An Approach for Segmentation of Airborne Laser Point Clouds Utilizing Scan‐Line Characteristics

In this study, we suggest a new segmentation algorithm for processing airborne laser point cloud data which is more memory efficient and faster than previous approaches. The main principle is the reading of data points along a scan line and their direct classification into homogeneous groups as a single process. The results of our experiments demonstrate that the algorithm runs faster and is more memory efficient than previous approaches. Moreover, the segmentation accuracy is generally acceptable.     

Growth of tin whiskers for lead-free plated leadframe packages in high humid environments and during thermal cycling

Growth behavior of tin whiskers from pure tin and tin–bismuth plated leadframe (LF) packages for elevated temperature and high humidity storages and during thermal cycling was observed. In the storage at 60 °C/93% relative humidity (RH) and 85 °C/85%RH the galvanic corrosion occurred at the outer lead toes and shoulders where the base LF material is exposed, forming tin oxide layers of SnO₂. The corroded layers spread inside the film and formed whiskers around the corroded islands. Many whiskers were observed to grow from grain boundaries for the Fe–42Ni alloy (alloy42) LF packages. It was confirmed that the corrosion tends to occur on the side surfaces of outer leads adjacent to the mold flash. The contribution of ionic contaminants in epoxy mold compound (EMC) to the corrosion was not identified. During thermal cycling between −65 °C and +150 °C whiskers grew out of as-deposited grains for pure tin-plated alloy42 LF packages and they grew linearly with an increase of number of cycle. Growth mechanisms of the whiskers from grain boundaries and as-deposited grains were discussed from the deformation mechanism map for tin and mathematical calculation with a steady-state diffusion model.     

The time domain Green's function and propagator for Maxwell's equations

The free space time domain propagator and corresponding dyadic Green's function for Maxwell's differential equations are derived in one-, two-, and three-dimensions using the propagator method. The propagator method reveals terms that contribute in the source region, which to our knowledge have not been previously reported in the literature. It is shown that these terms are necessary to satisfy the initial condition, that the convolution of the Green's function with the field must identically approach the initial field as the time interval approaches zero. It is also shown that without these terms, Huygen's principle cannot be satisfied. To illustrate the value of this Green's function two analytical examples are presented, that of a propagating plane wave and of a radiating point source. An accurate propagator is the key element in the time domain path integral formulation for the electromagnetic field.     

Improvement of kink and beam steering characteristics of 0.98-μmGaInAs-GaInP high-power lasers utilizing channel ion implantation

We demonstrate a kink and beam steering free operation of 0.98-μm GaInAs-GaInP high-power ridge waveguide (RW) lasers utilizing channel ion implantation. The ion-implanted regions along the both sides of the ridge effectively suppressed the excitation of higher order lateral modes, which causes beam steering and kink. The maximum power without beam steering and kink has been achieved over 250 mW for channel ion-implanted RW lasers with 1.8-3.7-μm ridge width, compared to 120-mW maximum power without the channel ion implantation     

Performance of improved probabilistic location update scheme forcellular mobile networks

This paper suggests an improved probabilistic location update (IPLU) scheme for advanced cellular mobile networks. The location management cost with IPLU is analyzed, and various performance characteristics of IPLU are investigated. It is shown that IPLU has the parameter q that can be used as a control parameter to achieve the best performance when the unit location update cost (U) and the unit paging cost (P) are given. In addition, this paper provides some recommendable values of q in two cases, P>U and P⩽U. As a result, we demonstrate a merit of IPLU, that is, simple implementation with an acceptable performance level, especially, under the future cellular mobile network environments where a vast number of microcells/picocells exist and the relative user mobility is very high     

Optical BGP Routing Convergence in Lightpath Failure of Optical Internet

Optical Border Gateway Protocol (OBGP) is an extension to BGP for Optical Cross Connects (OXCs) to automatically setup multiple direct optical lightpaths between many different autonomous domains. With OBGP, the routing component of a network may be distributed to the edge of the network while the packet classification and forwarding is done in the core. However, it is necessary to analyze the stable convergence functions of OBGP in case of lightpath failures. In this paper, we first describe the architecture of the OBGP model and analyze the potential problems of OBGP, e.g., virtual BGP router convergence behavior in the presence of lightpath failure. We then propose an OBGP convergence model derived from an inter‐AS (Autonomous System) relationship. The evaluation results show that the proposed model can be used for a stable OBGP routing policy and OBGP routing convergence under lightpath failures of the optical Internet.     

The analysis and compensation of dead-time effects in PWM inverters

The quantitative prediction of the dead-time effect in pulse width modulated (PWM) inverters is addressed. Through analysis and simulation it is shown that the effect results in a decrease of the fundamental component and an increase in the low-order harmonics in the output voltage of the inverter. To compensate the effect, two simple methods, which are adequate for sinusoidal PWM and memory-based PWM, respectively, are presented. Experimental results show the validity of the analysis and the usefulness of the compensation methods     

Electrochemical Migration Characteristics of Eutectic Sn-Pb Solder Alloy in NaCl and Na<Subscript>2</Subscript>SO<Subscript>4</Subscript> Solutions

Anodic dissolution and the electrochemical migration characteristics of eutectic Sn-Pb solder alloy in deaerated 0.001% NaCl and Na₂SO₄ solutions were investigated using anodic polarization and water drop tests. Anodic polarization results revealed that a Pb-rich phase was preferentially ionized in deaerated 0.001% NaCl solution and an Sn-rich phase was predominantly ionized in deaerated 0.001% Na₂SO₄ solution, which coincides well with the composition of the dendrites formed during water drop tests. X-ray diffraction and photoelectron spectroscopy results showed that the surface oxide film formed on pure Sn in deaerated 0.001% NaCl solution is more stable than that formed on pure Sn in deaerated 0.001% Na₂SO₄ solution. The surface oxide film formed on pure Pb in deaerated 0.001% Na₂SO₄ solution is more stable than that formed on pure Sn in deaerated 0.001% NaCl solution. Therefore, the quality of the surface film of eutectic Sn-Pb solder in a chemical environment seems to be critical not only for corrosion resistance, but also for electrochemical migration resistance.     

Stress Mechanism about Field Lightning Surge of High Voltage BJT Based Line Driver for ADSL System

In this paper, we have verified stress root caused by lightning surge in High voltage BJT based line driver of ADSL telecommunication and created failure mechanism. To reproduce damages in Line driver, we have applied STD surge waveform in operating condition, which is specified in IEC-6000-4-5, to component and board level. Visual isolation for Damage root was conducted with Real-time Electrical Stress Analysis (RTESA) utilizing Photon Emission Microscopy (PEM). The surge made with input of Tx output created junction breakdown of amplifier, which is made of HVBJT cells, and also caused current crowding from Vcc (supply voltage). In case of Positive pulse, current crowding was observed from between Collector and Vcc (+)12V. For negative pulse, at between Emitter and Vee (−)12V, current crowding was found. For both cases, device damage level was the same. All of these could be considered as transient latchup phenomenon created in BJT cell. Applying temporary clamping diode to line driver Tx, we have conducted Board level surge injection test. As a result, with the correlation between surge level from component level reproduction test and the one from system level, we have decided field lightning surge damage level and set up line driver protection margin.