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排序方式: 共有674条查询结果,搜索用时 15 毫秒
61.
Maki Mandela Dr 《Refocus》2001,2(7):50
Dr Maki Mandela, Executive Manager of Corporate Services at the Development Bank of Southern Africa (DBSA; www.dbsa.org), visited the International Solar Energy Society (ISES) in June and was taken on a five-day RE fact-finding mission of Europe. The trip was unofficial; not representing the DBSA and the sole aim was to gather information to take back to DBSA to help increase the prominence of RE policies and initiatives within the DBSA, and hence in Southern Africa. 相似文献
62.
The polymorphism of Ca3SiO5 has been studied microscopically by following changes in optic properties and modes of twinning of the crystal as a function of temperature. Besides the six modifications already established, a hitherto-unidentified monoclinic phase M3, which can be characterized only by microscopy at present, has been found to exist just below the rhombohedral phase (R). The transitions that give clear thermal effects on the DTA curve show no corresponding change under the microscope. 相似文献
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64.
Kazumi Maki 《Journal of Low Temperature Physics》1978,32(1-2):1-17
Making use of the Ginzburg-Landau free energy, singularities such as disgyrations and vortex lines and stable textures in the planar (or two-dimensional) texture are studied. Here both % MathType!MTEF!2!1!+-% feaafeart1ev1aaatCvAUfeBSjuyZL2yd9gzLbvyNv2CaerbuLwBLn% hiov2DGi1BTfMBaeXatLxBI9gBaerbd9wDYLwzYbItLDharqqtubsr% 4rNCHbGeaGqiVu0Je9sqqrpepC0xbbL8F4rqaqpepeea0xe9qqVa0l% b9peea0lb9sq-JfrVkFHe9peea0dXdarVe0Fb9pgea0xa9pue9Fve9% Ffc8meGabaqaciGacaGaaeqabaWaaeaaeaaakeaaieqaceWFSbGbaK% aaaaa!3883!\[{\hat l}\] and % MathType!MTEF!2!1!+-% feaafeart1ev1aaatCvAUfeBSjuyZL2yd9gzLbvyNv2CaerbuLwBLn% hiov2DGi1BTfMBaeXatLxBI9gBaerbd9wDYLwzYbItLDharqqtubsr% 4rNCHbGeaGqiVu0Je9sqqrpepC0xbbL8F4rqaqpepeea0xe9qqVa0l% b9peea0lb9sq-JfrVkFHe9peea0dXdarVe0Fb9pgea0xa9pue9Fve9% Ffc8meGabaqaciGacaGaaeqabaWaaeaaeaaakeaaieqaceWFKbGbaK% aaaaa!387B!\[{\hat d}\] vectors, characterizing the texture in 3He-A, are assumed parallel to each other and lie always in a plane. The dynamics of disgyrations is also considered.Work supported by the National Science Foundation under grant number DMR76-21032. 相似文献
65.
Maki Toshihiro Horimoto Hiroumi Ishihara Takashi Kofuji Kazuya 《International Journal of Control, Automation and Systems》2020,18(3):597-604
International Journal of Control, Automation and Systems - This paper proposes a method for autonomous underwater vehicles to chase sea turtles without attaching any tag to them, toward efficient... 相似文献
66.
Takashi Hamachiyo Maki Ashida Kazuhiro Hasezaki 《Journal of Electronic Materials》2009,38(7):1048-1051
A fine measurement system for measuring thermal conductivity was constructed. An accuracy of 1% was determined for the reference
quartz with a value of 1.411 W/m K. Bi0.5Sb1.5Te3 samples were prepared by mechanical alloying followed by hot-pressing. Grain sizes were varied in the range from 1 μm to 10 μm by controlling the sintering temperature in the temperature range from 623 K to 773 K. The thermal conductivity was 0.89 W/m K
for the sample sintered at 623 K, while a grain size of 1.75 μm was measured by optical microscopy and scanning electron microscopy. The thermal conductivity increased on the sample sintered
at 673 K because of grain growth and decreased on those sintered at the temperatures from 673 K to 773 K because the increase
of pore size caused to decrease thermal conductivity. The increase of thermal conductivity for the samples sintered at temperatures
above 773 K was affected by the increase of carrier concentration. 相似文献
67.
Sato H. Wada T. Ohbayashi S. Kozaru K. Okamoto Y. Higashide Y. Shimizu T. Maki Y. Morimoto R. Otoi H. Koga T. Honda H. Taniguchi M. Arita Y. Shiomi T. 《Solid-State Circuits, IEEE Journal of》1999,34(11):1571-1579
This paper describes a 0.25-μm, 64 K×36 bit pipelined burst SRAM using a 6.156-μm2 cell. It realizes over 500-MHz operation using a lower cost double metal process, Internal 16 K×144 organization by T-shaped bit line array reduces 20% of latency, 20% of active power, and 8.5% of die size. The low power also enables us to use lower cost thin quad flat type packages. Our solution to the soft error problem, a shallow triple well structure and four-transistor cell with stacked capacitor, improved soft error rate by 3.5 orders of magnitude compared with the conventional SRAM cell 相似文献
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