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31.
S Sharma P R Sankaridurg N Venkata S Potluri S Athmanathan S Reddy B A Holden G N Rao 《Contact lens & anterior eye》1999,22(4):110-115
To increase our knowledge of factors leading to Acanthamoeba keratitis in contact lens wearers, we determined the ability of this organism to adhere to corneal epithelial cells (EC) recovered from non-lens wearers (NL) and from subjects using hydrogel contact lenses on a daily (DW) and extended wear (EW) schedule. ECs were incubated with trophozoites of Acanthamoeba and, after 3 h, the median per cent of cells exhibiting adherence was 24, 23 and 23 for NL, DW and EW groups respectively (P=0.552, Kruskal-Wallis Test). There were no differences between the groups for the number of adherent amoebae and a significant majority had only one adherent trophozoite per EC. No difference in adherence was seen with increasing exposure time. Factors other than amoebic adherence to superficial corneal EC are responsible for the increased incidence of Acanthamoeba keratitis in lens wearers. 相似文献
32.
Prasad Ravi Kumar Madhu Santanoo Ramotra Prashant Edla Damodar Reddy 《Wireless Networks》2021,27(6):4111-4122
Wireless Networks - In Wireless Sensor Networks (WSNs), where power consumption is a huge concern, the improvement of the network’s lifetime is an area of constant study and innovation. The... 相似文献
33.
Karthikeyan Reddy Shanthi Pavan 《Analog Integrated Circuits and Signal Processing》2010,63(3):397-406
A state variable block diagram method is given for the realization of universal biquadratic transfer functions employing second-generation
current-controlled conveyors (CCCIIs). Using minimum number of passive components and properly adjusting the bias currents
of CCCIIs, the proposed circuits can realize all the tunable frequency standard filter functions: high-pass, band-pass, low-pass,
notch-pass, and all-pass by choosing appropriate input branches without changing the passive elements. These presented circuits
are in current-mode and voltage-mode separately. The non-ideality analyses of these configurations are given. Additionally,
a high-order low-pass filter derived from the proposed voltage-mode biquadratic filter is introduced. PSPICE simulation results
are included to verify the theory. 相似文献
34.
Autoscan: a scan design without external scan inputs or outputs 总被引:1,自引:0,他引:1
Pomeranz I. Reddy S.M. 《Very Large Scale Integration (VLSI) Systems, IEEE Transactions on》2005,13(9):1087-1095
We propose a design-for-testability technique for synchronous sequential circuits called autoscan. Autoscan uses scan chains similar to conventional scan. However, it gives up the external scan inputs and outputs in order to eliminate the test data volume associated with them. Scan operations under autoscan improve the circuit testability by allowing the circuit state to be modified through shifting. Due to the removal of the scan inputs and outputs, synthesis of scan chains under autoscan does not have to satisfy all the constraints imposed on conventional scan chains. We describe a synthesis procedure for autoscan chains, and demonstrate that autoscan allows us to detect almost all the faults that are detectable using conventional scan. We use random sequences in order to show that sequential test generation is not necessary under autoscan. We also describe a test generation procedure, and discuss the effect of autoscan on fault diagnosis. 相似文献
35.
Reddy R. Garrett R. 《Proceedings of the IEEE. Institute of Electrical and Electronics Engineers》1995,83(8):1188-1195
The paper examines the changes in computer and communications capabilities over the next 10-15 years which are most likely to affect the central components of distributed interactive simulation (DIS): manned simulators, synthetic environments, and semi-automated forces (SAF). Because these components of DIS are currently very resource intensive, improvements in computer and communications capabilities translate into direct and immediate improvements in DIS capabilities. These improved capabilities in turn allow DIS to contribute in much broader arenas, enhancing troop readiness and reducing system acquisition costs. These improvements will not all come automatically, however. Substantial planning is required to ensure that DIS can take advantage of the coming changes, rather than being overcome by them 相似文献
36.
S. K. Datta S. U. M. Reddy P. K. Jain B. N. Basu 《Journal of Infrared, Millimeter and Terahertz Waves》1999,20(3):483-490
A third-order nonlinear Eulerian hydrodynamic formulation was developed for the analysis of harmonic generation in helix traveling-wave tubes. The analysis was simple and computationally fast compared to Lagrangian analysis, and contrary to the existing belief, the theory could as well demonstrate the saturation behavior of the device. The performance of the theory was also found to be in close agreement with that of the Lagrangian analysis. The theory is expected to be useful as a first-hand design and simulation tool for microwave and millimetric wave traveling-wave tubes. 相似文献
37.
A mathematical expression for the outage probability of a selection combining diversity receiver with an arbitrary number of input branches is presented for exponentially correlated K fading channels. Numerical and simulation results are plotted and the effect of correlation, number of diversity branches and fading parameter on the outage performance of the receiver is studied. Results suggest that a correlation coefficient less than 0.5 may be used in practice. 相似文献
38.
Venkata Rao Tirumalasetty Madhusudhan Reddy Machupalli 《International Journal of Electronics》2019,106(4):521-536
This paper presents a low power and high speed two hybrid 1-bit full adder cells employing both pass transistor and transmission gate logics. These designs aim to minimise power dissipation and reduce transistor count while at the same time reducing the propagation delay. The proposed full adder circuits utilise 16 and 14 transistors to achieve a compact circuit design. For 1.2 V supply voltage at 0.18-μm CMOS technology, the power consumption is 4.266 μW was found to be extremely low with lower propagation delay 214.65 ps and power-delay product (PDP) of 0.9156 fJ by the deliberate use of CMOS inverters and strong transmission gates. The results of the simulation illustrate the superiority of the newly designed 1-bit adder circuits against the reported conservative adder structures in terms of power, delay, power delay product (PDP) and a transistor count. The implementation of 8-bit ripple carry adder in view of proposed full adders are finally verified and was observed to be working efficiently with only 1.411 ns delay. The performance of the proposed circuits was examined using Mentor Graphics Schematic Composer at 1.2 V single ended supply voltage and the model parameters of a TSMC 0.18-μm CMOS. 相似文献
39.
Reddy N.P. Costarella B.R. Grotz R.C. Canilang E.P. 《IEEE transactions on bio-medical engineering》1990,37(4):392-397
Dysphagia is a disorder of the swallowing mechanism and presents a major problem in the rehabilitation of stroke patients and head injured patients. The authors have identified several biomechanical parameters that characterize the oral musculature and have developed techniques to quantify these parameters in normal and dysphagic patients. These parameters include lip closure pressure, lip interface shear force, tongue thrust, and swallow pressure. Significant differences were found in each of these parameters measured in normal and dysphagic patients. The quantitative measurements may aid the physician in choosing the appropriate therapy during the course of recovery. 相似文献
40.
Pomeranz I. Reddy S.M. 《Very Large Scale Integration (VLSI) Systems, IEEE Transactions on》2004,12(7):780-788
Functional test sequences were shown to detect unique defects in VLSI circuits. This is thought to be due to the fact that they are applied at-speed. However, functional test sequences do not achieve complete stuck-at fault coverage. Therefore, scan-based stuck-at tests, as well as other types of tests, are typically also applied. This increases the amount of test resources required for test application. We describe a procedure for inserting (limited) scan operations into a functional sequence in order to improve its stuck-at fault coverage, thus reducing or eliminating the need for separate scan-based stuck-at tests. Between scan operations, the functional test sequence can still be applied at-speed; however, a higher stuck-at fault coverage is achieved. 相似文献