SIL验证与安全仪表系统的优化设计

安全仪表功能(SIF)回路是为了降低特定场景的安全风险而设置的,定级报告中SIF回路的功能描述是工艺设计的完整逻辑要求,包含关键动作及附件动作。安全完整性等级(SIL)验证属于概率学领域研究范畴,影响失效率的因素多且复杂。如果SIL验证无法通过,将造成大量的设计变更,浪费工程投资,影响工期。设计人员应关注SIL定级报告中关键动作的识别、要求平均失效概率以及SIF回路架构的约束。按照文中方法优化测量元件、逻辑控制器、执行元件及辅助元件的设计,可增加通过验证的概率。在没有预验证及安全要求规格书时,可以参考文中典型可通过SIL验证的SIF回路的经验架构进行优化设计,以减少工程变更。     

Multiple clusterings of heterogeneous information networks

Machine Learning - Traditional clustering algorithms focus on a single clustering result; as such, they cannot explore potential diverse patterns of complex real world data. To deal with this...     

An index structure supporting rule activation in pervasive applications

World Wide Web - Rule mechanism has been widely used in many areas, such as databases, artificial intelligent and pervasive computing. In a rule mechanism, rule activation decides which rules are...     

A mini review on two-dimensional nanomaterial assembly

Two-dimensional (2D) nanomaterials have attracted a great deal of attention since the discovery of graphene in 2004, due to their intriguing physicochemical properties and wide-ranging applications in catalysis, energy-related devices, electronics and optoelectronics. To maximize the potential of 2D nanomaterials for their technological applications, controlled assembly of 2D nanobulding blocks into integrated systems is critically needed. This mini review summarizes the reported strategies of 2D materials-based assembly into integrated functional nanostructures, from in-situ assembly method to post-synthesis assembly. The applications of 2D assembled integrated structures are also covered, especially in the areas of energy, electronics and sensing, and we conclude with discussion on the remaining challenges and potential directions in this emerging field.