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A. Alt Dr.‐Ing. H. Mertens U. Arz L. Blessing C. Berger 《Materialwissenschaft und Werkstofftechnik》2007,38(5):402-409
High cycle fatigue of bolted connections Extensive tests regarding the influences on the fatigue of bolt‐nut‐connections of preloading with torsion, of preloading with yielding, of loading with superimposed bending and of the tested lot are processed. These influences are not yet known according to VDI 2230. New testing devices were designed for these tests, which allow a far less expensive operation and may easily be used for bolts of diameters up to M100 and testing frequencies up to 1000 Hz. The validity of fatigue resistance according to VDI 2230 is specified with respect to the test results. The determined influence of the tested lots is unexpectedly high. The manufacturing process of bolts should be improved to minimize this influence. 相似文献
36.
简要介绍了鞍钢现有人造富矿生产能力,分析了鞍钢生产1600万t/a生铁所需要的炉料数量、品种和质量,并提出了解决炉料缺口的方法和措施。 相似文献
37.
Huai Wen-xin Wuhan University of Hydraulic & Electric Engineering Wuhan Hubei P.R.China Prof.Li Wei 《水动力学研究与进展(B辑)》1993,(3)
Turbulence represents an essential aspect in atmospheric and oceanic circulations.In particu-lar,it is a preponderant factor in the dispersion of pollutants of artificial or natural origin.Thevertical turbulent jets,plumes and buoyant jets discharging into static environment is one of themost important and basic flow patterns related with the environment pollution.These flows havenumerous important applications,for example,thrust augmentors,waste disposal plumes fromstacks and combustion systems,and significant problems of turbulent diffusion. 相似文献
38.
房营光 《广东工业大学学报》1993,(1)
本文利用小参数摄动法研究了非线性弹性岩土中孔室对平面波的散射和动应力集中问题,对于圆孔情况给出了各渐近方程的解析解和应力集中系数的数值结果。 相似文献
39.
Kollipara R.T. Arodzero A. Bashindzhagyan G. Brau J.E. Frey R. Gao D. Mason D. Sinev N. Strom D. Yang X. 《IEEE transactions on nuclear science》1995,42(2):92-101
The SSC GEM silicon Central Tracker design incorporated 18-cm long single-sided AC-coupled silicon microstrip ladders. Compared to the 12-cm long ladders considered in the preliminary stages of the tracker design, the 18-cm long ladders have the advantage of reduced cost, channel count and overall power consumption, and led to a simplified tracker assembly. However, such long ships also present the challenge of maintaining satisfactory performance. The increased capacitance and series resistance contribute to lower signal-to-noise ratios, longer time walk, higher power consumption per channel and increased probability of crosstalk to neighboring channels. In this paper, an accurate method to calculate the geometric capacitance of the AC-coupled microstrips is presented and the calculated results are compared with measurements, SPICE simulations are performed to predict the noise, the extent of interstrip capacitive coupling and the dispersion of the detector signal due to the finite series resistance of the metal strips and the long length of the detector. The influence of the preamplifier current and the shaping time on the signal and noise levels is also presented. The study concludes that the 18-cm long ladders can successfully satisfy the performance goals of the GEM silicon Central Tracker 相似文献
40.
Ku T.K. Chen S.H. Yang C.D. She N.J. Wang C.C. Chen C.F. Hsieh I.J. Cheng H.C. 《Electron Device Letters, IEEE》1996,17(5):208-210
Undoped and phosphorus (P)-doped diamond-clad Si field emitter arrays have been successfully fabricated using microwave plasma chemical vapor deposition (MPCVD) technology. The electron emission from the blunt diamond-clad microtips are much higher than those for the pure Si tips with sharp curvature due to a lower work function. Furthermore, the characteristics of emission current against applied voltage for the P-doped diamond-clad tips show superior emission at lower field to the undoped ones. After the examination of Auger electron spectroscopy (AES) and electrical characteristics of as-grown diamond, such a significant enhancement of the electron emission from the P-doped diamond-clad tips is attributed to a higher electron conductivity and defect densities 相似文献