Modeling of multilevel converters

In this paper, the imbricated cells multilevel converters are studied and modeled from a control viewpoint. These converters make use of several switches connected in a series, which allows using switches with reduced voltage ratings; these low voltage switches have lower conduction losses and can switch at higher frequency. In addition to this feature common to all converters using series connected switches, the control signals of multilevel converters can be phase shifted to increase the apparent switching frequency and improve the dynamic performances of the whole converter. It is shown that a multilevel inverter leg, composed of p pairs of switches and p-1 capacitors, forms a multivariable nonlinear system that cannot be properly modeled by standard methods such as state-space averaging. The transient behavior of this system depends on the current harmonics and their phase shift with the different control signals. A specific model is detailed, studied, and used to illustrate the properties of these converters. In particular, the natural balancing of the voltage across the switches is demonstrated and the time constants involved in this process are determined     

Unsubstantiated claims of false memory and essential responsibilities.

Comments on the assertion of K. S. Pope (see record 83-37387) that the confirmation that supposedly validates claims about the false memory syndrome, its antecedents, and its rampant magnitude needs to be made available and carefully examined. The author considers why there has been acceptance of unsubstantiated claims of false memory, and also points to essential responsibilities for psychologists whose clients have abuse memories. (PsycINFO Database Record (c) 2010 APA, all rights reserved)     

Reply to comments on “Error rate performance of theprojection code”

The authors reply to the comments by Koppelaar and Tolhuizen (see ibid. vol.46, no.9, p.573, 1998). They state that the optimum choice of the slopes used to perform the encoding process in a projection code always results in maximizing the minimum Hamming distance so that d=2 ^r     

Mechanical stress evolution and the blech length: 2D simulation of early electromigration effects

Modeling of stress and electromigration at the microscopic level, in confined interconnect metallic lines with tungsten studs, can very well account for the resistance behaviour in time. The resistance change at saturation for a metallic line with blocking boundaries at both ends can be related, according to the model, to threshold product (jL)_c found by Blech [1].     

Muon spin relaxation study of amorphous Hf2Co

Muon spin relaxation measurements were carried out in zero magnetic field on amorphous Hf₂Co. The results obtained and comparison with the behaviour of the muon in crystalline Hf₂Co (A. Baudry, P. Boyer, L.P. Ferreira, S.W. Harris, S. Miraglia and L. Pontonnier, J. Phys.: Condens. Matter, 4 (1992) 5025) indicate that muons occupy interstitial sites without Co atoms in first-neighbour positions and diffuse through those sites, suggesting the existence of some degree of short-range order in the amorphous structure. Muon diffusion cannot be described by a single thermally activated process and is faster in the amorphous alloy than in the crystalline alloy.