如何掌握印刷压力

<正> 一、印刷压力的概念与作用 印刷的过程,从某种意义上讲,是解决油墨与纸张之间矛盾的过程。要将印版上图文处的油墨转移到承印物上,就必须施加一定的力,即所谓的印刷压力。它在印刷中具有重要的作用。 1.保证粗糙的印刷面完全接触 纸张、橡皮布、印版的表面均成粗糙微孔状。对这些粗糙表面,必须在一定的压力作用下,使其受     

宝钢2号高炉4号热风炉凉炉实践

对宝钢2号高炉4号热风炉凉炉的原因、凉炉的前期族备工作、凉炉的设备和方法以及凉炉的实际效果进行了总结。通过这次凉炉实践，取得了一些有价值的经验，这些经验对今后宝钢砖硅热风炉的凉炉具有重要的参考意义。     

催化裂化汽油选择性加氢脱硫催化剂RSDS-1的开发

介绍了用于催化裂化汽油选择性加氢脱硫催化剂RSDS-1的研究开发，考察了载体、活性组元、金属原子比以及助剂对催化剂选择性的影响。研究结果表明，催化裂化汽油中烯烃的加氢饱和受扩散限制；Co—Mo组合对烯烃饱和的能力相对较弱；较高的Co／Mo原子比有利于提高催化剂选择性；助剂的加入对催化剂选择性有明显的影响；RSDS—1催化剂用于催化裂化汽油选择性脱硫，对不同原料油适应性好，脱硫率可达80％，RON损失小于2个单位，且可长周期稳定运转。     

Residual toughness of poly(acrylonitrile-butadiene-styrene) (ABS) after fatigue loading—effect of uniaxial fatigue loading

Toughness variation of non-notched poly(acrylonitrile-butadiene-styrene) (ABS) subjected to uniaxial fatigue loading was investigated. The experiments were conducted by applying fatigue loading to strip specimens first, from which dog-bone specimens were machined. The dog-bone specimens were tested to measure the strain for the on-set of fracture, named cracking strain here, thus to monitor the toughness change due to the fatigue loading.The test results showed that the fatigue loading caused the toughness drop in ABS, even before any visible crack was developed. Damage development and fracture behavior were then analyzed using scanning electron microscopy (SEM). The SEM analysis revealed that damage zones, not cracks, were initiated during the fatigue loading, and were the main cause of the toughness drop. Mechanisms for the damage initiation include matrix crazing and debonding of small rubber particles; however, large rubber particles remained intact. Based on the results, a deformation model is proposed for the damage zone initiation, which provides an explanation for the toughness change under the fatigue loading.     

A new iterative order reduction (IOR) method for eigensolutions of large structures

Order reduction is a computationally efficient method to estimate some lowest eigenvalues and the corresponding eigenvectors of large structural systems by reducing the order of the original model to a smaller one. But its accuracy is limited to a small range of frequencies that depends on the selection of the retained degrees of freedom. This paper proposes a new iterative order reduction (IOR) technique to obtain accurately the eigensolutions of large structural systems. The technique retains all the inertia terms associated with the removed degrees of freedom. This hence leads to the reduced mass matrix being in an iterated form and the reduced stiffness matrix constant. From these mass and stiffness matrices, the eigensolutions of the reduced system can be obtained iteratively. On convergence the reduced system reproduces the eigensolutions of the original structure. A proof of the convergence property is also presented. Applications of the method to a practical GARTEUR structure as well as a plate have demonstrated that the proposed method is comparable to the commonly used Subspace Iteration method in terms of numerical accuracy. Moreover, it has been found that the proposed method is computationally more efficient than the Subspace Iteration method. Copyright © 2003 John Wiley & Sons, Ltd.     

电容传感器在使用中存在的几个问题及处理方法

随着电容测量技术的迅速发展，电容传感器在非电量测量和自动检测中得到广泛应用，但它在使用过程中也存在一些问题，针对在使用电容传感器过程中存在的几个问题，从电容传感器的原理和工作过程两个方面进行了讨论，并提出行之有效的处理方法。     

Nanoscale structural characteristics and electron field emission properties of transition metal–fullerene compound TiC60 films

Transition-metal compound TiC₆₀ thin films were grown by co-deposition from two separated sources of fullerene C₆₀ powder and titanium. Study of structural properties of the films, by Raman spectroscopy, atomic force microscopy, and scanning tunneling spectroscopy reveals that the films have a deformed C₆₀ structure with certain amount of sp³ bonds and a rough surface with a large number of nanoclusters. z–V tunnelling spectroscopic measurements suggest that several charge transport mechanisms are involved in as the tip penetrates into the thin film. Conventional field electron emission (FEE) measurements show a high emission current density of 10 mA/cm² and a low turn-on field less than 8 V/μm, with the field enhancement factors being 659 and 1947 for low-field region and high-field region, respectively. By exploiting STM tunneling spectroscopy, local FEE on nanometer scale has also been characterized in comparison with the conventional FEE. The respective field enhancement factors are estimated to be 99–355 for a gap varying from 36 to 6 nm. The enhanced FEE of TiC₆₀ thin films can be ascribed to structural variation of C₆₀ in the films and the electrical conducting paths formed by titanium nanocrystallites embedded in C₆₀ matrix.