A New Classification of Path-Delay Fault Testability in Terms of Stuck-at Faults

A new classification of path-delay fault testability in a combinational circuit is presented in terms of testability of stuck-at faults in an equivalent circuit. Earlier results describing correlation of path-delay and stuck-at faults are either incomplete, or use a complex model of equivalent circuit based on timing parameters. It is shown here that a path-delay fault (rising or falling) is testable if and only if certain single or multiple stuck-at fault in the equivalent circuit is testable. Thus, all aspects of path-delay faults related to testability under various classification schemes can be interpreted using the stuck-at fault model alone. The results unify most of the existing concepts and provide a better understanding of path-delay faults in logic circuits.     

First and second law investigations of a new solar‐assisted thermodynamic cycle for triple effect refrigeration

This investigation is persuaded for the first and second law analyses of a new solar‐driven triple‐effect refrigeration cycle using Duratherm 600 oil (Duratherm Extended Life Fluid, NY, USA) as the heat transfer fluid is performed. The proposed cycle is an integration of ejector, absorption, and cascaded refrigeration cycles that could produce refrigeration output of different magnitude at different temperature simultaneously. Both exergy destruction and losses in each component and hence in the overall system are determined to identify the causes and locations of the thermodynamic imperfection. The effects of some influenced parameters such as hot oil outlet temperature, refrigerant turbine inlet pressure, and the evaporator temperature of ejector and cascaded refrigeration cycle have been observed on the first and second law performances. It is found that maximum irreversibility occurs in central receiver as 52.5% and the second largest irreversibility of 25% occurs in heliostat field. The second law efficiency of the solar driven triple effect refrigeration cycle is 2%, which is much lower than its first law efficiency of 11.5%. Analysis clearly shows that performance evaluation based on the first law analysis is inadequate and hence, more meaningful evaluation must be included in the second law analysis. Copyright © 2013 John Wiley & Sons, Ltd.     

Effect of Duplex Ageing on the Properties of A356 Alloy Containing Rare Earth Elements

Reduced weight of automobiles for the purpose of fuel economy has encouraged the use of light metals especially aluminium alloys. A356 Al alloy containing 7% Si and 0.3% Mg is widely used in automobile and aircraft industries due to excellent castability, good corrosion resistance and good pressure tightness. A356 is age hardenable alloy and there is appreciable improvement in strength and hardness achievable due to precipitation of intermetallic compound Mg₂Si. In the present investigation, aluminium alloy A356 with and without rare earth (RE) addition (0.5 wt%) was subjected to single ageing as well as double aging treatment. The results were compared for mechanical properties like hardness and ultimate tensile strength with the material not containing RE additions.     

Frequency channeling: a concept to increase the frequency and control the PPV of blast-induced ground vibration waves in multi-hole blast in a surface mine

Bulletin of Engineering Geology and the Environment - Vibrations induced due to blasting in mines may damage the nearby houses and disturb the habitants. The monitoring, prediction, and control of...     

Magnetic Behaviour of Granular GdMnO<Subscript>3</Subscript> Film

The present study deals with the investigation of magnetic properties along with morphological and microstructure analyses of a multiferroic GdMnO₃ film fabricated on Si(100) substrate by the pulsed laser deposition technique. Rutherford backscattering spectroscopic analysis suggests that the film is fabricated in the form of diffused layers having different stoichiometric proportions. Raman spectroscopy signifies that few modes present in the film are associated with MnO₆ octahedra and some extra peaks indicating the mixed phase formation in tuning with the Rutherford backscattering spectroscopy. Atomic force microscopy confirms the granular nature of the film. Field-cooled and zero-field-cooled thermal magnetization curves show irreversible behaviour extending well above room temperature, which is associated with spin disorder. The presence of Gd⁺³ state and Mn⁺³/Mn⁺⁴ mixed states in the uppermost layers of the film was confirmed by near-edge X-ray absorption fine structure. Subsequently, in association with these observations, the film is a weak ferromagnetic at 5 K and even at room temperature.     

3D study of temperature drop behavior of subsonic rarefied gas flow in microchannel

3D Numerical study of temperature variation for subsonic rarefied gas flow in a microchannel is carried out using an in-house MPI-based parallelized DSMC code. The temperature drop in the microchannel decreases with an increase in the aspect ratio whereas it increases with an increase in the pressure ratio, the cross-aspect ratio (CAR), and the Knudsen number. 3D and 2D simulations results are compared and effect of the CAR and Knudsen number are brought out. Finally, a correlation that predicts the temperature drop is formulated along with a list of conditions that ensures a near isothermal flow.     

Data-Driven DPPM Estimation and Adaptive Fault Coverage Calibration Using MATLAB?

A manufacturing defect is a finite chip area with electrically malfunctioning circuitry caused by fabrication errors. The fraction of defective chips that escapes to the customer is called the defect level, also known as defective parts per million (DPPM, or simply PPM) when normalized to one million units. This paper demonstrates a technique used to correlate coverage goals to DPPM based on test fallout data using a MATLAB^?-based error function minimization approach. This analysis is explained using regression models for DPPM yield versus fault/defect coverage. This approach is beneficial to semiconductor companies for calibrating their fault coverage goals to meet DPPM requirements from automotive or other customers that have very aggressive (i.e., ultra-low) DPPM demands.