氧化剂协同降低CMP中Co/Cu电偶腐蚀

钴(Co)作为10 nm及以下技术节点的铜互连极大规模集成电路(GLSI)的新型阻挡层材料,在阻挡层化学机械抛光(CMP)中易与铜(Cu)发生电偶腐蚀。本文采用电化学、CMP、静态腐蚀实验以及扫描电镜(SEM)表征方法,研究了弱碱性抛光液中螯合剂和氧化剂在Co/Cu电偶腐蚀中的协同作用。研究表明:抛光液中的氧化作用,使得Co和Cu表面生成一层由氧化物及氢氧化物组成的钝化膜,抑制了Co和Cu的静态腐蚀;多羟多胺螯合剂浓度增加,抛光液pH升高,Co和Cu表面钝化膜的生成加快;CMP过程中,Co和Cu腐蚀电位均有明显降低,去除速率均加快。抛光液组分为1.5 ml·L-1H2O2、0.1%FA/O螯合剂、30%AEO-9、5%硅溶胶(质量分数)时,Co的腐蚀电位低于Cu的腐蚀电位;研磨状态下,Co/Cu腐蚀电位差降到-6 m V,电偶腐蚀电流很小,极大地减弱Co/Cu电偶腐蚀。同时,Co的去除速率为130 nm·min-1,Cu的去除速率为76.5 nm·min-1,Co与Cu的静态腐蚀均不明显,可以很好地满足阻挡层CMP要求。     

新型阻挡层材料钌的研究进展北大核心

随着集成电路特征尺寸不断缩小到14 nm及以下,钌凭借其低的电阻率、对铜高的依附性而被考虑替代传统阻挡层材料Ta/TaN。但是,钌作为阻挡层材料依然存在很多问题,如低去除速率、容易引起铜的界面腐蚀、铜钌去除的不均匀性。针对以上问题,主要从三个方面介绍了近几年的研究进展。首先,介绍了氧化剂及络合剂对钌去除速率的影响;然后,总结了针对铜钌界面腐蚀问题的研究进展;最后,阐述了国内外解决铜钌去除速率选择性问题的研究进展。此外,提出未来新型阻挡层钌的抛光液的研究应综合解决上述问题,而非单一解决,才能真正应用于生产领域。     

Synergetic effect of chelating agent and nonionic surfactant for benzotriazoleremoval on post Cu-CMP cleaning

The cleaning of copper interconnects after chemical mechanical planarization (CMP) process is a critical step in integrated circuits (ICs) fabrication. Benzotriazole (BTA), which is used as corrosion inhibitor in the copper CMP slurry, is the primary source for the formation of organic contaminants. The presence of BTA can degrade the electrical properties and reliability of ICs which needs to be removed by using an effective cleaning solution. In this paper, an alkaline cleaning solution was proposed. The alkaline cleaning solution studied in this work consists of a chelating agent and a nonionic surfactant. The removal of BTA was characterized by contact angle measurements and potentiodynamic polarization studies. The cleaning properties of the proposed cleaning solution on a 300 mm copper patterned wafer were also quantified, total defect counts after cleaning was studied, scanning electron microscopy (SEM) review was used to identify types of BTA to confirm the ability of cleaning solution for BTA removal. All the results reveal that the chelating agent can effectively remove the BTA residual, nonionic surfactant can further improve the performance.     

低压下碱性铜抛光液对300mm多层铜布线平坦化的研究

随着微电子技术进一步发展,低k介质的引入使得铜的化学机械平坦化(CMP)须在低压下进行。提出了一种新型碱性铜抛光液,其不含常用的腐蚀抑制剂,并研究了其在低压下抛光及平坦化性能。静态条件下,铜的腐蚀速率较低仅为2nm/min。在低压10.34kPa时,铜的平均去除速率可达633.3nm/min,片内非均匀性(WIWNU)为2.44%。平坦化效率较高,8层铜布线平坦化结果表明,60s即可消去约794.6nm的高低差,且抛光后表面粗糙度低(0.178nm),表面状态好,结果表明此抛光液可用于多层铜布线的平坦化。     

65nm多层铜布线的碱性化学机械平坦化工艺

主要研究了65 nm碱性铜布线的平坦化工艺。对不同尺寸铜线条进行抛光,讨论了抛光压力、抛光液流量和转速对平坦化的影响。结果表明,压力是影响平坦化的主要因素;分别改变压力、流量或转速时,窄线条的平坦化效果优于宽线条;平坦化效果随着压力的减小逐渐变好,即压力为1.0 psi(1 psi=6.895 kPa)时,平坦化效果最好;抛光液流量在300 mL/min时,化学反应和机械作用都达到饱和,平坦化效果最佳;平坦化效果随着转速的提高逐渐变好,转速在100 r/min时,保证了质量传递效率,所有铜线条都达到了最好的平坦化。     

碱性抛光液中H_2O_2对铜布线CMP的影响

化学机械平坦化(CMP)过程中,抛光液的化学作用对平坦化效果起着不可替代的作用。介绍了碱性抛光液中氧化剂(H2O2)对铜布线CMP的作用:H2O2对铜的强氧化性可以将铜氧化为离子状态,然后在螯合剂的螯合作用下快速去除铜膜;H2O2对铜的钝化作用可以保护凹处铜膜不被快速去除,从而有效降低高低差。此外,还研究了碱性抛光液中不同H2O2浓度对铜的静态腐蚀速率、动态去除速率及铜布线平坦化结果的影响。研究表明:抛光液对铜的静态腐蚀速率随H2O2浓度的增大逐渐降低然后趋于饱和;铜的动态去除速率随H2O2浓度的增大而逐渐降低;抛光液的平坦化能力随H2O2浓度的增大逐渐增强再趋于稳定。     

PS-b-PDMS/环氧树脂制备疏水性环氧涂层的性能

用共混法将聚苯乙烯-b-聚二甲基硅氧烷(PS-b-PDMS)嵌段共聚物与环氧树脂E-44复合制备了一种疏水性环氧涂层。研究了PS-b-PDMS的用量对涂层力学性能、表面性能及耐化学腐蚀性的影响。结果表明,随着共聚物用量的增加,涂层的冲击强度及柔韧性明显提高,表面能显著降低,接触角明显增大,当PS-b-PDMS用量为E-44的7%(质量分数)时,冲击强度和柔韧性分别为50kg.cm和0.5mm,表面能为13.8mN/m,对水接触角增大至115.9°,具有优异的疏水性及耐化学腐蚀性。     

抛光液添加剂协同作用对铜互连阻挡层CMP后碟形坑及蚀坑的影响

为了有效控制铜互连阻挡层化学机械平坦化(CMP)过程中产生的碟形坑和蚀坑等缺陷,研究了在低磨料下柠檬酸钾(CAK)和FA/OⅡ络合剂协同作用对Cu/TEOS去除速率、碟形坑和蚀坑修正的影响.结果表明:加入质量分数为1％CAK后,TEOS去除速率增加了31.6 nm/min,Cu的去除速率无明显变化,说明CAK在不影响C...