Surface leakage currents in SiN/sub x/ passivated AlGaN/GaN HFETs

A novel guarded surface leakage test structure is used to isolate the surface and bulk leakage contributions to gate current in AlGaN/GaN HFETs. Passivation with various recipes of SiN/sub x/ always resulted in the commonly observed increase in gate leakage, which was found to be dominated by bulk leakage through the AlGaN. However, high temperature deposited SiN/sub x/ recipes gave a 1-2 orders reduction in surface leakage, whereas low temperature deposition gave an increase. Gate lag measurements were found to correlate closely with the surface leakage component, giving direct evidence that the key device problem of current slump is associated with current flow at the AlGaN surface.     

多组分间歇精馏工艺计算探讨

介绍用“微元时段”计算多组分间歇精馏的方法。     

Field dependence of impact ionization coefficients in In/sub 0.53/Ga/sub 0.47/As

Electron and hole ionization coefficients in In/sub 0.53/Ga/sub 0.47/As are deduced from mixed carrier avalanche photomultiplication measurements on a series of p-i-n diode layers, eliminating other effects that can lead to an increase in photocurrent with reverse bias. Low field ionization is observed for electrons but not for holes, resulting in a larger ratio of ionization coefficients, even at moderately high electric fields than previously reported. The measured ionization coefficients are marginally lower than those of GaAs for fields above 250 kVcm/sup -1/, supporting reports of slightly higher avalanche breakdown voltages in In/sub 0.53/Ga/sub 0.47/As than in GaAs p-i-n diodes.     

一种基于自然数线性八叉树的优化构造算法

本文提出了一种基于自然数线性八叉树的优化构造算法。该算法以活动结点表为中间辅助结构，在图像输入过程中直接生成基于Ｎ码的八叉树叶结点．与常规构造算法相比，新提出的优化构造算法省去了Ｎ码的计算及合并过程，从而具有较高的时空效率．     

四川优质苧麻的结构和性能研究

本文采用扫描电镜、Ｘ射线衍射仪以及常规仪器分析的方法测试了四川优质麻－达县红皮小麻和大竹青白麻的形态结构，超分子结构和力学性能，并与棉纤维进行了对比．实验表明，精干麻表面光洁．有裂纹裂缝等结构不匀点，取向度高，结晶度高，断裂强度高，刚性和断裂比功大，而延伸小；纤维粗．在主要指标上，红皮小麻优于青白麻。     

波形刃铣刀片铣削温度试验分析

进行了铣削温度试验 ,采用改进的人工热电偶法 ,利用动态数据采集系统 ,对波形刃铣刀片的铣削温度进行了采集。利用C语言和MATLAB软件对试验数据进行了分析 ,拟合出温度—时间 (T t)曲线 ,初步得到了受热密度函数 ,为温度场的可视化打下有力的基础     

保证跌落试件姿态的方法

进行包装件的自由跌落试验时,必须保证试件姿态符合标准规定。笔者在实践中总结出一种保证试件姿态和检验试件姿态误差的具体方法。