Layered Working-Set Trees

The working-set bound [Sleator and Tarjan in J. ACM 32(3), 652–686, 1985] roughly states that searching for an element is fast if the element was accessed recently. Binary search trees, such as splay trees, can achieve this property in the amortized sense, while data structures that are not binary search trees are known to have this property in the worst case. We close this gap and present a binary search tree called a layered working-set tree that guarantees the working-set property in the worst case. The unified bound [B?doiu et al. in Theor. Comput. Sci. 382(2), 86–96, 2007] roughly states that searching for an element is fast if it is near (in terms of rank distance) to a recently accessed element. We show how layered working-set trees can be used to achieve the unified bound to within a small additive term in the amortized sense while maintaining in the worst case an access time that is both logarithmic and within a small multiplicative factor of the working-set bound.     

响应面法优化油茶粕中茶皂素提取工艺

采用单因素实验结合响应面法,优化了从油茶粕中提取茶皂素的工艺参数。单因素实验最佳条件：乙醇体积分数为70%、提取时间为3 h、提取温度为70℃、料液比为1∶4。在单因素的基础上,选取乙醇体积分数、提取时间、料液比为影响因子,以茶皂素提取得率作为响应值,进行3因素3水平响应面分析。结果表明：茶皂素最佳提取条件是乙醇体积分数为72%、提取时间为3.8 h、提取温度为70℃、料液比为1∶4.5,提取得率预测值为14.54%,验证实测值为14.22%,与预测值相对误差为2.20%。     

Prediction of time-varying metrology delay for dEWMA and RLS-LT controllers

This paper investigates how to adaptively predict the time-varying metrology delay that can realistically occur in the semiconductor manufacturing practice. In the presence of metrology delays, the expected asymptotic double exponentially weighted moving average (dEWMA) control output, by using the EWMA and recursive least squares prediction methods, is derived. It has been found that the relationships between the expected control output and target in both estimation methods are equivalent, and six cases are addressed. Within the context of time-varying metrology delay, a new time update scheme to the recursive least squares-linear trend (RLS-LT) controller, combined with zone tests and the moving average (MA) control chart, is proposed. Simulated single input–single output (SISO) run-to-run processes subject to two time-varying metrology delay scenarios are used to assess the effectiveness of the proposed controller.     

New approaches for determining a common set of weights for a voting system

Data Envelopment Analysis (DEA) is one of the methods that have been proposed to determine the weights in a ranked voting system. DEA solves one model corresponding to each candidate and evaluates candidates with their own weights. However, sometimes solving only one model, and evaluating the candidates based on a common set of weights, is preferred. In this paper, some drawbacks of existing models are explained and new approaches for determining a common set of weights are proposed. Numerical examples are utilized to illustrate the content of the paper.     

A general bayes rule and its application to nonlinear estimation

This paper consists of two main results, a general Bayes rule, and a general Bucy representation theorem. The general Bayes rule is a natural generalization of the elementary Bayes rule:

$\text{P(A}\text{B)}\text{P(A)}\text{=}\text{P(B}\text{A)}\text{P(B)}$

. The general Bucy representation theorem plays a central role in nonlinear estimation theory as does the Bucy theorem in nonlinear filtering. A simple and direct proof of the general Bucy representation theorem is obtained by the application of the general Bayes rule.     

Simulation of interconnect inductive impact in the presence of process variations in 90 nm and beyond

The on-chip inductive impact on signal integrity has been a problem for designs in deep-submicrometer technologies. The inductive impact increases the clock skew, max timing, and noise of bus signals. In this letter, circuit simulations using silicon-validated macromodels show that there is a significant inductive impact on the signal max timing (/spl sim/ 10% pushout versus RC delay) and noise (/spl sim/2/spl times/RC noise). In nanometer technologies, process variations have become a concern. Results show that device and interconnect process variations add /spl sim/ 3% to the RLC max-timing impact. However, their impact on the RLC signal noise is not appreciable. Finally, inductive impact in 65- and 45-nm technologies is investigated, which indicates that the inductance impact will not diminish as technology scales.     

Competitive Effects of Trichloroethylene on Cr(VI) Removal by Zero-Valent Iron

Eleven columns were set up under various groundwater geochemistry conditions to investigate the competitive effect of trichloroethylene (TCE) on hexavalent chromium [Cr(VI)] removal by zero-valent iron (Fe0). They were found to be electron competitors in the redox reactions. In the presence of TCE, the Cr(VI) removal capacities of Fe0 were decreased by about 40% when compared with their respective Cr(VI) removal capacities with identical groundwater geochemistry but without TCE. The specific reaction rate constant (kSA) of TCE was decreased by about 50% when Cr(VI) was singly applied. The kSA of TCE was further decreased by 75% in the presence of both Cr(VI) and carbonate. However, there was no apparent effect on the kSA of TCE when Cr(VI), hardness and carbonate were all present. It revealed that TCE was a stronger electron competitor of Cr(VI) and the degradation of TCE became more favorable when both hardness and carbonate were present. This suggests that the passivated precipitates formed on the Fe0 surface in the presence of both hardness and carbonate may significantly affect the Cr(VI) removal by Fe0 but has insignificant effect on the TCE removal.     

Refinement computations of electromagnetic fields using FE and meshless methods

A refinement algorithm for electromagnetic field computations using a combination of finite element and meshless methods is introduced. Bridging scales are used to separate the finite element and meshless shape functions to make the refinement hierarchical and to uphold the mathematical properties such as consistency and linear independence for all the bases. To facilitate the application of the proposed algorithm, details about the node addition, requirements for the node distribution, and relationships between the finite element and meshless shape functions, as well as the determination of the stop criterion are also fully addressed. Primary numerical results are reported to demonstrate and validate the applicability and advantages of the proposed algorithm over traditional ones.     

Recursive estimation methods for discrete systems

In system identification, the error evolution is composed of two decoupled parts: one is the identifying information on the current estimation residual, while the other is past arithmetic errors. Previous recursive algorithms only considered how to update current prediction errors. Up to now, research has mostly been based on recursive least-squares (RLS) methods. In this note, a general recursive identification method is proposed for discrete systems. Using this new algorithm, a recursive empirical frequency-domain optimal parameter (REFOP) estimate is established. The REFOP method has the advantage of resisting disturbance noise. Some simulations are included to illustrate the new method's reliability.