均衡营养早餐的研制

根据膳食营养的要求,以燕麦、爆裂玉米、奶粉、鸡胸肉、胡萝卜和香菜为原料,采用微波技术和冷冻干燥技术生产均衡营养早餐,确定了最佳的配方为燕麦片15g、爆裂玉米8g、奶粉10g、鸡肉丁5g、胡萝卜丁0.5g、香菜干0.5g、盐或糖1g.     

丙烯酸高碳醇酯的合成

介绍了降凝剂中间体丙烯酸高碳醇酯的合成和产品分离提纯方法。考察了合成条件对酯化反应的影响，结果表明，在原料丙烯酸与十八醇摩尔比1．2：1，阻聚剂对苯二酚用量占原料总量1．5％，催化剂对甲苯磺酸用量占原料总量1．5％，反应温度80-86℃，回流反应时间6h条件下，酯化率最高达89％。产品分离提纯方法与传统分离方法比较，所需分离时间短，洗涤用水量少，而产品收率远高于传统分离方法，达95％以上。     

Essential SMSs: developing a service management scheme for semiconductor factory management systems

A semiconductor factory contains hundreds of pieces of equipment. More reliable service by equipment managers is required to increase the utilization of equipment and improve product quality and yield. Therefore, developing a reliable service management scheme (SMS) for semiconductor factory management systems is essential. This study presents an SMS that applies Jini Technology and uses the design by contract technologies. The SMS has error-detecting and function-replacing capabilities. The SMS detects the malfunctioning of an equipment manager (service) and sends an event notice to the factory manager. The GEV in the SMS archives the credit values of all of the equipment managers so that the factory manager can select better equipment managers for service by checking their credit values. The illustrative example and the evaluation of the reliability improvement reveal that the proposed SMS provides an efficient, reliable, fault tolerant, and cost-effective mechanism for semiconductor factory management systems. Lastly, this illustrative example is successfully implemented and demonstrated and the core technology of SMS is transferred to and commercialized by Charming Systems Corporation.     

3.5代通信中链路自适应技术的研究和仿真

3.5代移动通信中的链路自适应技术使用自适应调制编码和快速混合重传技术替代了3代中使用的功率控制技术。仿真结果比较了这两种新技术与功率控制技术的性能,证明了这两个新技术显著地提高了网络平均的吞吐量。     

反应注射成型工艺进展

本文介绍了反应注射成型新工艺和演变过程，论述反应注射成型工艺所需新材料及其发展．     

Binding of tissue plasminogen activator to endothelial cells. The effect on functional properties. Localization of a ligand in the B-chain of tPA

The binding of 125I-labelled tissue plasminogen activator (tPA), the tPA A- or B-chain to endothelial cells (EC) were studied in suspensions of cultured human umbilical vein EC (HUVEC) or immortalized microvascular EC (HMEC). By determinations of the concentration-dependent binding it was shown that both the A-chain and the B-chain, which were isolated after partial reduction of two-chain tPA, contain ligands for binding to EC. The affinity for the B-chain was much higher than for the A-chain according to Scatchard analysis (Kd 24 and 515 nM, respectively), whereas the number of binding sites was higher for the A-chain than for the B-chain (Bmax 8 x 10(5) and 1.2 x 10(5), respectively). There were no cross interactions between the A- and B-chains and their binding sites. The binding of tPA to EC induced an almost 100-fold increase of the activation rate when compared to the same amount of enzyme in free solution, which in contrast to the fibrin-induced stimulation was not inhibited by antibodies against fibrin. The enzymatic activity of the B-chain was much less affected by the association to the cells. Both tPA and the tPA B-chain were largely protected against inhibition by an excess plasminogen activator type-1 (PAI-1) when bound to EC, whereas the same amount of free tPA was totally inactivated. The competition studies strongly indicated that an N-terminal segment in the B-chain, AKHRRSPGER, may be the ligand part of the B-chain. It is interesting to note that this polypeptide segment also participates in a binding site for PAI-1, necessary for effective inhibition. This implies a possible competition between PAI-1 and a tPA-receptor for binding of tPA. High molecular weight urokinase had no quenching effect on the binding of the B-chain to EC.     

Designing circuits with partial scan

In this scan design methodology, only selected faults are targeted for detection. These faults are those not detected by the designer's functional vectors. The test generator decides exactly which flip-flops should be scanned using one of two methods. In the first method, all possible tests are generated for each target fault, and the set of tests requiring the fewest flip-flops is selected. In the second method, only one test is generated for each fault, and the use of flip-flops is avoided as much as possible during test generation. Examples of actual VLSI circuits show a savings of at least a 40% in full-scan overhead