Two-color photorefractive effect in Mg-doped lithium niobate

The two-color photorefractive response of near stoichiometric lithium niobate (SLN) doped with Mg above a critical threshold has been investigated. Striking differences as compared with non Mg-doped material were observed: The intermediate level in the two-color writing process has approximately a two orders of magnitude longer lifetime in SLN:Mg than in nominally undoped SLN, the grating is written in a shallower level but can be fixed via a simple thermal process and complementary electron-hole gratings are formed. It is proposed that the Fe impurity level moves from below the small-polaron level in nonMgO-doped material to above it, resulting in the increased lifetime of the small polaron. These changes are associated with a shift of the Fe from a Li site to a Nb site. The two-color sensitivity is higher than in the absence of MgO but the dynamic range is much lower.     

Stress field near interface edge of elastic-creep bi-material

Stress fields on elastic-creep bi-material interfaces with different geometry of the interface edge are analyzed by finite element method. The results reveal that the stress highly concentrates near the interface edge at the loading instant and it gradually decreases as the creep-dominated zone expands from the small-scale creep to the large-scale creep. The stress singularity due to creep which resembles the HRR stress singularity appears near the interface edge in all cases. The stress intensity near the interface edge time-dependently decreases and becomes constant when the transition reaches the steady state. The magnitude is scarcely influenced by the edge shape of elastic material, though it depends on the edge shape of creep material. The stress intensity during the transition can be approximately predicted by the J-integral at the loading instant.     

Role of plasticity on interface crack initiation from a free edge and propagation in a nano-component

In order to elucidate the role of plasticity on interface crack initiation from a free edge and crack propagation in a nano-component, delamination experiments were conducted by a proposed nano-cantilever bend method using a specimen consisting of ductile Cu and brittle Si and by a modified four-point bend method. The stress fields along the Cu/Si interface at the critical loads of crack initiation and crack propagation were analyzed by the finite element method. The results reveal that intensified elastic stresses in the vicinity of the interface edge and the crack tip are very different, although the Cu/Si interface is identical in both experiments. The plasticity of Cu was then estimated on the basis of the nano-cantilever deflection measured by in situ transmission electron microscopy. The plasticity affects the stress fields; the normal stress near the interface edge is intensified while that near the crack tip is much reduced. Both the elasto-plastic stresses are close to each other in the region of about 10 nm. This suggests that the local interface fracture, namely, the crack initiation at the interface edge and the crack propagation along the interface, is governed by elasto-plastic normal stress on the order of 10 nm.     

Quantum-Mechanical Properties of Protons in Solid Molecular Hydrogen at Megabar Pressures

Quantum distributions of protons in three high-pressure phases of solid molecular hydrogen are investigated by the first-principles path integral molecular dynamics (FP-PIMD) method, in which interatomic forces are calculated precisely based on the density functional theory. The distributions have entirely different symmetries from those predicted by conventional simulation with classical treatment of protons. Especially in phase II, we found that molecular rotation is hindered by quantum fluctuation of protons, having a strong resemblance to a quantum distribution of impurity muonium in crystalline silicon. The mechanism of this “quantum localization” is clarified by a detailed study of the potential energy surface for the molecular rotation.     

Microcoaxial electrode for in vivo nitric oxide measurement

Nitric oxide (NO) is a gaseous mediator involved in various physiological phenomena, such as vasorelaxation and neurotransmission. Investigation of local cellular responses of NO production in vivo and in vitro requires a measurement method with a high spatial resolution. For selective NO measurement, we therefore developed a microcoaxial electrode whose tip diameter is less than 10 microm. Calibration using various concentrations of NO (0.1-1.0 microM) showed that the electrode has good linearity (r = 0.99) and its detection limit is 0.075 microM (S/N = 3). We verified the applicability of this electrode to in vivo and in vitro local measurement NO released from bovine aortic cultured endothelial cells (BAECs) stimulated by acetylcholine (ACh). After the addition of ACh, a transient increase in NO concentration was detected by the electrode. In the presence of NG-nitro-L-arginine methyl ester (L-NAME), a putative NO synthase inhibitor, NO release (peak NO concentration) from RAECs was significantly less than that in the absence of L-NAME (0.18 +/- 0.04 microM vs 0.47 +/- 0.13; P < 0.01). After removal of L-NAME, NO release partially recovered (0.39 +/- 0.10 microM). In conclusion, the microcoaxial electrode was successfully applied to direct and continuous NO measurement in biological systems.     

Stress intensity factors of microstructurally small crack

The stress intensity factor (SIF) is widely used for evaluating integrity of cracked components. Averaging the anisotropy of each crystal, the macroscopic behavior of polycrystalline materials is isotropic and homogenous in terms of elastic deformation. However, the anisotropic and/or inhomogeneous property influences on the stress field around a crack if the crack size is small in comparison with the grain. Thus, the SIF of the microstructurally small crack may differ from that in the isotropic body. In present study, the effect of anisotropic/inhomogeneous elasticity on the SIF is investigated by using the finite element analysis (FEA). At first, the SIFs of semi-circular crack in a single crystal and a polycrystalline material are calculated. These reveal that the magnitude of SIF is dependent not only on the crystal orientation but also on the deformation constraint by the neighboring crystals. Then, the statistical scatter of SIF due to the random orientation of crystal orientation in a polycrystal is examined by a Monte Carlo simulation.     

Reconstruction of a high-resolution image on a compound-eye image-capturing system

The authors have proposed an architecture for a compact image-capturing system called TOMBO (thin observation module by bound optics), which uses compound-eye imaging for a compact hardware configuration [Appl. Opt. 40, 1806 (2001)]. The captured compound image is decomposed into a set of unit images, then the pixels in the unit images are processed with digital processing to retrieve the target image. A new method for high-resolution image reconstruction, called a pixel rearrange method, is proposed. The relation between the target object and the captured signals is estimated and utilized to rearrange the original pixel information. Experimental results show the effectiveness of the proposed method. In the experimental TOMBO system, the resolution obtained is four times higher than that of the unit image that did not undergo reconstruction processing.