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41.
The device developed allows one to measure the dielectric characteristics of solid substances and their melts at frequencies of 20–20000 Hz and in a wide temperature range of 20–250°C. The measured temperature dependencies of the dielectric permittivities of several molecular and liquid crystals (stilbene, diphenyl, naphthalene, cholesterylpelargonate, and 8OCB) are presented.  相似文献   
42.
The microscopic structures of PLZT(7.9/70/30 and x/65/35, x = 7 or 8) ceramics were studied by means of transmission electron microscopy. The presence of micro-regions in PLZTs was first verfied.  相似文献   
43.
Strain endurance experiments on a filled elastomer were performed at several temperatures. It was found that superimposed prestraining accelerated the ageing process. This process was caused by microstructural changes in the elastomer. In order to evaluate the mechanical properties of a filled elastomer it is necessary to take into consideration not only the ageing effects but also the loading history.  相似文献   
44.
Unsatisfactory conditions of storage of decontamination waste (DW) in the storages formed in the territory of Belarus after the Chernobyl accident require the evaluation of the level of protection of the environment and population. The potential hazard of the decontamination waste burial grounds (DWBGs) has been evaluated based on the use of a generalized multichamber model that was verified by comparing the calculation results and the results obtained by the American (GW SCREEN) model. The characteristics of the 24 largest and most hazardous DWBGs are given and the evaluations of their safety are presented. The zones of influence of these storages, whose size varies from 100 to 330 m, have been determined. The reliability of the prediction evaluation of a possible hazardous radioactive contamination of water near the storages has been verified using the Dudichi DWBG as an example.  相似文献   
45.
We formulate the inverse problem of scattering of electromagnetic fields by thin defects and analyze numerical algorithms used for its solution. It is shown that, in the two-dimensional case, the shape of a thin defect is completely determined by the scattered field given on a certain curve for a fixed value of the wave number. For the solution of the inverse scattering problem, we propose to use the procedure of iterative regularization based on the gradient methods. We deduce expressions for the Fréchet derivative of the operator of direct scattering problem with Dirichlet conditions imposed on the surface of a scatterer.  相似文献   
46.
This paper presents a mathematical model that is capable of calculating the ampacity of a wide variety of power cable designs consisting of an arbitrary number of layers on a cable reel. The model considers round cables with copper conductors. The validity and accuracy of the ampacity model were verified by comparing the predicted temperature distribution within the reel with measured temperatures collected during an extensive testing program conducted at the US Bureau of Mines (USBM). The mathematical model predicted a temperature distribution within the cable layers that was very close to the measured variation in temperature. The value of the program is illustrated by calculating ampacities for several copper conductor sizes  相似文献   
47.
48.
Translated from Khimicheskoe i Neftyanoe Mashinostroenie, No. 1, pp. 14–15, January, 1992.  相似文献   
49.
The optimal design of the high power plate and grid modulated selective amplifier is examined in this paper. For the analysis purposes, the linear model of constant plate current characteristics for HF power triode is applied. The carrier wave state of the unmodulated amplifier is chosen so to enable the realization of the high levels of modulation. The results are obtained immediateZy, and the estimated error is acceptable. The estimated characteristic values of this high power and high efficiency HF amplifier are shown in the corresponding diagrams.  相似文献   
50.
It has been reported that high-temperature (~1100°C) N2 O-annealed oxide can block boron penetration from poly-Si gates to the silicon substrate. However, this high-temperature step may be inappropriate for the low thermal budgets required of deep-submicron ULSI MOSFETs. Low-temperature (900~950°C) N2O-annealed gate oxide is also a good barrier to boron penetration. For the first time, the change in channel doping profile due to compensation of arsenic and boron ionized impurities was resolved using MOS C-V measurement techniques. It was found that the higher the nitrogen concentration incorporated at Si/SiO2 interface, the more effective is the suppression of boron penetration. The experimental results also suggest that, for 60~110 Å gate oxides, a certain amount of nitrogen (~2.2%) incorporated near the Si/SiO2 interface is essential to effectively prevent boron diffusing into the underlying silicon substrate  相似文献   
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