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81.
A powerful concept to cope with resource limitations and information redundancy in wireless sensor networks is the use of collaboration groups to distill information within the network and suppress unnecessary activities. When the phenomena to be monitored have large geographical extents, it is not obvious how to define these collaboration groups. This article presents the application of geometric duality to form such groups for sensor selection and non-local phenomena tracking. Using a dual-space transformation, which maps a non-local phenomenon (e.g., the edge of a half-plane shadow) to a single point in the dual space and maps locations of distributed sensor nodes to a set of lines that partitions the dual space, one can turn off the majority of the sensors to achieve resource preservation without losing detection and tracking accuracy. Since the group so defined may consist of nodes that are far away in physical space, we propose a hierarchical architecture that uses a small number of computationally powerful nodes and a massive number of power constrained motes. By taking advantage of the continuity of physical phenomena and the duality principle, we can greatly reduce the power consumption in non-local phenomena tracking and extend the lifetime of the network. 相似文献
82.
83.
84.
Plasma spraying and pack-aluminising processes were combined and applied to the nickel-base superalloy Mar-M247 to improve its cyclic oxidation resistance. The performance tests of duplex ZrO2-8 wt.%Y2O3/MCrAlY thermal barrier coatings (TBCs) were conducted at 1050 °C, 1075 °C, 1100 °C, 1150 °C and 1200 °C. The results of the experiments in this study showed that TBC specimens with the aluminised MCrAlY bond coat exhibited higher cyclic lives (except for the Ni-22Cr-10Al-1Y bond coat), at all the temperatures tested, than specimens on which the bond coat was not aluminised. The microstructures of the Co-29Cr-6Al-1Y, Co-32Ni-21Cr-8Al-0.5Y and Ni-22Cr-10Al-1Y bond coats with or without aluminising treatment were examined in detail using a scanning electron microscope equipped with an electron probe microanalyzer. 相似文献
85.
T. Jing M. Sc. Ir. P. H. F. Moshuis Prof. Dr. Ir. F. H. Kreuger 《Electrical Engineering (Archiv fur Elektrotechnik)》1991,74(4):315-319
Contents Surface charge accumulation and its decay at a GIS spacer are studied at atmospheric conditions employing a two step-calibration method. The results show that the accumulation saturates within 30 minutes; the dominant mechanism of surface charge accumulation is the drift of charged particles via air, while that of the decay is surface conduction. The characteristics are similar at both polarities.
Sättigungskonzentration und Abklingverhalten der Oberflächenladung an einem mit Gleichspannung beanspruchten Abstandshalter unter atmosphärischen Bedingungen
Übersicht Die Konzentration und das Abklingen von Oberflächenladungen an einem GIS Abstandshalter wurden unter atmosphärischen Bedingungen mit Hilfe eines zweistufigen Kalibrierungsverfahrens untersucht. Die Ergebnisse zeigen eine Sättigung der Ladungskonzentration innerhalb von 30 Minuten. Als Hauptursache der Ladungskonzentration ist die Drift geladener Teilchen in Luft anzusehen, während das Abklingen auf die Oberflächenleitung zurückzuführen ist. Ähnliche Charakteristiken ergeben sich mit beiden Polaritäten.相似文献
86.
87.
With the aid of a double-tilt holder in a transmission electron microscope, a new method for a rapid and precise determination of the misorientations of a large number of subgrain or grain boundaries is given in this article. By use of the method, the continuous recrystallization can be rapidly and precisely evaluated when compared to the other conventional methods. 相似文献
88.
An experimental study has been carried out of debonding and fibre rupture in model composites. A single glass rod or fibre was embedded in the centre of a long transparent silicone rubber block. Strains in the rubber in close proximity to the rod or fibre were measured as the specimen was slowly stretched. Pull-out forces, strain distributions, and debonded lengths are compared with the predictions of a simple theory based on a fracture energy criterion for debonding, and taking into account friction at the debonded interface. Experiments were carried out with rods of different diameter, rubber blocks of varied cross-section, and with two levels of adhesion. By extrapolating the debonded length to zero, values of the debonding force in the absence of friction were obtained. They were in accord with fracture energies of about 50 J/m2 for weak bonding and about 200 J/m2 for strong bonding. Fibre fragmentation lengths were measured also. They were in reasonable agreement with the inferred fracture energies and the measured frictional properties of silicone rubber sliding on glass. In a separate study, it was found that the frictional stress between cast silicone rubber and glass was approximately constant, about 0.1 MPa, rather than proportional to pressure, for pressures exceeding about 0.02 MPa. This feature is attributed to a particularly smooth interface between the two materials. 相似文献
89.
A state-dependent variable-gain control system is implemented to follow the characteristics of a laboratory-scale up-flow anaerobic fixed-bed reactor dynamically. The transition from one state to another is determined on an hourly basis, depending on difference between the setpoint of the reactor pH and its true value. Considerable improvement of the process stability--reduction of oscillation in both the reactor pH and biogas production rate during high-rate operation, has been achieved, although the control structure is simple and intuitive. 相似文献
90.
Yuanning Chen Myricks R. Decker M. Liu J. Higashi G.S. 《Electron Device Letters, IEEE》2003,24(5):295-297
As CMOS device dimensions scale down to 100 nm and beyond, the interface roughness between Si and SiO/sub 2/ has become critical to device performance and reliability. Si/SiO/sub 2/ interface roughness degrades channel mobility decreasing drive currents. The authors have used atomic force microscopy to study surface roughness in the processing of 0.16 /spl mu/m CMOS integrated circuits. All of the process steps that could potentially affect the interface roughness have been studied. The results show that oxidation is the major contributor to the interface roughness. The rms roughness is found to be linearly dependent on oxide thickness. Transistors with Si/SiO/sub 2/ interface rms roughness that has been reduced from 1.6 to 1.1 /spl Aring/ by reducing oxide thicknesses show improved device drive currents. This technique for interfacial smoothing and device performance improvement has the advantage of being easily implemented in today's technology. 相似文献