Microstructure and properties of (Sr, Ca)CuO2/(Sr, Ca)RuO3 multilayers

Epitaxial multilayer thin films of infinite-layer (Sr, Ca)CuO₂ and perovskite (Sr, Ca)RuO₃ have been prepared on (100) SrTiO₃ substrates by multitarget rf magnetron sputtering. X-ray diffraction analyses revealed that the multilayer structure of (Sr, Ca)CuO₃/(Sr, Ca)RuO₃ was successfully fabricated with a minimum layer thickness of 20 Å. Transmission electron microscopy measurements of the multilayers indicated that there was no dislocation which normally exists in single-layer films with an infinite-layer structure. Resistivities of multilayer films at room temperature ranged from 1 to 10 m cm and showed semiconductor-like dependence against the temperature.     

Incoherent-only joint-transform correlator

An incoherent-only optical and electronic digital joint-transform correlator is proposed. A technique for the removal of extraneous signals inherent in the incoherent-only joint-transform correlator is also presented. A computer simulation and experimental results confirm the performance of the proposed incoherent-only joint-transform correlator.     

Color ellipsoscope for real-time imaging of nanometer-scale surface phenomena

An imaging method was developed based on null ellipsometry with a white-light source. It is useful for visualizing the kinetics of fast surface phenomena on the nanometer scale.     

Rational Filters for Passive Depth from Defocus

A fundamental problem in depth from defocus is the measurement of relative defocus between images. The performance of previously proposed focus operators are inevitably sensitive to the frequency spectra of local scene textures. As a result, focus operators such as the Laplacian of Gaussian result in poor depth estimates. An alternative is to use large filter banks that densely sample the frequency space. Though this approach can result in better depth accuracy, it sacrifices the computational efficiency that depth from defocus offers over stereo and structure from motion. We propose a class of broadband operators that, when used together, provide invariance to scene texture and produce accurate and dense depth maps. Since the operators are broadband, a small number of them are sufficient for depth estimation of scenes with complex textural properties. In addition, a depth confidence measure is derived that can be computed from the outputs of the operators. This confidence measure permits further refinement of computed depth maps. Experiments are conducted on both synthetic and real scenes to evaluate the performance of the proposed operators. The depth detection gain error is less than 1%, irrespective of texture frequency. Depth accuracy is found to be 0.51.2% of the distance of the object from the imaging optics.     

Effect of poly(acrylic acid) on the preparation of thick silica films by electrophoretic sol–gel deposition of re-dispersed silica particles

Thick silica films were prepared by the electrophoretic sol–gel deposition technique in the presence of poly(acrylic acid) (PAA) using monodispersed silica particles; the particles were prepared by the sol–gel method, pre-heat treated and then re-dispersed in the mixture of H2O and ethanol. The weight of deposited silica films was maximized when 0.2 mass % of PAA against the whole amount of sol was added. The particles constructing the thick silica films were packed densely when the amount of added PAA was less than 0.2 mass%. The weight of the film increased with decrease in the content of H2O in the sol when a fixed amount of PAA was added. After the heat treatment of deposited films at 800 °C, crack-free silica films of about 30 m thickness were prepared. © 1998 Chapman & Hall     

Discharge properties and chemical stability of SrZrO films

Abstract— MgO thin film is currently used as a surface protective layer for dielectric materials because MgO has a high resistance during ion sputtering and exhibits effective secondary electron emission. The secondary‐electron‐emission coefficient γ of MgO is high for Ne ions; however, it is low for Xe ions. The Xe content of the discharge gas of PDPs needs to be raised in order to increase the luminous efficiency. Thus, the development of high‐γ materials replacing MgO is required. The discharge properties and chemical surface stability of SrO containing Zr (SrZrO) as the candidate high‐γ protective layer for noble PDPs have been characterized. SrZrO films have superior chemical stability, especially the resistance to carbonation because of the existence of a few adsorption sites due to their amorphous structure. The firing voltage is 60 V lower than that of MgO films for a discharge gas of Ne/Xe = 85/15 at 60 kPa.     

Design of an adaptive fuzzy sliding mode control for uncertain discrete-time nonlinear systems based on noisy measurements

This paper presents the design of an adaptive fuzzy sliding mode control (AFSMC) for uncertain discrete-time nonlinear dynamic systems. The dynamic systems are described by a discrete-time state equation with nonlinear uncertainties, and the uncertainties include the modelling errors and the external disturbances to be unknown but nonlinear with the bounded properties. The states are measured by the restriction of measurement sensors and the contamination with independent measurement noises. The nonlinear uncertainties are approximated by using the fuzzy IF-THEN rules based on the universal approximation theorem, and the approximation error is compensated by adding an adaptive complementary term to the proposed AFSMC. The fuzzy inference approach based on the extended single input rule modules is proposed to reduce the number of the fuzzy IF-THEN rules. The estimates for the un-measurable states and the adjustable parameters are obtained by using the weighted least squares estimator and its simplified one. It is proved that under some conditions the estimation errors will remain in the vicinity of zero as time increases, and the states are ultimately bounded subject to the proposed AFSMC. The effectiveness of the proposed method is indicated through the simulation experiment of a simple numerical system.     

Defect distribution near abraded surface of III–V compound semiconductors

Microstructures of damaged layers near the abraded surface of GaP, GaAs_0.6P_0.4 and GaAs single crystals have been observed with a transmission electron microscope. The damage due to 0.3 m Al₂O₃ abrasion consists of dislocations. Dislocation densities in the abrasion band and other regions are larger than 5×10¹¹ cm^–2 and about 10¹¹ cm^–2, respectively. Dislocation density decreases with increasing distance (depth) from the abraded surface. The depths of the damage layers for GaP, GaAs_0.6P_0.4 and GaAs are about 0.4, 0.55, and 0.8 m, respectively. The Burgers vector of dislocations is a/2[1 1 0], and A and B dislocations are observed. During annealing, the dislocations are rearranged and eliminated by the reaction of the dislocations with different Burgers vectors and climbing motion. The rearrangement temperatures for dislocations in GaP and GaAs are about 500 and 450° C, respectively. Electrical resistance changes in the damaged layer of GaP are recognized by electrical resistance measurements.     

Real-time measurements of spatial velocity distribution with a laser Doppler imaging system

A new laser Doppler imaging system with a TV camera has been constructed, which brightly displays 1-D velocity distribution on a monitor. Some characteristics of this system have been experimentally investigated from measurements of simple velocity distribution on a constantly rotating ground glass disk. From an adaptation to fluid flow, it has been shown that the measurements of spatial velocity distribution can be achieved in real time.