Transient and dynamic average-value modeling of synchronous machinefed load-commutated converters

A new average-value model of a synchronous machine fed load-commutated converter is set forth in which the stator dynamics are combined with the DC link dynamics. This model is shown to he extremely accurate in predicting system transients and in predicting frequency-domain characteristics such as the impedance looking into the synchronous machine fed load-commutated converter. The model is verified against a detailed computer simulation and against a hardware test system, thus providing a three-way comparison. The proposed model is shown to be much more accurate than models in which the stator dynamics are neglected     

Structural studies of TiN/ZrN multilayer coating deposited by physical vapour deposition

Multilayer coatings have been produced using unbalanced magnetron physical vapour deposition in which discrete layers of TiN and ZrN were co-deposited. It has been shown that the multilayers exhibited two-fold periodicity having values of 13 and 2.8 nm. This periodicity, measured both by cross-sectional transmission electron microscopy and low-angle X-ray diffraction, has been precisely related to the process parameters used. Analysis has shown that a third, previously unreported, phase existed within the coating having a lattice parameter comparable to that of TiN and a well-defined orientation relationship with the primary phases. The existence of this phase has been explained in terms of variations in the stoichometry of the coating due to non-uniform metal to nitrogen deposition rates within the chamber. Textural studies revealed that preferred orientation existed in the coating; the degree of which was greater in the ZrN layers than the TiN layers.     

Growth of Fe on Si (100) at room temperature and formation of iron silicide

Low-energy electron diffraction (LEED), Auger electron spectroscopy and X-ray photoelectron spectroscopy (XPS) investigations of both the growth of an iron film on silicon (100) at room temperature and the subsequent formation of iron silicide are the subjects of this paper. An in-situ cleaned silicon (100) wafer without carbon or oxygen contamination exhibiting the known 2 × 1 reconstruction in the LEED pattern served as the substrate. Iron was deposited on this reconstructed surface at 300 K. The comparison of theoretical calculations based on three growth mechanisms with XPS data obtained with take-off angles of 0° and 50° clearly demonstrates a layer-by-layer growth of the iron film on silicon (100). At 300 K no formation of iron silicide was observed, although an interaction between iron and silicon could be detected at the interface. The formation of iron silicide was observed at annealing temperatures of 630–730 K. Quantitative XPS analysis yields the presence of FeSi₂, when the thickness is large enough. Neither the iron film on silicon nor the silicide shows any LEED pattern.     

Movement stability analysis of a pipe string in a thixotropic fluid

Features of movement of a drill pipe string in a well filled with a thixotropic fluid are analyzed taking into account inertial and elastic forces of the rope system. It is shown that processes of fluid structure degradation can lead to nonstationary movement of the pipes. In this case periodic and chaotic auto-oscillations are excited in the system.Bashkir State University, Ufa, Russia. Translated from Inzhenerno-Fizicheskii Zhurnal, Vol. 66, No. 4, pp. 405–411, April, 1994.     

A channel model for characterization of the error data recoveredfrom compact discs

The data recovered from compact discs are contaminated with errors that exhibit a bursty behavior. A channel model is developed to characterize the error bursts and good-data gaps that occur in actual data recovered from compact discs. The probability of having m erroneous symbols in a data block of length n symbols is calculated using the channel model. This probability can be used to evaluate the performance of the error-correction code (ECC) used in the compact disc system     

Local staging with CT of tumors of the upper urothelium

OBJECTIVE: To evaluate the ability of computerized tomography (CT) to stage transitional cell carcinoma of the upper urinary tract. METHODS: 29 transitional cell carcinoma of the upper urinary tract submitted to nephroureterectomy were retrospectively evaluated. All 29 tumors had preoperative CT scans performed to stage the lesion. The pathological staging was compared to that of CT. RESULTS: 10 of the 29 tumors had CT evidence of tumor extension and 19 had localized noninvasive tumor on CT. Of the 10 patients with CT findings of tumor extension, 2 (20%) had superficial tumors and 8 (80%) had tumors that invaded into the adventitial fat, renal parenchyma or perirenal fat (pT3, pT4). Of the 19 patients with localized noninvasive tumor on CT, 13 (68%) had superficial tumors and 6 (32%) had pT3 or pT4 tumors. CT sensitivity for tumor invasion was 57% with a specificity of 87.5%. CONCLUSIONS: Our analysis shows that CT is of limited value in staging these tumors. When CT demonstrates direct tumor extension through the renal pelvic or ureteral wall, it is a sensitive indicator of high-stage tumor. However, the results obtained in low stage tumors must be viewed with caution.     

Visual functions after photorefractive keratectomy

1. 45 myopes (-3.0 to -6.0 D) were examined before and 1 and 6 months after photorefractive keratectomy (PRK). Visual acuity (VA) was tested using Snellen and logMAR charts. Contrast sensitivity (CS) was measured using a computerized system. 2. Preoperative best corrected VA (BCVA) in myopes was significantly lower in comparison with a control group using logMAR charts only. A reduction of BCVA by both methods at 1. month and its return after 6 months nearly to original values was noted. 3. Significantly lower values of CS were found in patients before PRK compared to the control group. After 1 and 6 months stayed the values on preoperative level.     

Analysis of integrated optical waveguide mirrors

A new method is presented to analyze reflection losses of integrated mirrors, taking into account the exact guided mode profile and assuming that this profile remains unchanged up to the reflecting plane. The fraction of the reflected light coupled to one of the guided modes of the output waveguide is calculated, taking into account the mirror reflection coefficient. The influence of both translation and tilt of the reflecting plane is investigated. The method applies for every guided mode and any reflection angles. Numerical calculations are derived for a 90° optical corner mirror