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221.
Yang Wang Mansour N. Salem A. Brennan K.F. Ruden P.P. 《Quantum Electronics, IEEE Journal of》1992,28(2):507-513
The authors present a theoretical analysis of a possible avalanching photodetector (APD)-based on II-VI compound semiconductors. Each unit cell is composed of a HgTe layer, or a similar semimetal, sandwiched between two layers of CdTe and HgCdTe or similar semiconducting materials. The barrier layers are graded so that the leading barrier height is just high enough to eliminate the thermionic emission dark current out of the well. The use of a semimetal within the well has a distinct advantage over a semiconductor, which is that the ionization process is essentially an interband mechanism since the confined carriers within the well lie within the overlapping conduction and valence bands. As a result, the concentration of target carriers is virtually inexhaustible as in a conventional interband device 相似文献
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223.
在钢的连铸过程中,结晶器保护渣的性质强烈地影响着铸造的行为、钢的质量、以及连铸工艺的环境.本研究采用高温显微技术来研究保护渣的熔化行为,采用液滴测试方法来测定保护渣的熔化速率.结果表明:自由碳是控制保护渣熔化行为的主要因素.熔化速率随碳的反应能力的增加而增加,随着碳含量的减少而增加. 相似文献
224.
225.
详细介绍了Iu-Flex的基本原理,包括核心网络(CN)节点标识、路由机制等,给出了移动通信网中利用Iu-Flex技术实现CN节点间负载均衡、负载重分配的方法和步骤。 相似文献
226.
227.
Degradation Behaviors of Metal-Induced Laterally Crystallized n-Type Polycrystalline Silicon Thin-Film Transistors Under DC Bias Stresses 总被引:1,自引:0,他引:1
Min Xue Mingxiang Wang Zhen Zhu Dongli Zhang Man Wong 《Electron Devices, IEEE Transactions on》2007,54(2):225-232
Device degradation behaviors of typical-sized n-type metal-induced laterally crystallized polycrystalline silicon thin-film transistors were investigated in detail under two kinds of dc bias stresses: hot-carrier (HC) stress and self-heating (SH) stress. Under HC stress, device degradation is the consequence of HC induced defect generation locally at the drain side. Under a unified model that postulates, the establishment of a potential barrier at the drain side due to carrier transport near trap states, device degradation behavior such as asymmetric on current recovery and threshold voltage degradation can be understood. Under SH stress, a general degradation in subthreshold characteristic was observed. Device degradation is the consequence of deep state generation along the entire channel. Device degradation behaviors were compared in low Vd-stress and in high Vd-stress condition. Defect generation distribution along the channel appears to be different in two cases. In both cases of SH degradation, asymmetric on current recovery was observed. This observation, when in low Vd-stress condition, is tentatively explained by dehydrogenation (hydrogenation) effect at the drain (source) side during stress 相似文献
228.
Yubin Yang Hui Lin Jixi Jiang 《IEEE transactions on systems, man, and cybernetics. Part A, Systems and humans : a publication of the IEEE Systems, Man, and Cybernetics Society》2006,36(1):162-172
This paper presents a computer-aided cloud-analysis approach by effectively modeling the integration of heterogeneous satellite-observed data and remote sensing images. First, automatic cloud detection and tracking methods are proposed to identify the georeferenced cloud objects in satellite remote sensing images. Then, a data integration modeling mechanism is designed to collect meaningful properties of those detected clouds by integrating the heterogeneous satellite-observed data and imaging into a unified cloud database. Finally, based on the integrated global data schema, a two-phase data mining method employing the decision tree algorithm is implemented to analyze and forecast the meteorological activities of all the cloud objects. Experimental results have shown that the proposed data integration model can effectively extract and synthesize all the useful information from heterogeneous data sources to generate a unified view of knowledge, on the basis of which the evolvement trends of clouds can be analyzed properly. 相似文献
229.
The objective of this research is to investigate the feasibility of a theoretical development which could lead to advanced manipulator concepts offering fast dynamic and control features. Specifically, the application of “dynamic linearization” to a kinematically redundant planar manipulator is studied. In comparing such a manipulator with a standard non-linear, non-redundant design it is shown that in addition to the expected merits in linearity, dexterity, and computational simplicity, savings in actuator energy consumption can also be realized using a relative simple trajectory optimization scheme. 相似文献
230.