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排序方式: 共有393条查询结果,搜索用时 78 毫秒
81.
Chemical vapor infiltration is now being used to produce advanced materials for aerospace applications. It is also applicable to carbons to enhance the resistance against oxidation. In the present study, methane pyrolysis was conducted for several kinds of carbons such as electrode-grade graphite, electrode-grade carbon, coke and activated charcoal. The structural change of micropores (radius < 10 nm) accompanying infiltration and oxidation was investigated because oxidation is considered mainly to occur in such small pores due to their large specific surface area. The change of macropores measured by mercury porosimeter is also shown for comparison with that of fine pores. Pore-size distribution measured by the BET method have shown that the filling mode depends on the pore structure of carbons. 相似文献
82.
Over the last decades, the Symposium has been the premier forum for memory, putting more emphasis on seminal memory circuits rather than on record-setting performances with actually fabricated full chips, which has been the emphasis at the ISSCC. Indeed, it has been the breeding ground for DRAMs, SRAMs, flash memories, and other memories. 相似文献
83.
Y. Kim C. Kim K. Husimi S. Ohkawa Y. Fuchi S. Osada 《Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment》1984,226(1):125-128
Epitaxial integrated dE1 ? dE2 silicon detectors have been developed by using the multilayer epitaxial crystal growth technique combined with the chemical preferential etching technique. These detectors are useful for eliminating events affected by channeling and blocking effects in the identification of heavy ions using multiple detector telescope systems. Characteristics of dE detectors of the integrated dE1 ? dE2 type are confirmed to as good as those of integrated E ? dE detectors. 相似文献
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Yamaguchi K. Takemura Y. Osada K. Ishibashi K. Saito Y. 《Electron Devices, IEEE Transactions on》2004,51(3):378-388
Soft-error tolerance of static random-access memory (SRAM) devices has been predicted by using three-dimensional (3-D) and time-dependent device simulation in conjunction with circuit simulation. An inverter model developed for 3-D device simulation is described, along with the analysis of the inverters device response as a function of time. The output thus obtained was applied as an input voltage source in circuit simulation of unit SRAM cell and the stability of this bistable circuit is studied on that basis. The effects on soft-error immunity of changes in alpha-particle injection conditions and in load resistance and capacitance are described. The validity of the presented model is examined through comparison of the bit-error-rate dependence on incident angle of alpha particles to that of measured rates. To simulate the angular dependence, we introduce statistical distribution models for alpha-particle energy, position of incidence on the device surface, and angle of incident. Results of device/circuit simulation carried out with many sets of energy, position, and angle are presented. Reasonable agreement between results of simulation and experimental data without the use of adjustment parameters is demonstrated. A map of soft-error tolerance on the CR plane with critical charge Q/sub c/ as a parameter is presented and its derivation explained. An analytic expression for the tolerance is clarified by proposing an equivalent circuit model for the simulation of alpha-particle injection at the output node in an inverter circuit. Inverter modeling is shown to be essential to obtaining SRAM soft-error tolerance to high degrees of accuracy. 相似文献
86.
Finite element analysis of fracture statistics of ceramics: Effects of grain size and pore size distributions
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Shingo Ozaki Yuya Aoki Toshio Osada Kyohei Takeo Wataru Nakao 《Journal of the American Ceramic Society》2018,101(7):3191-3204
A novel numerical simulation method based on finite element analysis (FEA), which can evaluate the fracture probability caused by the characteristics of flaw distribution, is considered an effective tool to facilitate and increase the use of ceramics in components and members. In this study, we propose an FEA methodology to predict the scatter of ceramic strength. Specifically, the data on the microstructure distribution (i.e., relative density, size and aspect ratio of pore, and grain size) are taken as the input values and reflected onto the parameters of a continuum damage model via a fracture mechanical model based on the circumferential circular crack emanating from an oval spherical pore. In addition, we numerically create a Weibull distribution based on multiple FEA results of a three‐point bending test. Its validity is confirmed by a quantitative comparison with the actual test results. The results suggest that the proposed FEA methodology can be applied to the analysis of the fracture probability of ceramics. 相似文献
87.
It was found that the addition of SeO2, TeO2 or Sb2O3 to a V2O5/TiO2 catalyst greatly improved the catalytic activity in the vapor phase oxidation of toluene to selectively form benzoic acid. 相似文献
88.
Yoshiyuki Sato Ming Wang Shigeki Takishima Hirokatsu Masuoka Taku Watanabe Yoshihito Fukasawa 《Polymer Engineering and Science》2004,44(11):2083-2089
The solubility of butane and isobutane in molten polypropylene (PP) and polystyrene (PS) was measured at pressures up to 3 MPa and along four isotherms from 438 to 483 K for PP and from 348 to 473 K for PS. The solubility increased with increasing pressure and decreasing temperature. At 438 K and 2 MPa, the solubilities of butane and isobutane in PP were 0.15 and 0.11 g‐gas/g‐polym, respectively. At 423 K and 2 MPa, the solubilities of butane and isobutane in PS were 0.08 and 0.05 g‐gas/g‐polym, respectively. Solubility could be correlated with the Sanchez‐Lacombe equation of state with temperature‐dependent binary interaction parameters to within 4.4% average relative deviation. Henry's constant for these gases in the PP and PS obtained in this work were used to determine correlation equations along with literature data. Polym. Eng. Sci. 44:2083–2089, 2004. © 2004 Society of Plastics Engineers. 相似文献
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