压差式漏率测试仪的实验研究

将薄膜电容真空计的测量室接于被测密闭容器，静态真空室接于一个比较容器，即组成一台压差式漏率测试仪。首先使两容器压力平衡，真空计读数为零。当被测容器存在漏孔时，真空计薄膜两侧形成压差，真空计指示读数，继而计算出该容器的漏率。应用商品真空计在抽真空测试时，检测的最小可测漏率达10－4～10-5Pa·L／s；而在充压测试时，因受气体温度变化的影响，灵敏度会降低几个量级。该仪器有可能具备寻找漏孔位置和确定漏孔漏率的功能。     

Deformation and fracture of glass bead/ CTBN-rubber/epoxy composites

Carboxyl-terminated butadiene-acrylonitrile-rubber decreases modulus and yield stress of the studied epoxy but increases fracture toughness. The addition of glass bead compensates for the loss in modulus but has little effect on yield stress. However, it significantly contributes to the fracture toughness by providing additional mechanisms for toughening of both the unmodified and rubber-modified epoxy. For the toughened epoxies studied, fracture surfaces gave only limited information on fracture mechanisms since significant energy absorption also occurs in the material below the fracture surface. Suggestions for suitable material compositions for fiber composite matrices are given.     

场顺序彩色显示器

荫罩CRT受自身结构的限制,要进一步改进其分辨率就有很大的困难。近年已研制成一种获得彩色图像的颇有吸引力的替代品,即场顺序彩色显示器。它由单色CRT和液晶电子色闸组成,称之为LC/CRT系统。液晶电子色闸由液晶π盒及其连用的偏振片组成,可看成是老式机械彩色轮那样的一种电控色带带通滤色片。本文描述了液晶电子色闸的功能及其工作优点,讨论了其可能结构与显示特性。     

铁路冷藏运输运价分析

本文对各种运输方式易腐货物的运价进行了比较分析,对铁路冷藏运输的现行运价和保本运价进行了讨论,提出了铁路冷藏运输运价改革的若干建议,可供铁路进行冷藏运输改革参考。     

Systematic characterization of Cl2 reactive ion etchingfor improved ohmics in AlGaN/GaN HEMTs

Pre-metal-deposition reactive ion etching (RIE) was performed on an Al_0.3Ga_0.7N/AlN/GaN heterostructure in order to improve the metal-to-semiconductor contact resistance. An optimum AlGaN thickness for minimizing contact resistance was determined. An initial decrease in contact resistance with etching time was explained in terms of removal of an oxide surface layer and/or by an increase in tunnelling current with the decrease of the AlGaN thickness. The presence of a dissimilar surface layer was confirmed by an initial nonuniform etch depth rate. An increase in contact resistance for deeper etches was experienced. The increase was related to depletion of the two-dimensional (2-D) electron gas (2-DEG) under the ohmics. Etch depths were measured by atomic force microscopy (AFM). The contact resistance decreased from about 0.45 Ωmm for unetched ohmics to a minimum of 0.27 Ωmm for 70 Å etched ohmics. The initial thickness of the AlGaN layer was 250 Å. The decrease in contact resistance, without excessive complications on device processing, supports RIE etching as a viable solution to improve ohmic contact resistance in AlGaN/GaN HEMTs     

结合试飞特点,开展专用测试设备计量确认

根据我院专用测试设备计量确认现状及需求，对开展试飞专用测试设备计量确认工作的要求，步骤、确认原则，以及编定计量确认方法进行了必要的讨论分析。     

Development of the Chinese Scientometric Indicators (CSI)

We describe the Chinese Scientometric Indicators (CSI), an indicator database derived from the Chinese Science Citation Database (CSCD). Its design is supported by the Natural Sciences Foundation of China (NSFC). In this indicator database data of a statistical nature are organized and categorized leading to ranked lists and providing bases for comparisons among Chinese institutions and regions.     

8096/8098单片机集成开发系统

本集成开发环境集编辑、编译、调试和运行于一体,模拟了MCS-96系列单片机的指令系统,并给教学、实验、应用、科研和单片机的开发提供了强有力的手段。