The prospects of non-volatile phase-change RAM

Phase-change read-and-write memory (PRAM) is a promising memory that can solve the problems of conventional memory—scalability, read/write speed, and reliability. We will review the opportunities and technical challenges of PRAM. The most important challenge of PRAM is the reduction of the writing current. Various approaches to reduce the writing current will be reviewed and the prospects of PRAM are discussed.     

The nuclear fuel cycle

In the first half of the 21st century, a redistribution of the energy data should occur, where nuclear will play a more important role, particularly as coal will become more and more costly to extract.On a worldwide basis, the unability of oil to be replaced in some areas like transportation, and the difficulty of developing countries to find substitutes for this energy source, could also lead developed countries to keep the energy resources for a better utilization, and give the countries which have no access to other resources, a possibility to develop.Thus, France has extensively enhanced nuclear energy for its electricity production, and, consequently, makes the necessary efforts for the knowledge of the whole fuel cycle.     

Aging, expertise, and narrative processing.

In a study of how aviation expertise influences age differences in narrative processing, young and older pilots and nonpilots read and recalled aviation and general narratives. They chose referents for sentences referring to a protagonist or minor character mentioned 1 sentence (recent character) or 3 sentences (distant character) before this target sentence. All groups chose referents less accurately for sentences about distant and minor characters than about recent and protagonist characters, perhaps because these referents were less likely to be in working memory. Young readers and pilots were more accurate for distant and minor character target sentences in aviation narratives and recalled aviation narratives more accurately. Expertise did not reduce age differences. Expertise differences may reflect decreased demands on working memory capacity, and age declines may reflect reduced capacity. (PsycINFO Database Record (c) 2010 APA, all rights reserved)     

Fabrication of sharp silicon tips employing anisotropic wet etching and reactive ion etching

We developed a process to obtain sharper silicon tips by employing anisotropic etching in a KOH solution followed by SF₆ plasma etch. The tips were further sharpened using the established thermal oxidation technique to decrease the cone angle and, therefore, obtain smaller curvature radii. We have analyzed the impact of such changes in geometry on a figure of merit associated with the field emission characteristics. An increase in the figure of merit by a factor of three was found in relation to the tips before sharpening.